NOT MEASUREMENT SENSIUYE h MIL-STWI05E 10 MAY 1989 SUPERSEDING MIL-STD-105D 29 APRIL 1963

MILITARY STANDARD
SAMPLING PROCEDURES AND TABLES
FOR INSPECTION BY ATTRIBUTES

AMSC N/A
q

AREA Qcil

~~~

& Approved for public reiesse; dktribution

is Unlimfi

!QL-SID105E

DEPA~ W DEFENSE Washbgmn, DC 20301

SAT*LDG

P~

T I!NDZABES FOR INSP=TI@JBYMTNBUES

and Jqencies 1. Ttis tilitarystandad is approvedfor use by all Depsmmms of ~~~ of ~f- . ~.ts Cemmm&tiom. additions,Wetions) and any 2. Beneficial peeine.ntdatawhi~ may beef usein~this~ shouldbe addressedto: CnRInancier Dwelopnent Amy AmamE!!!Rem-a, +-king Ckmer M-IN: SK?R-BAC-WBM!J . 6 Picatinnytisenal,NJ 07806-5000
Us.

and

by usi..g the self-a=-essed&.andardizat ion Dmmmt (DD Fom 1426)~L-hq at the md of this docmmt

m~ or

PrepSal
letter.

ii

MZL-SIZ+1C5Z

mRE3m*

ms

providessawling proce&res and referwm

tables for use in are

on the pxobabiiis.ic recu.+mce 05 e%.ts when a sa~ies of-iots or bat~s produ~ ti a stableenvironmrt.

of an This publication shouldbeused to guide the user in the ~kpmnt inspee.ion Stratw that providesa co=. eff~ive qroach to attaining ats. The ca%racaual te-&%i~ reqJ cm-:idm~ in pro&t ~liance with user is warned of the assumedrisks relativeto the *sem sanple size and
w-.

~ifications shouldnot contakn requirement s for use of specific Q.z?s , !23Z shxld .!y provideAQLs or H?Ds as a -~rmem. pkns fc= coxinuous, rahr than lot inspection,are contm M

iii

~L-.STD-lO5E

GmTmTs Page Paragraph 1. 1.1 1.2 2. 2.1 3. 3.1 3.2 3.3 3.4 3.5 2.6 3.7 3.e 3.9 3.10 3.11 3.12 3.13 3.14 3.15 3.16 3.17 3.18 3.19 3.20 3.21 3.22 3.23 4. 4.1 4.2 4.3 4.4 4.4.1 4.4.2 4.4.3 SCOPE............................................... -se
*liation

1
1

........................................... ....................................... ...............................

1
1

~IxmPEursW.

qplicable ....................................

1 1 2 2 2 2 2 2 2 3 3 3 3 3 3 3 3 3 3 4 4 4 4 4 4 4 4 4 5 5 5 5 5

=INITIONS .........................................
Acq.able Qdality Ievel WE) .................... Average Outgo ~Quality (lQ) .................... Averaoe OutqoingQualityWt (AOQIJ ............. Classification of Defects ......................... CriticalDefect................................... CriticalDefective ................................ Defect............................................ D@eccive. ................ ........................ DefectsPer Ru@edUn its... ...................... .................................. ~i~...... ~aim by Attribxes .......................... w&or Batdl...................................... Im or Batch Size................................. Major Defect ...................................... Major Defective ................................... Minor Defect ..................................... Minor Defeaive. .................................. ................................. PercentDefective ................................... ~s Average Sanple ............................................ Sanple Size COde~tt=v ........................... Salq?ling Plan..................................... unit of Procalct ...................................
q

~mxm=nm

. . ... ....... ... ... . ... .. .. ......

................................ Written ~ NmcVnfozmne .................................... Fonmticm and Itificatim of ~ or =Cks. .. ............................................... ......*... ........................ ML use...0..... Umkation ........ ............................... choosingAQU .....................................
q

iv

mL-sm-lo5E

CcNTmrs

Conttiued. Page 5 5 5: 5 : 6 6 6 6 7 7 7 7 7 8 8 8 8 8 8 8 9 9 9 9 9 11 13 14 15
16 17

Paragraph

~B~ Sarrpling. ........................................ .......................... Representative San@.ing 4.5.1 .................. .............. The of Sanpling 4.5.2 Double or MQtiple Sampling ...................... 4.5.3 .................... ....... 4.6 ~on P~ ............................. 4.7 WitdlirlgP~ ......0... .................... Normalto Tightened 4.7.1 4.7.2 ................... Tightto Normal .....0.... .. ..............*.....**...**.. 4.7.3 Normalto ~ ................................ 4.7.4 Rduced to Normal 4.8 Disconthtion of~on... ................. 4.9 SanplingPlans................................... 4.9.1 ............. ~ion Wvel .................0.. 4.9.2 Co& utters ..................................... 4.9.3 ~aining San@ing Plan.......................... 4.9.4 TYF= of sapling Pkns .......................... 4.10 Determination of~ability. .................. 4.lC.1 P~Defective~ion. .................... 4.lC.1.A Single Sanql@ Plan............................. 4.1(?.1.2Double Sa@ing Plan............................. 4.10.1.3 FhltipleSanpling. ....... Plan.......... *........ 4.10.1.4 ~ for Redu*IrqeCtion ......... p~ 4.10.2 ............ DefectsPer ?lundmdt?nit s~ion 4.11 Idniting@ality Protection.. .................... 4.12 ~s .................*. ........................ 4.12.1 ~t@~merkic ~ .................. A~ge Sanple Size Comes... .................... 4.12.2
q q q q q

5. Table I.
II-A.

...............*.. ........... TABES .............*...* Sa@e Size Coda Mitters.............. o.......... Single San@ing Plans for Normal~im Naster table) ...................... Single Smpliq Plms for Tightewd ~i~ ~=t~le) o.. o-oooo= ==oo. =.e .... Single Sapling Plans for ~ ~ia (Mas@rt able) ...................... Double SamplingPlans for Normal ~i~ -a~le).. oo......o. BOO ....... Dcxble Sapling Plans for Tight~m ~er=e) ...................... Double SamplimgP1.ans for Reduced ~im (Master table) ......................

II-B. II-C. III-A. III-B. III-C.

18 19

MIL-STW105E

mtnmrsTable

Conthued.

Page Mltiple Sa@ing Plans for Norml Inspectim M3ster-le) ...................... M.dtipleSanplingPlans for Tightened IV-B. ~im (Master taMe) ...................... Mdtiple SamplingPlans for ReduOed TV-c. Inspection(Master table) ...................... IAmit F~s for V-A. Average Outgoinguty lwml~on (Sin@e Zq) .....-.. .o.. V-B. ~ge Outgo* QualityLimit Fa=ors for TightenedIMpeCtiOn (S=le ~1~).:...-.. %3-A. uting Quality (h Perumt Def-iue) for Wch a Pa = 10% (forNomal Inspemion, S~le Saxrpling) ....................-. .-...-*o LimitingQuality (inDefectsper ~ V3-3. Unks) for which the Pa = 10% (forNozmal Inspection, Single Sanplhg).-..-------------XI-A. Unliziq Quality (inP~t mfecti=) fo~ khid. the Pa = 5% (forNom@ ~ionl SingleSawling)...................... . ......... LimitingQuality (fiDefectsper Hmdma VII-B. Units) for which the Pa = 5% (f= W* ....*... ........... Siwle S=@@ ~m, ~*~1Li,mit Nmbersfor ~ Inspection... .......... Auerage SampleSize Cumes for DDuble and IX. FmltipleS.mpliq .. . ..........-...--. -......-.c~ltig pl= and cparatirq ~amic Cumes (andData) for: San@e Size ~ktter A........................ X-A. X-3 . Sanple Size ~Utter B ......... . ............... x-c. Sanple Size Mkter C ..........e00-00 o... .... X-D. San@e Size Co& LetterD ........................ X-E. Sanple Size ~Utter E ........................ San@e Size Mletter F ........................ X-F. Sanple Size MUtter G ...............--.. -..x-G . X-H. ~le Size @ckletter H ........................ X-J. qksM-~ J............*.... X-K. Sauple Size MIetter K .......----------------X-L. ~le S~M~ L ........................ x-M. Sanple Size M~M ...........e.. .......... X-N. San@eSizeM E~N . ....................... Sal@esizeM wtterP . . . . . . . . . . . . . . . ....... x-P. ~le S~Mk= Q.......*+ *. ==.*+*..= x-Q. X-R. ~le S@ Mk=R ..................= ~ IV-A. 20 22 24 26 27 28 29 33 31 32 33 34 36 38 40 42 44 46 48 50 52 54
56 58 60 62 64

vi

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CCNTS

- Continued. Page

x-s. Paragraph
6.

~~e

size ~

~tt~v S ........................
. . . .

66

........*. .............................
Intf2nckci

6.1 6.2 6.3

use................................... (keyuofi) tist~ ................ Issw . . . . . . . . . . . . . . . . . . . . ~fr~P~im

SubjectIem

67

67
67

mlmsAL. .............................

