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Texas Instruments Msp430f1101a Datasheet - Retroamplis
Texas Instruments Msp430f1101a Datasheet - Retroamplis
description
The Texas Instruments MSP430 family of ultralow-power microcontrollers consists of several devices featuring
different sets of peripherals targeted for various applications. The architecture, combined with five low-power
modes is optimized to achieve extended battery life in portable measurement applications. The device features
a powerful 16-bit RISC CPU, 16-bit registers, and constant generators that contribute to maximum code
efficiency. The digitally controlled oscillator (DCO) allows wake-up from low-power modes to active mode in less
than 6 μs.
The MSP430x11x1(A) series is an ultralow-power mixed signal microcontroller with a built-in 16-bit timer,
versatile analog comparator and fourteen I/O pins.
Typical applications include sensor systems that capture analog signals, convert them to digital values, and then
process the data for display or for transmission to a host system. Stand alone radio frequency (RF) sensor front
end is another area of application. The I/O port inputs provide single slope A/D conversion capability on resistive
sensors.
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range
from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage
because very small parametric changes could cause the device not to meet its published specifications. These devices have limited
built-in ESD protection.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date. Copyright © 2008 Texas Instruments Incorporated
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
AVAILABLE OPTIONS
PACKAGED DEVICES
PLASTIC PLASTIC PLASTIC PLASTIC
TA
20-PIN SOWB 20-PIN TSSOP 20-PIN TVSOP 24-PIN QFN
(DW) (PW) (DGV) (RGE)
MSP430C1101IDW MSP430C1101IPW MSP430C1101IRGE
MSP430C1111IDW MSP430C1111IPW MSP430F1101AIDGV MSP430C1111IRGE
MSP430C1121IDW MSP430C1121IPW MSP430F1111AIDGV MSP430C1121IRGE
40°C to 85°C
−40°C
MSP430F1101AIDW MSP430F1101AIPW MSP430F1121AIDGV MSP430F1101AIRGE
MSP430F1111AIDW MSP430F1111AIPW MSP430F1111AIRGE
MSP430F1121AIDW MSP430F1121AIPW MSP430F1121AIRGE
P1.6/TA1/TDI/TCLK
TEST 1 20 P1.7/TA2/TDO/TDI
P1.7/TA2/TDO/TDI
VCC 2 19 P1.6/TA1/TDI/TCLK
P2.5/Rosc 3 18 P1.5/TA0/TMS
VSS 4 17 P1.4/SMCLK/TCK
P2.5/ROSC
XOUT 5 16 P1.3/TA2
XIN 6 15 P1.2/TA1
TEST
RST/NMI P1.1/TA0
VCC
7 14
NC
P2.0/ACLK 8 13 P1.0/TACLK
P2.1/INCLK 9 12 P2.4/CA1/TA2
P2.2/CAOUT/TA0 10 11 P2.3/CA0/TA1 NC 1 23 22 21 20 18 P1.5/TA0/TMS
VSS 2 17 P1.4/SMCLK/TCK
XOUT 3 16 P1.3/TA2
XIN 4 15 P1.2/TA1
RST/NMI 5 14 P1.1/TA0
P2.0/ACLK 6 8 9 10 11 13 P1.0/TACLK
P2.1/INCLK
P2.2/CAOUT/TA0
NC
P2.3/CA0/TA1
P2.4/CA1/TA2
NC
Note: NC pins not internally connected
Power Pad connection to VSS recommended
8 6
ROSC Flash/ROM RAM
Oscillator ACLK POR I/O Port 1 I/O Port 2
4KB 256B
8 I/Os, with 6 I/Os, with
System SMCLK Interrupt Interrupt
Clock 2KB 128B
Capability Capability
1KB 128B
MCLK
MAB,
Test
4 Bit
JTAG MAB,MAB,
16 Bit16-Bit
CPU
(F versions only)
MCB
Incl. 16 Reg.
Emulation
Module
MDB,
MDB, 16-Bit
16 Bit Bus MDB, 8 Bit
Conv
TEST
Watchdog Timer_A3 Comparator
Timer A
3 CC Reg
15/16-Bit
Terminal Functions
TERMINAL
NO.
DESCRIPTION
NAME DW, PW, RGE I/O
OR DGV
P1.0/TACLK 13 13 I/O General-purpose digital I/O pin/Timer_A, clock signal TACLK input
P1.1/TA0 14 14 I/O General-purpose digital I/O pin/Timer_A, capture: CCI0A input, compare: Out0
output/BSL transmit
P1.2/TA1 15 15 I/O General-purpose digital I/O pin/Timer_A, capture: CCI1A input, compare: Out1
output
P1.3/TA2 16 16 I/O General-purpose digital I/O pin/Timer_A, capture: CCI2A input, compare: Out2
output
P1.4/SMCLK/TCK 17 17 I/O General-purpose digital I/O pin/SMCLK signal output/test clock, input terminal for
device programming and test
P1.5/TA0/TMS 18 18 I/O General-purpose digital I/O pin/Timer_A, compare: Out0 output/test mode select,
input terminal for device programming and test
P1.6/TA1/TDI/TCLK 19 20 I/O General-purpose digital I/O pin/Timer_A, compare: Out1 output/test data input or
test clock input
P1.7/TA2/TDO/TDI† 20 21 I/O General-purpose digital I/O pin/Timer_A, compare: Out2 output/test data output
terminal or data input during programming
P2.0/ACLK 8 6 I/O General-purpose digital I/O pin/ACLK output
P2.1/INCLK 9 7 I/O General-purpose digital I/O pin/Timer_A, clock signal at INCLK
P2.2/CAOUT/TA0 10 8 I/O General-purpose digital I/O pin/Timer_A, capture: CCI0B input/ comparator_A,
output/BSL receive
P2.3/CA0/TA1 11 10 I/O General-purpose digital I/O pin/Timer_A, compare: Out1 output/ comparator_A,
input
P2.4/CA1/TA2 12 11 I/O General-purpose digital I/O pin/Timer_A, compare: Out2 output/ comparator_A,
input
P2.5/ROSC 3 24 I/O General-purpose digital I/O pin/input for external resistor that defines the DCO
nominal frequency
RST/NMI 7 5 I Reset or nonmaskable interrupt input
TEST 1 22 I Selects test mode for JTAG pins on Port1. The device protection fuse is connected
to TEST.
