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1. General description
The LPC2109/2119/2129 are based on a 16/32-bit ARM7TDMI-S CPU with real-time
emulation and embedded trace support, together with 64/128/256 kB of embedded
high-speed flash memory. A 128-bit wide memory interface and a unique accelerator
architecture enable 32-bit code execution at maximum clock rate. For critical code size
applications, the alternative 16-bit Thumb mode reduces code by more than 30 % with
minimal performance penalty.
With their compact 64-pin package, low power consumption, various 32-bit timers,
4-channel 10-bit ADC, two advanced CAN channels, PWM channels and 46 fast GPIO
lines with up to nine external interrupt pins these microcontrollers are particularly suitable
for automotive and industrial control applications, as well as medical systems and
fault-tolerant maintenance buses. With a wide range of additional serial communications
interfaces, they are also suited for communication gateways and protocol converters as
well as many other general-purpose applications.
Remark: Throughout the data sheet, the term LPC2109/2119/2129 will apply to devices
with and without the /00 or /01 suffixes. The /00 or the /01 suffix will be used to
differentiate from other devices only when necessary.
3. Ordering information
Table 1. Ordering information
Type number Package
Name Description Version
LPC2109FBD64/01 LQFP64 plastic low profile quad flat package; 64 leads; SOT314-2
body 10 10 1.4 mm
LPC2119FBD64/01 LQFP64 plastic low profile quad flat package; 64 leads; SOT314-2
body 10 10 1.4 mm
LPC2129FBD64/01 LQFP64 plastic low profile quad flat package; 64 leads; SOT314-2
body 10 10 1.4 mm
LPC2109_2119_2129 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
LPC2109_2119_2129 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
4. Block diagram
EMULATION TRACE
LPC2109 TEST/DEBUG
INTERFACE VDD(3V3)
LPC2119 SYSTEM
MODULE
PLL VDD(1V8)
LPC2129 FUNCTIONS
VSS
ARM7TDMI-S
P0[30:27], system
P0[25:0] HIGH-SPEED clock VECTORED
GPI/O(4) AHB BRIDGE INTERRUPT
P1[31:16] 46 PINS TOTAL CONTROLLER
INTERNAL INTERNAL
SRAM FLASH
CONTROLLER CONTROLLER AHB TO APB APB AHB
BRIDGE DIVIDER DECODER
SCK1(1)
SPI1/SSP(4) SERIAL MOSI1(1)
EXTERNAL INTERFACE MISO1(1)
EINT[3:0](1)
INTERRUPTS
SSEL1(1)
SYSTEM
PWM[6:1](1) PWM0 CONTROL
002aad172
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5. Pinning information
5.1 Pinning
54 P0[19]/MAT1[2]/MOSI1/CAP1[2]
53 P0[18]/CAP1[3]/MISO1/MAT1[3]
55 P0[20]/MAT1[3]/SSEL1/EINT3
64 P1[27]/TDO
52 P1[30]/TMS
56 P1[29]/TCK
60 P1[28]/TDI
63 VDDA(1V8)
58 VSSA(PLL)
51 VDD(3V3)
49 VDD(1V8)
57 RESET
62 XTAL1
61 XTAL2
59 VSSA
50 VSS
P0[21]/PWM5/CAP1[3] 1 48 P1[20]/TRACESYNC
P0[22]/CAP0[0]/MAT0[0] 2 47 P0[17]/CAP1[2]/SCK1/MAT1[2]
P0[23]/RD2(1) 3 46 P0[16]/EINT0/MAT0[2]/CAP0[2]
P1[19]/TRACEPKT3 4 45 P0[15]/RI1/EINT2
P0[24]/TD2(1) 5 44 P1[21]/PIPESTAT0
VSS 6 43 VDD(3V3)
VDDA(3V3) 7 42 VSS
P1[18]/TRACEPKT2 8 LPC2109 41 P0[14]/DCD1/EINT1
LPC2119
P0[25]/RD1 9 40 P1[22]/PIPESTAT1
LPC2129(2)
TD1 10 39 P0[13]/DTR1/MAT1[1]
P0[27]/AIN0/CAP0[1]/MAT0[1] 11 38 P0[12]/DSR1/MAT1[0]
P1[17]/TRACEPKT1 12 37 P0[11]/CTS1/CAP1[1]
P0[28]/AIN1/CAP0[2]/MAT0[2] 13 36 P1[23]/PIPESTAT2
P0[29]/AIN2/CAP0[3]/MAT0[3] 14 35 P0[10]/RTS1/CAP1[0]
P0[30]/AIN3/EINT3/CAP0[0] 15 34 P0[9]/RXD1/PWM6/EINT3
P1[16]/TRACEPKT0 16 33 P0[8]/TXD1/PWM4
VDD(1V8) 17
VSS 18
P0[0]/TXD0/PWM1 19
P1[31]/TRST 20
P0[1]/RXD0/PWM3/EINT0 21
P0[2]/SCL/CAP0[0] 22
VDD(3V3) 23
P1[26]/RTCK 24
VSS 25
P0[3]/SDA/MAT0[0]/EINT1 26
P0[4]/SCK0/CAP0[1] 27
P1[25]/EXTIN0 28
P0[5]/MISO0/MAT0[1] 29
P0[6]/MOSI0/CAP0[2] 30
P0[7]/SSEL0/PWM2/EINT2 31
P1[24]/TRACECLK 32
002aad173
LPC2109_2119_2129 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
LPC2109_2119_2129 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
LPC2109_2119_2129 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
LPC2109_2119_2129 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
6. Functional description
Details of the LPC2109/2119/2129 systems and peripheral functions are described in the
following sections.
