ASME BPVCY-2021, ARTICLE 4 NONMANDATORY APPENDIX P PHASED ARRAY (PAUT) INTERPRETATION P-410 SCOPE ‘This Nonmandatory Appendix is to be used asan aid for the interpretation of Phased Array Ultrasonic Testing (PAUT) images.'® The flaw signal interpretation metho- dology using PAUT is very similar to that of conventional ultrasonics; however, PAUT has improved imaging cap- abilities that ald in flaw signal interpretation. This inter- pretation guide is primarily aimed at using shear wave angle beams on butt welds, Other possibilities include (a) longitudinal waves (b) zero degree scanning (©) complex inspections, eg, nozzles, fillet welds P-420 GENERAL P-421 PAUT IMAGES — DATA VISUALIZATION PAUT data is routinely displayed using a rainbow color palette, with the range of colors representing a range of signal amplitude. Generally, “white” represents 0% signal amplitude, “blue” (or lighter colors) represents low ampli- tudes, and "red" (or darker colors) represents above re- ject signal amplitude (see Figure P-421-1) (a) PAUT has the ability to image the data in the same format as conventional ultrasonics - A-scans, and time or distance encoded B-scan, D-scan, and C-scans. (See Figure P-a21-2) NOTE: The examples shown here are not necessurlly typical ofall de fects due to diferences in shape, size, defect erentation, roughness, (b) The PAUT primary image displays are an E-scan or S-scan, exclusive to the PAUT technique. Both the E-scan and S-scan display the data in a 20 view, with distance from the front of the wedge on the X-axis, and depth on the Y-axis, This view is also considered an “end view. E-scans and S-scans are composed of all of the A-scans (or focal laws) in a particular setup. The A-scan for each beam (or focal Jaw) is available for use in flaw signal interpretation. () An E-scan (also termed an electronic raster scan) is ‘a single focal law multiplexed, across a group of active ele- ments, for a constant angle beam stepped along the phased array probe length in defined increments. Figure 421-3 shows an example of an E-scan, (@) An S-scan (also termed a Sector, Sectorial, Swept ‘Angle, or Azimuthal scan) may refer to either the beam movement or the data display (see Figure P-421-4) 197 P-450 PROCEDURE P-451 MEASUREMENT TOOLS PAUT instruments typically have flaw sizing aids con- tained within the software. These sizing aids are based fon using multiple sets of horizontal and vertical cursors overlaid on the various image displays. PAUT instruments rely on the accuracy of the user input information (such as component thickness) and calibration to accurately display flaw measurements and locations. P-452 FLAW SIZING TECHNIQUES Flaw sizing can be performed using a variety of indus try accepted techniques, such as amplitude drop (e., 6 dB Drop) techniques and/or tip diffraction techniques. Different flaw types may require different sizing techniques, P-452.1 Flaw Length. Flaw lengths parallel to the surface can be measured from the distance encoded D- or C-scan images using amplitude drop techniques by placing the vertical cursors on the extents ofthe flaw dis played on the D- or C-scan display. Figure P-452.1 shows ‘an example of cursors used for length sizing P-452.2 Flaw Height. Flaw height normal to the sur- face can be measured from the B-, E-, or $-scan images using amplitude drop or tip diffraction techniques, (a) Using amplitude drop techniques, the horizontal cursors are placed on the displayed flaws upper and low- er extents. Figure P-#52.2-1 shows an example of cursors used for height sizing with the amplitude drop technique. (2) Using tip diffraction techniques the horizontal cur= sors are placed on the upper and lower tip signals of the displayed flaw. Figure P-52.2-2 shows an example of cursors used for height sizing with the tip diffraction technique. P-480 EVALUATION ‘This section shows a variety of PAUT images and the in- terpretation/explanation, There are significant variations amongst flaws and PAUT setups and displays, so the fol- lowing images should be used as a guide only. Evaluator experience and analysis skills are very important as well,ARTICLE 4 P-481 1D. (INSIDE DIAMETER) CONNECTED CRACK These typically show multiple facets and edges visible in the A-scan and S-scan, There isa distinct start and stop fon the A-scan, and a significant echodynamic travel to the signal as the probe is moved in and aut from the weld (if the crack has significant vertical extent). The reflector is usually detectable and can be plotted from both sides of the weld. The reflector should plot to the correct I.D depth reference or depth reading, as shown in Figure P48 P-481.1 Lack of Sidewall Fusion. LOF (Lack of Fu: