fe letratem Bistaton Time and Frequency Systems OPERATION AND MAINTENANCE MANUAL MODEL M-100 RUBIDIUM OSCILLATOR47 43 wageanry The seller warrante that aach item furnished under this order vill at the tine of shipnent be free from Gefects in materials furnished and vorknanship performea by the Seller. This warranty As Limited to either granting credit or repairing or replacing s Seller's option with reasonable pronptness after return te Seller ony axticles or materials which are Sisclosed to Seller's satis faction to be defective, and only if said articles or materials faze returned to the seller promptly after discovery of such de~ fect and in no ovent later than 1e months fron the date of delivery thereof. Normal transporvation charges in connection with itens returned shall be at the Seller's expense only if the Seller is responsibie under the terme of this warranty. This warrenty does not extend to any Stan which has been subject to isuse, neglect or accident, nor does it extend to anything whick as becn repaired or altered by other than the Seller. THIS WARRANIY 416 0 LIBU OP ALL CTMER WARRANTIES EXPRESSED OR INPLIED, AND THE SXGHTS 20D REMEDIES PROV-DED HEREIN ARE EXCLUSIVE AND IN LIEU OP AW OMHER RIGHTS OR REIEDIES, IN NO EVENT SHALL SELLER BE LIABLE POR ‘CONSEQUENTIAL DAMAGES."e100 LIST OF EFFECTIVE PAGES Insert the latest changed page by either inserting the new page in place of the old page, or by stapling the changed page over the old page. NOTE: On # changed page, the portion of the text affected by the latest change is indicated by a vertical line, in the outer margin of the colum affected. Page Change Change Page Change Change Now Now * Date No Now *| date iow ° ft through | 0 5-26 * Zero in this colum indicates an original page.TABLE OF conreNTs SECTION /PARAGRAPR 1 INTRODUCTION & sPectPrcATion Ll Desersptton « 1.2 Manual Content s+.sssseeesee sa) i Ls Available Options eseseeeeees 1.6 Spectftestions INSTALLATION 2, Introduction 2s1 Receiving And Inspection se+seeees 2.2 Shipping ssvees 2.3 Storage... 24 Wouating .+se+s+5 2.3 Power Requirenents « 2.6 wonttoring Signal outputs 2,7 Installation Considerations «++s+eese+e+ OPERATION AND FUNCTIONAL, TESTS 3. Introduction «s+. Bel Test Bqutpent 3.2 operation 3.3 Atomic Resonance Lock, And Control Voltage Tests « 3.4 Operational Frequency Accuracy Test esssvesee 43.5. Short-Term Stab{lity Test (Allan Variance) «. ‘THEORY OF OPERATION 4. General «. 4.1 Theory OF Operation esesssvee 4.2 Block Diagram Analyete MAINTENANCE D+ Introduction se++s Sel Required Test Equipment .. 5.2 Test Procedur re100 PAGE ms vt 12 ot ot wssectto8/ 1-100 ‘TABLE OF conrENTs /PARAGRAPE PACE 5. MAINTENANCE (cone) 5.3 5.4 5.5 5.6 5 5.8 5.9 5,10 Harnonie/Norarmonfe Distortion Tests « 5a 3.12 Calfbration sssseeses Troubleshooting « 53 Equipment Wistory .+.- Warm-up Current, Frequency Accuracy, And Input Power Tests «4+ 254 aries 8 Short-Term Stability Test (Allan Vartance) sees Trim Range Test s+ Oveput Level Test. Long-Tere Stability Test sessseseeeee Voltage Variation Test ss seeseses 5-10 5.19 crystal Aging Compensation «-esse+ves seeveeeeseetens SEM 5.14 DUT Output Prequency Low Compensation sesssesssessssssseseesceeee S15 5.15 WUT Output Prequency High Componsstion sesssessessseseeeseeseesee S18 5.16 Soldering Techasaues +. 2 5-20 517 Sample Test Data Sheets aa eyann rave 8-25 APPENDIXES Appendix A: Schematic Diagrams. Appendix 3: Outline Drauing, Assembly Drawings, Parts Lists. Appendix C: Additonal 4-100 Speetfications. List oF ILLUSTRATIONS Proves me Pace a 3a 3.2 33 24 4a 4a Sal Winchester Connector and Pin Arcangonent «+ 2 Connections for Normal Operation «.++- re Test Setup for Atoaie Resonance Lock Test +++++ a2 Operational Frequency Accuracy Test Setup sessssereeesesseseseenee JS Location of N-100 Frequency Adjustment sssseeseees 25 Dertvation of Nodulation Signs} s+. = ere) Block Diagr ee oe bo Warm-up Current, Frequency Accuracy, and Input Pover Tet es+se+e+ So atre100 ‘TABLE OF contexts LIST OF TLLUSTRATTONS (cont) runs, me PAGE 5.2 Output Level Test Configuration « 5.3, Long-Tore Stability Test Setup sess 38 5e4 Crystal Aging Compensation Test Setup +++» sen 5.5 Crystal Trim Adjustment Location iris - 5-12 5.6 Location of Frequency Correction Coapensat ion on Synthesizer Board Assembly «+. bas sis 3.1 Location of Frequency Correction Compensation on Synthesizer Board Assembly --...