Measure Phase

LSS Metrics
 Module Goals
• Define various metrics used in Lean Six
Sigma
• Review examples
• Work through exercises
 Project Metrics are Crucial
• Metrics are essential for
– Determining project priorities
– Establishing baseline performance (product or
process)
– Tracking/reporting process improvements
 Key Metrics
• Six Sigma (focused on defect reduction)
– RTY (Rolled Throughput Yield)
– DPU (Defects per Unit)
– DPMO (Defects per Million Opportunities)
– Sigma Level/Z-Score
• Lean (focused on reducing cycle time)
– Process Cycle Efficiency
– Others (as discussed during VSM)
 Classical Yield Calculation
• FTY – Final test yield (or first time yield)
• FTY= (Units passing final test)/(Units tested)
• FTY is a function of the number of defective
units reaching final test and the efficiency of
detecting these units
• What is wrong with this metric???
 In-Process Defective Yield
• Often defective units are counted at
various process stages
• In-process yield (Units out/Units In) for
each process stage
• What is wrong with this metric???
 Nomenclature
• Number of operation steps = m
• Defects = D
• Unit = U
• Opportunities for a defect = O
• Yield = Y
 Basic Relationships
• Total Opportunities
TOP = U*O
• Defects per Unit
DPU= D/U
• Defects per unit opportunity
DPO = DPU/O = D/(U*O)
• Defects per million opportunities
DPMO = DPO*1,000,000
 The Hidden Factory
• Using FTY ignores the hidden factory
• Final test performance is a function of inspection
and test – not actual defect data
• Defects need to be detected and repaired
• FTY counts defectives at Inspection/Test
• RTY counts defects through the process
 Yield and the Hidden Factory
Items in = 352 Circuit Items out = 347 Here we see that there were actually 103
boards that did not meet spec the first
build time. Each were reviewed. 98
corrected/passed, and 5 had to be
(98) scrapped.
inspection Pass
First Time Yield = 249/352 = .707
First Time Yield = 70.7%
Re-work (103)
The Hidden factory accounts for 98.6 –
Scrap “The Hidden Factory” 70.7 = 27.9% of the production
(5)
 IPY and RTY
• IPY can be calculated by dividing the
number of successes in a process step by
the number of attempts
• RTY is calculated by multiplying together
the all of the IPY’s
 The Process Yield Metric
IPY = exp(-dpu)
• We count defects not defectives

RTY – Rolled Throughput Yield

– Probability of any unit having zero defects
– Is the product of the in-process yields

RTY = IPY1*IPY2*…IPYn
 Rolled Throughput Yield, (RTY)

Calculating the Rolled Throughput Yield, (RTY).

 Rolled Throughput Yield, (RTY)
• Or … if we know the DPU total count from each individual work
station, we can use the probability equation with the TOTAL DPU

• Example: A process has an individual defect count through from

each individual process totaling 75 defects for the month of
production that launched a total of 400 units through the process.
• Total DPU = 75/400 = 0.1875
• = 0.829 = 83%
 Opportunities for Defects
• Active vs Passive
• Active counts every possible
measurement as an opportunity
• Passive involves using the opportunity
count as a relative measure of complexity
eg parts+connections on a PCB
• Method is not important – consistency is
 dpu
• DPU = (Total defects observed)/(Total
units processed
• IPY = exp(-dpu)
• RTY = IPY1*IPY2*…=exp(-dpu1-dpu2..)
• Ie RTY =exp(-dpu process)
• Also dpu process = -ln(RTY)
 Exercise 1
• Five defects are observed in 623 units
produced
• What is the DPU?
• What is the probability of obtaining units
with zero defects?
• Challenge: What is the equivalent Z-
Score?
 Exercise 2
A process has defects described as Types A-F. Data was collected for
the number of defects (D) and the number of units processed (U). OP
is the number of opportunities per process step. Complete the following
table:
Characteristic/
Defect Type D U OP TOP DPU DPO DPMO
A 21 327 92
B 10 350 85
C 8 37 43
D 68 743 50
E 74 80 600
F 20 928 28
Totals 201

Create a Pareto chart of DPMO by failure type.

How does this help us focus our efforts?