68

F2L-SID-105S

1. ~~~ This ~li=tim establishes lot or bat~ sapling plans and 1.2 Pqse. publi=tion shallnot & irfterproceduresfor ~ion by attributes. 1nis words s. m p.reted to superm3e or confli= with any amtraCtti ~ to the contractors use of refer only a~, acceptable* e tc, awqX, ~anddonotinplyana~ W the sanplingpkms Writin this erfnination of aqability by the -the Gove&mmnt to accept any prcdom. Det me Sarfpling plans Gwen :=% shall k as desm~ in contractual ~ts. *sdhd in Ws standad m awli-le to Us of .01pe~t or ~~ and arethe.ref ore not suitablefor ++lications where quality1-1s in the defemive ;az.s per million range m be realiz05. are applicable,

items. a. ElrIc b. Cmponents

c. Qerations d. Materialsin process. e. Su@ies in storage.

f. Maintenance~ations. 9. Data
or records.

h. Mmbistrative ~Theseplans are intendedprimarilyto be used for a continuing series of lots The plans may also be used for the inspection of isolatedlots or 0: batches. Mches, W., in MS latter=, m = K =i~ to ~t ~ ~m mrves to find a plan whichwill yieldthe desiredprotectim characteristic (see4.11). 2. 2.1 N&. -liable. 3. =INITICNS

FEL-SIW105E

~able QualityLevel (ML) . When a mntinuous seriesof 10Es is 3.1 z considered, the AQiiis tbe qualitylevelfib, for the roses of sa@@ ~.ion, is the limitof a satisfactory processaverage (Se 3.19). NOTE: A sanpl~ plan and an AQL are chosenin accordanm with the risk assured. Useofa@ueoflQL fora a2rtain&!fector group of &fec5s indicam that the pbded the ql~ PM till acoeptthe -t majorityof the lots or bata prooess -X level of ~ defectiwe (or&fects per huxlred units) in these Thus, the AQL is lots or batchesbe no greaterthan the ~ignated value of A& a ckignated value of ~ defective (or&facts per hundredunits) for fich ~re bing used. The btswill~a~+m~oftk timbythesaqlingp of a~ ~liw pl~ prfi~ here~ ~ ~ ~ tit ~ p~i~ty at the ~ignat~ A@ ~ue ~ ~ the sanplesize,~ Z~N ~Xr :0= 1~~ samples -n for mall ones, for a givenAQL. The AQL alone does not idelm=if y the chanoes of aqing or rejectingindividual 10Ls or batches M m...-y frun a seriesof lots or batches, dire~ relates to what might be ~ed to prmi- * steps indi=ted h -s publi~tion aze taken. lt is ~sary the relative ~ of t.te plan to *texmine =eYer to the operattigdarad.=iscic risks.

. The M(2L is the maximum ACQ fora 3.3 Average Qxqoing QualityLimit (ADQL) ML tiues are givm M 9L~ a9L~~ -lW pkn. Factors for ~@? Tabie V-A for each of ~ singlesaqlimg plans for normal irqection and in on. Table V-3 for each of the singlesmpling plans foz tightened~
of defectsis t!! enumeration of 3.4 ClassifimEion of Defects. A classification of the unit of pxduct classified amrdirq to their seri~. pcsstiie defects

3.5 Czlti~ DefS&. A criticaldefect is a ~fect that j~ and ~ri=ce ~mte would result in hazardousor unsafeconditions for individualsUS*, ~ ora ~fecttbat~ti --, or ~upontheprodwt, of ttE ~cal fun-on of a indicate is likely to prevent perf~ experim title. major * itm SU* as a Ship, aixuaft # tank, nbsile, or ~
3.6 Critidl Defective. A criticalckfectiveis a unit of prockt uhi~ contti one or mre criti~ defectsti may also contdn mejor and/or minor defects.

3.7 Defect., A defect is any nonconformanm of the unit of product with specimTEi%@l=mts .

laksm-lo5E

3.8 Def-.ive. A def=~ive is a unit of productwhich containsone or mre defe.s.

Defe.s per HunckedUnits. The nwber of defe=s per hundred units of ~Y gim quantityof units of productis one hundredtimes the mm&r of &fects being possible in any unit of product) con=zinedtherein (one or mme *fec&s diviti by the total nunberof units of product,i.e.:
3.5
Defects

hundredunits

Nunberof &fects x Nmbar of units ~~

100 testmt

~gt is the processof ~imt 3.2C Impaction. Inspection cr o-.?m.isecmparing the unit of pmdu~. with the reqair-nts.
7,1i ---

T ~io~ by Attribtes. Inspectim by attributesis inspection whe~ eizher & unit of productis classified simplyas defectiveor non+ef=eive, or to a givm ~he number of defe~.sti the unit c= prcdue.is courted,with re~st ~~:i~m or set or requirements.

lot or or -t&l. The term lot ox katch shall man inspection 3.12 tit of units of product from whi~ a sanple i==se.ion batcb., i.e. , a collee.ion is EC be dram and i~ed md may dif5erfrm a mll-~ion of units designated as a 10= or bat~ for 0= purposes (e. g., production,shipnent,etc. ). 3.13 bt or Batch Size. The lot or ~t~ A a lot0:bata. size is the number of units of prtib

3.14 M3jor Defect. A major defecL is a -fact, other than criti-, that is liKelyto resultin failure, or to reducemateriallythe usabilityof the unit of productfor its int~~ajor * f~i~. A major defectiveis a unit of product whid? containSone defecLsbut containsno aiti0: mre major defects,* may alSO contain rrtior defect.
3.15

isnot-yto~ 3.16 Minor Defect. Anbm~i.Sa&fti~t materially the usabilityof the unit of productfox its intpuzpose~m is e ~WviIgU*~@m tkeffeCtiWUSec fran ~ &par&m operatim of the unit. 3-17 Minor - . . . Def-i-. --ox more minor &facts
mtamtains

A minor defectiveis a unit of P-a M* no aititi or major *feet.

!!GL-SB105!2

3.16 Per-m Defective. The percent &femive of any givm quantityof units of produe~is one hur&4 tires the n~of defemive units of prda~. contairEd thereindiviti by the total mmber of units of produa, i.e.: ?ercentDefective = Nmber of &fectives x ~ of lmits ~ed 100

s average is the average~t &fective or 3..19ProcessAverage. The Droces of product averagenmber of &fects pez hw@red units (whichever is ~li~le) szhitted by the sq@ier for originalinspection. Originalinspection is ~ firstinspection of a pa.z.zicula.r quantityof produceas d.istinguis@d fran the ~ion of productwhi~ has been resu&nittedafterprior rejection. 3.2C Sa~le. A sampleconsi=.sof one or mre u..irs of product drawn fran a 10= to their or &z&, the units of the sem@e being sele~beda= randomwithoutrq~z:icy. ~ nmtx= C: units of product in the sample is the sarplesize. 3.22 SampleSize Coae Utter. ElO.ng Witih the WA fcr l-tins
3.22

The sanple size code letter is a deviceused plans. a sapling plan cm a table cf sempling

A sanplingplan indc!caces the nunt?er of units of product Sa?@hg Plan. ad (sanplesize or seriesof fromeat. io= or bat&. which m to be insoect sa@e sizes)and the criteriafor cke.rmi.%ng the acceptability of the lot or batch (acceptan02 anc rejectionnumbers) .
of Prodxz . The unit of produ~. is the thing inspectedin o-r to ?.23 Unit &.emme lts class if~mtion as defectiveor non-def-hive or to count the ~ of +.fecbs. It my be a single article,a p&ir, a set, a hmgth, an =8 ~ operation, a volme, a cmpcmmt of an end product,or tlw end prociuaitself. SWPIY, The unit of p~GL may or my not be the same as the unit of ~, production, or sh.ipnent.

4. QN=AL

RmJIm=m

are o~ily daveloped ami made 4.1. Written P~ . Written p~ Ves~,lqmnmquast. -avaalablefor * Govemmm ~ writtenp~ indime me of this stmdard, they shall amply with mq111 raErltsof this stmdard arxlZefermce appropriate ~ as ~. ofpro&ct sbaube=rP=4.2 Nonconformance . he extent of nonconf~ titS. eitherin terns Of peroentCkfectiveor in term of ckfectsper ~

MIPSTD-105E

4.3 Fo.mationand Identification of Uts or Bat&es. Theproductshauke as-led into i-tifiable lots, -lots, batches,or in otkr manneras may be paaibed . Ea* lot ox bat~ shall,as far as is practicable, mnsist of units of prcduct of a singletype, grade, class,size, and composition, . manufactured under es-tially the sam renditions, and at ~ythesam tine . The lots or batshall be itified by the contractor and shallbe ke intar.in adequateand suitablestoragespace.
4.4 AQL.

. ~ ln&?Lnc

4.4.1 AQL use. The AQL, to@ther with the SaupleSize b& plans p.mcw herein. . the sapling

Letter,is used

for

4.4.2 Iimita:ion. The selectionor use of an AQL shallm. inplythat the cwcractor has the right to sm@ y any defecEivewilt of product.

