920-185A-EN

COMPOSITE INSPECTION
CFRP Radii Inspection
Application Guide
Photo used with the permission of
Avior, Produits Intgrs
Radii Inspection Solution
OmniScan

MX
Curved Linear Array
Software Tools for Composite
Inspection
2
www.olympus-ims.com
The Company
Olympus NDT designs and manufactures ultra-
sonic and eddy current test systems for manual and
automated nondestructive testing. These systems are
used throughout the world for the analysis of defects
resulting from processes such as welding, extrusion,
and casting, as well as from wear, corrosion, and
fatigue.
The companys broad eld of activity includes aero-
space and automotive manufacturing, petrochemi-
cal industries, construction welding, and in-service
inspection.
To serve these markets, Olympus NDT has manufac-
turing facilities in the United States and Canada. The
company manufactures state-of-the-art, conventional
and phased-array ultrasonic equipment and probes
for the inspection of a wide range of tubes, plates,
welds, and composite structures.
Olympus NDT offers high-quality products and
services that have earned excellent reputations for
providing cost-effective solutions and excellent sup-
port and customer service.
Table of Contents
CFRP Radii Inspection Application Guide
Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
Basic Concepts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
Terminology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
Probe Positioning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Typical Setup Conguration . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Data Analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Radii Inspection Solution
OmniScan

MX . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
General Phased Array Software Features . . . . . . . . . . . . . . . . 8
Software Tools for Composite Inspection . . . . . . . . . . . . . . . 9
Curved Array Probes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Immersion Corner Wedges for Curved Array Probes . . . . . 13
Options and Accessories
Custom Wedges . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Mini Wheel Small Footprint Encoder . . . . . . . . . . . . . . . . 14
TomoView PC-Based Analysis Software . . . . . . . . . . . . . . 15
3
Introduction
Parts manufactured of carbon ber reinforced plastics (CFRP) pose an inspection challenge because of their many shapes and thickness-
es. Several parts in the aerospace industry consist of corners such as spars, stringers, and top-hat structures. Typical corner inspections
are performed in a manufacturing environment. Inspection of these corners is relatively new but is becoming more and more important
with the increasing usage of CFRP laminates in aircraft structures. Traditional inspections are performed manually with a conventional
ultrasonic probe. The slow and tedious nature of this inspection approach and the strong dependency on the inspector, are major disad-
vantages.
The OmniScan

PA uses appropriate probe holders and curved linear arrays composed of 16 to 64 elements that re in sequence to
cover the entire corner in a single pass. The inspection of the entire corner becomes an encoded one-line scan. The geometry of the
probe allows for all of the ultrasonic beams to coincide at 90 with the surface of the part in a manner similar to at surface inspections.
Furthermore, the unit provides multiple amplitude or time-of-ight C-scan mapping views that make data analysis an easy task. The
main advantages of using the OmniScan PA for this application, is the possibility of inspecting the entire corner in one simple scan. This
encoded data can then be used for sizing indications and defects. With respect to inspection speed, a typical setup can inspect along a
corner at up to 200mm/s.
This radius inspection solution is based on:
OmniScan MX instrument
OmniScan MXU software
- Familiar menu-driven interface
- Multiple C-scan option
- A-Scan and C-scan data storage
- TCG
- One-button switching between PA and UT
- Customizable color palette for amplitude and thickness C-scans
- Live A-scan and B-scan
Curved PA probes
- Acoustic impedance matched with water
- High circumferential resolution around the radius
- Corrosion-resistant stainless steel case
- Waterproof guaranteed to 1 m (3.28 ft)
- Compatible with adjustable immersion wedges
Immersion corner wedges for curved array probes
- Available in specic radius and angle
- Adjustable radius to t on various components to be inspected
- Designed to perform manual scans with a Mini Wheel

encoder, or a
time base
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www.olympus-ims.com
Basic Concepts
Phased array technology is a nondestructive technique that enables the genera-
tion of an ultrasonic beam where parameters such as angle, focal distance, and
focal point size are controlled through software. Furthermore, this beam can
be multiplexed over a large array. In composite inspection, a 0 electronic scan
is performed through successive ring of the elements. When no time delay is
applied to the elements, the PA probe res a 0 beam and does not apply any
steering or focusing.
There are a multitude of benets associated with using phased array ultrasound
for inspecting at and corner-shaped composite parts. Notably, the enhanced
data imaging reduces the human-error factor. Likewise, the use of C-scan
imaging increases the reliability of the inspection because it guarantees the full
coverage of the inspected surface. Also, the large multielement probes increase
inspection speed and resolution. With the use of an appropriate scanner, radii
can be inspected in one pass, while a linear encoder assists in defect position-
ing and sizing. As well, future analysis and periodic comparisons can be done
because the A-scan and C-scan data is stored.
Furthermore, the OmniScan