Pipeline techniques are employed so that all parts of the processing and memory systems
can operate continuously. Typically, while one instruction is being executed, its successor
is being decoded, and a third instruction is being fetched from memory.
The key idea behind Thumb is that of a super-reduced instruction set. Essentially, the
ARM7TDMI-S processor has two instruction sets:
Thumb code is able to provide up to 65 % of the code size of ARM, and 160 % of the
performance of an equivalent ARM processor connected to a 16-bit memory system.
On-chip bootloader (as of revision 1.60) provides Code Read Protection (CRP) for the
LPC2109/2119/2129 on-chip flash memory. When the CRP is enabled, the JTAG debug
port and ISP commands accessing either the on-chip RAM or flash memory are disabled.
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However, the ISP flash erase command can be executed at any time (no matter whether
the CRP is on or off). Removal of CRP is achieved by erasure of full on-chip user flash.
With the CRP off, full access to the chip via the JTAG and/or ISP is restored.
In addition, the CPU interrupt vectors may be re-mapped to allow them to reside in either
flash memory (the default) or on-chip SRAM. This is described in Section 6.18 “System
control”.
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0x8000 0000
2.0 GB 0x7FFF FFFF
BOOT BLOCK (RE-MAPPED FROM
ON-CHIP FLASH MEMORY) 0x7FFF E000
0x7FFF DFFF
0x0004 0000
0x0003 FFFF
256 kB ON-CHIP FLASH MEMORY (LPC2129)
0x0002 0000
0x0001 FFFF
128 kB ON-CHIP FLASH MEMORY (LPC2119)
0x0001 0000
0x0000 FFFF
64 kB ON-CHIP FLASH MEMORY (LPC2109)
0.0 GB 0x0000 0000
002aad174
FIQ has the highest priority. If more than one request is assigned to FIQ, the VIC
combines the requests to produce the FIQ signal to the ARM processor. The fastest
possible FIQ latency is achieved when only one request is classified as FIQ because then
the FIQ service routine can simply start dealing with that device. But if more than one
request is assigned to the FIQ class, the FIQ service routine can read a word from the VIC
that identifies which FIQ source(s) is (are) requesting an interrupt.
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Vectored IRQs have the middle priority. Sixteen of the interrupt requests can be assigned
to this category. Any of the interrupt requests can be assigned to any of the 16 vectored
IRQ slots, among which slot 0 has the highest priority and slot 15 has the lowest.
The VIC combines the requests from all the vectored and non-vectored IRQs to produce
the IRQ signal to the ARM processor. The IRQ service routine can start by reading a
register from the VIC and jumping there. If any of the vectored IRQs are requesting, the
VIC provides the address of the highest-priority requesting IRQs service routine,
otherwise it provides the address of a default routine that is shared by all the non-vectored
IRQs. The default routine can read another VIC register to see what IRQs are active.
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6.7.1 Features
• Bit-level set and clear registers allow a single instruction set or clear of any number of
bits in one port.
• Direction control of individual bits.
• Separate control of output set and clear.
• All I/O default to inputs after reset.
6.7.2 Features added with the Fast GPIO set of registers available on
LPC2109/2119/2129/01 only
• Fast GPIO registers are relocated to the ARM local bus for the fastest possible I/O
timing, enabling port pin toggling up to 3.5 times faster than earlier LPC2000 devices.
• Mask registers allow treating sets of port bits as a group, leaving other bits
unchanged.
• All Fast GPIO registers are byte addressable.
• Entire port value can be written in one instruction.
• Ports are accessible via either the legacy group of registers (GPIOs) or the group of
registers providing accelerated port access (Fast GPIOs).
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6.8.1 Features
• Measurement range of 0 V to 3 V.
• Capable of performing more than 400000 10-bit samples per second.
• Burst conversion mode for single or multiple inputs.
• Optional conversion on transition on input pin or Timer Match signal.
6.9.1 Features
• Data rates up to 1 Mbit/s on each bus.
• 32-bit register and RAM access.
• Compatible with CAN specification 2.0 B, ISO 11898-1.
• Global Acceptance Filter recognizes 11-bit and 29-bit Rx identifiers for all CAN buses.
• Acceptance Filter can provide FullCAN-style automatic reception for selected
Standard identifiers.
6.10 UARTs
The LPC2109/2119/2129 each contain two UARTs. In addition to standard transmit and
receive data lines, the UART1 also provides a full modem control handshake interface.
6.10.1 Features
• 16 B Receive and Transmit FIFOs.
• Register locations conform to 16C550 industry standard.
• Receiver FIFO trigger points at 1 B, 4 B, 8 B, and 14 B.
• Built-in fractional baud rate generator covering wide range of baud rates without a
need for external crystals of particular values.
• Transmission FIFO control enables implementation of software (XON/XOFF) flow
control on both UARTs.
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• UART1 is equipped with standard modem interface signals. This module also
provides full support for hardware flow control (auto-CTS/RTS).
• Fractional baud rate generator enables standard baud rates such as 115200 Bd to be
achieved with any crystal frequency above 2 MHz.
• Auto-bauding.
• Auto-CTS/RTS flow-control fully implemented in hardware.