4.4.3 Chmshc ?@&. Diff~t ~Ls IllSy be Chosenfor ~ of &fects cms.ide.red colle.+.ivel y, or for individual &fee&s. An ML for a groupof &fec my be tiosen in a~cion to AQM for individual defects,or mkqraps, within chat group. AQL values of 10.0 or less my be expressed either in ~t &fective or *. ~fects ~- hunckd units;those over 10.0 ZhaU be qressed ix defe.s per h!mdmd units only. 4.5 Saxlplinq. 4.5.1 Repmsmt ative (Stratified) Satrplinq. When ~ropriate, the rnzr&r of units in the sanple shall & sel~ed in proportion to the size of subletsor -bat-, or -s of tM lot or bat~, idmtified by q rationalcriterior when represemathHaIcpMn giswad,121e units franeaal Sublet,sub-batch or part of the lot or batdi shall be selected at ranch. 4.5.2 Time of SanPlhq A samplemay be dram after all the units caprising the lot or batch have bi+en assembled,or sarrple unitsmay be drawn duringassak of the lot or bat~, in uhi~ case the size of the lot or M* till k *te* kefore any ample units are dram. If tk sampleunits are drawn duringas~l~ oftklot or batda, mdif tkrejectionnmb2ris ~m!foreth lotis Curpleted, that pomim of U lot almldy cxmpleted shallbe @ected. m a oftkdefective ~shall bedmermined and ammctive actiontaken,after *. &ichanewl otorbat*shgd.lk
4.5.3 Double or Mltiple Saup 1~ WherI &&le or mkiple sauplingis to be used, ea~ qle shall be selecte&Ovar the entire lot or bat~.

IaL-sIwlc5E

~ion Pr~. Normal inspection wink-at the startof shall continueundwqed for inspection. Normal,tightenedor redu~ -bion an sumsive lots ox batd7esexq. where the each class of def~s or &fectiws *1 givm klw require -. m swit~ P~? p~ %it~ oz &2f_iveS ~ <Y be -lied to each class of ckfecSs
4.6 4.7
%?it-

P~es

normal inspection is in effect,ti@tened 4.7.1 Normal to Tightened. ~ *mim shallk instituted whm 2 ouc of 2, 3, 4, or 5 comecutive lots or tted lots batches have been rejetted on originalhspection (i.e.,ignoring~ 0: btC!!S fOr thiS Fr~) . 4.?.2 Tig?l:enee to No.mal. When tightened~ion is -b effect,no.mbal inspecuon shailbe instituted *=I 5 consecutive 10:s or baccbeshave -n on. co.nsidey-a-ptable on original~ 4.7.3 No.mal to R@xed. When normal inspection is in effect,reducedir++ion shal 1 be -.ituted providedthat all of the followi~ conditionsare satisfied: (ormre, as indicated by EYW note tc 6. Tne pretig 20 lots ox batTa5~e VIII) have bee!! on no.mal ~ction aiid all have ben acceptedon original inspection; and
total nurber of ckf-i= (orbf~) fi ~ ~~es ~ ~ b. The. p.re ceding 10 lots or batches (orSU* Ot&r mmber as was used for conditiona -) is equal to or less than the a@i-le nmber given in TableVIII. If dable or mikiple smpling is in use, all samplesinspectedshouldbe ~ti-, +les only; imd

Pro@cLion is at a steadyrate; and RE!cked~ on is consi&rr &sirable. is in effect,normal inspection on originalinq3acEcion:

4.7.4 RedWed to Normal. _ ~ ~ion follcwingomu shallbe instituted if any of a. A lot or bat~ is rejected;or b. A le. Or batd) is comi4.10.1.4,or c. Productionbecmes -= d. Other conditims ~ant

acceptaMe under the procedueS of or dela~; or

that normal inspection shallbe instituted.

MIL-SIW105E

4.8 Discontinuation of 1~ ion. If the cumulative nmber of lots not acce~.edin a sequenceof mnsecmive LuLs on originaltightmed inspection r~achesfive,the acceptan~ prm3dures of this standardshall be discontfiued. Inqlm un~- the provisims of *this standardshallnot be ~ until mrrective actionhas ~ takZ7. Tigthened~ion shall then be used as if 4.7.1had been invoked. . 4.9 SanplinqPlans.

4.9.1 Inspection M. The inspection level &termines the rela+~onship ~ the lo: or &t* size and the sanplesize. Thehspemion levelto be used for any pa.mieti~-re@~c will be as prescribed by the contractors written Three in.spec.ion levels:I, II, and 111, are g:van in Table I for --es. P-~ ge-.-erai use (see4.1). Normally,hspee~ion Level II is us-. Hmmmr, In~=.ion @vel I my be used whm less dis=wtion is needed,or Ievel 111 my be used for greaterdiscrtition. Four additional speciallevels: S-1, S-2, S-3, mti S-4, am gimn in the same tabie and my be used where relaciveiysmall sanpiesizesace necessaryand large sa@ing risks can or W. & mlerat~.
N3TE:

In the selectionof inspee.im ievelsS-1 tc S-4, ~ must be exercised avoidAQii mm.asistent witi. these ~eion levels. Lm OLk words, the ~ inspemion levels is to keep sanplessmall when ~saxy. For of the special in.stanae, the code iectersunder S-1 go no funk: than D, equivalentto a siql sanpleof size 8, but it is cf nc use to choose S-1 if the AQL is 0.10 ~. f which the mhinm ample is 125. Sanplesizes are designated by wck letters ..Table I shal 4.9.2 Co& Letters. be used to find t& applicable co& letterfor the ~icular lot or batch size and the p~iked impectl on level. 4.3.3retainingSallp lillg Plan. TTie AQLandthe m& letter shall be usedto =ain tne sanpl.irq plan fran Tables II, III, or IV. Whm no sapling plan is availablefor a given cabination of AQL and code letter,the tables directthe user tc a different letter. Thesa@e size to beusedisgLvm bythenew co& letter,not by t& originalletter. If this p~ leads to differentsample sizes for diff~ classesof &fects, t& code letter m ~tothe . ~ sa@e size derivedmay be used for all Classesof defec+s. & an alternative to a sirqle sauplii plan with an ~ ~ofo, the plan with an a~ ly Mqer sauple size for e m.mberof lwithitscomeqmmbg &signated AQL (wkre available), may be ~.

MIL-SID-105E

ling Plans. Three types of sapling plans: Single,Double, 4.9.4 Types of Sanp several and Wlziple, are givm h Tables II, III, and IV, respectively. Whe!! :ypes of plans are availablefor a given AQL and code letter,any one may be used. A decisionu to t= of plan, either single,double,or titipler ~ ~l~le @ * letter, will ~ly & ~ ~ * ~ison bet= for a given ~ diffitity and the ~ge sanple sizes of the availableplans. the administrative 7he averageszmplesize of multipleplans is less than for -Ie (~ M ~ case co.~ to si@e aqance n-1) and both of these m always less than a si~le qle size (seeTable IX). US@lY m ~~a~ve difficultyfor singlesmpling and the cost per unit of the sanple are lessthan for double or mltiple. 4.lG Daennina:ia of Amsmability. 4.2G. I Pe~nt Defeaive Inspection. To determinea~ ility of a lot or bate!! mder percentdefectiveinspection, the appli-le. San@@ plan shallbe used in accodance with 4.10.1.1,4.10.1.2,4.10.1-3,@ 4.3~.l.4. 4.IC. I.2 Shgie SanpLingPlan. The n- of sanpleunits inspecxedshallbe qua2 tc the sanplesize givm by the plan. If tk n-v of =f-.if~ the sample is equalto or less than the aqan~ rnmber,t& lot or bat~ shall m considered aqable. If the nmber of &feccives is equal to or great-than the mjemion nwker, the 10= or bat~ shall be rejected. 4.10.1.2 Double SamplinqPlan. Anuberof sa@eunkS6S?ud to the first sa@e size giw by the plan shallbe inspected. If the mmber of def=ives found m the firstsanple is equal to or less than the first~ nmber, the lot or bat- shallbe consia~le. If tb ~ of W-W found inthefirst sample is equal toorgmater than the firSt z@eCtim~l the lot or batd shallbe rejected. If tb nmber of &fectives fomd in & firstsanple is betweenthe first~c and rejectionxnzc&rs,a ~ sanpleof the sane size shallbe ~ed. TM ~ of a-i= fin the fixst and secmd aanpks shallbe ammlated. If the ~tiw ~ of mmber, the lot or batd *fectives isaqualto or less thanthesemnda~ shallh cmsickred a~le. If the cmdative rnmber of &fectives G equal toorgreaterthan~~ rejectim~,t&lOtOrk* aballbe = jetted.

im. 4.10.1.4 special P~for~xnSJect Xed13=d ~im * Sanplingpmoadura may t~ or rejectionaiteria Withult aith=ac=pt== m-- ~ *l~or=*~~be-acceptable, but normal reinstatedstartingwith the next lot or batch (see4.7.4.b) .

8
.

mL-Slmlo5E

a-ability of a 4.10.2 Defectsw Hundredunits Inspection. To &temine ~ ion, t& promdure specified k&feCts ~ hundredunits ~ lot Or batti for pemem 63feGive inapecxion above shallbe -, ex~ that the woti defects shallbe substituted for ckfectives.
4.~1 ~i plans and associated~ mg QualityProtection.The sanpling given m this @liatim were designedfor use _ the units of product are prodmed in a continuingseriesof lots or batches mer a period of tire.~t the lot or batti is of an isolated mm, it is ~irable to limit the with a ck2signated ML mlw, Z =lec&im of sarrpling plans to those, associated prouidenot less than a ~fied limitingqualitypmtectim -W pldns for this purpose-. be selected by dmosing a LimitingQuality (L@ and a ~s risk to be associated with it. TablesVI and VII give values of W for the If a the cmnonly used bonsmers risks of 10 ~at and 5 ~t ~bively. s risk is recpired, the O.C. cumesandtheirtabutiffe.mc value of co~ lazed valuesmy be used. The conceptof IQ may also be useful in specify+q the on Levels for a seriesof lots or bat-s, thus fixim mimmm L-L and ~~.i s*ie sizevhere there is saw reason for avoiding (withmre than a-gima corsmers risk)more than & Limking p~rtion of def-kives (or defects)in any single lot or bat~..
q

4.X2

Cum?es.