PA instrument supports both phased array and

conventional ultrasonic modes with one-button switching between the two
techniques.
SUMMARY
While conventional UT may be used for radius inspection, the OmniScan PA
technology explained in this guide improves the detection of defects typical to
this inspection (notably delamination). Phased array technology brings these
added advantages:
FASTER inspection speed
FULL COVERAGE in a single scan
BETTER probability of detection (POD)
REPORTING and traceability
Terminology
CFRP radii are charaterized by three main parameters:
Part radius
Part opening angle
Thickness
The specic linear Curved Array PA probes used to
inspect these radii are dened by the probe radius
and the probe angle.
Two main inspection types exist, which are char-
acterized by the relative position of the probe to
corner:
Inside the corner ID
Outside the corner OD
CFRP Radii Inspection Application Guide
Direction of the electronic scan
1 16
Aperture: 4 element
1
16
R
T
r

Probe radius: R
Part radius: r
Thickness: T
Part opening angle:

ID
Direction of the
electronic scan
1 16
Aperture:
4 element
1
16
R
r
T
Probe radius: R
Part radius: r
Thickness: T
Part opening angle:


OD
Flat linear array
Curved linear array
5
1
16
R
T
r
1
16
R
r
T
1
16
R
T
r
Probe Positioning
The geometry of the probe allows for all of the ultrasonic beams to
coincide at 90 with the surface of the part in a manner similar to at
surface inspections.
With the probe positioned correctly, the inspection becomes identical
to a 0 at inspection as each focal law intersects the surface at 90.
The front wall in the corner of the part appears as a straight horizontal
surface. A similar approach can be applied for inspection from inside
the corner as well as from outside the corner. Olympus offers several
probes and probe holders to meet the challenges of corner inspec-
tions including adjustable immersion wedges that are adaptable to a
range of corner radii.
The probe holders are chosen and positioned according to the corner
geometry. The probe holder must be aligned so that the center radius
coincides with the center of radius of the corner. With these holders
the same probe can be used for a range of corner geometries by
simply changing or adjusting the probe holder.
Probe radius does not coincide with the part radius. Probe radius coincides with the part radius creating two
concentric circles.
Probe radius does not coincide with the part radius.
Uncompleted front-wall echo Completed front-wall echo Uncompleted front-wall echo
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www.olympus-ims.com
1
16
R
T
r
d
s
I
s
s = I
s
(r + d)
R
1 1
8
8
16
s = I
s
(r + T - d)
R
1
16
R
r
T d
s
I
s
Probe radius: R
Part radius: r
Thickness: T
Size of indication: s
Size of indication as seen by the probe: I
s
Depth of indication: d
Gate I
Gate A
Gate B
TCG
Beam 1
Beam 8
Typical Setup Conguration
The front wall of the corner of the parts is viewed
as a straight horizontal interface. The gate setups for
C-scan displays are almost identical to the at part
inspection setup. However, the OmniScan