+- eevee S18 List oF Tastes asl mum Pace 1.1 M100 General Perfornance Specifications - 3s Funetional Operation Test Equipaent Sel negutred Mat Jeuauce Test Equipaent « 5.2 Teoubleshootiog ssessesess seeeeee S21 rorenianee 522 5223 524 5-26 5-24 5.3 Servo Board Al Test Measurements sunabe ce 5.4 Synthesizer AS Test Measurements 3.5 Oscillator Board As Test Measurements 5+6 Power Supply a3 Test Measure 5.7 Lasp Board A2A2 Test Measurements WwSection t 100 SECTION 1 {TWTRODUCTION & SPECIFICATIONS awtgopuerton 1.1 pescatPrrow The Efratom Model Y-100 Rubidium Frequency Standard (RFS), Patt Nuaber (PIN) 705021, 1s 2 sub-eonpact, ight weight, atomic resonance-controlled oscillator. The unit provides a pure and stable 10 Miz sinusoidal signa! from a 10 Mz voltage-controlied crystal oscillator (VCXO), which is ref- ferenced and locked to the hyperfine transition of Rubidiua 87 (x7), The reforonce elenent {2 an optically-punged integrated rubidium vepor cell, contained vithin the phyates package. or the standard Model H-100 thts technique provides long-term stability of ¢ 6x10! /soath (< 3.6x10 for first year) improving to < 2210!/ye azareing with the second year: 1f or dered with che lowértte option the long-term stability 8 < 107! Short-tera stability 4a rated at < 3810 averaged over 2 onevsecond period. The M100 was designed to be used by the ilitary as a Master oscillator 1s higi-perforeance communication systens, frequency standard equipsent, advanced navigation equipsent, and all other syst 15 which require ex tremely precise frequencies and tine intervals. With the proper Input Power provided, and su{table cooling provisions, the ¥-100 can be used as 2 freerstanding secondary frequency standard for Laboratory and testing exposes. 1.2 ManuaL, conten This wal containe all of the pertinent infor eion concerning the ‘operation and f{eld matntonance for the Model H-100, Efratom P/H 70502-1. ‘A Model H-100 with a Part Number other than 70502-1 is a modified unit. Tf a voditied untt differs operationally from the standard unft an adder dun will have been added. If an addendua has been added, tt {8 taportant to read the addendum prior to reading this nanual. Tf an addendum has not heen added for a partiealar Bfraton P/l, it can be assuned that the unit modification did not affect the unit's operations ‘The Efraton P/N is located on the naneplate label, between the 10 Mz output connector Ji and the rectangular input/nonitor connector J2. 1Seetton | 100 1.3 conwecroRs AIL necessary connectors for inputs at curput/eonteoring signals are easily accessible fron the cover of the M-100. The input pover and eignal fnonitor connections are to the rectangular connector J2, P/N ¥28748/7~ DooFIA, which mates with rectangular connector P/N M28748-/8-DIOLIA. The 10 Miz output 1s from the suA-sertes coaxsal connector JI, P/N 139012/61- 3001, which mates with SuA-sertes coaxtal connector P/N 139012/55~3006. Mating connectors for J1 and J2 are eupplied with o: unite 1.4 ELECTRICAL PROTECTION The electrical protection features of the M100 include internal diodes to protect against reversed-polarity {npute and 4nput~pover transients (high amplitude). ‘The 10 mlz output and all nonttor efgnal outputs have short~ cfreait protection. 1,5: AVATLABLE oPrioNS (a) Fast ware-up, £5 min to reach final frequency + 2x10"! @ 250, (2) Low-noise (5 Mie @ 1 veme tato 50 ohm load): > 125 dB @ 10 te fron carrier, > 155 48 @ 300 Hr from carrier. (e) Lowdrife, < 120M /aoath. (Meat sink, BEratos P/8 70577 1.6 sPectFrcattons. ‘The pertinent performance specifications for Model H-100 «1 Table Lele Meted in 12Section | M100 TABLE 11, Model H-100 General Perforaance Specifications ‘OUTPUT. cuaRAcTERISTICS Frequency: 10 tis Sine Wave, (+ Sxl0™!! at shipment) Auplitude: 0.5 veag (-10E + 50%) dato 50-ohm oad Phase Noise (S58 1 Hs By): > 120 €B at 100-Rz from carrier (Stgnal-to-Notse) > 135 dB at 1000-He from carrier Harmonic Distortion: 30 a8 Down Mon-Harmonic Distortion: 80 48 Dow Wormup: < 10 minutes to reach 10 wiz + 2x10! at 25°C anbient Peek current during vare-up: approx. 2.2 amps max. at 25°C with 26 vée input. eur Voltage: 22.5 to 32 vde (50 v, 50 ma transient). 10 watts eax, at 25°C with 26 vie input. < tml! for + 10 % tnpur voltage change. Power: STABILITY Long-Tera Drift: < 6x10"! for the First month after 14 days of continuous operation, < 3.6 x 107"? for the firet year, total period < 207"? tor the second year, Short-Tere Stabélity: y(t) = 3 x 107!! x (qh) for 1 see ¢y ¢ 100 seconds Magnetic Field: 3 x 1078 jai? worst se ortentation 2.4 x 107" !/causs) GENERAL <3 x 10719 From -55°C to 468°C (67°? co 15°F) at baseplate ature (non-operational): ~62°C to 465°C (80°F to 185") 4,81 high x 3.90 vide x 3.94 deep (sos Outline Dvg No. 70549-1) Weight: 4 16 max. without heatsink 4.5 1b max. with standard heatsink attached. Size (inches) 1Section 2 n-100 SECTION 2 INSTALLATION Iurgopverton cauzr0N TE UNIT'S OUTER COVER 1S A SPECTALLY DESIGNED MAGNETIC SHIELD; DAMAGE TO THE OUTER COVER COULD CHANGE ITS SHIELDING ccuagacretstics. 2.1 RECEIVING AND INSPECTION ‘The H-100 is packaged and shipped in 2 foaw-packed container. ‘The unit was inspected sechanically and electrically prior to shipaant. If the shipping carton is danaged, ask that che carrier's agent be present when ‘the unft ds unpacked. The uelt should be inspected for external damage (ues scratches, dente, or broken connectors), If danage is discovered, oF 4£ the unft fatls the Operations} tests, nceify the carrier, and Ball Corp., Efratom Division, 18851 Bardeen Ave., Irvine, CA 92715. Telephone (714) 152-2891; Telex 685-635. Retein the shipping carton and the foam packing material for the carrier's inspection. 