VCC 2 23 Supply voltage
VSS 4 2 Ground reference
XIN 6 4 I Input terminal of crystal oscillator
XOUT 5 3 O Output terminal of crystal oscillator
QFN Pad NA Package NA QFN package pad connection to VSS recommended.
Pad
† TDO or TDI is selected via JTAG instruction.
short-form description
CPU
The MSP430 CPU has a 16-bit RISC architecture Program Counter PC/R0
that is highly transparent to the application. All
operations, other than program-flow instructions, Stack Pointer SP/R1
Peripherals are connected to the CPU using data, General-Purpose Register R10
address, and control buses, and can be handled
with all instructions. General-Purpose Register R11
instruction set
General-Purpose Register R12
The instruction set consists of 51 instructions with
three formats and seven address modes. Each General-Purpose Register R13
operating modes
The MSP430 has one active mode and five software selectable low-power modes of operation. An interrupt
event can wake up the device from any of the five low-power modes, service the request, and restore back to
the low-power mode on return from the interrupt program.
The following six operating modes can be configured by software:
D Active mode (AM)
− All clocks are active.
D Low-power mode 0 (LPM0)
− CPU is disabled.
− ACLK and SMCLK remain active. MCLK is disabled.
D Low-power mode 1 (LPM1)
− CPU is disabled.
− ACLK and SMCLK remain active. MCLK is disabled.
− DCO’s dc generator is disabled if DCO not used in active mode.
D Low-power mode 2 (LPM2)
− CPU is disabled.
− MCLK and SMCLK are disabled.
− DCO’s dc generator remains enabled.
− ACLK remains active.
D Low-power mode 3 (LPM3)
− CPU is disabled.
− MCLK and SMCLK are disabled.
− DCO’s dc generator is disabled.
− ACLK remains active.
D Low-power mode 4 (LPM4)
− CPU is disabled.
− ACLK is disabled.
− MCLK and SMCLK are disabled.
− DCO’s dc generator is disabled.
− Crystal oscillator is stopped.
Address 7 6 5 4 3 2 1 0
0h ACCVIE NMIIE OFIE WDTIE
WDTIE: Watchdog timer interrupt enable. Inactive if watchdog mode is selected. Active if watchdog timer
is configured in interval timer mode.
OFIE: Oscillator fault enable
NMIIE: (Non)maskable interrupt enable
ACCVIE: Flash access violation interrupt enable
Address 7 6 5 4 3 2 1 0
01h
Address 7 6 5 4 3 2 1 0
02h NMIIFG OFIFG WDTIFG
Address 7 6 5 4 3 2 1 0
03h
memory organization
BSL FUNCTION DW, PW, AND DGV PACKAGE PINS RGE PACKAGE PINS
Data Transmit 14 - P1.1 14 - P1.1
Data Receive 10 - P2.2 8 - P2.2
flash memory
The flash memory can be programmed via the JTAG port, the bootstrap loader, or in-system by the CPU. The
CPU can perform single-byte and single-word writes to the flash memory. Features of the flash memory include:
D Flash memory has n segments of main memory and two segments of information memory (A and B) of
128 bytes each. Each segment in main memory is 512 bytes in size.
D Segments 0 to n may be erased in one step, or each segment may be individually erased.
D Segments A and B can be erased individually, or as a group with segments 0 to n.
Segments A and B are also called information memory.
D New devices may have some bytes programmed in the information memory (needed for test during
manufacturing). The user should perform an erase of the information memory prior to the first use.
0FFFFh Segment0 w/
0FE00h Interrupt Vectors
0FDFFh
Segment1
0FC00h
0FBFFh
Segment2
0FA00h
0F9FFh
Segment3
0F800h
0F7FFh Flash Main Memory
Segment4
0F600h
0F5FFh
Segment5
0F400h
0F3FFh
Segment6
0F200h
0F1FFh
Segment7
0F000h
010FFh
SegmentA
01080h Information
Memory
0107Fh
SegmentB
01000h
peripherals
Peripherals are connected to the CPU through data, address, and control buses and can be handled using all
instructions. For complete module descriptions, see the MSP430x1xx Family User’s Guide, literature number
SLAU049.
oscillator and system clock
The clock system is supported by the basic clock module that includes support for a 32768-Hz watch crystal
oscillator, an internal digitally-controlled oscillator (DCO), and a high-frequency crystal oscillator. The basic
clock module is designed to meet the requirements of both low system cost and low power consumption. The
internal DCO provides a fast turn-on clock source and stabilizes in less than 6 μs. The basic clock module
provides the following clock signals:
D Auxiliary clock (ACLK), sourced from a 32768-Hz watch crystal or a high-frequency crystal
D Main clock (MCLK), the system clock used by the CPU
D Sub-Main clock (SMCLK), the subsystem clock used by the peripheral modules
digital I/O
There are two 8-bit I/O ports implemented—ports P1 and P2 (only six P2 I/O signals are available on external
pins):
D All individual I/O bits are independently programmable.
D Any combination of input, output, and interrupt conditions is possible.
D Edge-selectable interrupt input capability for all the eight bits of port P1 and six bits of port P2.
D Read/write access to port-control registers is supported by all instructions.