PA al-
lows A-scans to be synchronized to an interface gate
(I), which gives exibility to the probe position with
respect to the radius. The A and B data gates as well
as the TCG correction, are all synchronized to the
interface gate.
TWO OR THREE GATES (I, A, B)
Gate I can be used to synchronize the other 2
gates on the front wall.
Gate A typically begins right after the front wall
and continues past the back wall. This gate is
used to produce amplitude and time-of-ight
(TOF) C-scans.
Gate B is typically employed to monitor back-
wall amplitude when the panel has a relatively
constant thickness.
C-SCAN DISPLAYS (A%, TOF, B%)
Depending on the sample and the defects, each
display has its merits and inconveniences.
TIME-CORRECTED GAIN (TCG)
To obtain 80% front-wall and back-wall echoes.
Data Analysis
The main differences between inspecting the corners
in this way and inspecting a at panel are:
The correlation required for index sizing on the
corners.
The beam inversion for ID inspections
INDEX SIZING ON THE CORNERS
Indication sizing in the scan direction can be di-
rectly measured from the encoded readings and the
displays on the OmniScan. In the index direction, a
geometric conversion taking into account the radius
of the phased array probe (R), the radius of the corner
(r), the depth of the indication (d), the thickness of
the part (T) and the indication size as displayed on
the OmniScan (S), is required to obtain the actual
indication size (s). This conversion is also dependant
on the type of inspection (ID or OD).
BEAM INVERSION FOR ID INSPECTION
When performing an inspection from the inside
diameter (ID), the beam created from the rst ele-
ments of the probe reects on the highest part of the
corner (beam 1), whereas the beam created from the
last elements reects on the bottom part of the corner
(beam 8). Therefore, the beams are inverted on the
S-scan display as well as on the C-scan.
Display showing A-scan, S-
scan, and TOF C-scan
Display showing A-scan, ampli-
tude C-scan, and TOF C-scan
Display showing A-scan, S-scan, and ampli-
tude C-scan
Due to the beam inversion phenomenom the beams are
inverted on the C-scan.
7
OmniScan 16:128 phased array module offers live switching from
phased array mode to conventional UT mode for quick verication
and defect sizing useful for certain code requirement applications.
OmniScan

MX
With hundreds of units being used throughout the
world, the OmniScan

MX is Olympus most success-

ful portable and modular phased array and eddy cur-
rent array test instrument. The OmniScan family in-
cludes the innovative phased array and eddy current
array test modules, as well as the conventional eddy
current and ultrasound modules; all designed to meet
the most demanding NDT requirements. The OmniS-
can MX offers a high acquisition rate and powerful
software features, in a portable, modular instrument,
for efcient manual and automated inspections.
RUGGED, PORTABLE, AND BATTERY
OPERATED
The OmniScan is built to work in the harshest eld
conditions. A solid polycarbonate-based casing and
rubber bumpers make it a rugged instrument capable
of withstanding drops and shocks.
The OmniScan is so compact and lightweight (only
4.6 kg, 10.1lb) that it can be carried easily and
handled anywhere, inside or outside. The OmniScan
runs for 6 hours with its two lithium-ion batteries.
USER INTERFACE
The 8.4in. real-time display (60Hz A-scan refresh
rate) with an SVGA resolution of 800 x 600, allows
you to clearly see defects and details under any light
conditions. A scroll knob and function keys make it
easy to navigate the menus and to select functions. A
mouse and keyboard can also be connected for users
wanting a more PC-like interface.
SETUP AND REPORTING
Setup storage is compatible with Microsoft

Windows

(exportable using a CompactFlash

card).
Complete report setups, including reading
congurations, that can be customized using
HTML page layouts.
Easy report generation; from acquired data to
complete report in seconds
On-screen interactive help that can be
customized for procedure-oriented setups using
HTML script templates
Setup preview
Predened setups
CONNECTIVITY, DATA STORAGE, AND
IMAGING
The OmniScan

