SEM06 L04_F60

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Test Object - Device Settings
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Substation/Bay:
Substation: SEM-06 Substation address: MINA
Bay: L-04 Bay address: SEM-06
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Device:
Name/description: UR-F60 Manufacturer: GENERAL ELECTRIC
Device type: RELE DE PROTECCION Device address: SEM-06
Serial/model number:
Additional info 1:
Additional info 2:

Hardware Configuration
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Test Equipment
Type Serial Number
CMC256plus RJ811T
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Hardware Check
Performed At Result Details
16/09/2023 12:26:34 Passed
p.m.

QuickCMC:
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Test Module
Name: OMICRON QuickCMC Version: 4.31
Test Start: 16-sep-2023 13:31:43 Test End:
User Name: Manager:
Company:

Test Results
Summary
0 tests passed, 0 tests failed, 0 tests not assessed
No results available!

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 SEM06 L04_F60

Test Settings
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General
No. of ramp states: 1
Total steps per test: 41
Total time per test: 10.250 s
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L1, L2, L3 / Magnitude
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Ramp States
Ramp Ramp 1
I L1 40.00 mA
0.00 °
60.000 Hz
I L2 40.00 mA
-120.00 °
60.000 Hz
I L3 40.00 mA
120.00 °
60.000 Hz
Force abs. Phases Yes
Sig 1 From 40.00 mA
Sig 1 To 80.00 mA
Sig 1 Delta 1.000 mA
Sig 1 d/dt 4.000 mA/s
Sal. bin 1 0
Sal. bin 2 0
Sal. bin 3 0
Sal. bin 4 0
dt per Step 250.0 ms
Ramp Steps 41
Ramp Time 10.250s
Trigger Bin
Trigger Logic OR
TRIP 1
Entr.bi. 2 X
Entr.bi. 3 X
Entr.bi. 4 X
Entr.bi. 5 X
Entr.bi. 6 X
Entr.bi. 7 X
Entr.bi. 8 X
Entr.bi. 9 X
Entr.bi. 10 X
Step back No
Delay Time 0.000 s

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Test Module
Name: OMICRON Ramping Version: 4.31

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 SEM06 L04_F60
Test Start: 16-sep-2023 13:15:36 Test End: 16-sep-2023 13:15:45
User Name: Julio Flores Manager:
Company: MMG

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Arranque 51P Ramp 1 TRIP 0->1 I L1, L2, 65.00 mA 65.00 mA 130.0 mA 130.0 mA 0.000 A + 86.90 ms
RST L3
Assess: + .. Passed x .. Failed o .. Not assessed

Assessment Statistics
Name Ramp Condition Sig Nom. Act.Av. min max Std. Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed

Calculation Results
Name/ Exec. Calc. X Y Nom. Act. Tol.- Tol.+ Dev. Assess
Reposición/Arr X/Y Arranque 51P Arranque 51P 1.000 1.000 0.05000 0.05000 0.000 +
anque RST RST
Assess: + .. Passed x .. Failed o .. Not assessed

Calculation Statistics
Name Calc. X Y Nom. Act.Av. min max Std. Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed

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 SEM06 L04_F60

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Cursor Data
Time Signal Value
Cursor 1 0.000 s <none> n/a
Cursor 2 6.337 s <none> n/a
C2 - C1 6.337 s n/a

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Test State:
Test passed

Test Settings
.
General
No. of ramp states: 1
Total steps per test: 41
Total time per test: 10.250 s
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L1, L2, L3 / Magnitude
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Ramp States
Ramp Ramp 1
I L1 230.0 mA
0.00 °
60.000 Hz
I L2 230.0 mA
-120.00 °
60.000 Hz
I L3 230.0 mA

