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1. Variable: continuous data. Things we can measure. Example includes length, weight, time, temperature,
diameter, etc.
2. Attribute: discrete data. Things we count. Examples include number or percent defective items in a lot,
number of defects per item etc.
Types of Control Charts: the classification of control charts depend upon the type of data.
1. Variable charts: are meant for variable type of data. X bar and R Chart, X bar and sigma chart, chart for the
individual units
2. Attribute chats : are meant for attribute type of data. p chart, np chart, c chart, u chart, U chart
Control charts for the variable type of data (X bar and R charts)
In the x bar chart the sample means are plotted in order to control the mean value of a variable. In R chart, the sample
ranges are plotted in order to control the variability of a variable
Centre line, upper control limit, lower control limit for x bar and R charts are calculated. The formulae used are as
following:
n = sample size,
Xi = ith data
= mean of g samples
g = number of samples
sx = standard deviation of samples
Example:
Mean values and ranges of data from 20 samples (sample size = 4) are shown in the table below:
Upper Control Limit of X bar chart = 11.6 + A2 4.15 (A2 = 0.729 for sample size 4)
= 14.63
Lower Control Limit of X bar chart = 11.6 - A2 4.15 (A2 = 0.729 for sample size 4)
= 8.57
Upper Control Limit of R chart = D3 4.15 (D3 = 2.282 for sample size 4)
= 9.47 9.5
X-Bar Chart
Sample data at S.N 2, 16, and 18 are slightly above the UCL. Efforts must be made to find the special causes and
revised limits are advised to calculate after deleting these data.
R Chart
All the data are within the LCL and UCL in R Chart. Hence variability of the process data is not an issue to worry.
p-charts calculates the percent defective in sample. p-charts are used when observations can be placed in two
categories such as yes or no, good or bad, pass or fail etc.
c-charts counts the number of defects in an item. c-charts are used only when the number of occurrence per unit of
measure can be counted such as number of scratches, cracks etc.
u-chart counts the number of defect per sample. The u chart is used when it is not possible to have a sample size of a
fixed size.
For attribute control charts, the estimate of the variability of the process is a function of the process average.
Centre line, upper control limit, lower control limit for c, p, and u charts are calculated. The formulae used are as
following:
p-chart formulae
Sometimes LCL in p chart becomes negative, in such cases LCL should be taken as 0
c-chart formulae
u-chart formulae
k = number of samples
Example: p-chart
Data for defective CDs from 20 samples (sample size = 100) are shown in the table below:
CL =
p-Chart
Sample data at S.N 16 , 18, and 20 are above the UCL. Efforts must be made to find the special causes and revised
limits are advised to calculate after deleting these data. There is important observation that is clearly visible from the
data points that there is an increasing trend in the average proportion defectives beyond sample number15 also, data
show cyclic pattern. Process appears to be out of control and also there is a strong evidence that data are not from
independent source.
Example: c-chart
Data for defects on TV set from 20 samples (sample size = 10) are shown in the table below:
CL =
c-Chart
None of the sample is out of the LCL and UCL. But the chart shows cyclic trend.
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