The I2C-bus implemented in LPC2109/2119/2129 supports a bit rate up to 400 kbit/s (Fast
I2C-bus).
6.11.1 Features
• Standard I2C-bus compliant interface.
• Easy to configure as Master, Slave, or Master/Slave.
• Programmable clocks allow versatile rate control.
• Bidirectional data transfer between masters and slaves.
• Multi-master bus (no central master).
• Arbitration between simultaneously transmitting masters without corruption of serial
data on the bus.
• Serial clock synchronization allows devices with different bit rates to communicate via
one serial bus.
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6.12.1 Features
• Compliant with Serial Peripheral Interface (SPI) specification.
• Synchronous, Serial, Full Duplex communication.
• Combined SPI master and slave.
• Maximum data bit rate of 1⁄8 of the input clock rate.
The SSP is a controller capable of operation on a SPI, 4-wire SSI, or Microwire bus. It can
interact with multiple masters and slaves on the bus. Only a single master and a single
slave can communicate on the bus during a given data transfer. Data transfers are in
principle full duplex, with frames of four to 16 bits of data flowing from the master to the
slave and from the slave to the master.
While the SSP and SPI1 peripherals share the same physical pins, it is not possible to
have both of these two peripherals active at the same time. Application can switch on the
fly from SPI1 to SSP and back.
6.13.1 Features
• Compatible with Motorola’s SPI, Texas Instrument’s 4-wire SSI, and National
Semiconductor’s Microwire buses.
• Synchronous serial communication.
• Master or slave operation.
• 8-frame FIFOs for both transmit and receive.
• Four to 16 bits per frame.
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to trap the timer value when an input signal transitions, optionally generating an interrupt.
Multiple pins can be selected to perform a single capture or match function, providing an
application with ‘or’ and ‘and’, as well as ‘broadcast’ functions among them.
6.14.1 Features
• A 32-bit Timer/Counter with a programmable 32-bit Prescaler.
• Timer or external event counter operation
• Four 32-bit capture channels per timer that can take a snapshot of the timer value
when an input signal transitions. A capture event may also optionally generate an
interrupt.
• Four 32-bit match registers that allow:
– Continuous operation with optional interrupt generation on match.
– Stop timer on match with optional interrupt generation.
– Reset timer on match with optional interrupt generation.
• Four external outputs per timer corresponding to match registers, with the following
capabilities:
– Set LOW on match.
– Set HIGH on match.
– Toggle on match.
– Do nothing on match.
• Timer can count cycles of either the peripheral clock (PCLK) or an externally supplied
clock.
• When counting cycles of an externally supplied clock, only one of the timer’s capture
inputs can be selected as the timer’s clock. The rate of such a clock is limited to
PCLK / 4. Duration of HIGH/LOW levels on the selected CAPn input cannot be
shorter than 1 / (2PCLK).
6.15.1 Features
• Internally resets chip if not periodically reloaded.
• Debug mode.
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6.16.1 Features
• Measures the passage of time to maintain a calendar and clock.
• Ultra low power design to support battery powered systems.
• Provides Seconds, Minutes, Hours, Day of Month, Month, Year, Day of Week, and
Day of Year.
• Programmable reference clock divider allows adjustment of the RTC to match various
crystal frequencies.
The ability to separately control rising and falling edge locations allows the PWM to be
used for more applications. For instance, multi-phase motor control typically requires
three non-overlapping PWM outputs with individual control of all three pulse widths and
positions.
Two match registers can be used to provide a single edge controlled PWM output. One
match register (MR0) controls the PWM cycle rate, by resetting the count upon match.
The other match register controls the PWM edge position. Additional single edge
controlled PWM outputs require only one match register each, since the repetition rate is
the same for all PWM outputs. Multiple single edge controlled PWM outputs will all have a
rising edge at the beginning of each PWM cycle, when an MR0 match occurs.
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Three match registers can be used to provide a PWM output with both edges controlled.
Again, the MR0 match register controls the PWM cycle rate. The other match registers
control the two PWM edge positions. Additional double edge controlled PWM outputs
require only two match registers each, since the repetition rate is the same for all PWM
outputs.
With double edge controlled PWM outputs, specific match registers control the rising and
falling edge of the output. This allows both positive going PWM pulses (when the rising
edge occurs prior to the falling edge), and negative going PWM pulses (when the falling
edge occurs prior to the rising edge).
6.17.1 Features
• Seven match registers allow up to six single edge controlled or three double edge
controlled PWM outputs, or a mix of both types.
• Supports single edge controlled and/or double edge controlled PWM outputs. Single
edge controlled PWM outputs all go HIGH at the beginning of each cycle unless the
output is a constant LOW. Double edge controlled PWM outputs can have either edge
occur at any position within a cycle. This allows for both positive going and negative
going pulses.
• Pulse period and width can be any number of timer counts. This allows complete
flexibility in the trade-off between resolution and repetition rate. All PWM outputs will
occur at the same repetition rate.
• Double edge controlled PWM outputs can be programmed to be either positive going
or negative going pulses.
• Match register updates are synchronized with pulse outputs to prevent generation of
erroneous pulses. Software must ‘release’ new match values before they can become
effective.