2.2 sHIPEING 1x Tesnipsent ot the unit ts necessary, the original container and packing should be used. If the original container 4s not available, a suitable container with foarpacking 1s recommended. 2.3 STORAGE Teaperatures during storage should be lint (a) eaximie tesperature: +85°C (185°F) (b) aintmon temperature: ~62°C (-79°F) a follows: 2.4 nourruc. ‘The unit's baseplate has boon drilled end tapped to facilitate Lestat! tion. Although the unit 1s shipped ready for inetallation, = heat atnk and sufficient airflov aust be provided to ensure that the unit baseplate tesperature does not exceed 68°C (154°F) during operation. ‘The unit may be sounted with the eluatoua chersa] baseplate 12 contact with a flat metal curface using the supplied routing screvs, but the sounting screvs should not be alloved to penetrate the baseplate sore than 0.2 taches (Sen).Section 2 n100 ‘The hoat eranafer characteristics of the sounting surface mst be adequate to limit the rise of the untt's baseplate to 468°C. The cllovable environ ental temperature (Ta) for this mounting is: Ta 48°C - Vy, Ty, Ry here: V,= Supply Voleage in voles. 14> Supply Current tn ampere Ry= Thermal Resistance between unit and ambient, (*c/watt)« 2.5 POWER REQUIREMENTS. ‘The ¥-100 requires an external power source capable of providing between 422.5 ve and +32 vde, with minimum output of 2.0 amp. The positive Anput voltage is to J2 pin L, the negative return voltage oa J2 pin Pe In order to obtain optiqun signal tovnotite ratio the nax{aum ac ripple voltage to the input of che unit mist be less than 100 a peak-to-pesk during normel operation. During the warmup period a higher ac ripple ts acceptable, but at no tiue should the input voltage + ac ripple be higher/ lower then the input power Léaits stated. 2.6 MONITORING SIGNAL OUTPUTS. Figure 2.1 iMustrates the pin connections for the Winchester connector 42, and presents s brief functional description of the connections. 523. Rb LAMP VOLTAGE SIONAL YF. XTAL CONT VOLTAGE SIGNAL 4M. RESONANCE LOCK SIGNAL L. 422.5 70 +22 voc mNeUr P. GROUND (connected to enclosure) FIGURE 2.1. Winchester Coaneétor and Pin Arrangement. 2.7 INSTALLATION CONSIDERATIONS. Whether the unit 46 to be installed tn aystem, or used as freestanding frequency standerd, some consideration aust be given to the operating location. If the signal-to-noise ratio and/or non-harnonte distortion are considerations, the unit should not be installed near equipnent generating strong magnetic ftelds such a6 generators, traneformers, etc. aeSection 3 3. wmRoOUERTON 3e1 Test EqurENeNT section 2 OPERATION AND FUNCTIONAL TESTS 100 The test equipsent required to perfor functional teste 1s listed in Teble Del. Test equipment other than those items listed may be used, provided [thet the porforsance equals or exceeds the MINIMUM USE CIARACTERISTICS as stated in Table 3 TABLE 3.1 Functional Operation Test Equipaent Tre HINIWUM USE CHARACTERISTICS TEST EQUIPAENT 3.1 DC Power supply 3.2 Digital Maleineter (00) 3.3 Atomte Oses1~ Lecor Test Set 3.4 Resistive Load 3.5 Tine Output Voltage: 0 Te 30 vie Output Currents 3.0 aap Voltage Range : 0 To 30 vée Accuracy: + 1.25% tv Resistance Renge: 0 To 150° oh Accuraey: N/A Input Frequency: 10 sate Accuracy: + Ixo™!! ae 12 ity: parce in 10 Feed-ehew type 50. ohm Cepable of indicating I min to 15 ain Mewlece-Packard 62964 or 64335 Fluke 80004 or 0208 Efratom 15-1054 oF T5105 Hovlete-Packard 10100¢ oF Pesone Electric 4119-50 Any wetstwaceh er wall clock 3.2 OPERATION With the output connector JI terminated vith a S0-ohe resistive load, and the required input power applied to the pins L (+) § P (-) of comector J2, the onfe will Immediately begin producing a 10-¥ilz signal fron the VoHO. Within 10 minutes after application of input pover, the OHO will bbe locked to the etomte reference frequency. aSection 3 PikBistive Load Pigure 3.1. Consections for Normal Operation nore. Throughout the test procedures, ‘the Model H-100 may be referred to as the UUT (Unit Under Test). Also, all con nections described or {llustrated are for the standard configuration, SMA-type coaxial connector JI, and Winchester connector J2; 4€ tho UT has @ different connector arrange- ent, make the described connections to the appropriate pins as described in the pin diagran accospanying the WUT. 3.3 ATOMIC RESONANCE LOCK, AND VCHO CONTROL VOLTAGE TESTS. 