offers alarm outputs and standard PC

ports: USB, SVGA out, and Ethernet. It offers internal
data storage capability and extended storage using
a CompactFlash (CF) card, USB, or network storage
device.
With hundreds of units being used throughout the world, the OmniScanMX is Olympus most
successful portable and modular phased array and eddy current array test instrument.
The OmniScan offers thourough report
conguration, and easy generation;
from acquired data to complete
personalized report in seconds.
Radii Inspection Solution
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www.olympus-ims.com
Live switching between conventional
UT and phased array UT
General Phased Array Software Features
FULL-FEATURED C-SCAN
Monitors amplitude, peak position, crossing level position,
and thickness on each gate
A-scan data storage and C-scan postprocessing capabilities
Optional I gate for surface-following synchronization or
measurement gate, or TCG/DAC curves
Customizable color palette for amplitude and thickness
C-scans
Adjustable 256-level color palette
Positive or negative gate on RF signal (independent for each
gate)
Eight completely congurable alarms on single-gate events
or multiple-gate events, lter for n occurrences from one or
multiple channels
2-axis mechanical encoding with data acquisition
synchronization on mechanical movement
Optional data library to access A-scans and/or C-scans on PCs
for custom processing
FULL-FEATURED B-SCAN
Easy-to-interpret cross-sectional view of inspected parts
Visual identication of acquired thickness values
FULL-FEATURED A-SCAN
Peak-hold mode (always keeps the signal that shows the
maximum amplitude in gate A)
Gate threshold-level crossing (changes the color of the curve
that is over the gate level)
Thinnest mode automatically selects and displays the focal law
with the thinnest part section
Color-selectable A-scan display
Reject mode lters signals below a dened amplitude
threshold
3 A-scan displays, ll, hollow, and two-colored
60Hz A-scan refresh rate with envelope and peak overlays
inside the gate
WIZARDS FOR GROUPS AND FOCAL LAWS
The Group and Focal Law Wizards allow you to enter all
probe, part, and beam parameters, and to generate all focal
laws in one step instead of generating them with each change.
The step-by-step approach prevents the user from missing a
parameter change.
Onboard help provides general information on parameters to
be set.
Examples of the Focal Law Wizard
CALIBRATION PROCEDURES AND PARAMETERS
All calibration procedures are guided by a step-by-step menu us-
ing Next and Back navigation.
Example of sensitivity calibration
ADVANCED REAL-TIME DATA PROCESSING
Real-time data interpolation to improve spatial representation
of defects during acquisition of data
User-selectable high-pass and low-pass lters to enhance
A-scan and imaging quality
9
Software Tools for Composite Inspection
The rugged and portable OmniScan PA offers a high acquisition
rate and powerful software features to efciently perform manual
and automated inspections. This section showcases a series of
useful features for composite inspection such as:
Gate measurements
Gate synchronization
Thickness conguration
Range: how to set the minimum range
Automatic tracking the thinnest or highest beam in gate At
Layout ABS
Reading I/(w)
C-scan analysis readings list
GATE MEASUREMENT
PEAK (^)
Position is taken at the maximal signal amplitude in the gate
and the amplitude is also taken at the maximum signal in the
gate.
Peak measurement
Edge measurement
EDGE (/)
Position is taken at the crossing position in the gate and the
amplitude is taken at the maximum signal.
GATES SYNCHRONIZATION
GATES ON PULSE
Gate start is considered from the 0mm position
This mode allows the user to verify the probes position with
respect to the radius, while performing the manual scan.
Go to Gate/Alarm > Gate > Gate = I and parameters
= Mode
Go to A-Scan synchro = Pulse
GATE A ON I/
Gate A is synchronized on gate I crossing.
Gate start A is considered from I/ position
(0,27 mm + 1,15 mm = 1,42 mm).
Go to Gate/Alarm > Gate > Gate = A
Gate/Alarm > Gate > Parameters = Mode
Gate/Alarm > Gate > Synchro. = I/
A-SCAN SYNCHRONIZATION (GATE IF ON I/)
Edge position of the signal in Gate I is automatically placed at
0mm.
Gate Is threshold becomes important.
Gate I is no longer displayed on the screen.
Gates A and B are automatically synchronized on I/.
Gate starts A and B are considered from 0 mm.
Edge position of the signal in Gate IF is
automatically placed at 0 mm
Gate start (A and B) are considered from
0 mm.
Go to Gate/Alarm > Gate > Gate = I
Gate/Alarm > Gate > Parameters = Mode
Go to A-Scan Sync = I/
GATE B ON A/
Gate B is synchronized on the crossing position of gate A. By
setting gate B immediately after the crossing signal in gate A,
the rst peak amplitude can be monitored.
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THICKNESS CONFIGURATION
Many gate combinations can be congured in the OmniScan

in
order to provide the correct thickness measurement. The Min. and
Max. values are used to set up the color palette scale. By default,
everything below the minimum value is colored red and every-
thing above the maximum is colored blue.
Display showing the effect of setting
the maximum thickness value. On the
left, the Max. is set to 50mm; on the
right the Max is set to 5.5mm.
Measurements > Thickness > Source = A/ - I/
Measurements > Thickness > Min. = 0.05
Measurements > Thickness > Max. = 50
HOW TO SET THE MINIMUM RANGE
Composite materials can be manufactured in a wide range of
thicknesses. When inspecting thin parts, it is often necessary to re-
duce the range to analyze the area of interest. The range is directly
proportional to the number of points recorded on each single A-
scan. By default, the points quantity is set to 320. For example, in
a material with a velocity of 3000m/s and without compression,
the minimum range permitted by the OmniScan is 4.80mm. It is
also possible to reduce that range to 0.48mm by directly editing
the minimum number of points quantity on the OmniScan to 32.
UT Settings > Advanced > Points Qty. = 32
UT Settings > General > Range = edit or scroll
with the knob
Display showing the effect of setting
the point quantity on the range value.
On the left, the number of points is
set to 320; on the right the number is
set to 160.
DISPLAY WITH AUTOMATIC DATA CURSOR SELECTION
When in the phased array conguration, the user must select, with
the data cursor, the A-scan he wants to display. The OmniScan