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6.18.2 PLL
The PLL accepts an input clock frequency in the range of 10 MHz to 25 MHz. The input
frequency is multiplied up into the range of 10 MHz to 60 MHz with a Current Controlled
Oscillator (CCO). The multiplier can be an integer value from 1 to 32 (in practice, the
multiplier value cannot be higher than 6 on this family of microcontrollers due to the upper
frequency limit of the CPU). The CCO operates in the range of 156 MHz to 320 MHz, so
there is an additional divider in the loop to keep the CCO within its frequency range while
the PLL is providing the desired output frequency. The output divider may be set to divide
by 2, 4, 8, or 16 to produce the output clock. Since the minimum output divider value is 2,
it is insured that the PLL output has a 50 % duty cycle. The PLL is turned off and
bypassed following a chip Reset and may be enabled by software. The program must
configure and activate the PLL, wait for the PLL to Lock, then connect to the PLL as a
clock source. The PLL settling time is 100 s.
When the internal Reset is removed, the processor begins executing at address 0, which
is the Reset vector. At that point, all of the processor and peripheral registers have been
initialized to predetermined values.
The wake-up timer ensures that the oscillator and other analog functions required for chip
operation are fully functional before the processor is allowed to execute instructions. This
is important at power on, all types of Reset, and whenever any of the aforementioned
functions are turned off for any reason. Since the oscillator and other functions are turned
off during Power-down mode, any wake-up of the processor from Power-down mode
makes use of the Wake-up Timer.
The Wake-up Timer monitors the crystal oscillator as the means of checking whether it is
safe to begin code execution. When power is applied to the chip, or some event caused
the chip to exit Power-down mode, some time is required for the oscillator to produce a
signal of sufficient amplitude to drive the clock logic. The amount of time depends on
many factors, including the rate of VDD ramp (in the case of power on), the type of crystal
and its electrical characteristics (if a quartz crystal is used), as well as any other external
circuitry (e.g. capacitors), and the characteristics of the oscillator itself under the existing
ambient conditions.
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CRP1 disables access to chip via the JTAG and allows partial flash update (excluding
flash sector 0) using a limited set of the ISP commands. This mode is useful when CRP is
required and flash field updates are needed but all sectors can not be erased.
CRP2 disables access to chip via the JTAG and only allows full flash erase and update
using a reduced set of the ISP commands.
Running an application with level CRP3 selected fully disables any access to chip via the
JTAG pins and the ISP. This mode effectively disables ISP override using P0[14] pin, too.
It is up to the user’s application to provide (if needed) flash update mechanism using IAP
calls or call reinvoke ISP command to enable flash update via UART0.
CAUTION
If level three Code Read Protection (CRP3) is selected, no future factory testing can be
performed on the device.
Remark: Devices without the suffix /00 or /01 have only a security level equivalent to
CRP2 available.
In Power-down mode, the oscillator is shut down and the chip receives no internal clocks.
The processor state and registers, peripheral registers, and internal SRAM values are
preserved throughout Power-down mode and the logic levels of chip output pins remain
static. The Power-down mode can be terminated and normal operation resumed by either
a Reset or certain specific interrupts that are able to function without clocks. Since all
dynamic operation of the chip is suspended, Power-down mode reduces chip power
consumption to nearly zero.
A Power Control for Peripherals feature allows individual peripherals to be turned off if
they are not needed in the application, resulting in additional power savings.
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6.18.8 APB
The APB divider determines the relationship between the processor clock (CCLK) and the
clock used by peripheral devices (PCLK). The APB divider serves two purposes. The first
is to provide peripherals with the desired PCLK via APB so that they can operate at the
speed chosen for the ARM processor. In order to achieve this, the APB may be slowed
down to 1⁄2 to 1⁄4 of the processor clock rate. Because the APB must work properly at
power-up (and its timing cannot be altered if it does not work since the APB divider control
registers reside on the APB), the default condition at reset is for the APB to run at 1⁄4 of the
processor clock rate. The second purpose of the APB divider is to allow power savings
when an application does not require any peripherals to run at the full processor rate.
Because the APB divider is connected to the PLL output, the PLL remains active (if it was
running) during Idle mode.
6.19.1 EmbeddedICE
Standard ARM EmbeddedICE logic provides on-chip debug support. The debugging of
the target system requires a host computer running the debugger software and an
EmbeddedICE protocol convertor. EmbeddedICE protocol convertor converts the Remote
Debug Protocol commands to the JTAG data needed to access the ARM core.
The ARM core has a Debug Communication Channel function built-in. The debug
communication channel allows a program running on the target to communicate with the
host debugger or another separate host without stopping the program flow or even
entering the debug state. The debug communication channel is accessed as a
co-processor 14 by the program running on the ARM7TDMI-S core. The debug
communication channel allows the JTAG port to be used for sending and receiving data
without affecting the normal program flow. The debug communication channel data and
control registers are mapped in to addresses in the EmbeddedICE logic.
The JTAG clock (TCK) must be slower than 1⁄6 of the CPU clock (CCLK) for the JTAG
interface to operate.
The ETM is connected directly to the ARM core and not to the main AMBA system bus. It
compresses the trace information and exports it through a narrow trace port. An external
trace port analyzer must capture the trace information under software debugger control.
Instruction trace (or PC trace) shows the flow of execution of the processor and provides a
list of all the instructions that were executed. Instruction trace is significantly compressed
by only broadcasting branch addresses as well as a set of status signals that indicate the
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pipeline status on a cycle by cycle basis. Trace information generation can be controlled
by selecting the trigger resource. Trigger resources include address comparators,
counters and sequencers. Since trace information is compressed the software debugger
requires a static image of the code being executed. Self-modifying code can not be traced
because of this restriction.
