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Measurements System Analysis.

Conference Paper · January 2006

DOI: 10.1109/DELTA.2006.62 · Source: DBLP

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A. Sivaji
Malaysian Institute of Microelectronic Systems
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Proceedings of the Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA’06)
0-7695-2500-8/05 $20.00 © 2005 IEEE
Proceedings of the Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA’06)
0-7695-2500-8/05 $20.00 © 2005 IEEE
Proceedings of the Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA’06)
0-7695-2500-8/05 $20.00 © 2005 IEEE
Proceedings of the Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA’06)
0-7695-2500-8/05 $20.00 © 2005 IEEE
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