The qerathg ~ctaistic mmes for 4.12.1 @crating Characteristic ~s. shown in TableX, indi~=e the pe.roentage of lots or kt~ normal -~ion, whAti may be ~ed to be acceptedunder the various sapling plans for a given pmoess @ity. The mmes shown are for single sapling; cumes for tile and mlziple saqling are xmtchedas closelyas p-i-le. The O.C. cumes shown for AQIs greaterthan 10.0 are based on the Poisson&ibution ti are ~li~le fo= defectspax hundredunits i.nsp&tion; those for ~ of 10.0 or less and sanplesizesof 80 or less are M on the binanialdistrikmim and azz applicable for perdefecLive ~-ion; those for AQE of 10.0 or less and sarplesizes1-than 80 am based the Poisson distribution and m ~li-le eim- for defeczsper hundredunits hsoection, or for percent de@ctive .Onto the inspection(thePoissm distribution &&g an ~te q~ timid distrih.tim these conditions) . TaMhted mluas, selectedvalues or pmhabilitiesof aqanue (Pa,in ~) are gif= a& on, and for Mofth CUmes -, an& in addition,for tightenedimpectx perhundred units for ZoflO. O orlessand sauplesizesof800r less. 4.~2-2 Amage Sqle SizeOzrves. Averageample size mrves for ~le @ show the averagesa@e sizes wMA may mltiple sanplingam in TableIX. = levelsof prooess be qed to omzr un&r the varioussa@ing plans for qcumailmnt of ~im aml are ~roximte quality. The the m-t tha-m e= upon the Poissondistribution, and that the s&e sizes for double and multiplesamli.ngare assmed to & 0.631n and 0.25n size. respectively, where n is the

MIL-SlW105E

SEXZIC)N 5
TAW3SANOG7E7VES

<4<

<ma

C=W

Vvu

=aa

CODI
LETTEN

1.3

SINGLE NORMAL

14

TABLE
satnpling
itlspeclitm

11-6 Single
plans (Muster table)

/or tighened
(s0? 4.9.3

and

4.9.4)

do. b. M@ ldJ km . 0.40 I.e

MO

Ialu

4 e a s

a n to s w #w M ao ns SW we la 01 01 01

Ii

!
1?
r) )4

II

..

o 0
12

n 9

MIb~105E

SINGLE REDUCED

16

-SK)-105E

17

DOUBJ NORMI

.. .

(5ee4.9.3.ml 4.9.4)
A,.,sl.l.l. 1,..,1.
$, 1....1. ,..,..,,,8

. I,,, b,. . ..l

q

,I,lbl ( ,Iti+,

l,+

*V*?

l
I b

Idle, l:. t. II
1.
h

I
I 1. Il. II 4.

11

,,

, It 1, *

_LL
.
(

. . ;>
II

? ?

t:
. i

1
b

61 13 I

II

*
:

VI

I n
n n
I
q

---l=

?! 6:

e
Ilu II*

hew ,+1.,
PI.,

c-Il..

m
e-a~w

h,,,*,+ ., ,1,. - n,,.~,rw. q 8d94

.,.aI,

l-k,. urn*I,,,., me

11 s*w1..*I.

.w,I.-.

.,,...1. l.. e. tn. wh .,,.

tm ,.. ,., ,.,, -, ,,,.

..I,,

IIW pha h,

.h.m.11..l,

441. . ...1..,+

1-1..

.h.

w . ..4.!1.1

DOUBI mua
u

MULTIPLE NORMAL
20

KUF~105E

.1

I 1
I
G ..
---*

.:

; I .8 -----}!-! H sl~l----~
-.--.w.ei -------

1.- ----C.. --.

.----~~
--.--*3

a---=:~

-.o===~

....-

Z=Z:
-m-:=

-00 -------q   &&

+ .. *+.-..

*----

------------

-*j..-*

*- *-..:

s -----

.* -----

------

D-

n-----

.* .0---

1----l ----.- o-a..

-----

.--.--

m-. ***-

f .
r

. . .. ----

.0

-----

.. ---.0 ----..---?!

9 .. -.--

=m
. -----1.----I
.-r. .. ----*.-

..0---

. ..----1.*-*-.
* -.. .
------

I I

1
..

. ..0---1

-------

II ! I

21

aa

l=lsl=l
m
d

1=
o..-gn ---

-o=:~==

--1===---=1A

-,-

*--0-------.-------. ...=

0-...=: .-

-------I ..-----1 ------- ----.-~ ------I ------.--

jz
i :.-

i:i +

E
2 a a :

-:

i-----=: ------~
.- ---0

~ ---=:== --.====
0--.--

-.*

+1::::::: ::::::: :::::::1::::::: -------1 -------, -----:=1---;2 ! ;:::::: -,. 10 ~

.-...,.. . ..-

=1=1
-- -0 0 .0.=:

00---.

I 2 l+

II

-----51-------

0---.-

1 ------

i-------

I----q

= e.i Iiit

. d

:010

[11

ecw. :. ..

MULTIPLE TIGHTENED

22

MULTN TIGHTEN
23

! r
: =

MULTIPLE REDUCED
24

MULTI mu
25

TABLE
Factors
q

V.A Average
/or Ntmnd

Otdgoiug
fwspecjion (Single Jam@iwK)

Qwdity
(see

Lhd

3.3)

SkO .01 .02!

2.s 6,5

10I 40 62 69 65 63 M 34 24 22 14 13 12 5.2 33 3m 2.1 1.9 I.B ~.~: ).s2 1.2 2.9 C.7 4.7 7,s 7.3 12 21 19 33 16 29 n 60 47 46 91 la m to
1s

22 42

12( 23( 332 22(

4ot

6s 47q ml 73 7a

).014 1.04( I06s L10 0.1! 02s 1.( 10 1.s 4.0 ).60

Q&

2 12
23
46 39 4Q
27

3
74

I la Iw
9a w 72 73

in 1 m 1 la
m Iw ml 410 . 6(M

s
46 II 17 Is 24 6.S 11 9,7 . 9.9
4i

Ii

22 2.0 1.0 1.2 2.6 4.3 3q 6.3 5.6 4.4 6.1 l.? 2.? 2.4 1.1 ).6? 1.6 2.5 2.2 ).42 ).69 0.91 1.6 ).27 1.1?
).11 1.17

1?
6.9

13

31a m la M 270 Iia t7am

20

L74

32 30 20

).46
1.7 1.29 ).10 ).12
074

9.0 a.2

10

1%

1.1
1.0( 1.4 0.9( 1,3 O.ai 1.2

3.6

m 1.44 ).62 ).39 ).63 L40 L56 1.%

K L M
)21
).24 Ju .061
).11 .

3is

Soo

P
1.16 MS

Wo

Q
041

12s)

1.02!

mo

.(M

.097 I. 16

).22).33L41

1,73

lmPslwlo5E

3-

I
1

Z38

-. I 0. ==-

I Ss: I

Id

A( TWITEI
.

TAULE
percent !mpeclht!,
i%t~fp sdmi)hg)

VI-A Limiting
de/atirv) for

Qua[it y (in w~~ich P& =

(Sr?r? 4.11)

10 Percent

(/or

Norma!

:O& 0.010 0.015 0.025 0.040

Smple

Ntw

size

0.065 0,10
0.25

0.Is

0,40

0.65 1.0 1.5 2.5

4.(J

6.5 68
54

10

II

2 3 37 25
16
11

58
41 27 36 54 44

r%

13

F 6.9 4.s 2.0

IS(I

20

10 12
7.6 16

25
20

30
27

42

32

34 10
4.8 6.5 13

II

50

18 8.2 11 3.1 4,3

5,4

22

29
14 19
24

no

125 I .2
0.73
0.46 0.29 0.18

77
2,0

9.4 12 2.7
1.7

16 3.3 2.1 2.9 4.6 3.7 5.9 4.9 7.7 6.4

10 9.0

200

14

w
0.70

31s

I.2
1.1
0,67 0,53 o.a4 0,74

N 0.49 0.31 0.43

500

I.3 I,2

I.9 1.5
0.9,4 1,2

2.4 1.9 1.6

4.0 3.5

8W

3,1 2.5 2.3

S.6

1 ()

1250

2UO0

0.20 0.27 0.33

0.46

0.59

0.77

1.0

1.4

Accrpldll? (JUdily
l.cwl

tuer
Lti! )

0.2!