6.19.3 RealMonitor
RealMonitor is a configurable software module, developed by ARM Inc., which enables
real time debug. It is a lightweight debug monitor that runs in the background while users
debug their foreground application. It communicates with the host using the DCC (Debug
Communications Channel), which is present in the EmbeddedICE logic. The
LPC2109/2119/2129 contain a specific configuration of RealMonitor software
programmed into the on-chip flash memory.
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7. Limiting values
Table 5. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).[1]
Symbol Parameter Conditions Min Max Unit
VDD(1V8) supply voltage (1.8 V) [2] 0.5 +2.5 V
VDD(3V3) supply voltage (3.3 V) [3] 0.5 +3.6 V
VDDA(3V3) analog supply voltage (3.3 V) 0.5 +4.6 V
VIA analog input voltage 0.5 +5.1 V
VI input voltage 5 V tolerant I/O pins [4][5] 0.5 +6.0 V
other I/O pins [4][6] 0.5 VDD(3V3) + 0.5 V
IDD supply current [7][8] - 100 mA
ISS ground current [8][9] - 100 mA
Tj junction temperature - 150 C
Tstg storage temperature [10] 65 +150 C
Ptot(pack) total power dissipation (per based on package heat - 1.5 W
package) transfer, not device
power consumption
Vesd electrostatic discharge voltage human body model; all [11] 2000 +2000 V
pins
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8. Static characteristics
Table 6. Static characteristics
Tamb = 40 C to +85 C for industrial applications, unless otherwise specified.
Symbol Parameter Conditions Min Typ[1] Max Unit
VDD(1V8) supply voltage (1.8 V) [2] 1.65 1.8 1.95 V
VDD(3V3) supply voltage (3.3 V) [3] 3.0 3.3 3.6 V
VDDA(3V3) analog supply voltage 2.5 3.3 3.6 V
(3.3 V)
Standard port pins, RESET, RTCK
IIL LOW-level input current VI = 0 V; no pull-up - - 3 A
IIH HIGH-level input current VI = VDD(3V3); no pull-down - - 3 A
IOZ OFF-state output current VO = 0 V; VO = VDD(3V3); - - 3 A
no pull-up/down
Ilatch I/O latch-up current (0.5VDD(3V3)) < VI < 100 - - mA
(1.5VDD(3V3)); Tj < 125 C
VI input voltage [4][5][6] 0 - 5.5 V
VO output voltage output active 0 - VDD(3V3) V
VIH HIGH-level input voltage 2.0 - - V
VIL LOW-level input voltage - - 0.8 V
Vhys hysteresis voltage 0.4 - - V
VOH HIGH-level output voltage IOH = 4 mA [7] VDD(3V3) 0.4 - - V
VOL LOW-level output voltage IOL = 4 mA [7] - - 0.4 V
IOH HIGH-level output current VOH = VDD(3V3) 0.4 V [7] 4 - - mA
IOL LOW-level output current VOL = 0.4 V [7] 4 - - mA
IOHS HIGH-level short-circuit VOH = 0 V [8] - - 45 mA
output current
IOLS LOW-level short-circuit VOL = VDD(3V3) [8] - - 50 mA
output current
Ipd pull-down current VI = 5 V [9] 10 50 150 A
Ipu pull-up current VI = 0 V [10] 15 50 85 A
VDD(3V3) < VI < 5 V [9] 0 0 0 A
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[1] Typical ratings are not guaranteed. The values listed are at room temperature (25 C), nominal supply voltages.
[2] Internal rail.
[3] External rail.
[4] Including voltage on outputs in 3-state mode.
[5] VDD(3V3) supply voltages must be present.
[6] 3-state outputs go into 3-state mode when VDD(3V3) is grounded.
[7] Accounts for 100 mV voltage drop in all supply lines.
[8] Only allowed for a short time period.
[9] Minimum condition for VI = 4.5 V, maximum condition for VI = 5.5 V.
[10] Applies to P1[25:16].
[11] See LPC2119/2129/2194/2292/2294 User Manual.
[12] To VSS.
LPC2109_2119_2129 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
LPC2109_2119_2129 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
offset gain
error error
EO EG
1023
1022
1021
1020
1019
1018
(2)
7
code (1)
out
6
(5)
4
(4)
3
(3)
2
1 1 LSB
(ideal)
0
1 2 3 4 5 6 7 1018 1019 1020 1021 1022 1023 1024
VIA (LSBideal)
VDDA − VSSA
offset 1 LSB =
error 1024
EO 002aaa668
LPC2109_2119_2129 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
002aad127
45
IDD(act)
(mA)
35
15
5
12 20 28 36 44 52 60
frequency (MHz)
Test conditions: Active mode entered executing code from on-chip flash; PCLK = CCLK⁄4;
Tamb = 25 C; core voltage 1.8 V.
Fig 5. Typical LPC2109/01 IDD(act) measured at different frequencies
002aad128
45
60 MHz
IDD(act)
(mA)
35 48 MHz
25
15
12 MHz
5
1.65 1.70 1.75 1.80 1.85 1.90 1.95
voltage (V)
Test conditions: Active mode entered executing code from on-chip flash; PCLK = CCLK⁄4;
Tamb = 25 C; core voltage 1.8 V; all peripherals enabled.