3.31 Connect equipment as shown in Figure 3.2 with the 50 obm feedchrough connected at the H-100 output connector JI. Do not make the dotte connection until instructed to do ao. ane 9 ere sum om Figure 3.2 Test Setup for Atonfe Resonance Lock Test 3.3.2 Adjust the de power supply controls to obtain a 26 + 1.3 vde indication on the Diet. Note the tine (1ten 2.5) Input power Je applied to the unit. 3.3.3 Disconnect the DMM positive lead connected to J2 pin L without Assturbing the positive daput voltage connections aSection 3 M100 3.3.4 Set the DMY to measure resistance tm the 200 ohm range. (Do not use the ‘Auto Range for this test.) 3.3.5 Connect the DMM positive Lead to J2 pin H (Figure 3.4 dot ted-Iine connection). Monitor the DI {ndtestion during vai NOTE During warw-up the DMM will indicate overrange. Within 10 minutes after pover application, the D'M should indicate approximately 150 oha, indfesting that the crystal oscf]~ lator has become locked to the atomic reference frequency. 3.3.6 Verify that atonte lock occurs < 10 ainutes after application of input power to the 4-100. 3.3.7 Aftor the atomfe lock has been verified, renove the DMM positive lead From J2 pla H, and sat the DM controls to measure de voltage in the 20 volt range. 34.3.8 Connect the DMI positive lead co 2 pin Fy and verity that the DIM indication fe between +3 and +17 vies wore If the DMM indication de not between +3 and +17 de refer to Section 5, Maintenance, paragraph 5.13 stepe 5.13141 ehrough $.13.1.9 oF 5.13.61 eheough 5.13.44, as necessary, for the adjustment procedure. 3.4 OPERATIONAL. FREQUENCY ACCURACY TEST 3.bel Connect the equipment shown in Figure 3.4. own w Figure 3.3 Operational Frequency Accuracy Tost Setup. +3Section 3 100 3.4.2 Adjust the de pover supply controls to obtain a 26 + 1.3 vde indteatton fon the Diat. 3.4.3 allow suftictent tise for equipaent to stabilize, ore The UT requires 10 minutes stabilization to obtain the following frequency accuracy: + 2x10! of the final fre~ auency (calibrated frequency), oF the frequency before the vunie was turned off (1f turnoff vas within 24 hours). Tf the WUT vas in storage, the worse +H last calibration accuracy, or 5x10”! factory setting at ase error = + 22107! vareup ‘shipment (vhichever 1s applicabie) + “aging specifications ‘The WT requires | hour stabilization time to obtsin the following accuracy: + 2x10! of final frequency or fre quency at curnoff (Af turnoff vas within 24 hours). If WUT wos in storage, the worse case error = + 2x107!! yereup +/- 1 calibration accuracy, or Sxl0™! factory setting at shipment, vbichever Ls applicable + “aging apecification. aging Specification: Standard N-100: < 6110" /nonths -100 with high-stability option: {imo faonth (refer to the Table 1.1, Speci ications). 3.4.4 TE necessary, prose the test set's ADVANCE switch to unblank the Gleplay, then press the RESET switch to obtain the READY neseege. 3:4. Perform all necessary seny option selections and bring the READY message back to the display. Ensure that “UT 10 Me” 4s part of the bottomline message. 3-446 Press the test set's RESET push button to begin the test. Allow the test set suffictent tine co obtain the UT's FREQ OFFSET indication for the 100 see AVR TIME, and the UT's ALLAN VARIANCE indication for at least the 10 see AVR TIME, (the 100 sec freq offset will have to update 10 tines fn order to obtain the 10 sec Allen Yattance test results). a4Section 3 M100 3.4.7 Allow sufficient tine for the test set to indicate the UUT OFFSE? for the data you require. Verify that the UUT frequency offset 4s within the tolerance stated in the NOTE following Step 3.4.3. nore If the UT 4s not within the stated tolerance Iinite continue with the Frequency Adjustnent procedure, pare~ graph 34,7e1 and 34.7.2. 3.4.71 Refer to Figure 3.4 to Locate the 4-100 frequency adjustaent screw access hole. Figure 3.4 Location of M100 Frequency Adjustment 3.4.7.2 Using the appropriate alignnent too! and sonitoring the test set indtcation, rotate the adjustment screw clockuise or counterclochutse aa necessary, until the test set display indicates the M100 is within the requized tolerence (or + 5x10!) for ene thee averaging tines. wore 1 the watt 42 aged beyond the adjustuent capability of che frequency adjust potentiometer, refer to the Maintenance, Section 5, Subsection 5.14 or 5.15, as necessary. 3,5 SUORT-TERM STABILITY TEST (ALLAN VARIANCE) nove Tf you have just completed 3.4 through 3.4.7, the Allon Variance (AV) indications on the test set are valid. If 3.4 was not performed, continue with 3.51 3.5e1 Connect che equipment ae {llustrated in Figure 3.4. 35Section 3 m-100 3.5.2 Adjust the de pover supply controls to obtain a 26 1.3 vde indfeation fon the DM. 3.5.3 Allow sufficient tine for equipment co stabilize, See Note following paragraph 3.4.3. 3.5.4 TE necessary, press the test set's ADVANCE avitch to unblank the ‘tsplay, then press che RESET switch co obtain the READY nessage. 3.5.5 Perform all secessary senu option selections and bring the READY ‘message back to the dieplay. Eneure chat “WT 10 Mis" te part of the bottomline message. 3.5.6 Press che test set's RESET push button to begin the test. Allow the test set sufficient tive co obtain the WT's AV indication for at least the 10 see AVR THE. (The 100 sec FREQ OFFSET will have to update 10 tines in order to obtain the 10 see AV test remuite.) 