MODULE II

DEFECT LEVEL
Defect

It’s the physical imperfection.

Manufacturing defect or physical failure
occuring in the circuit.
Example: undercutting, defect that
appears as a groove in the parent metal,
directly along edges of weld.
Classification of defects

Uses three dimensions.

1)The injection phase: describes when
was the defect produced.
2)The defect type: describes what was
the structure of the defect itself.
3) The defect reason: describes why was
the defect introduced.
Types of defects

Functional defect: refers to activities that

verify a specific function.
Non-functional defect: refers to the
aspects of software that may not be
related to a specific action.
Examples.
Non-functional defect types:

Usability related
Security related
Safety related
Testability related
Portability related
External interface related
Definition of Defect Level

Basic measurement corresponding to the

proportion of faulty circuits in the circuits
which have passed the test.
Decreases as the yield increases.
Decreases as the performance of the test
sequences increases.
Let W :>number of similar circuits.

G :>good or fault-free circuits.

D:>defective or faulty circuits.

Then, W=G+D
Yield

Y:> production yield,proportion of the

good circuits in the manufactured
circuits.

Y=G/W.

Y=1,defect level should be very small.

Circuit Testing
Aim is that to separate defective circuits from
the fault-free circuits.
Passed circuit:> a fault-free response has been
observed.
Failed circuit:>a faulty response has been
observed.
D=Df+Dp.
Df:> fail the test.
Dp:>pass the test.
Cntd..
Defect level (DL),the proportion of faulty
circuits in the passed circuits can be expressed
as:
DL=Dp/G+Dp
DL depends on yield :
if Y=1,D=0.
Dp=0,DL=0
Also depends on the ability of the test sequence
to detect the faulty circuits.
Defect coverage.

Faulty circuit coverage: proportion of

faulty circuits which fail.
Denoted by Pu.
It can be expressed as:
Pu=Df/D.
DL=(1-Y)(1-Pu)/Y+(1-Y)(1-Pu)
Observations

Observations made from the equation:

DL ↓when Y↑ with limit cases;
DL=1 when Y=0.DL=0 when Y=1.
DL ↓ when Pu ↑ with limit cases for
Y>0,DL=1-Y when Pu=0 & DL=0 when
Pu=1.
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