can automatically display the A-scan with:
The highest signal in gate A
The minimum thickness value in gate A
Note that layouts containing a B-scan cannot be displayed when
using either of these two modes.
11
Display > Properties > Scan = A-Scan
Display > Properties > Source = Highest (%)
Display > Properties > Source = Thinnest
LAYOUT: ABS
The ABS layout offers an A-scan, B-scan, and S-scan to be viewed
all at the same time while in acquisition or setup mode. Further-
more, once the acquisition is complete and the OmniScan has
been switched to analysis mode, this layout adds the C-scan view
in order to facilitate quick and easy analysis.
Display > Selection > Display = A-B-S
READING I(W)/
This reading displays the water column between the probe and
the part.
Measurements > Reading > Field x
(1, 2, 3, or 4)= I(w)/
C-SCAN ANALYSIS READINGS LIST
A predened group of reading elds has been selected in order to
facilitate the analysis.
A%: amplitude of the signal in the gate
S(m-r): distance on the scan axis obtained by subtracting
the position of the reference cursor from the position of the
measurement cursor
I(m-r): distance on the index axis obtained by subtracting
the position of the reference cursor from the position of the
measurement cursor
T(A/-I/): thickness measurement
Measurements > Reading > Group =
C-scan Analysis
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R
A
R casing
Curved Array Probes
3.5CC25-32-R4 3.5CC10.2-16-R1 3.5CC50-64-R5
As a world leader in PA probe manufacturing, Olympus NDT has once
again proved its superior applications knowledge with the introduction
of the Curved Array Probe series. Every aspect of the probes has been
examined and optimized for more inspection possibilities and a more
ergonomic design.
Advantages
Acoustic impedance matched with water
High circumferential resolution around the radius
Corrosion-resistant stainless steel case
Waterproof guaranteed to 1 m (3.28 ft)
Compatible with adjustable immersion wedges (shown on page 13)
Probe Specications and Dimensions
Part number
Casing
type
Frequency
(MHz)
Number of
element
Pitch (mm)
Elevation
(mm)
Radius
(mm) (R)
Angle ()
(A)
Inspection
type
Minimum part
opening angle ()
3.5CC10.2-16-R1 R1 3.5 16 1.0 5.0 10.2 90 ID 70
5CC10.2-16-R1 R1 5.0 16 1.0 5.0 10.2 90 ID 70
3.5CC25-32-R4 R4 3.5 32 1.32 6.0 25.0 90 ID, OD 70
5CC25-32-R4 R4 5.0 32 1.32 6.0 25.0 90 ID, OD 70
3.5CC50-64-R5 R5 3.5 64 1.65 6.0 50.0 121 OD 50
5CC50-64-R5 R5 5.0 64 1.65 6.0 50.0 121 OD 50
These probes come standard with an OmniScan

connector and a 2.5 m (8.2 ft) cable, or can be specially tted with other connectors and cable lengths.
Choosing the appropriate probe depends on the geometry of the
part. The main factors that need to be considered are the inspec-
tion type (ID or OD), the radius of the corner, and the angle of the
corner. Once the choice of probes has been narrowed, the thick-
ness of the part as well as the footprint of the probe and wedge
must be taken into consideration. The following steps should be
used as a guideline:
Step 1: Choose the appropriate probes that match the inspection
type, radius and angle of the corner to be inspected. (This is espe-
cially important for ID inspections where the minimum radius that
can be inspected is determined by the angle of the corner.)
Step 2: Validate whether these probes are compatible with the
maximum thickness of the part.
Step 3: Ensure that the size of the probe is conducive to the part
geometry. Care must be taken with H beams to ensure that the
probe and wedge are small enough to t in between the anges.
For more information contact an Olympus representative.
Choosing the appropriate curved array probe
13
SR1-I81-ADJ SR4-IE90-ADJ
Available for specic radius and angle, and a radius adjustment to t various components
Designed to perform manual scans
Designed to be used with the Mini Wheel

