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ECE - 5366
Fall 2013
1
Performed Tests
Continuity
Leakage
IIH
IIL
Power Consumption
Dynamic
Tests
INL
DNL
Skew Added during Test Plan presentation
NI PXI System
-Lab VIEW
- 4130 (1nA resolution)
- 4141 (10 pA resolution)
- 2515
Switch Executive
JMP Statistical Analysis
Wave Generators
10
Power Consumption
Connect 5V to Vcc
Connect GND
After obtaining the current, the power is calculated as:
P = Vcc * Icc
11
Power = 5V
* Icc
13
Leakage Current
Condition
VIL = 0.4V, VIH =
5.0V
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15
16
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Dynamic Tests
21
To the
Logic
Analyzer
5V
NC
To the
Logic
Analyzer
5V
CLK Fcn
Gen
Conversion
Ready Pin
5V
22
INL is the max deviation from the ideal TF (best fit line) to
the actual TF, expressed in % or in LSBs
Vref (+) = 5V; Vref (-) = GND; LSB = 5/256 = 19.53mV
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DNL
INL
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26
27
Outputs
INT
Conversio
n ready
signal
ADC
Output
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Skew
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References
31
Appendi
x
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