NOTE:
Only six bits of port P2 (P2.0 to P2.5) are available on external pins, but all control and data bits
for port P2 are implemented.
Comparator_A
The primary function of the Comparator_A module is to support precision slope analog-to-digital conversions,
battery-voltage supervision, and monitoring of external analog signals.
Timer_A3
Timer_A3 is a 16-bit timer/counter with three capture/compare registers. Timer_A3 can support multiple
capture/compares, PWM outputs, and interval timing. Timer_A3 also has extensive interrupt capabilities.
Interrupts may be generated from the counter on overflow conditions and from each of the capture/compare
registers.
ÎÎÎÎÎ
fSYSTEM (MHz)
8.0 MHz
ÎÎÎÎÎ
ÎÎÎÎÎ
Supply voltage range,
Supply voltage range, ’F11x1A,
’x11x1(A), during
ÎÎÎÎÎ
during flash memory programming
program execution
ÎÎÎÎÎ
ÎÎÎÎÎ
4.15 MHz
ÎÎÎÎÎ
ÎÎÎÎÎ
1.8 V ÎÎÎÎÎ
2.7 V 3 V
Supply Voltage − V
3.6 V
electrical characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted)
supply current (into VCC) excluding external current
PARAMETER TEST CONDITIONS VCC MIN TYP MAX UNIT
TA = −40°C to 85°C, 2.2 V 160 200
f(MCLK) = f(SMCLK) = 1 MHz,
MHz
f(ACLK) = 32,768 Hz 3V 240 300
C11x1
TA = −40°C
40 C to 85
85°C,
C, 2.2 V 1.3 2
f(MCLK) = f(SMCLK) = f(ACLK) = 4096 Hz 3V 2.5 3.2
I(AM) Active mode TA = −40°C to 85°C, 2.2 V 200 250 μA
fMCLK = f(SMCLK) = 1 MHz,
f(ACLK) = 32,768 Hz, 3V 300 350
F11x1A Program executes in flash
TA = −40°C to 85°C, 2.2 V 3 5
Program executes in flash
f(MCLK) = f(SMCLK) = f(ACLK) = 4096 Hz 3V 11 18
TA = −40°C to 85°C, 2.2 V 30 40
C11x1 f(MCLK) = 0,
0 f(SMCLK) = 1 MHz,
MHz
Low power mode
Low-power f(ACLK) = 32,768 Hz
3V 51 60
I(CPUOff) μA
(LPM0) TA = −40°C to 85°C, 2.2 V 32 45
F11x1A f(MCLK) = 0,
0 f(SMCLK) = 1 MHz,
MHz
f(ACLK) = 32,768 Hz
3V 55 70
TA = −40°C to 85°C, 2.2 V 11 14
I(LPM2) Low power mode (LPM2)
Low-power f(MCLK) = f(SMCLK) = 0 MHz
MHz, μA
f(ACLK) = 32,768 Hz, SCG0 = 0
3V 17 22
TA = −40°C to 85°C, 2.2 V 1.2 1.7
C11x1 f(MCLK) = f(SMCLK) = 0 MHz
MHz,
f(ACLK) = 32,768 Hz, SCG0 = 1
3V 2 2.7
TA = −40°C 0.8 1.2
Low-power
Low power mode
I(LPM3) TA = 25°C 2.2 V 0.7 1 μA
(LPM3) f(MCLK) = 0 MHz,
MHz
TA = 85°C f(SMCLK) = 0 MHz, 1.6 2.3
F11x1A
TA = −40°C f(ACLK) = 32,768 Hz, 1.8 2.2
SCG0 = 1
TA = 25°C 3V 1.6 1.9
TA = 85°C 2.3 3.4
TA = −40°C 0.1 0.5
C11x1 TA = 25°C 2.2 V/3 V 0.1 0.5
TA = 85°C f(MCLK) = 0 MHz, 0.4 0.8
Low power mode
Low-power
I(LPM4) f(SMCLK) = 0 MHz,
MHz μA
(LPM4) TA = −40°C 0.1 0.5
f(ACLK) = 0 Hz, SCG0 = 1
F11x1A TA = 25°C 2.2 V/3 V 0.1 0.5
TA = 85°C 0.8 1.9
NOTE: All inputs are tied to 0 V or VCC. Outputs do not source or sink any current.
electrical characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (continued)
leakage current
PARAMETER TEST CONDITIONS VCC MIN TYP MAX UNIT
Port P1: P1.x, 0 ≤ × ≤ 7
2.2 V/3 V ±50
(see Notes 1 and 2)
Ilkg(Px.x) High impedance leakage current
High-impedance nA
Port P2: P2.x, 0 ≤ × ≤ 5
2.2 V/3 V ±50
(see Notes 1 and 2)
NOTES: 1. The leakage current is measured with VSS or VCC applied to the corresponding pin(s), unless otherwise noted.
2. The leakage of the digital port pins is measured individually. The port pin must be selected for input and there must be no optional
pullup or pulldown resistor.
electrical characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (continued)
output frequency
PARAMETER TEST CONDITIONS VCC MIN TYP MAX UNIT
fP20 P2.0/ACLK, CL = 20 pF 2.2 V/3 V fSystem
Output frequency TA0, TA1, TA2, CL = 20 pF MHz
fTAx 2.2 V/3 V dc fSystem
Internal clock source, SMCLK signal applied (see Note 1)
fSMCLK = fLFXT1 = fXT1 40% 60%
fSMCLK = fLFXT1 = fLF 35% 65%
P1.4/SMCLK,
P1 4/SMCLK 2 2 V/3 V
2.2
50%− 50%+
CL = 20 pF fSMCLK = fLFXT1/n 50%
15 ns 15 ns
tXdc Duty cycle of O/P 50%− 50%+
fSMCLK = fDCOCLK 2.2 V/3 V 50%
frequency 15 ns 15 ns
fP20 = fLFXT1 = fXT1 40% 60%
P2 0/ACLK
P2.0/ACLK,
fP20 = fLFXT1 = fLF 2.2 V/3 V 30% 70%
CL = 20 pF
fP20 = fLFXT1/n 50%
tTAdc TA0, TA1, TA2, CL = 20 pF, duty cycle = 50% 2.2 V/3 V 0 ±50 ns
NOTE 1: The limits of the system clock MCLK has to be met. MCLK and SMCLK can have different frequencies.