3.5.7 Alloy sufficient tine for the test set to indicate the WT AY, as re- quired. Verify chat che UT AV {8 within the tolerance Limits for short- term stability, as stated in Table 1.1. 36Section w100 stcrioN 4 ‘THEORY OF OPERATION 45 gua 441 THEORY OF OPERATION ‘The Model ¥-100 Rubdtum Froquency Standard utilizes the ground-state iy perfine transition of the rubidium atom, at approximately 6.8 Giz. In order to use this atonfc transition, the oscillator incorporates a rubé~ tua coll, a rub{dius emp, and servo electronics to control the frequency of a VoHO. The oscillator combines the parfornance of the basic quartz ‘crystal with a frequency comparison schese to en atoale resonance fre~ quency, the hyperfine frequency. Ie this sanner, the behaves ike a crystal oscillator for time partods shorter than the rome etandard oop response tine, and like an atonic oscillator for tine periods sreater ‘han the loop response tine. The inherently stable atomic resonance is therefore used to servo out the quarte crystal aging and a host of other eovironeentel effects. ‘The rub{diua atomic oscillator {s a passive device, meaning that the atons theaselves go not produce a self-sustaining otefllation. The physics can bbe viewed tn irs staples fora a series-resonant tank cireutt that 48 resonant at the hyperfine frequency (approxiaately 6.8 Gilz for rubldtua atoms). The voltage source driving the tank {6 the microwave input coming from the modulator/aynthesizer, and the LCR components are the rubidium atoms. ‘The atomic resonance 1s detected by optical seans and involves a process known as optical puaping, by which atoas ro raised to a higher state through absorption of Light energy coating from the rubidium lasp. ‘The crystal osctllator (VoXO) 42 locked to the rub{dium atomic resonence at fy, = 6.834 682...0il tn the following manner. A alcrovave signal, having a frequency 4n the vicinity of fy, 18 synthesized from the nominal 10 diz VoxO output. This microveve signal 1s used to resonate rubidium ‘tons that are present in a sealed glass cell (the Rb resonance cell) in the form of @ vapor that is placed inside lov Q alctowave cavity. The frequency synthesis scheme 1s designed fy, ) the photocell signal contains a 127 He ‘component which for suall offsets 18 proportional to the offeet. The phase of the 127 ls signal indicates Af the rf 42 Cfpy oF >fgps and the phase {nformation 1s used to servo the VCXO in the proper direction until the synthesized rf = f+ ae cae 25a He Pigure 4.1. Derivation of Nodvlation Signal 4.2 BLOCK DTAGRAM ANALYSIS ‘As (llustrated in the block dtagran Figure 4.2, the Mode! 4-100 containg the following five Asceablt (2) Servo board assembly Al. (b) Physics package A2, (A2 includes the resonator, resonator thersostat board sssenbly A2AI, and the leap bosrd arsenbly A2A2). (e) Pover supply board seseably 3. (a) OsesMator board assembly Ab. (e) Synthestzer board assesbly AS. In order to sore easily understand the operation of the H-100, the fol- lowing 48 written in the logical order-of-operation (with the exception of the power supply which {s covered last), and not in the numeric order of the jenblien.Section & 100 4.2.1 QeetI ator Board Assosbly Ale The 10-Mlz voltage-controlled crystal osefllator functions az the rei ference oscillator to provide 4 stable 10 Miz signal to the output com nector and to the input of the frequency synthestzer assembly AS. A control voltage fro the servo asseably 4e applied to « varactor diode to shift the frequency over a range of approximately 1,5x10° to aaintain a 10 Mts output. The oseiTlator board containa a 10 Miz quarts exystal ‘mounted in a thermal oven, the heater controller, an ogefllator circuit, and output buffer amplifier. The VOX crystal {5 oventzed to tuprove es natural stability, and fre~ quency locked co fy PHSeEfly to teprove ts long-ters stability. The temperature coofficient of the eryetal {¢ siniaized by elevating ite temperature to approxiaately €0°C, and holding that constant with the crystal heater controller cireuitry. After atomfe lock i obtained, the frequency of the oscillator 1s slaved to the atomie resonance of the rubidium ator via the VOX0 control voltage from the servo assembly. The output buffer amplifier provides isolation for the oscillator el cuits. The buffered 10 Miz signele are transformer coupled to the output connector JI and to the synthesizer assenbly AS. 4.2.2 Synthesizer Assexbly AS. The synthesizer assembly produces the 6.834 682...Clls efgasl, from the YoHO 10 Miz output, which te compared to fy, within the physics package. The VOXO's control voltage 1s determined by the results of the comparison betwoen the synthesized rf and the fy, Signal developed in the physics packages ‘The 10 viz signal from the VCXO fe applied to doth a tripler circuit and « sinewave to TTL conditioning eirevit on the