encoder
Immersion Corner Wedges for Curved Array Probes
GLOSSARY USED TO ORDER WEDGES
Wedge type
SR1 = wedge for curved probe type R1
SR4 = wedge for curved probe type R4
SR5 = wedge for curved probe type R5
Inspection type
I = internal
E = external
Angle of inspected part ()
81 = 81
90 = 90
98 = 98
Custom angles can be ordered.
Radius
Radius in in.
ADJ = adjustable radius
Wedge type
Inspection type
NUMBERING SYSTEM USED TO ORDER WEDGES FOR CURVED ARRAY PROBES
SR1-I90-0.125
Radius
Angle of inspected part
Wedge Specications
Part number Probe type Angle of the inspected part () Radius range in mm (in.) Inspection type
SR1-I81-ADJ R1 81 4 to 14 (0.157 to 0.551) ID
SR1-I90-ADJ R1 90 3 to 14 (0.118 to 0.551) ID
SR1-I98-ADJ R1 98 3 to 13 (0.118 to 0.512) ID
SR4-IE90-ADJ R4 90 3 to 20 (0.118 to 0.787) ID, OD
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www.olympus-ims.com

Mini Wheel Small Footprint Encoder
The Mini Wheel

encoder is used to position the probe and to accurately mea-

sure defects in the scan axis. It synchronizes data acquisition with probe move-
ment.
SPECIFICATIONS
RESOLUTION
12 steps/mm
A
B
C
E
F
D
A = 27 mm (1.06 in.) D = 24 mm (0.94 in.)
B = 28.7mm (1.12 in.) E = 17.5 mm (0.69 in.)
C = 22.5 mm (0.89 in.) F = 6 mm (0.23 in.)
FEATURES
Waterproof (IP68)
Small dimensions
Encoder resolution engraved on the wheel (12 steps/mm)
Removable encoder wheel
Double O-ring tire for better adherence
Strain relief for cable protection
Spring-loaded pin for adaptable encoder attachment
2 M3 threaded holes on top of the casing for rigid attachment
DE version compatible with the OmniScan

instrument
BX version compatible with the TomoScan FOCUS LT

instrument
Options and Accessories
Custom Wedges
REQUIRED INFORMATION FOR CUSTOM WEDGE ORDERS
When ordering custom wedges that are not listed, the following information must
be provided:
1. Part geometry (such as: I-beam, L, Z frame)
2. Preferred inspection approach: ID or OD
3. Probe casing type: R1, R4, or R5.
4. Fixed or variable radius
5. Part opening angle ()
6. Corner inner radius (provide maximum and minimum radii if variable wedge
is requested)
7. Maximum part thickness in the radius
1
6
5
15
Reference area dened by the
contour cursors (pink)
Reference area between the refer-
ence and measurement cursors
Binary image based
on the SNR values
Raw image Binary image
Reference Area Information
Displays mean value (Amplitude or Depth) and
standard deviation value of reference area.
Histogram Distribution
Counts the percentage of pixels of each color level
between 0% and 100% and displays the results as
a graph (represents the region dened between the
reference (red) and measure (blue) cursors).
Computed Indication Area
Measures the size of the area being above the Sig-
nal/Noise value (signal/noise value can be adjusted
using the K value).
Excludes values below gate amplitude threshold
from histogram and defect area.
TomoView PC-Based Analysis Software
OmniScan

is compatible with Olympus TomoView

PC-based software family.