).65 I .0

65 10
65

Is
40 25

la) 150

Z G
RI

).011 ).01! .02! w

10 1 Is

040

to

Zio iii

MO
13M

I-MO
iii

A
f7

2
IJO
78 130 120 91 71 48 40 25 19 }6 12 10 90 14 23 35 63 56 150 120 100 M 190 49 67 04 71 59 18
ul

z
220

z
3W 310

G
Slo
400

xi
610 w 94[ 77(

42 I 10

3
100

310
24a ml MI
140

w
lot 230 220 350 m w 410 61(

Iw

c
41 33 29 24 31 37

22

a
51 46 . 2
/7 !1 78 19 Is 49 6.7 54 46 37 3.1 2.s 2.J 3.1 20
2.9 2.4 1.9 1.2

2?

13

! 7.2 )6

20

J
I .0
1.2

w so w
2.9 43 33 27 21 I .9

r&
0.73 17 1.3 ).46 D.7m II
)49

125 m 31s

Soo

P
0.61
D84 0.14 0,94

Wo
).29

1.2 I .s
12 1.0
14 1.6

v
).20

1220
0.?1).33 D.44 D.5Y D.71

).10

0.31).43D.W

Jam

TABLE Vii-A
Limiting
(for iVoWnal

Qwdity
Percent

(iti fwcmt
Inspection,

Pa

dtfeciile) \nr which Shgle $dmplivlg)

(:;W7 4.11)

g Acceptable Quality 4.0 lAvel

Q ~
0.010

semph
0,015
0.025 0.040 0,065 0.10

= 0.15
0.25 0,40 0.65 1.0 I .s 2.5

leuet

Qlze

6.5 m
63

10

2
45

66
31

47
32 41

60

21 14
8,9 22

so
28 34

13

46
14
q

20 18 23 30

w o

37 9.1 12 5.8 7.7

9.4
15 13 26 16 2s 20

32 5.8 3.7
2.4 1.5

so

32 26
3.fl

00

u 0.95
O.tw 0.30 0.24 0,30 o.%

12s

S.o* 6.2 2.4

3.2

8.4

11 3.9 5.3
6.6

14

18

24
8.S

11 1.s 1.3

15

200

315

2.0

2.5 2.1

3.3 2.6 1.6 1.6 0.97 1.3 O.ty 1.1 1.4 2.1 1.8

4.2 3.4 2.7 2.4

5.4
4,4

7.0 6.1
3.8

9.6

500
0.50

800

0.59 0.79
0.62

1230

0.24

0.32

0.39

0,53

0.66 o.rL5 1.1

1.5

&

Lkde

Saaqh

Accqmble

Odity

I.?vrl

Imtt I.ol{

q IU
0.1! 0.40 1.5 2.5 6.5 6s
39(

40 J2a 2tM

0.6.5 4.0 10 260
144

I .0 Isa 100 210 160 lM 100 6s 66 . S3 66 60 % S9 97 81 24 39 !i3 33 26 2t 16 14 8.5 7.0 4.4 2.7 1.8 2.4 3.8 6.1 II 9.6 <
i

0.011

).01sm!
0.1( 0.06!

0.2s Is a 3s( 449

340

l!ilm

4006M

Ooo

S30

66a

Ma Ilm
s7fJ m 44a 610

1s0(

moo

14a

IWO

IM

210 26a 164 21C KM

Im

8]0 IIa
270 m

36 23 31 32 24 21 46 15 9,4 Is 9s 13 9.7 8.4 6.6 5.4 II 13 16 S.9 3.0 2.6 3.2 2.s ?.1 1.6 1.4 2,1 2.6 3A 3.3 4.2 3.9 5.3 S.o 6.2 7.9 20 6.0 u)

79

3na sla .310 ua

710

13

F 41 34
27 18 is

20

32

I10 1s0 9s
44 M

so

61

J
2.4
1.5

60 3.8

IS

24

T
.

31s

L9S

1.s 2.0
0.9! 1,3 1.6 1.3 0,9 O.(M 1.1 0.s9 0,71 0.6,

Soo

0,60
0.36
Mm 0s0

Wo

12s0

0.24

II k24

L32 0.39 B.sj

),66

1.1 ..

1.s

TAfJI.E

Vlfl I.;mh

Ntimbws

/or

Redr~ced ltt~pection (see 4.7.3)

Acco@.bl* f)uolll~ bd

2s 40
4

r as B. 10 00 .
q

1.s e o 1
14 2s @

4s

0.1$ 0.8
0M

10

42

am

Moo

. *
q q q q q q q q q q

100 IJO
n
8 11 1 1 1

m
11s

n.m
q q q q q q

Ion I01s Boa * IN .

.
* * . o 0

1.0 *

28.4Q

* .
q q q q q q

118
t4 $1 u

1s1 m

S4. n
q q q q q q q q q

* . #

1 84

a
41

It n u

n $) 10$

40 u I 10

42 18s 191

.ml

*
. * *
. . o 0 . It %

9 . .
8 4 8

n? 13
11s la
* 110 M 113 M

In
la w 4s

WI

Q4. 12? IJO .194 200. m

. . . .

4 1 It

44 11s 101

101 ml 4?1

o
0 0 ? 1 4 o

2n.4w
q q q q q q q

q q q q

q q q

$n.lw

* *
4

1 1
1

Wo .

1?44
q q q q

b *
. 0

.
0 o 1 4 9 1$ 0 It I Y 4 1

0 0

u *
Its Iw

Iao .1440
q q q q

6
o Q 0 t 2 t ? It 20 N m 14 )2 u 0?

. .
o .
q

110 191

moo. wQ

mo . w

s t

Ym.

b t o o 1
?J 24

IJ 2? ?4 24 m 6)
a )10

,oom . IMW 1.320. law

1 ? IJ 40

10$ 1$*
m
Ill 11s 106 .. I*1

i
4
s 14

e o 16 N

e Q I
bl

0 t ? 8 @

.- .

(WC

4.12.2)

.Srln

.2% t

,1.LiJz

1?s

t!
? lb 008

Q It

LILLJr
1

ii2
n B prqorllon Odatlvo

L_l_.IP
I)SM

1*

m 4-II A1.11\ IIF SIIIWI f IWO I IITS 10 in I#w.rII ddwtw

q

w
ml Doe
14m

an I.1, VII * < 10; i. .+frrt. P hwdd -., t t~.. . . . . . w 4,..~.&t, 4),.11..I ..*I. tmgl,.11. .*W1 l..p* ,1..

m
1,nl Ilm

tm

t ml

Ha

I* >101

Iml

lc-

Iw

WIl!s fw Wt.,

TA91,[ X-A-t
Arrtfwdtlc 4Jdltf 6% I I I I 65 n o 6s 110 I.*wI* Ietwfnd imqwrtim)

- TAWt.ATEO VAtUES

FOR OPERAllNG

CMRACTIRISIIC

CURV[S

FOR SINGL[

SAMPLING

PIJNS

P.

I
p Iin 145 Iw

Iwlx12:a&1400]xJm
4. I-K fur hmrlrwl mile)

]~]

IImo

@WI pmml# M.clid ?t R 409 Ill 68) 412 W J

I 7s 2.1s

?M
Zoa

J(I5 In I

314

$17

*2V

977

Wo 4s0 s 13 521 S5 1
91:
127 UN
2S -~ 314 320
420 S02

osol ?M
Isa
21I 284
311 464 m
6s5

O.*) 2s2
1!6 4AI (41.9
11} I*! 246 31s 1%

900
114 Mt 134

?41 11a %6.

4A2

622

141

97s

1122

2.IY
ml
JR3 4n4 Sw iii

212 342
4,U

3s1 431
w

4:1? 571
m

51s 612
?33

4JJ4 7W5
*yJ

812 914
Ioml

I07J 1?14
I lnl . .

Izm I .354
1111

7so

no
N.?
6? ) 11s !nO

241

250

S40
650 n2

651
?10 4448

TM.
8n9 w?

810
taut ln&-

Ilal
12.M JJli

124n

I%m

m
I 4W . 1512 . I ?48
184!7

1716

w.b ??s ?1)

11?
4n

mls
nlll
Is$ 100 ,$0 ;

1470 30 I II NO 2w
x ;

1001
x

1141 4m

1272

1s29

J7M

mm

?710

w x

m x-

35

!$!