Fig 6. Typical LPC2109/01 IDD(act) measured at different voltages
LPC2109_2119_2129 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
002aad129
10
IDD(idle)
(mA)
8
0
12 20 28 36 44 52 60
frequency (MHz)
Test conditions: Idle mode entered executing code from on-chip flash; PCLK = CCLK⁄4;
Tamb = 25 C; core voltage 1.8 V.
Fig 7. Typical LPC2109/01 IDD(idle) measured at different frequencies
002aad130
10
IDD(idle)
(mA)
60 MHz
7.5
48 MHz
5.0
2.5 12 MHz
0
1.65 1.70 1.75 1.80 1.85 1.90 1.95
voltage (V)
Test conditions: Idle mode entered executing code from on-chip flash; PCLK = CCLK⁄4;
Tamb = 25 C; core voltage 1.8 V; all peripherals enabled.
Fig 8. Typical LPC2109/01 IDD(idle) measured at different voltages
LPC2109_2119_2129 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
002aad131
45
IDD(act)
(mA)
35
15
5
12 20 28 36 44 52 60
frequency (MHz)
Test conditions: Active mode entered executing code from on-chip flash; PCLK = CCLK⁄4;
Tamb = 25 C; core voltage 1.8 V.
Fig 9. Typical LPC2119/01 and LPC2129/01 IDD(act) measured at different frequencies
002aad132
50
IDD(act)
(mA) 60 MHz
40
48 MHz
30
20
12 MHz
10
0
1.65 1.70 1.75 1.80 1.85 1.90 1.95
voltage (V)
Test conditions: Active mode entered executing code from on-chip flash; PCLK = CCLK⁄4;
Tamb = 25 C; core voltage 1.8 V; all peripherals enabled.
Fig 10. Typical LPC2119/01 and LPC2129/01 IDD(act) measured at different voltages
LPC2109_2119_2129 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
002aad133
10
IDD(idle)
(mA)
8
0
12 20 28 36 44 52 60
frequency (MHz)
Test conditions: Idle mode entered executing code from on-chip flash; PCLK = CCLK⁄4;
Tamb = 25 C; core voltage 1.8 V.
Fig 11. Typical LPC2119/01 and LPC2129/01 IDD(idle) measured at different frequencies
002aad134
10
IDD(idle) 60 MHz
(mA)
8
48 MHz
12 MHz
2
0
1.65 1.70 1.75 1.80 1.85 1.90 1.95
voltage (V)
Test conditions: Idle mode entered executing code from on-chip flash; PCLK = CCLK⁄4;
Tamb = 25 C; core voltage 1.8 V; all peripherals enabled.
Fig 12. Typical LPC2119/01 and LPC2129/01 IDD(idle) measured at different voltages
LPC2109_2119_2129 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
002aad135
45
IDD(act) 60 MHz
(mA)
35
48 MHz
25
15
12 MHz
5
1.65 1.70 1.75 1.80 1.85 1.90 1.95
voltage (V)
Test conditions: Active mode entered executing code from on-chip flash; PCLK = CCLK⁄4;
Temp = 25 C; core voltage 1.8 V; all peripherals disabled.
Fig 13. Typical LPC2109/01, LPC2119/01, and LPC2129/01 IDD(act) measured at different voltages
002aad136
8
IDD(idle)
(mA)
6 60 MHz
48 MHz
2 12 MHz
0
1.65 1.70 1.75 1.80 1.85 1.90 1.95
voltage (V)
Test conditions: Idle mode entered executing code from on-chip flash; PCLK = CCLK⁄4;
Temp = 25 C; core voltage 1.8 V; all peripherals disabled.
Fig 14. Typical LPC2109/01, LPC2119/01, and LPC2129/01 IDD(idle) measured at different voltages
LPC2109_2119_2129 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
002aad137
45
IDD(act) 60 MHz
(mA)
35
48 MHz
25
15
12 MHz
5
−40 −15 10 35 60 85
temperature (°C)
Test conditions: Active mode entered executing code from on-chip flash; PCLK = CCLK⁄4;
core voltage 1.8 V; all peripherals disabled.
Fig 15. Typical LPC2109/01, LPC2119/01, and LPC2129/01 IDD(act) measured at different temperatures
002aad138
6
60 MHz
IDD(idle)
(mA)
5
48 MHz
2
12 MHz
1
−40 −15 10 35 60 85
temperature (°C)
Test conditions: Idle mode entered executing code from on-chip flash; PCLK = CCLK⁄4;
core voltage 1.8 V; all peripherals disabled.
Fig 16. Typical LPC2109/01, LPC2119/01, and LPC2129/01 IDD(idle) measured at different temperatures
LPC2109_2119_2129 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
002aad139
200
IDD(pd)
(μA) 1.95 V
160 1.8 V
1.65 V
120
80
40
0
−40 −15 10 35 60 85
temperature (°C)
Test conditions: Power-down mode entered executing code from on-chip flash.
