Professional Documents
Culture Documents
American Semiconductor
Molex flexible substrate FleX-ICs
Sensor Signal Processing
Printed Electronics Data Processing
Sensors Data Storage
Interconnects Communications
Substrates
Displays Low Cost, High Performance
Compatible with Printed Electronics
Low Cost, Large Format Foundry CMOS + FleX Processing
Roll-To-Roll, Screen, Inkjet Print,
New Applications
FleX-IC Internet of Things (IoT)
Wearables
Traditionally Structural
Thinned Die
New Requirements
Conformal
Dynamically Flexible
Ultra thin
Ultra light weight
Improved Reliability
No Die Cracking
Reduced Breakage of Interconnects
Traditionally Thinned Die at 5mm Radius
2017 American Semiconductor, Inc. All rights reserved. 3
Features Drive Complexity
FleX SoC-Wafer on Dicing Tape Probing a FleX-SoC Die FleX-SoC Die After Pick
FleX-SoC NVM Erase RoC Results FleX-SoC NVM Program RoC Results
2017 American Semiconductor, Inc. All rights reserved. 7
FleX-SoC Die Testing
Test Coverage
85% of the Flash NVM
60% of the SRAM
30% of the GPIO Ports
Full speed 24MHz operation
Probing a FleX-SoC Die FleX-SoC Die During Probe FleX-SoC Die Test System
2017 American Semiconductor, Inc. All rights reserved. 8
FleX-SoC Radius of Curvature Testing
Devices tested for before and after bending around RoC test mandrels
FleX-SoC passed to 5mm RoC in both concave and convex directions