TAM.E X-O-1
CMRACIUIISTIC

- lAftUWIO

VAIUIS

FOR CWRAIMJC

CURWS

KIR SINGLE

SAMPLING PLANS

P. ! Oe I I Is 2s w a

be

I
0,33s

100 lxl.lxl~[x]mlx[lxl

woo

99.0

I
6.W
1$s w 3 ?7.6 94.* 11?

0.334

1s9

34s

419

41?

6s1

m?

9s0 Ml 1?.1 n.? !UJ.Y 1ss 10s

I .r@

1.11 11.0
Ml 2s.t
4s2 @n 131 110 241

?13
W,6 *.S 141 Iao 123 ml Iw M
321

4$.s W.1

131 -x?
101

2ii 2s
?.1$ m

m
3L1 Zm mQ
WI

41s

4s4

Iml

t 1s2

mo

3CS

4s4 2W 3S6 341 al 40s 409 w 4?2

S41 623

116 m

w W3

1131 124?

12ii 1344

150 SS9

*14 )?.0

Wo

20.6

la tli w m 124 8s2

??2 100

1021 tsw 11s? 1s0

14s?

2s0

3T0

1s44

10 1s4 6.$ 2s @ 231

n.s
m

)35 a

411 ml

SM ~ : ;L

?41 Ml

u ~

1019 400

INS ~

1392 6S0

1513 x

19$1 low

lwb~ ~

6s

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W-14

d,d$m,-e 1. ~..,

4.1..,1 . ..-..,-,,

P,,.-

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bhd ..11,

TAOL[
X- B-2

SAMPLING

PLANS

FOR SAMPLE SIZE

B

CODE UTTER:

Cml. 40 65

c
11?

114 c nl
n

.
Is

25
40 100

Ietiw

Tppe e4 99mplin# phm

q nple

lx
12 14
c

x
r It
B
4 15

65

x
50

x
6S0

x
nl

x
n

1000

silt

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5.6

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Cn

r c h

\c 16

c 16

10 3
11 #

44!

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w? U**

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61

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6.5

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40 6S 100

Accepabtc

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65o

UxtfJ

rArJLE x-c raf!les

/or sample $ize code

letter:

.... ... .. . . . n IP.) hct.trtr

la $0 w m w w al 40 m 10 a

8 - TABIMTEO
Atcrp*bfrUusliqI.rda Owrmtfkpr WI I I 4n ]* px+n[xIKOixlzsolx14@J p 1111 ddwts P? hwdmdWI-) 0.201 2.9? ?.li fh 4 ??.3 $?.3 &s.o 9). } 119 MB IJ? 34.9 :2.0 345 10,6 a.n 37.s so. I 70.1 m I.OJ ?.11 9s.4 . In 1s0 ml m 34) Jw $46 61S IinnI p+o

TAOLf X-C-I

VALUES FOR OPIRATING

CNARACIER ISTIC

CURV[S

FOR SINGLE

SAMPLING

PUNS

I
J.?) ?.~ M.a

f,

2.s

P lb wucm A? fwlhd

09.0

0.201

woo

Lo?

n.6

W*

12s
m t 72

1s4
17J m

10s
mo 24s

Z4* nJ Me

m
la m

m
429 46s

449 401 542

6s9
bl?

691 13J 149 606

90.0

2.W

n.o
w.? 04.4
113
)40 10s 210 Ybf 40 6s 31,4 4s.4 50.4 6s.? w.? 1$s m ?2,t 4.0 1$ 7s !3J 166 w.? I?n ??.0 ~ 40.1 IJ4 IJ.9 22.6

3.29 19.4 C*15 19.?

S1.s 11.6
}01

50.0

12.9

1s3
IV4 2 fs 2h.1 m x

I 73
116 -&f 269 346 IOU

21I WI Jf16 M4 M x

?sJ J04 MO

P) J48

373 4,s5

41s m

SIJ
621

6tJ ml

au 92J

891 *

25.0

?4.3

?il

$3.9

M4

10.0

n.?

n.o -.. Inn

.
M9

4fIJ 6s6

495 s]<

$64 40s

& 74s ON : ; : ; 400

166
mf4 w x

1010
m64 1171 6s0

lff16
I f .11 ... 1741 x

S.o

as.I

I .0

40?

4,0

1A(I[

X-C-2

- SAMPLING

PIANS

FOR SAMPLE

SIZC

CODf

l.EIWR: C

250

Pho

x
6.S

10
6s MO

60

d!
!? 2
H5 31

x x
600

x x

6s0

Km

k-l L.J

u u d
01
1: 7m 21

la
o

~
166!

It J

slqh )
q

II

a7
61 51
CC*

z
6

U*
1 16 621

3
CUB D: 1:

31

CO* I.otla

MI*

Lam
89

6s

r.

W
q

w ++
#-

Mllph

4+

-w

+$-

++

++

6.S
10

6s

b.@
Is

law

..

r
I

D
.

40

TABLE X-D-2
SAMPLING PUNS

FOR SAMPIf

SIZE CODE UTTER: D

GM.

!Bo

6.S Is 2s 10

hthe

tbw
!.s e RI
It NC nt

w+ m
k Re Ac k
AC nt Ac fle fh AC lb Ac fhAc fk )2 23 12 13 lb Is 4 la Ivl

1.s
it [It Ar

34 S6 78 89 to 1!

2.s

x
40 100 2s0 ~

x
no ~

~ ~
x

4(M3

h hrt 1 ~ *n H(

Ic n?Ac R? Ac f4r Ac 11? Ac N* Ac

64+
o

BI

u 22 27 28 m 31 41 42 44 L5

the
s
17 09

v
02 14 31 6 10 7 II t 59 45 6? 25 03 34

9 M II 16 is 20 17 23 ?3 n MIS

2531 17 36 S2 $1 % s? . .

5
to

Zkbb

Am
mlItl

10

12

12 12 13 15 16 10 19 23 24 /627

c
F

v
01
84 04 )6 la s 10

q 2 #3
04 0s 03 03 14 16 Is 03

06 39

17

a 4 to 6 121

29

3 1 14 10

10
t7

4 II

)2

6 19 lb

15 25

6 16 17 27

2 4

4
*2

27 49
6 II

30

e
6 02
01

6 10 7

12 0 I.1 II

17 1319

11 n 13 Ml Is 12 11 16 22 1? 2s 24

24 Iv 31 21

27 ?6 34

36 29 3+

Muhlpfc
8 10 12 M
23 4s 61

14 2s 36 46 19
9 10

31 so

)1 46 4049 1 II 012
13 ta
9 2 1? II Is lb 17 17 20 222s 14 14 17 la 20 21 23 2729 2s29 3? 3? 36 40 49

8
S5 Q2S2 N 33 40 43 4s 47 61 64 6S 66 10
12

13 13 3s

24

4 M 10 19 21 2? 2s 26
2s

32 33 )1 36 49 49 H 1$)

54 12 73 7178

t4

,.s thm
2s 2.s

4.0

10

15

40

1~

2s0

400

I&

A. v.

Ae w He m

b=

x
x

s a
$ :

-w :-

I
:

w iii ~

0 42

TABU)(-E-2 - SAMPLING
PUNS Fm s~fu SIZE

CODE LEITER: E

1.0
2<s

x
6S Re k l!? k 10

m
k

x
100 k Ae
%

~
At

m
N
At

~ n. Ar W

no
Ae

: n
la 19 21
22

Rt

Rc

v
ha m la 34 4s z 03 lb
9 14 11

2 23

S4

na

30

31 41 42 444s

v
te41
q

co&

16 6 20 l?

n 2329 23 31
56
s?

0419

#ltu

73 24 26 n 34= 31 36 529

o
(i # # 2 03 03 3 14 3 24 1s
46

3
q

2 92 03 14 2s 36

83

1 6 II

8 29 12 7 14

10 4 1017
II 11 13 19 17 24 19

12 6

15 6 19 16 Z n 2636 17 2939

16 n

3
6 9

6 9 12 1 13 23 4s 61 0 02

6 K ?7
)2

22 19 % 24 11 2734 2S S29 3231 29 31 33 #43

13 37

37 46 a 3440 42
36 46 40 53

49 49 35 5326

12 Is 10

Ihhlpto

15 19

4161
54 12

64 6s46

21
1.s

2.s

13 n

70

21

Lo
6.5

10

IS

100

~~

,.

(JM

mat

pNcan96 0+0

du.edo Iellef b

lrutb

Utxpmm

mph,

q **

u,

Wdldllo.