electrical characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (continued)
outputs − Ports P1 and P2 (continued)
10
15
10
6
4
5
2
0 0
0.0 0.5 1.0 1.5 2.0 2.5 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5
VOL − Low-Level Output Voltage − V VOL − Low-Level Output Voltage − V
Figure 2 Figure 3
VCC = 2.2 V
I OH − Typical High-Level Output Current − mA
VCC = 3 V
P1.0
−2 P1.0
−5
−4
−10
−6
−15
−8
−20 TA = 85°C
−10
TA = 85°C
−12 −25
TA = 25°C
TA = 25°C
−14
0.0 0.5 1.0 1.5 2.0 2.5 −30
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5
VOH − High-Level Output Voltage − V
VOH − High-Level Output Voltage − V
Figure 4 Figure 5
NOTE: One output loaded at a time.
electrical characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (continued)
optional resistors, individually programmable with ROM code (see Note 1)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
R(opt1) 2.5 5 10 kΩ
R(opt2) 3.8 7.7 15 kΩ
R(opt3) 7.6 15 31 kΩ
R(opt4) 11.5 23 46 kΩ
R(opt5) Resistors, individually programmable with ROM code, all port pins, 23 45 90 kΩ
2 2 V/3 V
VCC = 2.2
R(opt6) values applicable for pulldown and pullup 46 90 180 kΩ
R(opt7) 70 140 280 kΩ
R(opt8) 115 230 460 kΩ
R(opt9) 160 320 640 kΩ
R(opt10) 205 420 830 kΩ
NOTE 1: Optional resistors Roptx for pulldown or pullup are not available in standard flash memory device MSP430F11x1A.
RAM
PARAMETER MIN TYP MAX UNIT
V(RAMh) CPU halted (see Note 1) 1.6 V
NOTE 1: This parameter defines the minimum supply voltage VCC when the data in the program memory RAM remains unchanged. No program
execution should happen during this supply voltage condition.
electrical characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (continued)
Comparator_A (see Note 1)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
VCC = 2.2 V 25 40
I(DD) CAON=1 CARSEL=0
CAON=1, CARSEL=0, CAREF=0 μA
VCC = 3 V 45 60
CAON=1, CARSEL=0, VCC = 2.2 V 30 50
I(Refladder/RefDiode) CAREF 1/2/3 no load at
CAREF=1/2/3, μA
P2.3/CA0/TA1 and P2.4/CA1/TA2 VCC = 3 V 45 71
Common-mode input
V(IC) CAON =1 VCC = 2.2 V/3 V 0 VCC−1 V
voltage
electrical characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (continued)
650 650
Typical Typical
550 550
500 500
450 450
400 400
−45 −25 −5 15 35 55 75 95 −45 −25 −5 15 35 55 75 95
TA − Free-Air Temperature − °C TA − Free-Air Temperature − °C
0 1 CAF
CAON
Set CAIFG
Flag
τ ≈ 2.0 μs
Overdrive VCAOUT
V−
400 mV
V+ t(response)
electrical characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (continued)
PUC/POR
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
t(POR_Delay) Internal time delay to release POR 150 250 μs
V
VCC
V
POR
No POR
POR POR
V
(min)
2.0
1.8
1.8
1.6 1.5
Max
1.4
1.2
V POR [V]
1.4
1.2
Min
1.0 1.1
0.8
0.8
0.6
0.4
0.2 25°C
0
−40 −20 0 20 40 60 80
Temperature [°C]
electrical characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (continued)
DCO
PARAMETER TEST CONDITIONS VCC MIN TYP MAX UNIT
2.2 V 0.08 0.12 0.15
f(DCO03) Rsel = 0,
0 DCO = 3,
3 MOD = 0,
0 DCOR = 0,
0 TA = 25°C MHz
3V 0.08 0.13 0.16
2.2 V 0.14 0.19 0.23
f(DCO13) Rsel = 1,
1 DCO = 3,
3 MOD = 0,
0 DCOR = 0,
0 TA = 25°C MHz
3V 0.14 0.18 0.22
2.2 V 0.22 0.30 0.36
f(DCO23)
( CO ) Rsel = 2
2, DCO = 3
3, MOD = 0
0, DCOR = 0
0, TA = 25°C MHz
3V 0.22 0.28 0.34
2.2 V 0.37 0.49 0.59
f(DCO33) Rsel = 3
3, DCO = 3
3, MOD = 0
0, DCOR = 0
0, TA = 25°C MHz
3V 0.37 0.47 0.56
2.2 V 0.61 0.77 0.93
f(DCO43) Rsel = 4
4, DCO = 3
3, MOD = 0
0, DCOR = 0
0, TA = 25°C MHz
3V 0.61 0.75 0.9
2.2 V 1 1.2 1.5
f(DCO53) Rsel = 5
5, DCO = 3
3, MOD = 0
0, DCOR = 0
0, TA = 25°C MHz
3V 1 1.3 1.5
2.2 V 1.6 1.9 2.2
f(DCO63) Rsel = 6
6, DCO = 3
3, MOD = 0
0, DCOR = 0
0, TA = 25°C MHz
3V 1.69 2 2.29
2.2 V 2.4 2.9 3.4
f(DCO73) Rsel = 7
7, DCO = 3
3, MOD = 0
0, DCOR = 0
0, TA = 25°C MHz
3V 2.7 3.2 3.65
2.2 V 4 4.5 4.9
f(DCO77) Rsel = 7
7, DCO = 7
7, MOD = 0
0, DCOR = 0
0, TA = 25°C MHz
3V 4.4 4.9 5.4
fDCO40 fDCO40 fDCO40
f(DCO47) Rsel = 4
4, DCO = 7
7, MOD = 0
0, DCOR = 0
0, TA = 25°C 2 2 V/3 V
2.2 MHz
x1.7 x2.1 x2.5
S(Rsel) SR = fRsel+1/fRsel 2.2 V/3 V 1.35 1.65 2
ratio
S(DCO) SDCO = fDCO+1/fDCO 2.2 V/3 V 1.07 1.12 1.16
2.2 V −0.31 −0.36 −0.40
Dt Temperature drift,
drift Rsel = 4
4, DCO = 3
3, MOD = 0 (see Note 1) %/°C
3V −0.33 −0.38 −0.43
DV Drift with VCC variation, Rsel = 4, DCO = 3, MOD = 0 (see Note 1) 2.2 V/3 V 0 5 10 %/V
NOTE 1: These parameters are not production tested.