Fig 17. Typical LPC2109/01, LPC2119/01, and LPC2129/01 core power-down current IDD(pd) measured at different
temperatures
LPC2109_2119_2129 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
LPC2109_2119_2129 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
9. Dynamic characteristics
Table 10. Dynamic characteristics
Tamb = 40 C to +85 C for industrial applications; VDD(1V8), VDD(3V3) over specified ranges.[1]
Symbol Parameter Conditions Min Typ Max Unit
External clock
fosc oscillator frequency supplied by an external 1 - 50 MHz
oscillator (signal generator)
external clock frequency 1 - 30 MHz
supplied by an external
crystal oscillator
external clock frequency if 10 - 25 MHz
on-chip PLL is used
external clock frequency if 10 - 25 MHz
on-chip bootloader is used
for initial code download
Tcy(clk) clock cycle time 20 - 1000 ns
tCHCX clock HIGH time Tcy(clk) 0.4 - - ns
tCLCX clock LOW time Tcy(clk) 0.4 - - ns
tCLCH clock rise time - - 5 ns
tCHCL clock fall time - - 5 ns
Port pins (except P0[2] and P0[3])
tr rise time - 10 - ns
tf fall time - 10 - ns
I2C-bus pins (P0[2] and P0[3])
tf fall time VIH to VIL [2] 20 + 0.1 Cb - - ns
[1] Parameters are valid over operating temperature range unless otherwise specified.
[2] Bus capacitance Cb in pF, from 10 pF to 400 pF.
LPC2109_2119_2129 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
9.1 Timing
tCHCX
tCHCL tCLCX tCLCH
Tcy(clk)
002aaa907
Fig 18. External clock timing (with an amplitude of at least Vi(RMS) = 200 mV)
LPC2109_2119_2129 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
LQFP64: plastic low profile quad flat package; 64 leads; body 10 x 10 x 1.4 mm SOT314-2
c
y
48 33
49 32 ZE
e
E HE A
A2
(A 3)
A1
wM
θ
bp Lp
pin 1 index L
64 17
1 16 detail X
ZD v M A
e wM
bp
D B
HD v M B
0 2.5 5 mm
scale
mm 1.6 0.20 1.45 0.27 0.18 10.1 10.1 12.15 12.15 0.75 1.45 1.45 7o
0.25 0.5 1 0.2 0.12 0.1 o
0.05 1.35 0.17 0.12 9.9 9.9 11.85 11.85 0.45 1.05 1.05 0
Note
1. Plastic or metal protrusions of 0.25 mm maximum per side are not included.
00-01-19
SOT314-2 136E10 MS-026
03-02-25
11. Abbreviations
Table 11. Abbreviations
Acronym Description
ADC Analog-to-Digital Converter
AMBA Advanced Microcontroller Bus Architecture
APB Advanced Peripheral Bus
CAN Controller Area Network
CPU Central Processing Unit
DCC Debug Communications Channel
FIFO First In, First Out
GPIO General Purpose Input/Output
I/O Input/Output
PLL Phase-Locked Loop
PWM Pulse Width Modulator
RAM Random Access Memory
SPI Serial Peripheral Interface
SRAM Static Random Access Memory
SSI Synchronous Serial Interface
SSP Synchronous Serial Port
TTL Transistor-Transistor Logic
UART Universal Asynchronous Receiver/Transmitter
LPC2109_2119_2129 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
LPC2109_2119_2129 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
[1] Please consult the most recently issued document before initiating or completing a design.
[2] The term ‘short data sheet’ is explained in section “Definitions”.
[3] The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
Limited warranty and liability — Information in this document is believed to Limiting values — Stress above one or more limiting values (as defined in
be accurate and reliable. However, NXP Semiconductors does not give any the Absolute Maximum Ratings System of IEC 60134) will cause permanent
representations or warranties, expressed or implied, as to the accuracy or damage to the device. Limiting values are stress ratings only and (proper)
completeness of such information and shall have no liability for the operation of the device at these or any other conditions above those given in
consequences of use of such information. the Recommended operating conditions section (if present) or the
Characteristics sections of this document is not warranted. Constant or
In no event shall NXP Semiconductors be liable for any indirect, incidental,
repeated exposure to limiting values will permanently and irreversibly affect
punitive, special or consequential damages (including - without limitation - lost
the quality and reliability of the device.
profits, lost savings, business interruption, costs related to the removal or
replacement of any products or rework charges) whether or not such Terms and conditions of commercial sale — NXP Semiconductors
damages are based on tort (including negligence), warranty, breach of products are sold subject to the general terms and conditions of commercial
contract or any other legal theory. sale, as published at http://www.nxp.com/profile/terms, unless otherwise
Notwithstanding any damages that customer might incur for any reason agreed in a valid written individual agreement. In case an individual
whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards agreement is concluded only the terms and conditions of the respective
customer for the products described herein shall be limited in accordance agreement shall apply. NXP Semiconductors hereby expressly objects to
with the Terms and conditions of commercial sale of NXP Semiconductors. applying the customer’s general terms and conditions with regard to the
purchase of NXP Semiconductors products by customer.
Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without No offer to sell or license — Nothing in this document may be interpreted or
limitation specifications and product descriptions, at any time and without construed as an offer to sell products that is open for acceptance or the grant,
notice. This document supersedes and replaces all information supplied prior conveyance or implication of any license under any copyrights, patents or
to the publication hereof. other industrial or intellectual property rights.
Suitability for use — NXP Semiconductors products are not designed, Export control — This document as well as the item(s) described herein
authorized or warranted to be suitable for use in life support, life-critical or may be subject to export control regulations. Export might require a prior
safety-critical systems or equipment, nor in applications where failure or authorization from national authorities.
LPC2109_2119_2129 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Non-automotive qualified products — Unless this data sheet expressly own risk, and (c) customer fully indemnifies NXP Semiconductors for any
states that this specific NXP Semiconductors product is automotive qualified, liability, damages or failed product claims resulting from customer design and
the product is not suitable for automotive use. It is neither qualified nor tested use of the product for automotive applications beyond NXP Semiconductors’
in accordance with automotive testing or application requirements. NXP standard warranty and NXP Semiconductors’ product specifications.