OmniScan data is seamlessly imported into TomoView for further processing
and analysis. For example, TomoView Lite Aero is dedicated to aerospace data
analysis and offers:
Simple and quick data display
Generation of binary C-scan
Defect sizing with SNR
Multiple data les C-scan merge
Ofine resynchronization of A-scan
Post acquisition C-scan creation
Color palette edition and compression
Software gain adjustment
1:1 display ratio
DEFECT SIZING WITH SNR
Computes signal-to-noise ratio and total area of indications below a certain
SNR level
Easy selection of signal-to-noise ratio using a slider or directly edited values
User-selectable colors
Available with C-scan data
Available with Full, Analysis, and Lite Aero editions of TomoView
C-SCAN GENERATION
Digitize image data based on a reference zone (mean value, standard
deviation) or select a specic threshold
Digitize a region of interest (between cursors) or digitize the full C-scan image
Remove any spurious indications (between cursors)
Save results to companion le (A01)
Choose from Full, Analysis, and Lite Aero editions of TomoView
The free TomoVIEWER application can also be used to view data acquired by
the OmniScan.
Parts made of laminate composite materials
pose an inspection challenge because of
their many shapes and thicknesses. How-
ever, many parts consist of a somewhat at
section such as skins, stringers, and spars.
Olympus offers a complete solution for the
inspection of carbon ber reinforced poly-
mers at panels. This solutions is based on
the OmniScan

aw detector, the GLIDER

scanner and probes dedicated to CFRP at
panel inspection.
The CFRP Flat Panel Inspection Solution
from Olympus provides a portable solu-
tion with advanced tools such as two axes
encoded C-scans with amplitude and time-
of-ight (TOF) information, gate synchro-
nization, and data recording. The GLIDER
scanner is easy to use and well-suited for
raster scanning with both conventional UT
and phased array probes. The Olympus
CFRP solution offers important benets:
High inspection speed
Powerful and versatile software tools
Ease of deployment
Greater POD
Portability
Note:
The Olympus CFRP Flat Panel Inspection
Solution can also be used for other FRP
at panels.
920-166A-EN
OMNISCAN SOLUTION
CFRP Flat Panel Inspection
Conventional UT and Phased Array
Inspection Solution
FEATURES
OmniScan instrumentation
OmniScan software
- Familiar menu-driven interface
- Multiple C-scans option
- A-Scan and C-scan data storage
- TCG
- Quick swapping between PA and UT
for prove up and defect sizing
- Customizable color palette for
amplitude and thickness C-scan
GLIDER scanner
- Well suited for PA, UT, ECA, and EC
probes
- High inspection speed
- Two encoded axes
UT and PA probes and wedges
- Near-wall probes: shortened dead
zone at both ends
- Delay line: provides excellent near-
surface resolution
- Water Pocket Rexolite

wedge: for
limited irrigation needs and better
coupling on some surfaces
Your Challenge
Shinjuku Monilith, 3-1Nishi-Shinjuku2-chome, Shinjuku-ku, Tokyo 163-0914,
Japan, Tel: 81(0)3-6901-4039
48 Woerd Avenue, Waltham, MA 02453, USA, Tel.: (1) 781-419-3900
Stock Road, Southend-on-Sea, Essex, SS2 5QH, UK, Tel.: (44) (0) 1702 616333
450 Campbell St. Unit 5, Cobourg, Ontario K9A 4C4, Tel.: (1) 905-377-9611
31 Gilby Road, Mount Waverly, Victoria, 3149, Tel.: (61) 130-013-2992
Valley Point Offce Tower, 248373, Tel: (65) 68-34-00-10
CFRP Radii_Application_Guide_EN_200908 Printed in Canada Copyright 2009 by Olympus NDT.
*All specifcations are subject to change without notice. All brands are trademarks or registered trademarks of their respective owners.
is ISO 9001 certifed.
www.olympus-ims.com
info@olympusNDT.com
CFRP Flat Panel Inspection Solution
Parts manufactured from laminate composite materials pose an inspection challenge because of their many shapes and thicknesses. How-
ever, many parts consist of a somewhat at section such as skins, stringers, and spars. Olympus offers a complete solution for the inspec-
tion of carbon ber reinforced plastic at panels. This solution is based on the OmniScan

aw detector, the GLIDER

scanner, and probes

dedicated to CFRP at panel inspection.
The CFRP Flat Panel Inspection solution from Olympus provides a portable solution with advanced tools such as two-axis encoded C-scans
with amplitude and time-of-ight (TOF) information, gate synchronization, and data recording. The GLIDER scanner is easy to use and well-
suited for raster scanning with both conventional UT and phased array probes. The Olympus CFRP solution offers important benets:
High inspection speed
Powerful and versatile software tools
Ease of deployment
Greater POD
Portability
The Olympus CFRP Flat Panel Inspection solu-
tion can also be used for other FRP at panels.