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Kuliah v. Metalografi Kuantitatif
Kuliah v. Metalografi Kuantitatif
Kuliah v. Metalografi Kuantitatif
METALLOGRAPHY
Perhitungan Metalografi Kuantitatif
nV = 0.422nL3 = 0.677nA3/2
N L A V
= volume fraction
N L A V
Where :
N = number of point falling in a phase
N = total number of point counted
L = length of random line across a phase
L = total length of random line
Contoh
Obtain a
representative area
and produce a
micrograph showing
the overall structure.
A second, higher
resolution picture
might be required to
show detail.
enables the standard error to be calculated. However, this appraoch does not
allow the calculation of the number of points required to get a given error, for
that we use
where s is the error, fa, the volume fraction of phase a and N, the total
number of points. You should aim for an error of ±1%
Grain Size - Linear Intercept
A straight line is drawn across the sample and its length is noted - to do this
you will need to use the stage micrometer to determine the real length of
the line, l.
Linear Intercept
Alternatively, a circle may be drawn with a known diameter and hence
circumference (l). Again the interecpts of all the grain boundaries with the
circle are counted (n) and the grain size determined as above.
Linear Intercept
The number of grain boundary intercepts is then counted, n, and the grain
size, d, determined