TEST REPORT KERI SS asi aSeil S KOREA ELECTROTECHNOLOGY RESEARCH INSTITUTE“TEST REPORT ovrsoost 40 CLASSIFICATION Pertormance Test APPARATUS 17.5 KV Metal-Enclosed Switchgear and Controlgear DESIGNATION SOLUTION POWER S17 3 phases 17.5kV 630A 254A Qs 50 and 60 Hz RECEIPT No. ‘TRD10802043 (September 15, 2010} APPLICANT Ls INDUSTRIAL SYSTEMS Co. Lt. Songiung-dong 1, Hungdeok~gu, Cheengiu-si, 361-720, Korea MANUFACTURER LS INDUSTRIAL SYSTEMS Co. Songlung-dong 1, Hungdeok-gu, Checngiu-si, 361-720, Korea DATE OF TESTS October 13, 2010 ~ February 16, 2011 DATE OF ISSUE February 28, 2011 ‘The tests have been carried out in accordance with applicant's instructions. Test procedure and test parameters were based on clauses 6.2, 6.4, 6.5, 6.6, 6.7 and 6.102 of IEC 62271-200:2003. This Test Report has been issued by KER! The test results are shown in the records of tests with the performance of the apparatus tested and the observations made during the tests. The oscilograms are attached hereto. The Test Report applies oniy to the apparatus tested. The responsibilty for conformity of any apparatus having the same designations with that tested rests with the Manufacturer. Oniy integral reproduction of this Report are permitted without written permission from KERI. Electronic copies in POF-format or scanned version of this Report may be available and have the status "for information only’ The sealed and bounded version of the Report is only the valid version. TOTAL No. OF PAGES(40) : records (11), photographs (4), circuit diagrams (4), drawings & descriptions (3), attachments(0), oscilograms (18) jung. Henny Seo Jung , Heung-Soo Verified by — é (Technical manager) La , Dae-Ryeol dd Park, Sung-Kyun Prepared by ‘Approved by Power Apparatus Testing & Evaluation Division KOREA ELECTROTECHNOLOGY RESEARCH INSTITUTE KERI Sa t-dong 1271-19, Sangnok-gu, Ansan-si. Gyeonggi-do, Korea, 426-170 LL Tel : 482-31-8040-4114, Fax : +82-31-8040-4499, ww.ker re. kr KERI Laboratories are accredited by KOLAS (Korea Laboretory Accreditation Scheme) DF-CA-21/10/042orrTsoo311 2/40 Table of contents tems Sheet No Table of contents 240 Ratings _ - i ao aio] Uist of tests suo} Test results 7 : evao— 110 Photographs 270~ 1549 CCreut dagrams and parameters 1640~ 1949 Drawings - ~__20/a0~2240 ‘Atachmenss | Osollograms _ = | Tested by : tung, Heung-seo Kea Witnessed by Choi, Ki-yeo! LS INDUSTRIAL SYSTEMS Co,L1s Photographs : Photo. HOI Temperture-ise teats Photo. HTO2 + Verfation ofthe protection Photo. HTOG~C# + Shor-ime withstand cUrent and peak withstand curent tests Circuit diagrams and parameters Fig. HTO1 + Test clrout for short-time withstand current and peak withstand current tests Fig. HT02 Current path of shor-time withstand current and peak withstand current tests, Fig. HT08 Measuring point of temperature-rise tests, Drawings = The folowing drawings are included in this test report on the client's request. But it is not adequately checked by KERI thal the detals of test sample are correctly figured on drawings. Reference No. Drawing No. Revision No. Date WG, HTO! T7SKV 25KA 630A 0 Dwe. HTO2 E410970005-012-08 ° 2011.01.07 DWG. HT03 410970005-015 0 2008.05.11 Attachments = N/A -SM7|21F2 Korea Electrotechnology Research insttute2orrTsoost1 40 17.5 kV Metal-Enclosed Switchgear and Controigear Manufacturer LS INDUSTRIAL SYSTEMS Co.,Ltd. Type SOLUTION POWER $17 Serial No. 03 Ratings of the test object assigned by manufacturer and proved by tests Number of phases Three phases Rated votage 175 kV Rated current 60 A Rated frequency 60 Hz Rated short-time withstand current 