ayathesizer aeséably. The 10 Miz signal vbich was multiplied to 30 lz by the tripler cfrcuft is phase nodulated at 127 Hz rate, and then applied to a doubler circuit vhich produces a 60 \flz signal, wodulated at the 127 lize ‘The 10 Miz signal which vas conditioned into a TTL efgnal se divided and Tecosbined to produce 2 5.3125 Wiz TTL signal. This signal ie combined with the phase-aodulated 60 Miz eignal and coupled by coaxial cable to a harmonic generator/step recovery diode within the physics package. a5Section 4 e100 In addition, the synthesizer assenbly provides control over the strength the C-field. The Cr£ield is used as the fine tuning for the Rb output frequency. ‘The C- of 4 magnetic fleld around the resonator cavity, call t4eld control 1s cesperature-conpensated as 2 function of the resonator temperature, reducing the tenpereture coefficient of the M-100. 4.2.3 Phyetes Package a2. The function of the physics package 1s to provide the correct signal to the servo board in order to control the frequency of the VCIO. The physics pack je contains the components required to produce the atonie fence Fraquency (6.834 682 .., Gllz) to which the 10 Mie VCXO output 4s referenced and locked. The physics package consiete of the resonator cavity, the resonator thermostat board ZAI, the Rb leap osctllator beard 42242, and the Rb lamp and lamp housing assembly. The 60 tle and 5.3125 Mz signals from the synthesizer board are applied to a harsonte get fator/etep recovery Afode (GR1). When CRI conducts it produces the harmonics of the 60 Miz and 5.3125 Mis efgnale. The fund: ‘ental frequency and the harnonic frequencies are fed to the resonator ‘cavity (resonant cell) vila @ resonant loop. The resonant cell and 1000 fare tuned co select che 1144 harmonic of 60 Miz minus 5.3125 Hz, which corresponds to the resonant frequency of the rubldfus. The response of the atons tg detected by che photocell which supplies the correcting signal to the serve board from E13 and E14 located on the resonator chermostat board. Resonator Cavity. The resonator cavity contains the Rb cell, and a photocell (CR2). The Rb cell 4 specially deetged glace coll which contains a eixture of rubid- tum isotopes and various gases which are used to provide the reference frequency. The photocell 1s a silicon photodetector. The photocell 48 placed behind the Rb cell, directly in the Light path of the Rb spectral lamp. The photocell detects variations tn the Rb light {ntenaity which are < 0.1% of the overall intensity of the Tight. TF the synthests nicrowave aignal 4s not exactly equal to fy, indfeating that the VCXO output 12 aot oxactly 10 Miz, the photocell output signal 1s electronically converted into an error signal which 1s used to steer the VCHO to exactly 10 tie. 46Section 4 100 ‘The temperature of the cavity 4s elevated id satntained at approximately 75°C by evo heater tranetetors and a therafetor mounted on the resonator, operating in conjunction with the cireutta on the resonator thernostat board. A coil wrapped around the resonator cavity provides a magnetic field around the resonator cavity. This magnetic field 1s called the C-fleld, The adjustment of the C-field is used for fine-tuning the output Frequency of the M-100. Resonator Thernos oar A2AL The resonator thernostat regulates the temperature of the resonator cavity by regulating the power to the heater elements acunted on the resonator cavity. A theruistor eounced on che resonator cavity acts as a temper ‘ature sensor and foras part of the fet rack network for the thersal control eireuit. Lamp Osetl1ator Board A2A2, The Rb lanp oscillator board consists of the laup exciter circutts and ep-housing heater circuits. The function of the lasp oscillator board Ae to ignite ond maintain tgnition of the Rb spectral lamp, and co provide antral of the required heating neceecary tn matntatn the lamp housing a approximately 115°C. ‘The amp exciter cfrevit provides an rf excited plasma discharge which Agnites and msintatns ignition of the Rb spectral lenp. The aap exciter circutt 1s a tunable osed2ator, operating at approsinately 90 Miz. The actual frequency of oscillation is determined by a tuned LC tank circuit, with the L component being a coll permanently eounted in the lamp housing. Rb Lagp Assenbly. ‘The Rb lanp assoubly consists of che specially febricated Rb spectral lenp, the Rb lanp oscillator cofl, ané the lamp heater and tesperature ssengor elements. The Rb apectral lanp produces Might of the proper wave= Length to interact with the rubidium stoss contained u{thin the Eb reso nant cell, The Rb lamp coll Je permanently nounted within the Rb lanp housing 1a such a way chat {t surcounés the Rb lamp when the lamp is fnstalled dato the housing. orSection 4 e100 ry function of the servo assembly 4s to translate the photocel) ‘output signal into the correct control voltage for the VOXO in order to maintain the preci 10 Miz output frequency. The