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LASER CRYSTALLIZATION OF NANOSTRUCTURE CdS THIN

FILM
AUSAMA I. KHUDIAR * , SIDDHARTHA , M. ZULFEQUAR and ZAHID H. KHAN .
12
,
1 1 1

Department of Physics, Jamia Millia Islamia (Central University), New Delhi-110025, INDIA
1

2
Center of Laser and Optoelectronics, Ministry of Science and Technology, Baghdad, IRAQ
*Corresponding Author E-mail: ausamaikhudiar@yahoo.com

Abstract
Cadmium sulfide (CdS) thin films were deposited on a glass substrate using the thermal evaporation method at room temperature. The changes in the optical properties (optical band gap
and absorption coefficient) after irradiation by Nd: YAG laser at wavelength 532 nm have been measured in the spectral range 190-650 nm. It is found that optical band gap is decreased after
irradiating the thin films. The samples were characterized using XRD and the grain size of the CdS thin film the calculated from the XRD data was found as 25.91 nm as-deposited. The grain
size is also found to increase with exposure time of laser irradiation.

1. Introduction 2. Experimental
Cadmium sulfide (CdS) is an important metal chalcogenides. Its CdS Thin films of CdS were deposited on a glass substrate by using the thermal vacuum evaporation
thin films are regarded as one of the most promising materials for technique at room temperature and vacuum of ~2*10-5 torr, using a molybdenum boat. The films were
heterojunction thin film solar cells. Wide band gap (Eg =2.4 eV) has been kept inside the deposition chamber for 24 h to achieve the metastable equilibrium. The thin films were
used as the window material together with several semiconductor such as irradiated by pulsed Nd: YAG laser (wavelength 532 nm, energy 2mJ, pulse duration 5 nsec) for different
CdTe, Cu2S and InP with 14-16% efficiency1. Laser crystallization of thin durations of time. For measuring the optical absorption and transmittance of thin films, a double beam
films on glass is widely used to improve the electronic transport. In the UV/VIS/NIR Spectrophotometer (Camspee-M550) was used. The XRD measurements were carried out
production of flat panel displays, laser crystallization increases the carrier using an X-Ray Diffractometer PW 1830 PANalylical which has tube anode; copper using the wavelength
mobility in thin film transistors. Suitable laser intensity profiles in 1.54056Å. The X-ray diffraction and optical absorption measurements were carried at before and after
combination with multiple scanning sequences have been used to reduce the irradiation of the sample by the laser.
number of grain boundaries2,3 . Among the semiconductors of the group II-
VI chalcogenide semiconductors have received much interest as they find
applications in the solid-state physics. Such semiconductors have band gaps 3.2: Optical properties
between 1-3 eV in the visible region. They are also used worldwide in Figure 4 shows the variation of absorption coefficient (α) with wavelength (λ). The absorption
optoelectronic devices. coefficient is found to increase after laser irradiation of the thin film. It is clearly seen from the optical
spectra that the absorption edge is red shifted for irradiated films this shift indicates a decrease of the
optical band gap. This is possibly due to the increase in grain size and the decrease in the number of
defects. Figure 5 shows The estimated band gaps from the plots of (αhν) 2 versus hν are for ‘as-
3. Results and Discussion deposited’ and irradiated CdS films by pulsed Nd: YAG laser. It was found to be 2.42 eV1, for as-
3.1. X-ray diffraction studies deposited CdS films and shows ‘red shifts’ by 2.37 eV and 2.31 eV after irradiation by laser for different
exposure times of 2 and 5 min, respectively. . Figure 7 shows the variation of optical band gap and grain
Figure 1 shows the XRD of CdS thin film. The peak small but broad size as a function of irradiation time in minutes. From this figure it is clear that the optical band gap
corresponding to the (111) plane at 2θ=26.535º. The type of structure of cubic decrease with increase of irradiation time indicating the photodarkening8 and the grain size increase that
zincblende (ZB). The crystallite size of the nanocrystalline film was calculated by means the nanocrystalline nature of thin film increase according to the intensity of XRD increase with
Scherrer’s formula4 was found as 25.91 nm. Figure 2 shows the XRD of CdS thin irradiation time 9, 10 .
film after 2 min laser irradiation. The peak corresponding to the (002) plane at
2θ=26.475º . The type of structure is hexagonal wurtzite (W) 5 . The grain size of
the film increases to 69.09 nm after laser irradiation. Figure 3 shows the XRD of 110000
6 .0 0 E + 0 0 9