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 SEM06 L04_F60
120.00 °
60.000 Hz
Force abs. Phases Yes
Sig 1 From 230.0 mA
Sig 1 To 270.0 mA
Sig 1 Delta 1.000 mA
Sig 1 d/dt 4.000 mA/s
Sal. bin 1 0
Sal. bin 2 0
Sal. bin 3 0
Sal. bin 4 0
dt per Step 250.0 ms
Ramp Steps 41
Ramp Time 10.250s
Trigger Bin
Trigger Logic OR
TRIP 1
Entr.bi. 2 X
Entr.bi. 3 X
Entr.bi. 4 X
Entr.bi. 5 X
Entr.bi. 6 X
Entr.bi. 7 X
Entr.bi. 8 X
Entr.bi. 9 X
Entr.bi. 10 X
Step back No
Delay Time 0.000 s

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Test Module
Name: OMICRON Ramping Version: 4.31
Test Start: 16-sep-2023 13:20:07 Test End: 16-sep-2023 13:20:15
User Name: Julio Flores Manager:
Company: MMG

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Arranque 50P Ramp 1 TRIP 0->1 I L1, L2, 250.0 mA 251.0 mA 130.0 mA 130.0 mA 1.000 mA + 23.90 ms
RST L3
Assess: + .. Passed x .. Failed o .. Not assessed

Assessment Statistics
Name Ramp Condition Sig Nom. Act.Av. min max Std. Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed

Calculation Results
Name/ Exec. Calc. X Y Nom. Act. Tol.- Tol.+ Dev. Assess
Reposición/Arr X/Y Arranque 50P Arranque 50P 1.000 1.000 0.05000 0.05000 0.000 +
anque RST RST
Assess: + .. Passed x .. Failed o .. Not assessed

Calculation Statistics
Name Calc. X Y Nom. Act.Av. min max Std. Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed

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 SEM06 L04_F60

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Cursor Data
Time Signal Value
Cursor 1 0.000 s <none> n/a
Cursor 2 5.274 s <none> n/a
C2 - C1 5.274 s n/a

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Test State:
Test passed

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 SEM06 L04_F60

GRP1 50/51P Curva Operación:

Test Object - Overcurrent Parameters
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General - Values:
TimeTolAbs: 0.04 s VT connection: n/a
TimeTolRel: 5.00 % CT starpoint connection: n/a
CurrentTolAbs: 0.05 Iref
CurrentTolRel: 5.00 %
Directional: No

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Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes GRP1 51P IEEE EI 0.07 Iref 0.37 1.00 Non Directional
Yes GRP1 50P CEI Tiempo definido 0.25 Iref 0.05 s 1.00 Non Directional
No GRP1 51G CEI Tiempo definido 0.50 Iref 0.10 s 1.00 Non Directional

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Test Module
Name: OMICRON Overcurrent Version: 4.31
Test Start: 16-sep-2023 13:21:25 Test End: 16-sep-2023 13:23:56
User Name: Julio Flores Manager:
Company: MMG

Test Settings:
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Fault Model:
Time reference: Fault inception
Load current: 0.000 A
Load angle: n/a
Prefault time: 100.0 ms
Abs. max time: 240.0 s
Post fault time: 500.0 ms
Rel. max time: 100.0 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): n/a
Fault voltage LL (for two phase faults): n/a
Decaying DC active: No
Time constant: n/a
CB char min time: 50.00 ms
Thermal reset active: No
Thermal reset method: n/a
Thermal reset message: n/a