sion) plots correctly on the weld fusion line, either through geometrical plotting or via weld overlays. There ‘may be a significantly different response from each side of the weld, LOF is usually detected by several of the angles in an S-scan from the same position. The A-scan shows a fast rise and fall time with short pulse duration indicative of a planar flaw. There are no multiple facets or tips Skewing the probe slightly does not produce multiple peaks or jagged facets as in a crack. There may be mode- converted multiple signals that rise and fall together and maintain equal separation. Figure P-481.1 shows an example, P-481.2 Porosity. Porosity shows multiple signal re- sponses, varying in amplitude and position. The signals plot correctly to the weld volume. The signals’ start and stop positions blend with the background at low ampli- tude. The A-scan slow rise and fall time with long pulse duration is indicative of a nonplanar flaw. Porosity may or may not be detected from both sides of the weld, but should be similar from both sides. Figure P-41.2 shows an example of porosity. P-481.3 0.D. (Outside Diameter) Toe Crack. Toe cracks typically show multiple facets and edges visible in the A-scan and S-scan, There is significant echodynamic 198 ASME BPVCY-2021 travel to the signal as the probe is moved in and out from the weld, The reflector is usually detectable and can be plotted from at the correct 0.D. depth reference line or depth reading. Normally, toe cracks are best character ized on S-scans and lower angle E-scan channels. Figure -481.3 shows an example P-481.4 (Incomplete Penetration). Incomplete Pene- tration (IP) typically shows high amplitude signals with significant echodynamic travel or travel over the LD. skip line, IP will typically respond and plot from both sides of the weld in common weld geometries near centerline re- ference indicators. Generally, IP is detected on all chan- nels, with highest amplitude on a high angle E-scan. The A-scan shows a fast rise and fall time with short pulse duration indicative ofa planar flaw. Figure P-481.4 shows an IP signal. Note that IP must be addressed relative to the weld bevel. For example, a double V weld will have IP in the midwall, whereas a single V bevel will be surface- breaking. However, the rise-fall time of the signal is sim- ilar to that for toe cracks and other root defects. This re quires extra care on the part of the operator, Note that incomplete penetration can look similar to surface lack of sidewall fusion P-481.5 Slag. Slag typically shows multiple facets and edges visible in the A-scan and S-scan, The A-scan shows a slow rise and fall time with long pulse duration, indicative of a nonplanar flaw. Typically slag shows lower amplitude than planar flaws, and may be difficult to dis- tinguish from porosity, or from some smaller planar de- fects. lag is typically detectable from both sides, can be plotted from both sides of the weld and is often best char- acterized using an S-scan. A slag reflector will typically plot to the correct depth area and reference lines that co: incide to the weld volume, Figure P-481.5 shows an example.ASME BPVCY-2021, ARTICLE 4 Figure P-421-1 Black and White (B&W) Version of Color Palette o% Signal Amplitude Response 100% Blue tight) Red (dark) Figure P-421-2 Scan Pattern Format ‘Top (C) view Index axis sand Discan (side view! Utrasound Depth Biscan (end view! 199ARTICLE 4 ASME BPVGY-2021, Figure P-421-3 Example of an E-Scan Image Display Time or distance (surface path) Depth 200ASME BPVCY-2021, ARTICLE 4 igure P-421-4 Example of an $-Scan Image Display Time or distance (surface path) — Dopth Figure P-452.1 Flaw Length Sizing Using Amplitude Drop Technique and the Vertical Cursors on the C-Scan Display au 15mm ——_— | | } | | L 201ARTICLE 4 ASME BPVGY-2021, Figure P-452.2-1 Scan Showing Flaw Height Sizing Using Amplitude Drop Technique and the Horizontal Cursors on the B-Scan Display 2.3 mm) Figure P-452.2-2 Flaw Height Sizing Using Top Diffraction Technique and the Horizontal Cursors on the S-Scan Display Ten 1 EAST RO SCT a TOT 202ASME BPVCY-2021, ARTICLE 4 Figure P-481 -Scan of I.D. Connected Crack — Half Veo path showing LD, surlace Figure P-481.2 E-Scan of LOF in Midwalt e-———— HaIF vee path or. Full Veo path or 0.0, $$ Orw-andarat Vee paths or |. 203ARTICLE 4 ASME BPVGY-2021, Figure P-481.2 $-Scan of Porosity, Showing Multiple Reflectors Frat Vee pat $F V02 path or 0, Figure P-481.3 0.0. Toe Crack Detected Using S-Sean Veo path or OD. 204ASME BPVCY-2021, ARTICLE 4 Figure P-481.4 IP Signal on $-Sean, Positioned on Root $a ver pats i or. Figure P-481.5 Slag Displayed as a Midwall Defect on S-Scan 4 Half Veo oath or LD. 205