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Vietnam 2.23:Tổ chức lớp viết báo khoa học Kỹ thuật đăng trên tạp chí quốc tế
Vietnam 2.23:Tổ chức lớp viết báo khoa học Kỹ thuật đăng trên tạp chí quốc tế
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A. Nn tng (Background)
V d 1: Electrical Engineering
Thit lp cc xut nghin cu An intelligent thermostat testing
system can analyze how environmental temperatures cause instability
in the properties of integrated circuits (ICs).
Vn nghin cu However, conventional analysis methods fail to
determine precisely those factors that influence the temperatures that
ICs can operate under.
c im k thut nh lng ca vn nghin cu For
instance, although ICs can function normally at a room temperature of
25 C, an atypical voltage, current or frequency often occurs at
temperatures ranging from 55-80 C owing to non-linear factors.
Tm quan trng ca vn nghin cu The lack of a precise
temperature test likely leads to IC failure at a temperature to 55 80 C.
V d 1 (cont.)
Mc tiu nghin cu Based on the above, we should
develop an intelligent thermostat testing system for ICs that
can control temperature changes for extended periods and
record data from an expanded USB and relay switch, while
controlling 127 groups of test systems simultaneously.
Phng php t c mc tiu nghin cu To do so,
environmental temperature can be controlled automatically.
Data for parameter settings can then be recorded precisely.
Next, hardware circuitry and performance algorithms can be
integrated. Additionally, a Windows-based application program
can be designed to record and analyze results.
V d 1 (cont.)
Kt qu d kin As anticipated, capable of analyzing
temperature-related characteristics of ICs, the proposed
thermostat testing system can adequately control
temperature variations within a range of 20 C 120 C for
127 groups of test systems on a data log every 240 hours.
ng gp trong lnh vc l thuyt v thc tin The
proposed thermostat testing system can monitor and
effectively control factors that would enable a variation in
temperature to enhance IC characteristics, lower the product
error rate, and reduce the overhead costs of IC products.
V d 2: Electrical Engineering
Thit lp cc xut nghin cu DSP modulation algorithm
profoundly impacts the operations of sensorless motors in terms of
start-up, position, and speed control applications.
Vn nghin cu Given the narrow applications of sensorless
motor drivers, determining the appropriate applications of such drivers
is extremely difficult.
c im k thut nh lng ca vn nghin cu For
instance, complying with customized requirements involves adjusting
various electrical characteristics, subsequently increasing not only the
number of pins in sensorless motor driver ICs, but also the external
chip size by 10% as well as overhead costs by 20%.
Tm quan trng ca vn nghin cu The failure to incorporate
accurate position and speed control in motor control ultimately leads to
motor breakdowns and the inability.
V d 2 (cont.)
Mc tiu nghin cu Based on the above, we should
develop an algorithm based on sinusoidal current control to
prevent a sensorless motor from stopping, through start-up
to constant speed.
Phng php t c mc tiu nghin cu To do
so, all sensorless motor-related information can be
incorporated into the proposed algorithm to drive a
sensorless motor by using DSP. The sped range of startup can then be estimated under various load conditions.
Next, the initial position of a static motor can be evaluated
to prevent a reverse forward situation of the motor.
V d 2 (cont.)
Kt qu d kin As anticipated, the proposed algorithm
based on sinusoidal current control can integrate
information from a sensorless motor, e.g., phase voltage
and phase current, while disregarding information from the
conventional sensor.
ng gp trong lnh vc l thuyt v thc tin
Importantly, the proposed algorithm can enable sensorless
motor drivers to save sensor-related costs for motor
applications. Moreover, the sinusoidal current control for a
sensorless motor can decrease the torque ripple and
increase efficiency.
V d 3: Electrical Engineering
Thit lp cc xut nghin cu Low application voltage band-gap
circuits are conventionally used in analog and mixed signal circuits.
Vn nghin cu However, conventional band-gap circuits can only
operate above 1.8v, thus limiting the minimum application voltage of
analog circuits.
c im k thut nh lng ca vn nghin cu For
instance, a low-voltage band gap in low voltage applications requires an
application voltage below 1.8 in order to extend lifetime application by
20-30%.
Tm quan trng ca vn nghin cu The inability to design a low
voltage band-gap circuit in advanced integrated circuits will not only
reduce application lifetime, but also inhibit the development of next
generation ICs.
V d 3 (cont.)
Mc tiu nghin cu Based on the above, we should
establish a current and voltage detection function in a low
voltage band-gap circuit.
Phng php t c mc tiu nghin cu To do
so, a low threshold voltage device can be tuned for reducing
application voltage component. A device model can then be
developed for SPICE simulation. Next, a new current and
voltage detection circuit can be simulated and implemented.
Additionally, the proposed band-gap circuit can be
implemented in other processes.
V d 3 (cont.)
Kt qu d kin As anticipated, the proposed current and
voltage detection function can reduce the application voltage
from 1.8 V to 1.2 V, increase the circuit lifetime by
approximately 15%, and reduce the overall application
voltage.
ng gp trong lnh vc l thuyt v thc tin In addition
to reducing the application voltage, the proposed low voltage
band-gap circuit can not only enhance the quality of analog
IC design, but also provide an accurate reference voltage for
other analog circuits.
V d 4: Electrical Engineering
Thit lp cc xut nghin cu Despite their extensive use
in multi-power systems, CMOS low-dropout regulators (LDOs)
have a slower load transient response than bipolar LDOs have,
Vn nghin cu thus limiting CMOS LDO applications with
respect to fast load changes in advanced power systems.
c im k thut nh lng ca vn nghin cu For
instance, a LDO requires a fast load transient response below
50 mV/1us to provide a stable voltage for other components.
Tm quan trng ca vn nghin cu The inability to
design a faster transient response LDO in high current change
applications will not only cause errors in other components, but
also inhibit the development of CMOS LDO in advanced power
system ICs.
V d 4 (cont.)
Mc tiu nghin cu Based on the above, we should
develop a current and voltage sensing function in the erroramp of LDO circuits.
Phng php t c mc tiu nghin cu To do
so, a current mode control circuit can be designed for
sensing the output current. A current feedback path can
then be analyzed. Next, a novel current and voltage
feedback circuit can be simulated, along with its
effectiveness confirmed during wafer prediction.
Additionally, the proposed LDO control circuit can be used
in other linear control systems.
V d 4 (cont.)
Kt qu d kin As anticipated, in addition to increasing
both the speed of a feedback signal and the bandwidth of a
control system, the proposed current and voltage sensing
function can minimize the load transient response from 50
mV/us to 25 mV.
ng gp trong lnh vc l thuyt v thc tin Moreover,
in addition to minimizing the voltage of the load transient
response, the advanced CMOS LDO circuit can not only
enhance the quality of power systems, but also provide an
accurate output voltage for other analog or digital IC circuits
As is well known, system-on-a-chip (SOC) design often
requires internal LDOs for minimizing the noise effect between
two circuit blocks. The proposed CMOS LDO circuit can
upgrade the quality of multi-power systems in a SOC chip.