TABLE X-F-2

- SAMPLING PLANS FOR SAMPIE SIZE

CODE Lt71fR:f

Cnw

[:Um
I .0
Is 40 Jo

TTP d OMlpllw pk

25
23
bb
tc

6.s 15 Rr
n? Ac

6$ 4C
1

l~;fy

lalt.r

low. lb~lo 9h4

Ie

Ic

11?

lb AC R, Ac

=-b12 13 14

65

IM+ qi w

N* 4C N?

*
20
01

v
I
02
03 34
6 ? 8* w

12
23

34 5
670

10

II

Is

21

2?

Un CO*
14 2 45 53? 12
31 II

Ikmbh
E
q q q q q

v
Ce68

&

610711
)1

14

II

16
IS 16 1$ 19 23 24 26

A 21

L?*IWLMIH
N 2 t
03 03 14 24 3s 13 f ,. $s 2

T
3
I
4 04

11

26

v
9
02 03 13

0s s

617

18

2 16 2 6 38
30

9
3 6 9410 6
1?

A 7 14
10 ?12011
II 17

03
lb
2s 3. 46 b? 6

10
II J
s 1
19

ei

Is
7
n 9

s
?

10 It

0
II

II
1s

10

T
10 12
9
14

Is 12

1? f6

22

19

25

20
14
17 17 20

2225

2.5n

25
11
10202123 2729 31 33

.10 10 I.1 IQ
40 4 6.5

lb n

2225

26

)2

31

1?

311

M IS x

x
Is

40

N3

44
. . .

L&

46

TA8L[

X-C-2

- SAMPLING G

PWS

FU? SAMPLf SIZE CODC LETTIR:

O.a 1.0 1.s 6.0

0.64 2.s

x
6.S Is

10
\c
It

x
x
He Ae W 11
12 13

40

Cum9. l*lle* lum~le q IW

k

Ie

R*

k
RI ie n~

it nt
RI
e m Ac Ik 12
34 Sm

\c Ill At
Ac h 89
10

Ac

Re
!1 22

24*
32 01 Un 21

71

32

on Cti
12
4s 67

20
coda I@tet 34 a~ 02
14 31 2s 37 39

v
03 F

10

16

A
16
627

20

II 12 12 13 IS

40

1
B 2
93 # 4

v
04 02
Is 26 )7 se

q 2
03 03 l{ 2s 36 46 67 14 03

0
27

4 0
30

5 06
39

1?18

29
t10612

A
7 14

a
16

M
24 32 40 49 S6 13 03 02

16 30 s 10 1 11

4 6 9

10

1 12 0
11 e 12 11 J3

11 II

I
10 15 2171622
Is 14 11 720222s

11

3 925

19

26 32

24 J 45 3s

S29
79 9 to

40

1 23

10 12 12 14 14 13 )4 lb Is 10

17 10

20 1232724

It 19 11

33

22 !S 263233

36

y
2.s 4.0 6S
10

0.66

x
I .0

1.s

IS

2.s

Xbo

1
z
M&rt ut

40

Uac mtmto&mptM

wmplo SIW code ktter fat tchkh ucQptsmw ond ttltcliao

q vcilsblt.

Ac

Accepttnw q *. . ....

no

Me)actha WmbW.

1-

48

TAW X-t+2$AMPLING PIANS

FOR SAMPLE SIZE CODE KITER:

cum..
Iollvt

02s
1.s

0.40
25 x x Ac N? 10
k %

x
065
I .0

4.0
6.S k n* At fh II* Ac n? k

Is

~
Ic

25

scmfdr

q ite

Ck
RI
c c Ie

k
n

m
RI

Ie lb

Ac

nt

M*

MO*

v
ml 23

12
34 5 6

10
09

10

II .

12

13

Is

19 21

22

use
k

-
)2

32
Co40
.*lltr

v
q

fbblt

Codl Lctt&

03 34

14
2 a 1 5 37

37 II

$9 12 12

6 13 IS

10 16

7 :0

11

lb II

16

A
19 !1
24 26 21

64
u

12 J C2
# 2 03 03 14 24

4s

fJ9

13 26

v
q

m 3 03 14 2s 36

t 1 2 1 5 s 6 7 8

Ot 16 Jn 5 10 7 II

04 21 4 6 v Q II

0s 39 6 8 12 II 10

o 3 7 13 10 1s lb

6 9 12 Is

I 4

I 6

n 12

2
1

-2 m2 !t3 13 I.J 13

39
52 6S

a
12 17

13

I 17 16
12

11 22

13 19

25 2s 3s $5

10 w

46 61

r
Q

Q 10 12 12
to 13 14 lb

14 15

14 Ill

17 tv

N 2t

?1 2s

!7

29 31

I
12 )1 J? I .5

29
M

38

PD9 Ihu 040

0.40

0.65

1.0

40

65

10

Is

4
x

Em

R
0

:l=j=lgl~l.~

Is
o

1)(1

51

TABLE
CM4RT K -OPIRATING CNARACIIRISTIC CURVIS WR SINW SAMPLING PLANS (Curwo f- &No ad q .lllplo Su+lq m qotcbd 90 Cloml? QBpmdcwt)
1 II A(

X-K Tabfes

#or s~mpfe

size code letter:

lAtltE X-K-1 - IAO(RATID VAtU[S FOR WRAIINC

CttARACTtRISTIC CURWS F(HI SINCtf

SAMPLING PLANS

P. &2wtlw * Mom oalwl

I
I
0.00 0ss 1.0

0.10

I
1s
1.s @t kold O.zw 0.6s4
.. 0.262 .1.40

I I
La ?!Jl J.10 2.W 2$2 Ml

Xpolx
9.81 J 76
e.w

I
403
6.1s

I Xpo
5.9$
7<bo

I
0.26
9.9s

p (h

prmu

W.o 0.292
Q.u$

O.= I .W

mi
0.6$9

10.1
11.9

H.*

0.0$10

UI.Q

0.s023

J.71 4,70 6.14

t.32 s 61 6.92

S.oz 6.90 8.$3

6.92 0.32
10.1

0.24 9.??
11.T

10.9 12.7
14.9

130 14.9
1?3

1s.0 1.22
2.1s 3.11 4.30 B*M ~tb 4.W

0.230 2.14 2,94 4.s2

$94
1,42 O.u 10.3 1.s 2.s

0.7W

Lzoz

3.W

4
1.75
9.22 10.s 129

9.0

0.sss

2s.0

Llt

0.64
10.4 11.s 18.3

106
12.3 13.6 \6 I

W.*
14.2 1S.6 103

u.?
M.t 1?.$

11.4
19.8 ?1.4 M.S

200
22.3 ?4.2

10.0

t.s?

S.O 9.1$ o.b9 1.0 6. ?2

2.09

J.w 5.03

6.20
8.04

to

3.02

0.1s

4.0

6.$

to

~105E 1 I I

9BQB

,,

!53

?fIL-sID-lo5E

1
54

rABIE X-L-?

- SAMPLING PLANS F(XI SAMPLE S 17E COO[ LEITIR: L

cumu.

hllvc
q al+b
0.66s k n? k o 06s
,?*O

A 010 R* o. Is

6S k ne k NC

aiae
k
,C

x
0,2s
060 R? 0 6S I .0 1.s

x
25
4.0

x x
Ic
12 13 lb

II(
k

RF k

R* Ac n? Ac R.

S4+

200

v u.,

01
12
23 56

?8

15 18

19 21

22

200

Umo
02
03 2s 34 37 II 12 37 $V

12s

6 10 7 2; 9 lb II 15
16 10 t9 23 24
26

16 2?

12s

tbde
2s0 12 67

v
II
N so

l.%

Ceti Ltuw

250

v
# 2
03 03 26 31 59 lb 24 3s 45 1$ 16 30 5 1

92
2

9
q

04

04

o
2?

s 3 49 10 II 6 9 II 12 6 e II a 10 13 15

0 3 7 10 14

6 v 12

1? 4 0 Is 11 17 11

1 10 6 13 11 17 lb 20 22

8
12 1?

9 14 19 25 29

so
100

100 1s0 20
2W m M

02 03 13 13 23

1s0

200 2.s0

19
9

10 12

12

t? 19

18 21

20 21 22 n26

23 2?

.uto

lb 10 I 10 13 14 14 Is M

32

M(I

t W thl
o to 0.10 01$ 0.22

0.40

065

is

x
Acr?pttblr Qlrslilr Levels (Ilfimvl

2.s

4.0

6.S

inspvclion)

..