Semiconductors accepts no liability for inclusion and/or use of
non-automotive qualified products in automotive equipment or applications.
In the event that customer uses the product for design-in and use in 13.4 Trademarks
automotive applications to automotive specifications and standards, customer
Notice: All referenced brands, product names, service names and trademarks
(a) shall use the product without NXP Semiconductors’ warranty of the
are the property of their respective owners.
product for such automotive applications, use and specifications, and (b)
whenever customer uses the product for automotive applications beyond I2C-bus — logo is a trademark of NXP B.V.
NXP Semiconductors’ specifications such use shall be solely at customer’s
LPC2109_2119_2129 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
15. Contents
1 General description . . . . . . . . . . . . . . . . . . . . . . 1 6.15 Watchdog timer . . . . . . . . . . . . . . . . . . . . . . . 18
2 Features and benefits . . . . . . . . . . . . . . . . . . . . 1 6.15.1 Features. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
2.1 Key features brought by 6.16 Real-time clock . . . . . . . . . . . . . . . . . . . . . . . 19
LPC2109/2119/2129/01 devices. . . . . . . . . . . . 1 6.16.1 Features. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
2.2 Key features common for all devices . . . . . . . . 1 6.17 Pulse width modulator . . . . . . . . . . . . . . . . . . 19
6.17.1 Features. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
3 Ordering information . . . . . . . . . . . . . . . . . . . . . 2
6.18 System control . . . . . . . . . . . . . . . . . . . . . . . . 20
3.1 Ordering options . . . . . . . . . . . . . . . . . . . . . . . . 3
6.18.1 Crystal oscillator. . . . . . . . . . . . . . . . . . . . . . . 20
4 Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . 4 6.18.2 PLL. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
5 Pinning information . . . . . . . . . . . . . . . . . . . . . . 5 6.18.3 Reset and wake-up timer . . . . . . . . . . . . . . . . 21
5.1 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 6.18.4 Code security (Code Read Protection - CRP) 21
5.2 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 6 6.18.5 External interrupt inputs . . . . . . . . . . . . . . . . . 22
6 Functional description . . . . . . . . . . . . . . . . . . 10 6.18.6 Memory mapping control . . . . . . . . . . . . . . . . 22
6.1 Architectural overview . . . . . . . . . . . . . . . . . . 10 6.18.7 Power control . . . . . . . . . . . . . . . . . . . . . . . . . 22
6.2 On-chip flash program memory . . . . . . . . . . . 10 6.18.8 APB . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
6.3 On-chip SRAM . . . . . . . . . . . . . . . . . . . . . . . . 11 6.19 Emulation and debugging . . . . . . . . . . . . . . . 23
6.4 Memory map. . . . . . . . . . . . . . . . . . . . . . . . . . 11 6.19.1 EmbeddedICE . . . . . . . . . . . . . . . . . . . . . . . . 23
6.5 Interrupt controller . . . . . . . . . . . . . . . . . . . . . 12 6.19.2 Embedded trace macrocell . . . . . . . . . . . . . . 23
6.5.1 Interrupt sources. . . . . . . . . . . . . . . . . . . . . . . 13 6.19.3 RealMonitor . . . . . . . . . . . . . . . . . . . . . . . . . . 24
6.6 Pin connect block . . . . . . . . . . . . . . . . . . . . . . 14 7 Limiting values . . . . . . . . . . . . . . . . . . . . . . . . 25
6.7 General purpose parallel I/O (GPIO) and 8 Static characteristics . . . . . . . . . . . . . . . . . . . 26
Fast I/O . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 8.1 Power consumption measurements for
6.7.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 LPC2109/01, LPC2119/01, LPC2129/01
6.7.2 Features added with the Fast GPIO set of devices. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
registers available on 9 Dynamic characteristics. . . . . . . . . . . . . . . . . 39
LPC2109/2119/2129/01 only . . . . . . . . . . . . . 14
9.1 Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
6.8 10-bit ADC . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
6.8.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 10 Package outline. . . . . . . . . . . . . . . . . . . . . . . . 41
6.8.2 ADC features available in 11 Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . 42
LPC2109/2119/2129/01 only . . . . . . . . . . . . . 15 12 Revision history . . . . . . . . . . . . . . . . . . . . . . . 43
6.9 CAN controllers and acceptance filter . . . . . . 15 13 Legal information . . . . . . . . . . . . . . . . . . . . . . 44
6.9.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 13.1 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 44
6.10 UARTs. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 13.2 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
6.10.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 13.3 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . 44
6.10.2 UART features available in 13.4 Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . . 45
LPC2109/2119/2129/01 only . . . . . . . . . . . . . 16
14 Contact information . . . . . . . . . . . . . . . . . . . . 45
6.11 I2C-bus serial I/O controller . . . . . . . . . . . . . . 16
6.11.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 15 Contents. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
6.12 SPI serial I/O controller. . . . . . . . . . . . . . . . . . 17
6.12.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
6.12.2 Features available in LPC2109/2119/2129/01
only . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
6.13 SSP controller (LPC2109/2119/2129/01 only) 17
6.13.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
6.14 General purpose timers . . . . . . . . . . . . . . . . . 17
6.14.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
6.14.2 Features available in LPC2109/2119/2129/01
only . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.