25 kA Rated peak withstand curent 65 kAp Duration of short-circuit 38 Rated power frequency withstand voltage 38 KV Impulse witstand votage 95 KV Degree of protection Pax Ratings of the test object assigned by manufacturer but not proved by tests Rated frequency 50 He ‘Supply vollage of operating mechanism Dc 10 v Bustar size Main circuit busbar (10 x 80) mm (siver-coated copper busber) Earthing circuit busbar (10 * 40} mm (siver-coated copper busbar) Vacuum circuit breaker Manufacturer LS INDUSTRIAL SYSTEMS Co.Ltd. Tye VL-17H25A06 Number of phases ‘Three phases Rated voltage 175 kv Rated curtent 6A Rated frequency 50 and 60 Hz Rated short-time withstand current 25 kA Rated peak withstand current 65 kAp Duration of short-circuit 3s Rated power frequency withstand voltage a kV Impuise withstand voltage BR ‘Supply voltage of operating mechanism De 110V Vacuum interrupter Manufacturer LS INDUSTRIAL SYSTEMS Co,.Lt. — Lvse eHB2171¢78 Korea Electrotechnology Research InstituteEarthing switch Manufacturer Type Number of phases Rated voltage Rated frequency ated short-time withstand current Rated peak withstand curent Duration of short-circuit Rated power frequency withstand voltage Impulse withstand voltage Current transformer Manufacturer Type Rated voltage Rated primary current Rated secondary current Rated frequency Rated short-time withstand current Peak withstand current Duration of short-circuit Rated power frequency withstand vottage Impuise withstand voltage BRA IAFe Korea Electotechnology Research Insitute 2orrTso03t1 440 SHINWOO ELEC. Co, Lid. VES-1702250106 ‘Three phases 175 kV 50 and 60 Hz 25 kA 65 KAD 3s 38 ky 5 Kv DONG WOO ELEC. Lsc-411aW 175 kV 620A 5A 50 and 60 He 25 KA 65 Kap 38 38 kV 95 KV2orrTsooat1 ___ 5/40 List of the tests Test items Standard and clause Test date Sheet No. 62 of IEC 62271-200 1 Diolectic tests # . October 13, 2010 640 ‘and applicant's specification 64 of IEC 2271-200 2 Measurement of the resistance # 5 October 15, 2010 7/40 and applicant's spectication 65 of IEC 62271-200 moerature October 15, 2010 40 eee and applicant's specification 8102 of IEC 6227-200 ical operation November 17, 2010 4 Mechanical operation tests # al conan ten 9M 67 of IEC 6271-200 oi t Pax) January 31, 2011940 5. Vertfcation of the protection (IP4X) aaieoctcarts won Janvary 6 Short-time withstand current and 66 of IEC 6271-200 [canna Peak withstand current tests # and applicant's specification 7 Description of tests - - 11/40 Above test items # marked are witness tests (location of witness : LS INDUSTRIAL SYSTEMS Co,Ltd) BESH71 1781 Korea Electrotechnolagy Research InsitutezorrTsoogt1 6/40 1 Dielectric tests 1.1. Powor frequency voltage withstand test Test votiage Test duration | Test frequen: ‘Applied parts ~ . avency | Test results Ww rin Hz Phase to phase 3 ; (CB closed) Phase to ground co : (CB closed) — © Withstood ‘Across the isolating a 1 stance Control creuts 2 1 | sot pny | Teo | rer wy | tee |e Pt he = 7 = a Positive alee 7 7 pave teen [iss tte lira and Witstos distance a e Negative Negative - (1.3 x 47.2) | =_—— _ hPa = Power frequency voltage withstand test and impulse voltage withstand test ‘Ambient temperature 209 c Relative humiatty 338 % ‘Atmospheric pressure 1010 SISHI7IeIF21 Korea Electrotechnology Research Instiute_ aotrTsoeai1___7/40 2__Measurement of the resistance Resistance uo Arbient | Rate of States temperature | change v % Phase R | Phase S | Phase T — | Botore lomperatue-rise tests 145 185 160 a4 Main ee ——} Max. 25 creat tor tomperatre-rise tests 149 159 168 216 before the tests. + Measured