ÎÎÎÎÎ
ÎÎÎÎÎ
Frequency Variance
Max
ÎÎÎÎÎ
f(DCOx7)
Min
f DCOCLK
ÎÎÎÎÎ
1
f(DCOx0)
Max
Min ÎÎÎÎÎ
2.2 V 3V 0 1 2 3 4 5 6 7
VCC DCO Steps
electrical characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (continued)
main DCO characteristics
D Individual devices have a minimum and maximum operation frequency. The specified parameters for
f(DCOx0) to f(DCOx7) are valid for all devices.
D All ranges selected by Rsel(n) overlap with Rsel(n+1): Rsel0 overlaps Rsel1, ... Rsel6 overlaps Rsel7.
D DCO control bits DCO0, DCO1, and DCO2 have a step size as defined by parameter SDCO.
D Modulation control bits MOD0 to MOD4 select how often f(DCO+1) is used within the period of 32 DCOCLK
cycles. The frequency f(DCO) is used for the remaining cycles. The frequency is an average equal to:
32 f (DCO) f (DCO)1)
f average +
MOD f (DCO))(32*MOD) f (DCO)1)
DCO when using ROSC (see Note 1)
PARAMETER TEST CONDITIONS VCC MIN TYP MAX UNIT
2.2 V 1.8±15% MHz
CO, DCO output frequency
fDCO Rsel = 4
4, DCO = 3
3, MOD = 0
0, DCOR = 1
1, TA = 25°C
3V 1.95±15% MHz
Dt, Temperature drift Rsel = 4, DCO = 3, MOD = 0, DCOR = 1 2.2 V/3 V ±0.1 %/°C
Dv, Drift with VCC variation Rsel = 4, DCO = 3, MOD = 0, DCOR = 1 2.2 V/3 V 10 %/V
NOTES: 1. ROSC = 100kΩ. Metal film resistor, type 0257. 0.6 watt with 1% tolerance and TK = ±50ppm/°C.
electrical characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (continued)
flash memory
TEST
PARAMETER VCC MIN TYP MAX UNIT
CONDITIONS
VCC(PGM/
Program and erase supply voltage 2.7 3.6 V
ERASE)
fFTG Flash Timing Generator frequency 257 476 kHz
IPGM Supply current from VCC during program 2.7 V/ 3.6 V 3 5 mA
IERASE Supply current from VCC during erase 2.7 V/ 3.6 V 3 7 mA
tCPT Cumulative program time See Note 1 2.7 V/ 3.6 V 4 ms
tCMErase Cumulative mass erase time See Note 2 2.7 V/ 3.6 V 200 ms
Program/erase endurance 104 105 cycles
tRetention Data retention duration TJ = 25°C 100 years
tWord Word or byte program time 35
tBlock, 0 Block program time for first byte or word 30
tBlock, 1-63 Block program time for each additional byte or word 21
See Note 3 tFTG
tBlock, End Block program end-sequence wait time 6
tMass Erase Mass erase time 5297
tSeg Erase Segment erase time 4819
NOTES: 1. The cumulative program time must not be exceeded when writing to a 64-byte flash block. This parameter applies to all programming
methods: individual word/byte write and block write modes.
2. The mass erase duration generated by the flash timing generator is at least 11.1ms ( = 5297x1/fFTG,max = 5297x1/476kHz). To
achieve the required cumulative mass erase time the Flash Controller’s mass erase operation can be repeated until this time is met.
(A worst case minimum of 19 cycles are required).
3. These values are hardwired into the Flash Controller’s state machine (tFTG = 1/fFTG).
JTAG interface
TEST
PARAMETER VCC MIN TYP MAX UNIT
CONDITIONS
2.2 V 0 5 MHz
fTCK TCK input frequency see Note 1
3V 0 10 MHz
RInternal Internal pulldown resistance on TEST see Note 2 2.2 V/ 3 V 25 60 90 kΩ
NOTES: 1. fTCK may be restricted to meet the timing requirements of the module selected.
