Growth and Characterization of Quantum Dots of Copper

Sulfide Thin Film

Copper sulfide is a chalcogenic material composed of sulfur, that exhibits valuable properties in terms
of structure, electrical behavior, and optical properties, making it suitable for application in
photoelectrons and medicine. Copper sulfide thin films were grown by Solution growth technique.
The deposition bath consists of aqueous Copper sulfate pentahydrate ( CuSO4.5H2O), Thiourea, TEA
acts as a complexing agent, and a few drops of ammonia to adjust the alkaline medium. The deposited
film has been characterized by SEM, XRD, optical absorption, and electrical resistivity.
Optical research in the wavelength range of 300–800 nm has been conducted on as-grown CuS thin
film using a UV–Vis spectrophotometer. Fig displays the optical absorption spectrum. When the CuS
thin film was plotted between the variation in absorbance (αt) as a function of wavelength (λ), a sharp
beginning in absorbance around 580 nm and higher absorbance in the visible region were noticed.
The below fig shows the transmittance spectra of CuS. It has been observed that the maximum
absorption is around 590nm obtained.

41.562
80

70

60

50

40

30

20

10

0
300 400 500 600 700 800 900
The optical bandgap (Eg) of the film is estimated from the intercept of the linear portion of the plot of
(alphahnw)2 against (hnew ) Fig shows estimated values of band gap for CuS thin film. The band gap
value around 1.7 – 1.8 eV is obtained.

(alphahnw)2
1
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0
1 1.5 2 2.5 3 3.5 4