by the voltage drop method across the terminals of each pole with 100 A dc. + The resistance after temperature rise test shall be increased by not more than 20 % from those values 132171878) Korea Eloctrotechnology Research Institute3 Temperature-rise tests porrTsoast1 40. tems Test rsuts 1 Tet cara J pas __| © —_ Feat Feauendy He 7 © Test auraion 7 _ - ho el Connection conductor (10 * 80) mm (Copper busbar) TanDeenTe Tos Vane No, | Measuring point | Condition of measuring point | Teavement k | Phase A | Phase § | Phase 7 Tm aan fom Wal par, ry 128 No. 456 bbare-copper in air no 456 | 8 ao al Terminal for ‘Connector, boted 498 | extemal connection] __Siver-coated copger = eae 223) a3) ‘Connection of CT ‘Connection, bolted, 789 (Incoming) silver-coated copper a ou aw aa Geanecton ot OT] Coenecton, bated [211.12] (utaoing) siver-coated copper Zi os a) a3 Waters used a6 inslason, 19,1415] Surface of cr_| MAG vod es ini 0 168 | 70 | 167 Zonnecion of VOB] Connection, bated, [16:17.18] "oad side) Siver-coated copper ce =o aa | Re ap, Recon of mai] Coreen, bad, 9.20.21 busbar Silver-coated copper = yea) ae ee) eenacion of VOB Contact 22,28,24) (supply side) Silver-coated_ copper e ae oe ad Sippy de epoxy | Materials used ao iniaion, 25.2627)" ushing Gass E (epoxy resin) bg oe ve | 8s | Tovng Contacto Conia. co, 28.29.30) VCB (supply side) Silver-coated_ copper 2 a) et _ foal Tuowag Contact of] ‘Conia, cp, 91.32.33)" voB toad side) ‘Siver-coated copper ba ole lita baal Connecion of VI] Connecton, Lote eas (supply side) Silver-coated copper 6 wf) im = Gy) Sutace ot NCB Acesab0 pa en na0d TET) yn 7 cover plete | be touched in normal operation il je Sufacs oF CB ficcesto rar wen nee3 ne 19) gg 7 | cperaton utr _| be touched in nora operation ce | mer GB. [Recessbie sa when noes no) 7 i Compartent_| be touched normal patton _ ve ter bus —Jaccassie pat wich ned not) “oa Comgariment_| be touched in normal opraton ar) ter catia Jaccessbe pat wich need nota] os omearment_| be touched normal operation : ve | Gonrmon ofan ccessBe pat which need not] yo a Duster | be touched nora) operation (Continued) S1B2171E78) Korea Electrotechnology Research InstitutezoriTsogsti 9/40 Surface of panel | Accessible part expected to be 4 front cover touched in normal operation co “a | Sutace of panel | Accessible part expected 10 be | ar side cover toughed in normal operation eo we | Sutface of panel | Accessibie part exoected to be [a a top cover touched in normal operation “ | 6 aan In air (10 ~ 40) 225 temperature a7 en In air (10 ~ 40) © 222 temperature - 7 8 ed In air (10-40) & 2a temperature Remarks Refer to Fig, HTOS and Osc. HTOt 4 Mechanical operation tests Pants Test method Closing and opening : Each $0 operations Inserion and 7 withdrawal of VOB Insertion, withdrawal : Each 25 operations + Switching device shall not be operated. instock + Insertion and withdrawal of removable part shall be set in positon intended. + Swmching devices, removable pars and the introcks shall be in proper working and | the efforts to operata them shall be the same belore and after the tests. Test resuits Nothing wrong was observed 5. Verification of the protection (IP4X) Temperature : 118 , Relate humidity : 41.3 %, Aimospherc pressure : 1 O11 NPA Test condiion Test resut Diameter 10 mm Access probe Lenath 100 mm Goo |__ Fore N#10% SSU71GFH Korea Elecrotectnology Research Institute2011TS00311__1040 6 Short-time withstand current and peak withstand current tests 6.1 Test on main circuit Test requirements Test current |= 25 kA, tp = 65 kAp Frequency f= 00H Test duration