2. TEST pull-down resistor implemented in all versions.
APPLICATION INFORMATION
input/output schematic
Port P1, P1.0 to P1.3, input/output with Schmitt trigger
VCC
P1SEL.x
0 (See Note 1)
P1DIR.x
Direction Control 1
From Module (See Note 2)
0 Pad Logic P1.0 − P1.3
P1OUT.x
1
Module X OUT
(See Note 2)
(See Note 1)
P1IN.x
GND
EN
Module X IN D
P1IRQ.x P1IE.x
EN Interrupt
Q Edge
P1IFG.x Set Select
Interrupt
Flag P1IES.x
P1SEL.x
NOTE: x = Bit/identifier, 0 to 3 for port P1
Direction
PnSel.x PnDIR.x control from PnOUT.x Module X OUT PnIN.x Module X IN PnIE.x PnIFG.x PnIES.x
module
P1Sel.0 P1DIR.0 P1DIR.0 P1OUT.0 VSS P1IN.0 TACLK† P1IE.0 P1IFG.0 P1IES.0
P1Sel.1 P1DIR.1 P1DIR.1 P1OUT.1 Out0 signal† P1IN.1 CCI0A† P1IE.1 P1IFG.1 P1IES.1
P1Sel.2 P1DIR.2 P1DIR.2 P1OUT.2 Out1 signal† P1IN.2 CCI1A† P1IE.2 P1IFG.2 P1IES.2
P1Sel.3 P1DIR.3 P1DIR.3 P1OUT.3 Out2 signal† P1IN.3 CCI2A† P1IE.3 P1IFG.3 P1IES.3
†Signal from or to Timer_A
NOTES: 1. Optional selection of pullup or pulldown resistors with ROM (masked) versions
2. Fuses for optional pullup and pulldown resistors can only be programmed at the factory (ROM versions only).
APPLICATION INFORMATION
Port P1, P1.4 to P1.7, input/output with Schmitt trigger and in-system access features
VCC
P1SEL.x
0
P1DIR.x See Note 1
Direction Control 1
From Module See Note 2
0
P1OUT.x Pad Logic
1 P1.4−P1.7
Module X OUT
See Note 2
See Note 1
GND
TST
Bus Keeper
P1IN.x
EN
Module X IN D
TEST
TST
P1IRQ.x P1IE.x Interrupt
Fuse 60 kΩ
EN
Q Edge Typical
P1IFG.x
Set Select
GND
Interrupt Fuse
P1IES.x Control By JTAG Blow
Flag
TSTControl
P1SEL.x
P1.x
TDO
Controlled By JTAG
P1.7/TDI/TDO
Controlled by JTAG
P1.6/TDI/TCLK
Direction
PnSel.x PnDIR.x control from PnOUT.x Module X OUT PnIN.x Module X IN PnIE.x PnIFG.x PnIES.x
module
P1Sel.4 P1DIR.4 P1DIR.4 P1OUT.4 SMCLK P1IN.4 unused P1IE.4 P1IFG.4 P1IES.4
P1Sel.5 P1DIR.5 P1DIR.5 P1OUT.5 Out0 signal† P1IN.5 unused P1IE.5 P1IFG.5 P1IES.5
P1Sel.6 P1DIR.6 P1DIR.6 P1OUT.6 Out1 signal† P1IN.6 unused P1IE.6 P1IFG.6 P1IES.6
P1Sel.7 P1DIR.7 P1DIR.7 P1OUT.7 Out2 signal† P1IN.7 unused P1IE.7 P1IFG.7 P1IES.7
†Signal from or to Timer_A
NOTES: 1. Optional selection of pullup or pulldown resistors with ROM (masked) versions
2. Fuses for optional pullup and pulldown resistors can only be programmed at the factory (ROM versions only).
APPLICATION INFORMATION
See Note 1
GND
Bus Keeper
P2IN.x
EN
Module X IN D
CAPD.X
P2IRQ.x P2IE.x
EN Interrupt
Q Edge
P2IFG.x Set Select
Interrupt
NOTE: x = Bit Identifier, 0 to 2 for port P2 Flag P2IES.x
P2SEL.x
Direction
PnSel.x PnDIR.x control from PnOUT.x Module X OUT PnIN.x Module X IN PnIE.x PnIFG.x PnIES.x
module
P2Sel.0 P2DIR.0 P2DIR.0 P2OUT.0 ACLK P2IN.0 unused P2IE.0 P2IFG.0 P1IES.0
P2Sel.1 P2DIR.1 P2DIR.1 P2OUT.1 VSS P2IN.1 INCLK† P2IE.1 P2IFG.1 P1IES.1
P2Sel.2 P2DIR.2 P2DIR.2 P2OUT.2 CAOUT P2IN.2 CCI0B† P2IE.2 P2IFG.2 P1IES.2
†Signal from or to Timer_A
NOTES: 1. Optional selection of pullup or pulldown resistors with ROM (masked) versions
2. Fuses for optional pullup and pulldown resistors can only be programmed at the factory (ROM versions only).
APPLICATION INFORMATION
See Note 1
P2IN.3 GND
Bus Keeper
EN
Module X IN D
P2IRQ.3 P2IE.3
EN Interrupt
Q Edge CAPD.3
P2IFG.3 Set Select
Comparator_A CAREF P2CA CAEX
Interrupt
Flag P2IES.3 P2SEL.3
CAF
CCI1B +
_
0V
Set Interrupt
P2IFG.4 CAPD.4
Q Edge
EN Select
P2IRQ.4 P2IE.4
Module X IN D
EN
Bus Keeper
P2IN.4 VCC
See Note 1
See Note 2
Module X OUT
1
P2OUT.4 P2.4
0 Pad Logic See Note 2
Direction Control
From Module 1 1: Output See Note 1
P2DIR.4 0: Input
P2SEL.4 0
GND
PnSel.x PnDIR.x Direction PnOUT.x Module X OUT PnIN.x Module X IN PnIE.x PnIFG.x PnIES.x
control from module
P2Sel.3 P2DIR.3 P2DIR.3 P2OUT.3 Out1 signal† P2IN.3 unused P2IE.3 P2IFG.3 P1IES.3
P2Sel.4 P2DIR.4 P2DIR.4 P2OUT.4 Out2 signal† P2IN.4 unused P2IE.4 P2IFG.4 P1IES.4
†Signal from Timer_A
NOTES: 1. Optional selection of pullup or pulldown resistors with ROM (masked) versions