contrel voltage te derived by comparing the phase of the 127 He sodulation signal with the phase of the photocell output signal. The 127 Hz modulation signal, a 127 Us reference signal, and a 254 Wz reference signal originate ia the servo sseably. The cocondary function 49 to provide the monitoring signals for tthe Rb lamp operation, the atoate ri jonant lock cfxeust, ané the VCXO control voltage sonttors 4 CWS oscillator/divider on the servo assembly provides the 127 Hz modu lation eign for the synthesized ef {atroduced into the resonator. The oeeiMator frequency of 8-128 Kis {e divided into the required 127 te and 254 Hz reference efgnals. The 127 He nodulation signal is vevechaped {nto 4 sinewave on the servo assembly, and coupled to the eynthesizer assembly to sodulate the rf. ‘The photocel! output froa the physice packege 4e routed to 4 dual stage current amplifier on the servo assenbly. The photocall output efgnel ie 254 Hz when the unit 4s in the locked ode of operation, of 127 He while the unit {8 obtaining lock. The first stage of amplification conditions the photocel? signal, and provides the lasp voltage monitor signal avail able at the output connector J2 pin Bs The output of the second stege of ampliftcatfon is used for the phase comparison. ‘The phase detector 4s a triple two-channel CHOS analog switch which func~ tions as a synchronous demodulator. The 127 and 254 liz reference signals control the synchronous switching of the two switches, while the third switch ie controled by the level of signal from the lock monitor ctrcutt. 4.2.5 Power Supply A3. ‘The internal power supply accepts +22 to +32 ve input power and provides 120 wdc filtered and regulated power for the M100 electronics, #21 vde {Aleered, and floating power for the Rb Lamp hea! sj 1n addition to pro~ ‘viding the unregulated, f1ltered voltages for the oscillator heater and resonator heaters. The input voltage ine 42 fuse and diode protected inst reverse-polarity {npute.Section 5 100 secrion 5 MAINTENANCE, 5. INTRODUCTION. ‘This section of the nanval provides detatled procedures and instructions for perforuing all netorenance (unctfone on the M100, including incoming sccept 2 tests, perfornance tests, calibration, troubleshoot ing and repate. Throughout the test procedures the 4-100 will be referred to ae the VUT (Untt Under Test). Sel REQUIRED TEST EQUIPHENT. The required test equipeent to properly service the UT 4 Iisted in Table 5.1, Test equipment other than the iteus Mated aay be used provided that they meet oF exceed the Mintmun Use Specification stated {n Table 5.1. In the event that the required test equipsent or a suitable qubstituee {8 not available it 1s recomended that the unit be returned to the factory for evice. Table $.1 REQUIRED MAINTENANCE TEST EQUIPMENT Tees Wintaus Uae Specification [Test toutpmant Del DC Power Supply | Voltage: 0 to 30 we Meviett Packard ‘Accuracy: Output wonitored | 6296A or 64338 Current: 0 to 3 ade Accuracy: Output sont tored 5.2 Digital 0 to 30 wie John Fluke multigeter £1.25% sv 8600 opt 01 com) current: 0 to 3 ate (2 requtred) flea Restetance: 200 oha range WA 3.3 Reference 10 te ERATOM FRT-H Frequency Accuracy: ¢ 1x10 /aonen, standacd oogrtern dete Sud Linear Ph Compartson range! 1 part | Tracor 688 oll Re $n 10” to 1 part 10 51Section 5 ‘Table 5.1 REQUIRED MAINTENANCE TEST EQUIPHENT (cont+) Trea Mininua Use Specification | Test Equipment 5.5 True ANS Range: 0 tol veas Hewlett Packard Voltmeter 10 ie 34030 5.6 Spectrum Analyzer 5.7 Maltsfunetton Counter 5.9 Osettioscope 510 Resistive Load Sell Atomic Osetllator Test Set Range: 20 Hz to 100 ie Bandwidth: 300 KHz Perfors tine {aterval easurenent using externa] ‘time base. Periods averaged: 1. £0 10° Provide Data output Span Range: 1 aV to 1V ange: DC co 100 mz ‘Type: Feedthrough epedance: 50 ohm Accuracy: $0.5 oha Inputs 10 Mz Accuracy: + x17! Howlett Packard MIT Display with 8952 IF section and on 65538 RF etton Fluke 1910402 Howlett Packard 71324 oF Texas Instiunents PRIMAL GAFR, Tektronix 463 oF 7704 MoD 129F wich 7226 Vert. B/1 and 78534 Thee Base 2/1 Ponona Electric 4119-30 of Howlett Packard 101004 erator TS-1054Section 5 100 5.2 TEST PROCEDURES. ‘The test procedures described in subsections 5.6 through 5.11 can be used to check performance for incoming tnspection and periodic unit evaluation. These tests can be perforned without resoving the unit's outer cover. 5.3 CALIBRATION. Calibration of the M-100 se accomplished by performing the teste described Sn Section 3, $n addition to the teste in subsections 5.6 through 5.15 ( required). 