teas Tost resuts Gondtion | Atter measurement of the resisiance Test circuit: Fig. HTO1 botore test Test current Test duration Test nueniber vena Peak ems 8 KAD kA 69 258 | Current path : 205509 502 262 30 538 259 eter to Fig, HTO2 Condition during - eo tea’ | No visible signs of damages wore observed 62 Power frequency voltage withstand test (After short-time withstand current and peak withstand current tests) - Test voltage Test duration est Test ‘Apoied parts frequency w rin money | resus ri ase hase (0 pha = ; (CB closed) Phase to ground (6 cond . _ 60 ‘Withstood eros the isolating * 1 distance : Conttl ckeuts 2 1 BRHA7IAFE Korea Electrotechnology Research Institute_20r1Tso03t1 1140 Weather conditions — ona an ona : wumicity 330 = ~ hea 63 Measurement of the resistance (After short-time withstand current and peak withstand current tests) Resistance Ea | Ambient | Rate of States | terperature | change ) ov % Phase R | Phase S| Phase T Before short-ti a short-tire withstand curent | 46 4 aa oe and peak withstand current tests | Main rout ‘After short-time withstand current 153 164 167 25 and peak withstand current tests + Measured by the voltage drop method across the terminals of each pole with 100 A de. + The resistance after temperature rise test shall be increased by not more than 20 % from those values before the tests. 7 Description of tests 7.1. Above tests were executed for the specimen supplied and confirmed by applicant, and have been carried cut in accordance with the instructions of the applicant, based on IEC 62271-200%2003. 7.2 The earthing switch and earthing crcult in specimen (switchgear and controlgear) is identical with them of the 72 kV 630 A 25 kA rating, Refer to KERI test report 2011TS00252(201 1.02.16). End. 213217124721 Korea Electrotechnoiogy Research Insitute2orrTsoost1 12/40 Photographs Alter temperature-rse tests Photo. HTO1 Temperature-rise tests BERZI7Ie72) Korea Electrotechnology Research Institute2o1rTsoost1 19/40 Photographs VAS AMS PUM IU) Photo. HT02 Verfication of the protection SESH 71 e178 Korea Electrotechnology Research Instilute20117800311 Photographs 14/0 Photo. HT0 Before short-time withstand curent and peak withstand current tests 21521712472 Korea Electrotechnology Research Institute2orrTso0311 15/40, Photographs Photo. HTO4 Atter short-time withstand current and peak withstand current tests S3E71F2 Korea Electrotechnoiogy Research Insttute201 1TS00811 6140 Circuit diagram and parameters Circuit diagram and parameters toms Fig. HTOI Power frequency | _© Number of phaso 3 connection a Generator neutral Y Current limting reactor CLR @ | 3 ‘connection aly Transformer, - qens ratio w | saoa0 neutral 1 | Resistance in sores fe @| — - nol - trav Pesitarce |} — tuning 3 = Ce a stoment capacitance awl - Resistance Ro] — Load Reactance 2] — Capacitance C.| Shor ercuit point E | : Note) & : Earthed, |: Isolated, P, S, 4 & Y : Transformer’s parallel, series, della and star connection ‘Transformer ratio voltage based on phase to neutral. sISz171 72) Korea Electrotechnology Research InstituteaorrTsoosi1 17/40 Circuit diagrams es crear eee : oo scT At scT ‘Short-cireutt transformer : fs bY be be a = oor fotrearr Son ane ro ogre enacts epee een ast egumsnsee ee ere Fe. NTO} Tet at rs wisn cent an pak wird cat a BESH71 917-81 Korea Electrotechnology Research InsitutezorrTsoost1 14/40 Circuit diagrams s 1 s2-u ©) Vtayse Yisey 8308 SRRA/Seac sxcr Lsc-attan 63058 5°20 17,5KV. 25K UeseiTi2sa0e Quoin ous cireut> Fig. HT02 Current path of short-time withstand current and peak withstand current tests @1R2171G7-8l Korea Electrotechnology Research Institute2orrTsoo3t1__19/40 Circuit diagrams g 8 2 E Top cover @ site cover Fig. HT03 Measuring point of temperature~rise tests SIRA7IGFB Korea Electrotecnnology Research Institute20/40 or 7s0031 Drawings: DWG. HTO1 Outline drawing SHSZH71G15421 Korea Electrotechnology Research InstitutezorrTsoosi1 21/40 Drawings : & WG, HTG2 Single line diagram S1S2171G7-8) Korea Electrotechnology Research Insituteaorrrsocgit 22/40 Drawings ES naustriat systems DWG. HT03. Schematic diagram BRIG Korea Elecrotechnology Research Insitute23140 2orrTsoagtt Oscillograms srry owe G80 Hue ssp ma Sonya: sera uaqox pen Ose, HTO! Recording paper of temperature-rise tests SISHI71e1721 Korea Electrotechnology Research Institute20117800311 Oscillograms 20/40 468 i 3 a! cx 93 aa Ose, HT02 Wave shape of impluse voltage withstand tests (Positive) ‘RAI eFA Korea Electotechnology Research InsituteOscillograms 2011700311 25140 8 8 € € 2 # #€ 2 8 F Osc, HT03 Wave shape of impluse voltage withstand tests (Positive) 2tS171/ 217-8 Korea Electrotechnology Research Institute2orrTsocat1 26/40 Oscillograms Ose, HTO4 Wave shape of impluse voltage withstand tests (Positive) RA 7121F81 Korea Electrotechnology Research Insitute2o1rTs003tt Oscillograms z7le0, 5 28 27 a4 22 10, (Osc. HTO5 Wave shape of impluse voltage withstand tests (Posttve) FRE7Ie1-FB Korea Electrotechnology Research InstitutezorrTsoost1 ___2ai4o Oscillograms ono 828 03 511 xa 27 a (Ose. HTO5. Wave shape of impluse voltage withstand tests (Positive) SISH71G721 Korea Electrotechnology Research Institute2o1rTS00311___ 2940 Oscillograms. 100.0 a 58 (Osc. HTO7 Wave shape of impluse voltage withstand tests (Positive) eISI71 G78! Korea Electrotechnology Research InsitutezorrTsoosi1 30/40 Oscillograms Ose. HT08 Wave shape of impluse voltage withstand tests (Positve) #HSzI71G/7F2) Korea Electrotechnology Research Institute2orTsoc311 31/40. Oscillograms Phe 4 a Pe Pp fee (Oso, HT09 Wave shape of impluse voltage withstand tests (Postive) SISZI71G7°2) Korea Electrotechnology Research instituteOscillograms 2o11Ts003t1 2140 72 i m3 13 236 468 87 “61 Osc, HTIO Wave shape of impluse voltage withstand tests (Negative) 2010-10-18, 2 30432 Dat Ose, No,: O12 EHS I711F 2 Korea Electotechnology Research Institute2orrTsoosi1 33/40 Oscillograms 3 9 2 8 # @ § 8 F 8 om arn Wave shane of imoluse voltage withstand tests (Negative) SS2171E78 Korwa Elecrotechnology Research Institute2orrTsoost1 34/40 Oscillograms ao 2 144 “87 229 a s 93 “158 “08 00 Ose. HT12 Wave shape of imoluse voltage withstand tests (Negative) BSH71AFH Korea Eloctrotechnology Research InsttuteOscillograms Osc. HTI3 Wave shape of impluse voltage withstand tests (Negative) 20177800311 35140 ae] e181 Korea Electrotechnology Research Institute2orrTsoost1 36/40 Oscillograms Ose. HT!4 Wave shape of impluse voltage withstand tests (Negative) ‘BRAGA Korea Electotechnology Research InstituteaorrTsocgit 3740 Oscillograms iS peetyeeecc eect? cece (| eeel@peentseeelceeetr eee Ose, HTIS. Wave shape of implise votage withstand tess (Negatve) IRA7IGFH Korea Elearotectinology Research InstituteOscillograms 2o11Ts00a11 38140 Oso. HTI8. Wave shape of impluse voltage withstand tests (Negative) BST71GF Korea Electrotechnology Research Institute2011TS00311__39/40 Oscillograms s 3 = &€ # ¢ @ #€ € 8 Ose. HTI Wave shape of irpuse voltage wihsland tests (Negatve) BRM7I1IH Korea Electrotechnology Research Institute2orrTsocstt 4040 Oscillograms Dale: 2010-1027 1oam16 201 Ree No: 10208599 rer ‘BB M7/ e172 Korea Electiotechnology Research Institute