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ECLIPSE/ECLIPSE PACKET NODE RELIABILITY

ETSI

EXECUTIVE SUMMARY
This Product Reliability Report presents mean time between failure (MTBF) data prepared in accordance with Telcordia
TR-322, Issue 6, December 1997.

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TABLE OF CONTENTS

EXECUTIVE SUMMARY .......................................................................................................................... 1

REFERENCE DOCUMENTS ................................................................................................................... 3
SOURCE DATA AND ASSUMPTIONS .................................................................................................... 3
ECLIPSE RELIABILITY DEFINITIONS .................................................................................................... 3
CALCULATED MTBF ................................................................................................................................................ 3
ANTICIPATED MINIMUM FIELD MTBF ................................................................................................................... 3

ECLIPSE MTBF VALUES ......................................................................................................................... 4

INU MODULES .......................................................................................................................................................... 4
INDOOR UNITS ......................................................................................................................................................... 5
OUTDOOR UNITS ..................................................................................................................................................... 5

TERMINAL RELIABILITY.......................................................................................................................... 5
NODE RELIABILITY.................................................................................................................................. 6
INU/INUE-BASED TERMINAL RELIABILITY ........................................................................................................... 6
LINK RELIABILITY..................................................................................................................................................... 7

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REFERENCE DOCUMENTS
1.

Product Reliability Methodology, Aviat Networks

2.

Guidelines for Calculation of Product MTBF and Reliability, Aviat Networks, IRD-DES013

3.

TelCordia (Bellcore) Reliability Prediction Procedure for Electronic Equipment, TR-332, Issue
6, Dec 1997 and/or SR-332 May 2001

4.

Non-electronic Parts Reliability Data 1995, Reliability Analysis Center (RAC), NPRD-95

SOURCE DATA AND ASSUMPTIONS

The part failure rates used in this prediction are from TR-332, and NPRD-95 RAC Non electronics
Parts Reliability Data.
This reliability prediction is based on the high quality commercial parts used in the Eclipse product.
The mechanical and electromechanical components were from NPRD-95 RAC Non-electronic Parts
Reliability data. The environment was assumed to be Ground Benign (40C) for the INU and Ground
Fixed (50C) for the ODU.

ECLIPSE RELIABILITY DEFINITIONS

Reliability information is presented in the form of MTBF values for the Eclipse field replaceable units,
including indoor equipment and modules, and complete ODU assemblies.
All reliability information is based upon an ambient external temperature of 25C. Where average
annual temperature of operation is consistently above this temperature the reliability may be less than
that indicated. Several MTBF values are presented:

CALCULATED MTBF
Calculated or predicted MTBF is determined according to Bellcore methods (see Source Data and
Assumptions, above).

ANTICIPATED MINIMUM FIELD MTBF

Anticipated minimum field MTBF is the MTBF value that will be based upon measured field returns for
installed equipment. The anticipated field MTBF is determined by taking a 3x multiple of the predicted
values.
Aviat Networks compiles statistics for field returns and actual measured MTBF on a global basis. This
information can be supplied upon request.

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ECLIPSE MTBF VALUES

INU MODULES

Assembly

Calculated MTBF,

Anticipated Minimum Field

Years

MTBF, Years

Indoor Chassis, IDC

310

930

Indoor Chassis Extended, IDCe

201

603

Network Controller Card

54

162

FAN Card (1RU)

943

2829

FAN Card (2RU)

427

1281

Node Protection Card (NPC)

79

237

AUX Card (AUX)

136

408

Radio Access Card (RAC30)

104

312

Radio Access Card (RAC30a)

104

312

Radio Access Card (RAC3X)

99

297

Radio Access Card (RAC40)

98

294

Radio Access Card (RAC4X)

84

252

Radio Access Card (RAC6X)

80

240

Data Access Card (4x)

299

897

Data Access Card (16x)

204

612

Data Access Card (3xE3)

370

1110

Data Access Card (1x155o)

109

218

Data Access Card (2x155o)

67

134

Data Access Card (2x155e)

235

705

Data Access Card (1x155oM)

110

330

Data Access Card (ES)

358

1,074

Data Access Card (GE)

198

594

Data Access Card (GE3)

144

432

Network Convergence Module (NCM)

123

369

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INDOOR UNITS

Assembly
IDUsp 4x
IDUsp 16x
IDU 20x (v2)
IDUspe
IDU ES
IDU 155o
IDU GE 20x
IDU GE3 16x

Calculated MTBF,

Anticipated Minimum Field

Years

MTBF, Years

63
56
42
44
33
30
24
24

189
168
126
189
99
90
72
72

OUTDOOR UNITS

Assembly

Calculated MTBF, Years Anticipated Minimum Field

MTBF, Years

ODU spe (Edge)

ODU 300 sp
ODU 300 hp
ODU 300 ep
ODU 600

21.9
16.6
16.4
15.6
15.7

65.7
49.8
49.2
46.8
47.1

TERMINAL RELIABILITY
Eclipse terminal reliability is shown in the following table for non-protected configurations for example
purposes.

Assembly

Calculated MTBF, Years Anticipated Minimum Field

MTBF, Years

IDU spe + ODU spe

IDUsp 4x + ODU300sp
IDUsp 16x + ODU300sp
IDU 20x + ODU300hp
IDU ES + ODU300hp
IDU GE 20x + ODU300hp
IDU 155o + ODU300hp

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15
13.1
12.8
11.6
11.0
9.7
10.6

45
39.4
38.4
34.8
33.0
29.0
31.8

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NODE RELIABILITY
Eclipse provides a new node-based architecture that supports a variety of simple and complex site
architectures in a single INU or INUe. The resulting nodal reliability is improved over other systems that
comprise of an IDU for each radio path. The actual MTBF of a node is dependent on the arrangement
chosen.

INU/INUE-BASED TERMINAL RELIABILITY

The Eclipse INU and Extended INU (INUe) both support a modular architecture that can be populated
with a variety of system and interface modules, which can be arranged in a non-protected or protected
configuration (depending on the module).
All modules are treated in series for purposes of MTBF/MTBO calculations, as shown in Figure 1
example for a non-protected system equipped with both a Gigabit and NxDS1 tributary cards. Note
that the second fan is equipped for the INUe only.

Figure 3. INU/INUe 1+0 Terminal Reliability Model

Here the overall terminal MTBF is an addition of the component modules of the INU and the ODU:
MTBF = 1/((1/MTBFIDC)+ (1/MTBFNCC)+ (1/MTBFFAN)+ (1/MTBFFAN)+ (1/MTBFDAC GE)+
(1/MTBFDAC16x)+ (1/MTBFRAC)+ (1/MTBFODU))
Eclipse INU terminal reliability is shown in the following table for non-protected configurations for
example purposes.

Assembly
IDC+NCC+FAN+RAC30+DAC16x+
ODU300hp
IDC+NCC+FAN+RAC30+DACGE+
ODU300hp
IDC+NCC+FAN+RAC30+DAC16x+
DACGE+ODU300hp

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Calculated MTBF,

Anticipated Minimum Field

Years

MTBF, Years

10

30

10

30

10

30

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Eclipse INU terminal reliability can be improved by using the optional NPC to duplicate the NCC
functions.

LINK RELIABILITY
Link reliability is simply obtained by halving the terminal MTBF data provided above.

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