7.

Capability Indices for Qualitative Characteristics

Capability indices such as C p and C pk can only be calculated using “normal” formulae if the
characteristic is measurable. However, there are some processes where the characteristic is not
measurable. During the printed circuit board component assembly or soldering processes, for
example, defects can occur which are merely counted but not measured in the true sense of the
word. Such defects may include component assembly defects (incorrect or missing component
or wrong direction) and soldering defects (cold soldering point, short-circuit, missing
connection). In order to calculate a capability index in such a case, the following option is
suggested in the literature:

k
The ratio pˆ is considered as a theoretical fraction nonconforming of a normal distribution.
n
In this ratio, k stands for the number of defects in a random sample, and n stands for the sample
size. If u 1 pˆ designates the quantile of the standard normal distribution to the probability value
u1 pˆ
1 pˆ , then C pk is the capability index. This procedure corresponds to method M2 in
3
Section 9.2 and conforms with [8].

8. Report of Capability or Performance Indices

In order to achieve as much transparency as possible in calculating and circulating capability
indices (reporting), the following information should always be available (see [8]):

Example:

Process capability index Cp = 1.75

Process capability index Cpk = 1.47

Calculation method M4

Number of values taken as a basis 200

Optional:
- Sampling interval
- Time and duration of data recording
- Distribution model (reason)
- Measuring system
- Technical framework conditions

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