Binary Inputs:
Trigger Logic: And
Name Trigger State
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 SEM06 L04_F60
TRIP 1
Entr.bi. 2 X
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Shot Test Results:
Type Relative To Factor Magnitude Angle tnom tact Deviation Overload Result
L1-L2-L3 GRP1 51P 1.821 118.3 mA n/a 4.552 s 4.627 s 1.653 % No Passed
L1-L2-L3 GRP1 51P 1.495 97.17 mA n/a 8.496 s 8.663 s 1.965 % No Passed
L1-L2-L3 GRP1 51P 1.241 80.67 mA n/a 19.36 s 20.53 s 6.070 % No Passed
L1-L2-L3 GRP1 51P 2.181 141.8 mA n/a 2.823 s 2.871 s 1.717 % No Passed
L1-L2-L3 GRP1 51P 3.027 196.7 mA n/a 1.324 s 1.355 s 2.330 % No Passed
L1-L2-L3 GRP1 50P 4.379 1.095 A n/a 50.00 ms 65.40 ms 30.80 % No Passed
L1-L2-L3 GRP1 50P 6.145 1.536 A n/a 50.00 ms 64.70 ms 29.40 % No Passed
L1-L2-L3 GRP1 50P 8.067 2.017 A n/a 50.00 ms 64.50 ms 29.00 % No Passed
L1-L2-L3 GRP1 50P 10.10 2.525 A n/a 50.00 ms 64.30 ms 28.60 % No Passed
L1-L2-L3 GRP1 50P 10.10 2.525 A n/a 50.00 ms 65.20 ms 30.40 % No Passed
L1-L2 GRP1 51P 1.241 80.67 mA n/a 19.36 s 20.48 s 5.790 % No Passed
L1-L2 GRP1 51P 1.620 105.3 mA n/a 6.465 s 6.579 s 1.769 % No Passed
L1-L2 GRP1 51P 2.080 135.2 mA n/a 3.180 s 3.233 s 1.656 % No Passed
L1-L2 GRP1 51P 3.086 200.6 mA n/a 1.269 s 1.307 s 2.996 % No Passed
L1-L2 GRP1 50P 4.527 1.132 A n/a 50.00 ms 67.90 ms 35.80 % No Passed
L1-L2 GRP1 50P 6.735 1.684 A n/a 50.00 ms 66.30 ms 32.60 % No Passed
L1-L2 GRP1 50P 8.915 2.229 A n/a 50.00 ms 64.90 ms 29.80 % No Passed
L1-L2 GRP1 50P 10.44 2.611 A n/a 50.00 ms 65.80 ms 31.60 % No Passed
L1-L2 GRP1 50P 10.44 2.611 A n/a 50.00 ms 65.40 ms 30.80 % No Passed
L2-L3 GRP1 51P 1.273 82.71 mA n/a 16.89 s 17.87 s 5.746 % No Passed
L2-L3 GRP1 51P 1.598 103.9 mA n/a 6.762 s 6.864 s 1.507 % No Passed
L2-L3 GRP1 51P 2.267 147.4 mA n/a 2.565 s 2.611 s 1.812 % No Passed
L2-L3 GRP1 51P 3.439 223.5 mA n/a 1.009 s 1.040 s 3.089 % No Passed
L2-L3 GRP1 50P 5.333 1.333 A n/a 50.00 ms 66.70 ms 33.40 % No Passed
L2-L3 GRP1 50P 8.022 2.006 A n/a 50.00 ms 65.30 ms 30.60 % No Passed
L2-L3 GRP1 50P 10.19 2.547 A n/a 50.00 ms 65.60 ms 31.20 % No Passed
L3-L1 GRP1 51P 1.290 83.87 mA n/a 15.74 s 16.39 s 4.138 % No Passed
L3-L1 GRP1 51P 1.811 117.7 mA n/a 4.625 s 4.685 s 1.306 % No Passed
L3-L1 GRP1 51P 2.911 189.2 mA n/a 1.441 s 1.478 s 2.590 % No Passed
L3-L1 GRP1 50P 5.017 1.254 A n/a 50.00 ms 66.20 ms 32.40 % No Passed
L3-L1 GRP1 50P 7.978 1.994 A n/a 50.00 ms 66.50 ms 33.00 % No Passed
L3-L1 GRP1 50P 9.477 2.369 A n/a 50.00 ms 65.00 ms 30.00 % No Passed
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Charts for Fault
Types:
Type Angle
L1-L2-L3 n/a
10000.000
1000.000
100.000
10.000
t/s

1.000
0.100
0.010

0.02 0.05 0.10 0.20 0.50 1.00 2.00 5.00 10.00

I/A

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Charts for Fault

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 SEM06 L04_F60
Types:
Type Angle
L1-L2 n/a
10000.000
1000.000
100.000
10.000
t/s