5.4 TROUBLESHOOTING. In the event that aajor section of the complete unit is inoperative, troubleshooting will be necessary. Table 5.2 Mets the most conmon alfunctions and the recommended checks. In general, interna] adjustments hhave only a limited range and are designed to coapensate for minor varia~ tons in circuit components; seldoa, sf ever, will an internal adjustment restore operation. The test procedures in subsection 5.6 through 3.13 will serve ae an afd in further dsolating @ trouble to a specific efrouit section. Since the operation of 0 circuits 4s dependent on proper operation of other ctrouies, troubl hooting must be performed in the sequence given. Lf che trouble indleates a possible malfunction of a epecifie board, perform the troubleshooting procedure on that board. If the trouble cannot be found by any other aeans, perfora the measurenent tests described in Tables 3.3 through 5.7 in sequence until the trouble is located. If the problem is found to be in the physice package return the wnt to the factory. ‘The physics package 48 aot f1eld repalrable. 5.5 BQUIPHENT HISTORY. Ie 4s recomended that an Equipsent History be maintained for each unit, land that the results of che perforsance tests be nade a part of the per anent record for the Equipment History. A blank sanple Performance Check List is included at the end of this section for your conventence. The Dlank sample check Ifet may be reproduced aa necessary to provide @ pernanent record.Section § e100 If the DUT has a hesteink attached, remove it prior to be ginning the test sequence. 506 VARN-UP CURRENT, FREQUENCY ACCURACY AND INPUT POWER TESTS. 5.6.1 Connect the equipment as shown in Figure 5-1 a a Te 2 Figure 5-1. Warm-up Current, Frequency Accuracy, and Input Power Test Configuration. 5.6s141 Set the DO #1 controls for voltage measurements fn the 30 vde range. 5.6e1.2 Set the DMM #2 controls for current seasurenents in the 3 ade range. 5+6.1.3 Engure that all test equipment 1s operating and has hed sufficient warmup tine. 5.6.2 Adjust the DC pover supply controls to obtain a 26 + 1.3 vie indication on DMM #1. Note the execc indication; it will be required in step 5.6.5. 5.6.3 Allow the WUT to operate at embent toapersture for at least 5 hour: Nore, ‘The naxinum tonperature fluctuation mst aot exceed + 2*C. Also, continuous operation of the atoaie oscillator test set ie preferred over warwups 5.6.4 Ensure that the atonte oscillator test set has been operating at anbient temperature for at least 2 hours, press the RESET push button to begin the test.Section 5 m-100 5.6.5 Allow the atoate osefllator test set sufficient time to display che WUT offset for the 100 seconds averaging tine. 5.606 Record the WT offset as indicated on the atoate oscillator teat set Tf the indicated offect is greater than + 52107!, adjust the UOT Pre- quency Tris potentionster (ae described im Section 3, steps 3.4.7.1 and 3.4.7.2) to obtain an fn tolerance {adleation. If an in tolerance indi cation 16 not possible and the UIT frequency 16 too lox, perfora sub section 5.14; 1¢ eke WUT frequency 19 c00 gh, perfore subsection 5.13+ 5.6.7 Adjuet the DC pover supply for minimin output (0 vde), and note the turn-off tine. Allow a afnimum of 2 hours before proceeding. 3.6.8 Monitor Du?l and Dit #2 while adjusting the DC power supply for the exact voltage noted in step 5.6.2, and note the turn-on time. 5.6.9 Record the Dia #2 maxiaum current indication during the WUT 10 ainute warmup period. Nore. ‘The UT current normally reaches maxizua within ? ainutes ‘after Input power 49 applied 5.610 Verify that the WUT maximin warmup current i= ¢ 2.2 ade. 5.6.11 At the end of the 10 minute warmup, press the atonic oscillator test ‘set RESET push button end record the UIT frequency offset for 100 seconde averaging tines. 516-12 Verify that the WUT frequency offsets recorded for steps 5.6.6 and 5.6011 differ by no more chan + 2x107!, 5.6019 Allow the DT to operate continuously for at least 1 hour. 6.14 Note the voltage {ndleation on DMM # and the current indfeation on DIO n 55Section 5 100 5.6015 Using the following formule and the data fron step 5.6.14 determine the WUT pover consumption. Power Forma: P= 1 E P = Pover 1 = current B= Input voltage 5.6416 Verify that the WT power consumption after > 1 hour operation 42 < 18 wares. 5.6017 If no other tests are required, adjust the DC power supply for miniqus output and disconnect the test setup. 5.7 SHORT-TERM STABILITY (Allan Variance). 5.741 Ensure that che equtpeent {9 connected ag shown in Figure 5.1, (Om #2 Le not required for thie test). 5.7.2 Adjust the DC power supply controls to obtain a 26 41.3 vie indication of Dy #1. 5.7.3 Ensure that the WUT and the Atoafe Oscillator Test Set have had sufficient stabilization time. (The WUT requires 1 hour stabilisation). Nore ‘The maxima tonperature fluctuation must not exceed + 2°Cs 5.7.4 Press the RESET push button on the Atomic Oscillator Test Set to begin the Allan Variance tests. 5.7.5 Allow the Atonie OsedIator Test Set suffickent time to displey the Allan Varfance for averaging tine of 1 and 10 seconds. 5.7.6 Verity that che Allan Varfance for 1 second averaging tine is santo7!, and that the Allan Variance for 10 seconds averaging tine is { Into"! as indicated on the atoute oscilletor test sets 56