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L6 Resistor Fabrication
L6 Resistor Fabrication
Resistors
Dr. Robert Pearson
Resistor Fabrication
OUTLINE
Definitions
Resistor I-V Characteristics
The Semiconductor Resistor
Resistivity
Carrier Mobility
The Diffused Semiconductor Resistor
Resistor Design and Cross-Sections
Resistor Fabrication Sequence (micrographs)
Resistor Networks, Terminations
Resistor Fabrication
DEFINITIONS
Voltage - The force applied between two points causing charged
particles (and hence current) to flow. Units - Volts, and the symbol
used is V. Sometimes called the potential
Current - A measure of the number of charged particles passing a
given point per unit time. Units - Amperes or Coulombs per second.
The symbol I is usually used to denote a current.
Resistance - A measure of the ability of a sample of a material to
allow a current to pass through it when an external force or potential is
applied. The units are Ohms and the symbol R is used for a resistance.
Ohms Law V = I (R)
or
R=V/I
or
I=V/R
Resistor Fabrication
10
control
knob
+ -
resistor
(Volts)
V
10
Volts
V
-5
-4
-3
-2
-1
0
1
(Amperes)
I
Amperes
I
-0.005
-0.004
-0.003
-0.002
-0.001
0
0.001
Data Table
Resistance
(V/I) in Ohms
1000
1000
1000
1000
1000
?
1000
Resistor Fabrication
Resistor Fabrication
ohms
ohm-cm
integral
L
Area
w
t
R
q = 1.6E-19 coulombs
Rochester Institute of Technology - MicroE REP 3/15/2007
Resistor Fabrication
RESISTIVITY OF SILICON
Impurity Concentration, N, cm-3
1021
= 1/(qN)
1020
1019
1018
Phosphorous
Doped silicon
1014
1013
10-4
10-3
10-2
10-1 100
101
102
103
104
Resistivity, ohm-cm
Rochester Institute of Technology - MicroE REP 3/15/2007
Resistor Fabrication
(max-min)
(N) = min +
{1 + (N/Nref)}
Parameter
min
max
Nref
Arsenic
52.2
1417
9.68X10^16
0.680
Phosphorous
68.5
1414
9.20X10^16
0.711
Boron
44.9
470.5
2.23X10^17
0.719
Resistor Fabrication
1.40E+03
1.20E+03
1.00E+03
mu_n
mu_p
8.00E+02
6.00E+02
4.00E+02
2.00E+02
0.00E+00
1.00E+14 1.00E+15 1.00E+16 1.00E+17 1.00E+18 1.00E+19
Doping Concentration (Na or Nd)
Resistor Fabrication
DIFFUSED RESISTOR
Aluminum contacts
Silicon dioxide
n-wafer
The n-type wafer is always biased positive with respect to the p-type
diffused region. This ensures that the pn junction that is formed is in
reverse bias, and there is no current leaking to the substrate. Current
will flow through the diffused resistor from one contact to the other.
The I-V characteristic follows Ohms Law: I = V/R
Resistor Fabrication
Layout/Mask Layer 1 - Diffusion (green)
Top View
W
Resistor
termination
L
Side View
P type Diffusion
N wafer
The resistance, R = rhos (L/W)
The sheet resistance rhos, is the resistance of each square
L/W is the number of squares long the resistor is said to be.
Resistor Fabrication
Layout/Mask Layer 3 - Contacts (gray)
Top View
W
10 by 10 microns
Side View
contact
openings
Oxide
Diffusion
N wafer
Device Fab. 1 page-12
Resistor Fabrication
Top View
Side View
Metal (Aluminum)
Oxide
Diffusion
Resistor
Symbol
N wafer
Resistor Fabrication
Aluminum Pads
5 squares
5 squares
resistor 10 squares
Resistor Fabrication
MASK # 1
20m
This resistor is
many, many
squares long
Green is oxide
(glass)
Gray is bare
silicon
Diffusion openings
Resistor Fabrication
Resistor Fabrication
MASK # 2
Bare Silicon
Resistor Fabrication
1000 of SiO2
Resistor Fabrication
MASK # 3
Contact opening
To bare silicon
Resistor Fabrication
Particle on the
microscope
lens
Aluminum
Resistor Fabrication
Contact
Unused
Pad
Aluminum
Resistor Fabrication
RESISTOR NETWORK
Desired resistor network
500
400
250
Layout
Resistor Fabrication
0.5
4 4.5
5.5
6.5
10
0.5
Resistor Fabrication
RESISTOR TERMINATIONS
Field Mapping
~ 0 squares
~ 0.5 squares