1.000
0.100
0.010

0.02 0.05 0.10 0.20 0.50 1.00 2.00 5.00 10.00

I/A

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Charts for Fault
Types:
Type Angle
L2-L3 n/a
10000.000
1000.000
100.000
10.000
t/s

1.000
0.100
0.010

0.02 0.05 0.10 0.20 0.50 1.00 2.00 5.00 10.00

I/A

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Charts for Fault
Types:
Type Angle
L3-L1 n/a
10000.000
1000.000
100.000
10.000
t/s

1.000
0.100
0.010

0.02 0.05 0.10 0.20 0.50 1.00 2.00 5.00 10.00

I/A

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 SEM06 L04_F60
Test State:
32 out of 32 points tested.
32 points passed.
0 points failed.

Test passed

Test Settings
.
General
No. of ramp states: 1
Total steps per test: 21
Total time per test: 4.200 s
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L1 / Magnitude
.
Ramp States
Ramp Ramp 1
I L1 10.00 mA
0.00 °
60.000 Hz
I L2 0.000 A
-120.00 °
60.000 Hz
I L3 0.000 A
120.00 °
60.000 Hz
Force abs. Phases No
Sig 1 From 10.00 mA
Sig 1 To 30.00 mA
Sig 1 Delta 1.000 mA
Sig 1 d/dt 5.000 mA/s
Sal. bin 1 0
Sal. bin 2 0
Sal. bin 3 0
Sal. bin 4 0
dt per Step 200.0 ms
Ramp Steps 21
Ramp Time 4.200s
Trigger Bin
Trigger Logic OR
TRIP X
Entr.bi. 2 1
Entr.bi. 3 X
Entr.bi. 4 X
Entr.bi. 5 X
Entr.bi. 6 X
Entr.bi. 7 X
Entr.bi. 8 X
Entr.bi. 9 X

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 SEM06 L04_F60
Entr.bi. 10 X
Step back No
Delay Time 0.000 s

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Test Module
Name: OMICRON Ramping Version: 4.31
Test Start: 16-sep-2023 13:30:36 Test End: 16-sep-2023 13:30:42
User Name: Julio Flores Manager:
Company: MMG

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Arranque 51G Ramp 1 TRIP 0->1 I L1 20.00 mA 20.00 mA 10.00 mA 10.00 mA 0.000 A + 138.3 ms
Assess: + .. Passed x .. Failed o .. Not assessed

Assessment Statistics
Name Ramp Condition Sig Nom. Act.Av. min max Std. Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed

Calculation Results
Name/ Exec. Calc. X Y Nom. Act. Tol.- Tol.+ Dev. Assess
Reposición/Arr X/Y Arranque 51G Arranque 51G 0.9500 1.000 0.05000 +
anque
Assess: + .. Passed x .. Failed o .. Not assessed

Calculation Statistics
Name Calc. X Y Nom. Act.Av. min max Std. Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed

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 SEM06 L04_F60

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Cursor Data
Time Signal Value
Cursor 1 0.000 s <none> n/a
Cursor 2 4.200 s <none> n/a
C2 - C1 4.200 s n/a

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Test State:
Test passed

GRP1 51G Disparo:

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Test Settings
State State 1 State 2
I L1 10.00 mA 22.00 mA
0.00 ° 0.00 °
60.000 Hz 60.000 Hz
I L2 0.000 A 0.000 A
-120.00 ° -120.00 °
60.000 Hz 60.000 Hz
I L3 0.000 A 0.000 A
120.00 ° 120.00 °
60.000 Hz 60.000 Hz

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Test Module
Name: OMICRON State Sequencer Version: 4.31

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Test Start: 16-sep-2023 13:31:26 Test End: 16-sep-2023 13:31:29
User Name: Julio Flores Manager:
Company: MMG

Test Results
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Time Assessment
Name Ignore Start Stop Tnom Tdev- Tdev+ Tact Tdev Assess
before
Disparo State 1 State 2 TRIP 0>1 100.0 ms 50.00 ms 50.00 ms 139.2 ms 39.20 ms +
51G
Assess: + .. Passed x .. Failed o .. Not assessed

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Test State:
Test passed

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