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Article in IEEE Transactions on Circuits and Systems I Regular Papers · October 2011
DOI: 10.1109/TCSI.2011.2112830 · Source: IEEE Xplore
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Fig. 4. Transformed matching network with real source and load impedances.
analysis of its quality factor and the study of its power transfer
efficiency. The transformed matching network topology is
illustrated in Fig. 4.
The transformation consists of three steps: i) extraction of se-
ries-leg quality factors; ii) extraction of the transformed source
Fig. 5. Dynamic range of the impedance tuner at 2.4 GHz depending on the
and load; iii) analysis of the equivalent shunt variable capaci- inductance. (a) L = 2:5 nH. (b) L = 1:7 nH.
tors.
We can define the series-leg quality factors and of
source and load respectively by area can be matched to the source impedance; whereas it is im-
possible to match to the source impedance any normalized com-
plex conjugate load impedance located in the forbidden region.
(1) To avoid this type of scenario, it is necessary to correctly set the
value of the inductance in order to obtain the configuration il-
(2) lustrated in Fig. 5(b) where the complete normalized complex
conjugate load impedance variation range is included into the
The transformed source is a resistance in parallel with impedance tuner dynamic range.
capacitor For our study, we first apply a matching network transforma-
tion as described previously to achieve the matching network
(3) topology illustrated in Fig. 4. It becomes therefore evident to
identify the maximum and the minimum load impedance that
(4) affect our system. The range of the transformed and normalized
real load impedance which varies between and
Similarly, the transformed load is a resistance in parallel is illustrated in Fig. 5 by the bold lines.
with a capacitor In general, at a given angular frequency and neglecting
the self-resonant frequency of the elements, the forbidden circle
where load impedance can not be matched depends on the in-
(5) ductance value and its diameter is given by
(6)
(9)
The equivalent shunt capacitances and are expressed
as follows:
The inductance value should be set carefully in order to match
any value that could affect the load impedance. Indeed, the for-
(7) bidden circle diameter should be smaller than
(8) (10)
(14)
(15)
(16)
(17)
D. Matching Network Design Method Step 4: In general, the quadratic equation (17) has two roots:
and
We present a novel method strongly reducing the complexity
of the matching network design, providing a quick and easy
(18)
calculation. It exploits and approaches the Smith chart shown
in Fig. 6 in a novel way.
We simplify the analysis by using the transformed matching (19)
network shown in Fig. 4, where source and load impedance
values are real. The impedances are normalized assuming the The solutions depend on the normalized real load impedance
characteristic impedance to be defined in (3). The goal is to , on the normalized inductance value and on the angular
match the normalized impedance to the normalized source frequency . Since (19) can lead to negative optimum values of
equal to 1 and localized at the center of the Smith chart. the variable capacitors and shown in Fig. 3, only (18) is
The steps for matching the normalized load to the source selected as the unique solution.
are as follows: Step 5: The admittance of the node and are obtained
— Since is in shunt with the load , the normalized from (12), (15), and (18) as
real load impedance moves in the clockwise direction
(20)
on the admittance Smith chart until .
— The next element is a serial inductance . We rotate in (21)
the clockwise direction on the impedance Smith chart until
Step 6: The values of the capacitance and are given
.
in the admittance domain by the move from until and
— Finally, the shunted capacitor is designed to reach the
from until , respectively
final matching goal located at the center of the Smith
chart.
The steps and the analytical expressions to calculate the op- (22)
timum element values of the tunable matching network are pre-
sented below:
Step 1: The node is on the curve 1. In general, we can (23)
consider the capacitor quality factor is high . Therefore,
the parasitic resistance of the capacitor is neglected, the Step 7: Using (7), (8), (22), and (23), the capacitances and
analytical expressions of this curve in the admittance domain , giving the optimal configuration of the matching network,
and in the impedance domain are given by are calculated
(24)
(12)
(25)
(13)
Finally, after transforming the matching network and
Step 2: If is the normalized expression of the choosing the inductance value matching the desired load range
inductance and is its normalized parasitic resistance, the to the source, the matching network design algorithm can be
CHAN WAI PO et al.: A NOVEL METHOD FOR SYNTHESIZING AN AUTOMATIC MATCHING NETWORK AND ITS CONTROL UNIT 2229
implemented using only the analytical formulas given by (18), Thus, we get the intermediate real impedances of each stage
(20), (21), (24), and (25). These formulas can also be used to by exploiting the following equation:
calculate the necessary variation range of the capacitors and
suitable to adapt a variation range of load impedances to
the source.
where and are the transformed real source and load (31)
impedances, respectively. (32)
2230 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—I: REGULAR PAPERS, VOL. 58, NO. 9, SEPTEMBER 2011
Fig. 8. Low pass matching network with parasitic resistances divided into two sections: (a) a low pass L section and (b) a high pass L section. (c) demonstrates
the Smith chart with impedance transformation.
The nodal quality factor can be found as the ratio of Consider the low pass L section shown in Fig. 8(a). The ex-
the absolute value of the normalized reactance to the cor- pression of the powers and , entering the matching net-
responding normalized resistance [20] work from the left and from the right, respectively, are given by
(33)
(36)
Similarly, can be calculated as the ratio of the absolute
(37)
value of the normalized susceptance to the normalized con-
ductance
If the right port is connected to the load, the impedance of
the node shown in Fig. 8(a) is obtained from in addition
(34) with the impedance of the series inductance
The parasitic resistances of the lossy components, like induc- With no approximation and no simplification, the expression of
tors or capacitors, used to design the matching network con- the low pass matching network efficiency is
tribute to generate the insertion loss. The losses that affect the
low pass L section represented in Fig. 8(a) are the loss
in the inductor and the loss in the capacitor
(47)
(42)
The initial matching network is divided into two L sec-
tions where the inductors have exactly the same ratio between
their reactance and their parasitic resistance, consequently they
have the same quality factor . Also, the
nodal quality factors are most of the time small compared to the
quality factors of the matching components to avoid high inser-
tion loss. In this condition and for simplicity, we can transform
(43)
(47) into
(44) (49)
From (42), (43), and (44), we obtain therefore the expression It is well known that the quality factor of capacitors is strong
of the low pass L section matching network power efficiency compared to the quality factor of inductors. For
as the ratio between the output power and the input power and , the capacitor loss can be neglected and the
as follows: only loss to be considered is the inductor loss. In this case, (49)
can be approximated as
(45) (50)
(51)
(46)
TABLE I
CALCULATED PARAMETERS OF THE OPTIMAL MATCHING NETWORK
TABLE II
COMPARISON OF CALCULATED AND SIMULATED MATCHING NETWORK EFFICIENCY
Fig. 12. Two stage matching network with real source and load impedances.
TABLE III
COMPARISON OF THE ESTIMATED AND SIMULATED EFFICIENCY OF A SINGLE STAGE AND MULTISTAGE MATCHING NETWORK
Fig. 13. Automatic antenna impedance tuning unit (AATU) simplified block
diagram.
Fig. 16. Measured reflection coefficient: (a) before the calibration routine and
(b) after single iteration calibration process.
ACKNOWLEDGMENT
The authors would like to thank ELA Medical (Sorin Group)
for supporting this work. The authors would also like to thank
E. Isa for contributing to improve the quality level of this paper.
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