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Efecto de La Punta de Prueba en Mediciones (Tektronix AN) PDF
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Measurement
Application Note
Introduction
This application note describes how an oscilloscope probe changes the signal youre measuring at the test point and what
probing specifications to look for to minimize probing effects. One measurement trap users often forget or overlook
are the effects of probe loading. Ultimately, you want to select an oscilloscope probe that meets the following criteria:
1. Faithfully transmit the signal from your device under test to the oscilloscope
2. Do not disturb! meaning you want to select a probe that changes the signal at the test point as little as possible
Application Note
If I soldered a 15 pF capacitor from a random location in your current; its conductive. Since the probe tip has to draw
circuit to ground, would you expect the circuit to behavior some current, its going to disturb or load the circuit. There
differently? Of course you would. Because an oscilloscope are two probe specifications related to the probe loading the
probe has a capacitance, resistance and inductance, its circuit, and these loading factors are input resistance and
going to affect the signal youre measuring and can affect input capacitance. An example of probe input impedance
the operation of the circuit. To produce a voltage waveform data sheet specifications and an example of how these
on the oscilloscope, the probe tip is going to draw some specifications may be modeled are shown in Figure 1.
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How Oscilloscope Probes Affect Your Measurement
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Application Note
As shown in Equation 2, a measurement systems large 10 50 source resistance, a test fixture and an oscilloscope.
M input resistance has little impact on the measured signal. The test fixture has a 200 resistor and variable capacitor
In this example, the measured signal is calculated at 4.9995 V soldered to it. You can clearly see the test fixture is directly
which is 99.99% of the 5 V source signal. Reviewing equations cabled to the oscilloscope with the output of the test fixture
and models helps provide an academic overview of input attached to Channel 1. This setup is intended to show what
resistance, but the best method to see the impact of probe is happening at the test point and to observe the effects of
loading is to show how the signal at the test point changes. probe loading. The oscilloscope is showing the output of the
Figure 3 presents a test setup using a voltage source with test fixture, not the output of a probe.
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How Oscilloscope Probes Affect Your Measurement
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Application Note
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How Oscilloscope Probes Affect Your Measurement
Figure 7. Probe Loading from an Agilent Passive Probe with 9.5 pF Input Capacitance. Figure 8. Probe Loading from a Tektronix Passive Probe with 3.9 pF Input Capacitance.
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Application Note
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How Oscilloscope Probes Affect Your Measurement
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