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1 Diode Characteristics: 1.1 Objectives
1 Diode Characteristics: 1.1 Objectives
1 Diode Characteristics: 1.1 Objectives
1 DIODE CHARACTERISTICS
1.1 Objectives
Learning how to test the characteristics of each type of diode by using various
instruments.
Fig. 1.1
Thus in the region close to the junction, the carriers (electrons & holes ) are
depleted, whereas only positive and negative ions can exist. This region is referred to
as Depletion Region.
The force that prohibits the electrons and holes from passing the junction due
to the effect of ions in the depletion region is referred to as barrier voltage. The
typical barrier voltage in the p-n junction of germanium (Ge) is around 0.2 ~ 0.3 V,
whereas it is around 0.6 V for silicon (Si).
Fig. 1.2
If the voltage applied by forward bias is enough to overcome the barrier
voltage, the positive terminal of the power supply will attract electrons, whereas the
negative terminal will repel electrons. The electrons in the n-type semiconductor will
thus cross the p-n junction and enter the p-type semiconductor to combine with the
holes. Many holes are generated in the n-type semiconductor due to the ionization of
electrons, together with the electrons provided by external power supply (E). The
electrons continuously move through the driving of power supply (E) to form an
electron stream with the direction from the negative terminal E to positive terminal,
wherein this direction is contrary to that of conventional electric currents.
The forward bias applied to the diode generates a forward current denoted
as IF . The value of IF is directly proportional to the external power supply (E) and is
inversely proportional to the internal resistance (r) of the diode.
There exists a rate between the flow of injected rate and applied voltage called
Diffusion Capacitance. This capacitance is directly proportional to the current IF .
Reverse Bias:
As shown in Fig 1.3, if the positive terminal and negative terminal of the
power supply are respectively connected to n and p, both the electrons and holes will
be attracted by E and will be away form the junction to enlarge the depletion region,
and no electron or hole can cross the junction for combination. This method, to apply
the external voltage, is called reverse bias.
Fig 1.3
Fig 1.4
Fig. 1.5
From the characteristic curve we can see that the current is very low if the
forward bias applied to the diode is lower than the cutin voltage (Vr). Once the
forward biases exceed the cutin voltage ( 0.2 V for germanium diode, 0.6 V for silicon
diode), the current (IF) will be dramatically increased, in the manner that the diode will
function as short-circuit ( with VF being around 0.7 V). The equivalent circuit is shown
in Fig 1.6.
Fig. 1.6
Items
PIV
Temperature
Range
Silicon
High
2000C
Germanium
Low
1000C
Type
Cutin
Voltage (Vr)
Leakage
Current (Ir)
0.7 V
1/100~1/1000
of germanium
( 0.6)
0.3 V
(0.2)
Several
Table 1.1
Fig. 1.7
PZ max = VZ . I Z max
By these judgements, operating current range must be kept below Izmax and
above Izmin . These boundaries are specific for each type of zener diode and are
given in specification sheets of corresponding manufacturers. Symbol and
appearance of Zener diode is given below.
Fig. 1.8
Fig. 1.9
1.3.c Photo-diode
Photo-diode is one kind of junction type semiconductor device with operating
region limited at the reverse bias region, that is, a photo-diode is never applied
forward bias. The reverse current of photo-diode is directly proportional to the
strength of the light. The basic structures, bias method and symbol of photo-diode
are shown below.
Fig. 1.10
1.4
Experiment Equipments
1. KL-200 Linear Circuit Lab. Device
2. Experiment Module : KL -23001
3. Experiment Instruments: Multimeter
4. Cables for connections.
1.5 Procedures
Procedure 1: V-I characteristics curve of silicon diode
(1)
(2)
Use 10K variable resistor on KL-200 device and short circuit clips to
construct the circuit in Step 1 of Fig. 1.11
Fig. 1.11
(3)
Connect 12V to the input terminals, then adjust VR2 step by step (
measure voltage across OUT by using D.C. digital voltmeter on KL-200
device ) so that the voltage across the terminals of the diode equals to the
values given in Table 1.2 and measure and record IF in each step (by using
multimeter)
0.1V
VF
0.2V
0.3V
0.4V
0.5V
0.6V
0.7V
0.8V
0.9V
IF Silicon (CR1)
IF Germanium (CR2)
Table 1.2
(4)
Turn off all active devices, and re-locate the short circuit clips refering to
the circuit in Step2 of Fig. 1.11 . Realize that, by this process, we apply
reverse bias to the diode under test !!!
(5)
Now adjust VR2 to apply the voltages in Table 1.3 as in (3) and record
current values. This current is the reverse current.
1V
VR
2V
3V
4V
5V
IR Silicon (CR1)
IR Germanium (CR2)
Table 1.3
Note : Even these values seem to be positive, you apply negative
respect to preceding circuit.
values
(1)
Repeat the same steps for CR2. Refer to Fig.1.12 for connections.
Fig 1.12
1.0V
(1)
You will repeat similar steps for zener diode refering to Fig.1.13. Only
the amplitudes of reverse voltages, given in Table 1.4, are different. Make
your measurements and record them in Table 1.4.
Fig. 1.13
VF
IF
0.2V
0.3V
0.4V
0.5V
0.6V
0.7V
0.8V
0.9V
1.0V
1V
2V
3V
4V
5V
6V
7V
8V
9V
10.0V
Zener (CR3)
VR
IR
0.1V
Zener (CR3)
Table 1.4
1.6 Conclusion
In this experiment, you learned the relation between applied bias of a diode
and its current. In a simple resistance, the rate between an applied voltage (forward
or reverse) and yielding current is constant, which is the resistance of the element.
However, for a diode, it varies with applied voltage. This property, also called
dynamic resistance, is observed during this experiment.
In reverse biasing, you measured a small saturation current. Saturation current
exists whenever diode is reverse biased in between breakdown voltage and zero.