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Creep failure time prediction of polymers and polymer composites

Chi-Squared Accelerated Reliability Growth (CARG) Model - PDF

Parker EPS Seal Shelf Life

JAN-JANTX-JANTXV-JANS_MIL-HDBK-338-V2_Electronic_Reliability_Design_Handbook_15_Oct_1984_pp_380

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Origin of Thickness Dependent Dc Electrical Breakdown in Dielectrics

DTIC_ADA303506