2. Fuses for optional pullup and pulldown resistors can only be programmed at the factory (ROM versions only).
APPLICATION INFORMATION
Port P2, P2.5, input/output with Schmitt trigger and ROSC function for the Basic Clock module
VCC
P2SEL.5 0: Input
0 Pad Logic
P2DIR.5 1: Output See Note 1
Direction Control 1
From Module See Note 2
0
P2OUT.5 P2.5
1
Module X OUT
See Note 2
See Note 1
GND
EN
Module X IN D
Internal to
Basic Clock
P2IRQ.5 P2IE.5 Module
Interrupt VCC 0 1
EN Edge
Q
P2IFG.5 Select
Set
Interrupt
Flag P2IES.5 DC
DCOR
Generator
P2SEL.5
CAPD.5
NOTE: DCOR: Control bit from Basic Clock Module if it is set, P2.5 Is disconnected from P2.5 pad
Direction
PnSel.x PnDIR.x control from PnOUT.x Module X OUT PnIN.x Module X IN PnIE.x PnIFG.x PnIES.x
module
P2Sel.5 P2DIR.5 P2DIR.5 P2OUT.5 VSS P2IN.5 unused P2IE.5 P2IFG.5 P2IES.5
NOTES: 1. Optional selection of pullup or pulldown resistors with ROM (masked) versions
2. Fuses for optional pullup and pulldown resistors can only be programmed at the factory (ROM versions only).
APPLICATION INFORMATION
P2IN.x
Node Is Reset With PUC
EN
Bus Keeper
Module X IN D
Interrupt
Flag P2IES.x
P2SEL.x
NOTE: x = Bit/identifier, 6 to 7 for port P2 without external pins
Direction
P2Sel.x P2DIR.x control from P2OUT.x Module X OUT P2IN.x Module X IN P2IE.x P2IFG.x P2IES.x
module
P2Sel.6 P2DIR.6 P2DIR.6 P2OUT.6 VSS P2IN.6 unused P2IE.6 P2IFG.6 P2IES.6
P2Sel.7 P2DIR.7 P2DIR.7 P2OUT.7 VSS P2IN.7 unused P2IE.7 P2IFG.7 P2IES.7
NOTE 1: Unbonded bits 6 and 7 of port P2 can be used as software interrupt flags. The interrupt flags can only be influenced by software. They
work then as a software interrupt.
TMS
ITF
ITEST
www.ti.com 10-Dec-2020
PACKAGING INFORMATION
Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)
MSP430F1101AIDGV ACTIVE TVSOP DGV 20 90 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 4F1101A
MSP430F1101AIDGVR ACTIVE TVSOP DGV 20 2000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 4F1101A
MSP430F1101AIDW ACTIVE SOIC DW 20 25 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 M430F1101A
MSP430F1101AIDWR ACTIVE SOIC DW 20 2000 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 M430F1101A
MSP430F1101AIPW ACTIVE TSSOP PW 20 70 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 430F1101A
MSP430F1101AIPWR ACTIVE TSSOP PW 20 2000 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 430F1101A
MSP430F1101AIRGER ACTIVE VQFN RGE 24 3000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 M430F
1101A
MSP430F1101AIRGET ACTIVE VQFN RGE 24 250 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 M430F
1101A
MSP430F1101IDWR NRND SOIC DW 20 2000 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 M430F1101
MSP430F1111AIDGV ACTIVE TVSOP DGV 20 90 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 4F1111A
MSP430F1111AIDW ACTIVE SOIC DW 20 25 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 M430F1111A
MSP430F1111AIDWR ACTIVE SOIC DW 20 2000 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 M430F1111A
MSP430F1111AIPW ACTIVE TSSOP PW 20 70 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 430F1111A
MSP430F1111AIPWR ACTIVE TSSOP PW 20 2000 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 430F1111A
MSP430F1111AIRGER ACTIVE VQFN RGE 24 3000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 M430F
1111A
MSP430F1111AIRGET ACTIVE VQFN RGE 24 250 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 M430F
1111A
MSP430F1121AIDGV ACTIVE TVSOP DGV 20 90 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 4F1121A
MSP430F1121AIDGVR ACTIVE TVSOP DGV 20 2000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 4F1121A
MSP430F1121AIDW ACTIVE SOIC DW 20 25 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 M430F1121A
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com 10-Dec-2020
Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)
MSP430F1121AIDWR ACTIVE SOIC DW 20 2000 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 M430F1121A
MSP430F1121AIPW ACTIVE TSSOP PW 20 70 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 430F1121A
MSP430F1121AIPWR ACTIVE TSSOP PW 20 2000 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 430F1121A
MSP430F1121AIRGER ACTIVE VQFN RGE 24 3000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 M430F
1121A
MSP430F1121AIRGET ACTIVE VQFN RGE 24 250 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 M430F
1121A
MSP430F1121IDW NRND SOIC DW 20 25 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 M430F1121
MSP430F1121IDWR NRND SOIC DW 20 2000 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 M430F1121
MSP430F1121IPW NRND TSSOP PW 20 70 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 430F1121
MSP430F1121IPWR NRND TSSOP PW 20 2500 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 430F1121
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
Addendum-Page 2
PACKAGE OPTION ADDENDUM
www.ti.com 10-Dec-2020
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 3
PACKAGE MATERIALS INFORMATION
www.ti.com 1-Jan-2024
B0 W
Reel
Diameter
Cavity A0
A0 Dimension designed to accommodate the component width
B0 Dimension designed to accommodate the component length
K0 Dimension designed to accommodate the component thickness
W Overall width of the carrier tape
P1 Pitch between successive cavity centers
Sprocket Holes
Q1 Q2 Q1 Q2
Pocket Quadrants
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com 1-Jan-2024
Width (mm)
H
W
Pack Materials-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com 1-Jan-2024
TUBE
T - Tube
height L - Tube length
W - Tube
width
Pack Materials-Page 3
PACKAGE OUTLINE
PW0020A SCALE 2.500
TSSOP - 1.2 mm max height
SMALL OUTLINE PACKAGE
SEATING
6.6 C
TYP PLANE
A 6.2
0.1 C
PIN 1 INDEX AREA
18X 0.65
20
1
2X
6.6 5.85
6.4
NOTE 3
10
11
0.30
20X
4.5 0.19 1.2 MAX
B
4.3
NOTE 4 0.1 C A B
(0.15) TYP
SEE DETAIL A
0.25
GAGE PLANE 0.15
0.05
0.75
0.50
0 -8
DETAIL A
A 20
TYPICAL
4220206/A 02/2017
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed 0.15 mm per side.