100000
thin film CdS after 5 min laser irradiation. The peak corresponding to the (002)
2.42
100
5 .0 0 E + 0 0 9
90000 unirradaited
plane at 2θ=26.450º The type of structure is hexagonal wurtzite (W) 5 . The grain
absorption coefficients (Cm )

2 min 2.40
-1

80000
5 min 4 .0 0 E + 0 0 9 80

Optical Energy Gap (eV)


size increases from 25.91 nm to 103.69 nm after laser irradiation. Figures 2& 3 70000
) 2 (eV 2 Cm -2 )

2.38

show the intensity of the reflection peak increases due to lager volumes of
60000 Grain Size (nm)
3 .0 0 E + 0 0 9
60
50000 2.36

crystalline material present. All the parameters were changed after irradiation.

u n ir r a d a tie d ,E g = 2 .4 2 e V

40000 2 .0 0 E + 0 0 9 2 m in ,E g = 2 .3 6 e V
The diffraction peaks of laser irradiation samples are very sharp with the high 30000 5 m in ,E g = 2 .3 1 e V 40 2.34

intensity indicating the significant increase in crystallite size with the hexagonal 20000

10000
1 .0 0 E + 0 0 9

20
2.32

modification. The occurrence of phase transformation is probably due to the 0 0 .0 0 E + 0 0 0


2 3
2.30

increase in crystallite size and the change in atomic configuration of the CdS thin
200 400 600 0 2 4 6
wavelength (nm) hν
(e V ) T im e Irradation of Laser (m in.)

film6,7 .
Figure 4 shows the variation of Figure 5 The estimated band Figure 6 shows the variation of
absorption coefficient (α) with gaps from the plots of (αhν) 2 optical energy gap and grain
wavelength (λ). versus (hν). size with irradiation time.

Reference
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4.N J Suthankissinger, M Jayachandran, Bull Mater. Sci 30, 547 (2007). Indian Academy of Sciences.
5. Joint Comittee on Powder Diffraction Standards, (Newton Square,PA, USA,2000), Diffraction Data Files
Figure 1 shows the XRD of Figure 2 shows the XRD of Figure 3 shows the XRD of
CdS thin film as-deposited CdS thin film after 2 min CdS thin film after 5 min no. 73-1546 and 80-0006.
irradiation by Nd: YAG laser. irradiation by Nd: YAG laser.
6. P.Shindov, R. Kakanakov, L. Kolaklieva, Sv. Kaneva, T. Anastasova. Proc. 26th International

4. Conclusion Conference on Microelectronics (MIEL 2008), Nis, Serbia. (2008), pp. 11- 14.
7. R B Kale and C D Lokhande, Semicond. Sci. Technol 20, 1 (2005).
The XRD data show the crystalline nature increase with irradiation time and the 8. A.A. Othman, H. H. Amer, M. A. Osman and A. Dahshan, Radiation Effects & Defects in Solids 159,
grain size being increase and the structure was change from (ZB) to (W) after 659-666 (2004).
laser irradiation. The band gap was decreased and absorption coefficient was
increase after laser irradiation due to change in the structure. 9. K. Sarmah, R. Sarmaand H. L. Das, Journal of Physics: Conference Series 114, 012041 (2008).
10. F. S. Al-Hazmi, Chalcogenide letters 6, 63-69 (2009).

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