fAl?Ll! X-M Tables

- OPIIIATING
Iruwo
q

for ~ample
FOR SINCII
drIwlI . prudc*bld

size code
SAMPLING PLANS

letter:

CHARACIER IS TIC CURV[S

w
mf:fm $ 7!7 n? lot

CNART M m Or I.o?l
&tM* &d m,hipk
UQ mcwhd qt

q qllna

Im w m m a w a
m

m I* o 10 ?0 S* *O so 6n V* 0.0 *.O 100

TAME X-M-I
Aw*!*M*
(judh~

- TAWUTED
2,-..19

VAtUtS FOR OPERATING CNARACTIRSTIC CURV[S FOR SINGLE SAMPLING PIANS

(m-of in.pwlk.o)

P* I

0.040

Q,ls I I I I
p
mild

o.2s I
bwmkf 0.261 0.43? 0.020 Imo 0.})6 0.56? 0!?2Y 1,26 1.48

0,40

O.*

}.0

f.$

I
1.11 1.51

X1251X
1.94 ?.11 3.29

Id
.0 3.W

p (h fwwd &fcellw @ h *f*l* 0,0411 O.IM 0! 240 O,no 0.11$ 0.169

W.o

O,WI?

%0

0.0103

1.4?
1.72

1.96
2.23

1.44 2. M

2.94 3.Z7

3.9s 4.34

4.73 5.f6

W.e

0.0)2s

n.o
O.m 1.17 0.0ss 0.s49 1.s0

04913 O.ms
124 1.62
?.12

0.$40
2.36
1.9C

040$

1.34

1.69
2.43

2.17 2,1s

1.74 3,,39

u 4.02

3.8? 4.66

SM 5.9)

S.9J 660

So.o

0.220

as.o

0.640

.9.01
3.76 . -

3.43
4.13

4.13
4.m

4.W
$.64

552
6.39

6.W
7.n6

7.9? ..
n.%

10.0
I .s1 Zm

0.1s1 1.69

la

S.o

0.9s1

1.46
J Iv
ok%

3.34
4.16 I .0

4It

. 450
5.5? : I.!i

6<9S SW 640
~

b
02s 040

1.0

1.46

2.21

261

611 ?,24
~s ;

R.4r 971
40

9fAl .. 10 v
y_,

o 06s

57

Ii!
X-N-I
kcrpmblt 010 I I I I 0.?s I o do 065 01$ (JUOIW L-wI.

TAIM

- TAOUATtO VAIUIS

F(III OPIRATING CNARACIEfllSllC

CURVES FOR SINGll

SAMPLING PIANS

(manwl Im(wrtiea)

P. I

0.02s

?{10 PmCal d?kctia h 4dwlD pot hdfd wild

0.0s0? 0.?11 0.1*4 o ?11 o s?.! 0!0012 o Ml o 16s o sol o M

X]opc]lslxl?s
O.rol o 9M 0.%4 I.zl !32 1.s9 I .9 10s 20? 2.49 t St 2.W

W.o

0,00s01

9s.0

00103

Wo 0.N2 o so? 0044 1.13 1.4s O,lw 102 am 0.s3s 0104 0.s2s o )4s

0.0211

0.10s 0.220 0620 o34$

0 ml
1.1? 1s3 I w

10s
I Jt 1.13 2M

Iw
I lZ 2 D 260

1.73 2.W
3s2 304

2.06

2.73

32s

1$.0

0.0s?s

Its
2.?3 3 as

310
3.73 4.1s

314
4 u

Soo

o In

2s0

o 2??

4W

10.0
o ?49 1.39 0 !s 02s 14n f 1% I 55

0401

o.m I.M
01
040

IJ4

1.05
110

2 IS 2 t3

2W 209

3.0s 3.3?

3% 3.69

4.03 42s

49s su

S.u

so

0s?s

605 26?
0 6S k~-bl? :

.0 I

0921

348
o 01AII% I.CWIS Mphtwwd 2 in,prrtimd

4s6 1.s

s.w x

6.12 2s

6117 x, d

0040

\ mm., Ml ..1-0 .I-. b +

,*IO *4

qd-4101

.lb*l.. - *..

!-$ I.. ,. lb Dld*l

in

z o

II

.:!. ,! -,.,

#1,:, ,., ..

w,

!.

T]

Gz;-

! .

1.

I .

4D4i.e*-

m to

TAMI
Actrptmbk~dhf
I I I I I O.MO I o rm 0.10 0.1s 0,2s

X+
- TAWIATIO
LWOISkmo~
isc~tid

VALUES FM OPERATING CHARACTERISTIC CURVES FOR $lNGIE 5AAlPLlNG PIANS

P*

0.010

0.40

x I
0.281 0.3?6 0.42s

Xpqx
0 3s? 0494 o SW 0.498 0!61s O.m 0.SQ8 0140 0024

[
O.am 0.s9s 1.04

~ (h mm
*IV*
0.011? 0.0204 Oow o (m? 0.140 0.2s2 @.o@# ems 0 0310 0.372

u Mm0.0,142 0.2W

kdmd dlo

W.o

O*W

2j2

I Ot
1.19 In

9s.0

o.oosto

0.10?

$0. e

000W2

no 0.124 0.?1s 0.314 0.40s 0.216 0.294 04ss OS* 0.742 0641 IC6 o.no4 0 Is Ozs

O.mw

0.016?

o. Iw

0103

03M

0.416
0.614 0.11s 0.942 I .0s 1.29

0.s4?
004 0.664 I .04 1.1s I.w

O6W
08s3 I.@ 1.2s 1.26 1.61

0.034
1.01 1.22 La 1.s6 1.0.3

0.9?9 1.1? 1.39 1.61 Ida ~,

Ill 1.49 1.74 I.w 2.16 ;. ;

1.49 1.13 200 22s 2.b2 .

w,

0,0sss

2s.0

0.111

10.0 0.ss4
O.w 0.W9 0.!21 0.04s 0.10 o 67? O.sol

0.1$4 e.424

O.M1

S.O

0.240

I .0

O.w

001s

x
Arrr@ahlc (&olhf Lcwl. All 4#m b A@lb bm*4 - W4*. IMI--

040
(!I+I*w4 -Iti-

x
int ~ tie.) M ,b B$*I

O6S

\ a-

TABLE X+2

- SAMPLING PLANS F(M SAMPll S12[ CO(M WIERt Q

C9a.

1A,
etn Ic i ft

x
0.010 0.01s 0.6s 0.0s 0.040 0.0ss 0.10 0.1s o.%

t4i+w x 1.0

x
x
0.40
Ae m

x
Aa Ro he

lb4

k
R{

Ie
Re

he no
no k ,Ib

Ae Ie RO AC Rc
5 t 09
10 11 12

Ro AC no Ac h

Ae

R@

I%o

2 13
70

13 14

11 10

19 21 32

q A
10 7 11 9 14 11 16

13!M

Uee
Uee

600

02 03
14 s ? 99 31 2 31 6

59

$ 13 IS

A
16

600

Lam@
q

* buet

1n R
q

12 34 4s

11 12 12

to t9
04 0s 06

24 2427

Moo

31s 020 us
03

U2 92
9 6 s 6 ) ) T o

04 It 30 s 7 10

11
27 49 30 6 10 39 4
10

1
6

8
11

29
r

31s

qt o
1 ?

14
1 11 6 11 8 n 10 Is

?2
)3 14 Z4 3s 45 13 13 13

0
Is

13 II
11 M

11 13 19
22

94s 19 2S 12s0

Wl$49 1s?s 1020 Eos

l=

11 9 r ) 9 1012 2 101314
4

12 11 Is
14 14 Is la

14 17 18 19 21

11 20 22

11 20

nn

2s29 N n 2729 31 33 B* 3233 32s

1s7s low m%

0.010
0.01s

%.

).040 0.02s

0.066

0.10

0.1s

o.% ~

0.40

0,6s

}.0

/#

t .

},!,

ill

,,,

I i 1!

,,

.1,,

TAl)lE X-R-2

- SAMPLING PIANS FOR SAMPlf

SIZE CODE lEIER:

Acmpmblr QudltT k+
(wmel IMPA-)

T7?C d

x
0.010 0.015

x
0.0E4 0.40 O.oto O.MS

0.10 x

~ 0.1s
Re At R? Ac R, At Ih

o,~ ~ Ac ne
k n. AC

06

k
nc m

k I
23 56 9 11 12 13 10

c
k
1
14
q

R Ic he Ac nc RI k
8 @
Is 10

R?
19 21 n
mm

$IU19 01 Ua
on

MO
0
59 b

2 03
7 37

15
3 o 12 12 9 11 13 IS
61

I 10;

II 16 It
1

9 )9 n24

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