4. This dimension does not include interlead flash. Interlead flash shall not exceed 0.25 mm per side.
5. Reference JEDEC registration MO-153.
www.ti.com
EXAMPLE BOARD LAYOUT
PW0020A TSSOP - 1.2 mm max height
SMALL OUTLINE PACKAGE
SYMM
18X (0.65)
10 11
(5.8)
4220206/A 02/2017
NOTES: (continued)
www.ti.com
EXAMPLE STENCIL DESIGN
PW0020A TSSOP - 1.2 mm max height
SMALL OUTLINE PACKAGE
SYMM
18X (0.65)
10 11
(5.8)
4220206/A 02/2017
NOTES: (continued)
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
9. Board assembly site may have different recommendations for stencil design.
www.ti.com
GENERIC PACKAGE VIEW
RGE 24 VQFN - 1 mm max height
PLASTIC QUAD FLATPACK - NO LEAD
Images above are just a representation of the package family, actual package may vary.
Refer to the product data sheet for package details.
4204104/H
PACKAGE OUTLINE
RGE0024B SCALE 3.000
VQFN - 1 mm max height
PLASTIC QUAD FLATPACK - NO LEAD
4.1 B
A
3.9
0.5
0.3
DETAIL
OPTIONAL TERMINAL
TYPICAL
C
1 MAX
SEATING PLANE
0.05
0.00 0.08 C
2X 2.5
2.45 0.1 (0.2) TYP
7 12
EXPOSED
SEE TERMINAL
THERMAL PAD
DETAIL
6 13
2X 25 SYMM
2.5
1 18
0.3
20X 0.5 24X
0.2
24 19 0.1 C A B
SYMM
PIN 1 ID
(OPTIONAL) 0.05
0.5
24X
0.3
4219013/A 05/2017
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. The package thermal pad must be soldered to the printed circuit board for thermal and mechanical performance.
www.ti.com
EXAMPLE BOARD LAYOUT
RGE0024B VQFN - 1 mm max height
PLASTIC QUAD FLATPACK - NO LEAD
( 2.45)
SYMM
24 19
24X (0.6)
1
18
24X (0.25)
(R0.05)
TYP 25 SYMM
(3.8)
20X (0.5)
13
6
( 0.2) TYP
VIA
7 12
(0.975) TYP
(3.8)
SOLDER MASK
METAL OPENING
EXPOSED EXPOSED
METAL SOLDER MASK METAL UNDER
OPENING METAL SOLDER MASK
4. This package is designed to be soldered to a thermal pad on the board. For more information, see Texas Instruments literature
number SLUA271 (www.ti.com/lit/slua271).
5. Vias are optional depending on application, refer to device data sheet. If any vias are implemented, refer to their locations shown
on this view. It is recommended that vias under paste be filled, plugged or tented.
www.ti.com
EXAMPLE STENCIL DESIGN
RGE0024B VQFN - 1 mm max height
PLASTIC QUAD FLATPACK - NO LEAD
4X ( 1.08)
(0.64) TYP
24 19
24X (0.6)
1
25
18
24X (0.25)
(3.8)
20X (0.5)
13
6
METAL
TYP
7 12
SYMM
(3.8)
EXPOSED PAD 25
78% PRINTED SOLDER COVERAGE BY AREA UNDER PACKAGE
SCALE:20X
4219013/A 05/2017
NOTES: (continued)
6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
www.ti.com
PACKAGE OUTLINE
DW0020A SCALE 1.200
SOIC - 2.65 mm max height
SOIC
13.0 2X
12.6 11.43
NOTE 3
10
11
0.51
20X
7.6 0.31 2.65 MAX
B 0.25 C A B
7.4
NOTE 4
0.33
TYP
0.10
0.25
SEE DETAIL A GAGE PLANE
1.27 0.3
0 -8 0.40 0.1
DETAIL A
TYPICAL
4220724/A 05/2016
NOTES:
1. All linear dimensions are in millimeters. Dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed 0.15 mm per side.
4. This dimension does not include interlead flash. Interlead flash shall not exceed 0.43 mm per side.
5. Reference JEDEC registration MS-013.
www.ti.com
EXAMPLE BOARD LAYOUT
DW0020A SOIC - 2.65 mm max height
SOIC
1
20
20X (0.6)
18X (1.27)
SYMM
(R0.05)
TYP
10 11
(9.3)
www.ti.com
EXAMPLE STENCIL DESIGN
DW0020A SOIC - 2.65 mm max height
SOIC
20X (2)
SYMM
1
20
20X (0.6)
18X (1.27)
SYMM
10 11
(9.3)
4220724/A 05/2016
NOTES: (continued)
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
9. Board assembly site may have different recommendations for stencil design.
www.ti.com
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