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Thin Films Brief PDF
Thin Films Brief PDF
Series Editors
Editor-in-Chief Associate Editor-in-Chief Sr. Editor Editor
Dr AL Moorthy Shashi Tyagi Vinod Kumari Sharma Alka Bansal
Asst. Editor Editorial Assistant Printing Marketing
Kavita Narwal Gunjan Bakshi SK Gupta Rajpal Singh
Cataloguing in Publication
Chopra, K.N. and Maini, A.K.
Thin Films and their Applications in Military and Civil Sectors
DRDO Monographs/Special Publications Series.
Includes glossary
1. Thin Films 2. Coatings 3. Defence Applications
I. Title II. Series
621.3.049.772.2
© 2010, Defence Research & Development Organisation, New Delhi 110 105.
ISBN 978-81-86514-32-0
All rights reserved. Except as permitted under the Indian Copyright Act 1957, no part of
this publication may be reproduced, distributed or transmitted, stored in a database or
a retrieval system, in any form or by any means, electronic, mechanical, photocopying,
recording, or otherwise, without the prior written permission of the Publisher.
The views expressed in the book are those of the authors only. The Editors or Publisher
do not assume responsibility for the statements/opinions expressed by the authors.
Designed, produced, and printed by Director, DESIDOC, Metcalfe House, Delhi110 054.
Preface
Dr KN Chopra
Shri AK Maini
vi
Acknowledgements
Dr KN Chopra
Shri AK Maini
Contents
Preface v
Acknowledgements vii
CHAPTER 1: THIN FILMS: TECHNOLOGY AND APPLICATIONS
1.1 Introduction 1
1.2 Types of Thin Films 1
1.3 Thin Films Design 1
1.4 Thin Films Fabrication 6
1.5 Thin Films Thickness Control 8
1.6 Dependance of Thin Films Properties on Various Parameters 9
1.7 Thin Films Applications 10
CHAPTER 2: THIN FILMS: CLASSIFICATION AND TYPES
2.1 Introduction 13
2.2 Types of Thin Films 15
2.3 Metallic Films 25
2.4 Dielectric Coatings 26
2.5 Coatings Developed at LASTEC 27
CHAPTER 3: THIN FILMS: DESIGN METHODOLOGIES
3.1 Design Parameters 31
3.2 Design Criteria 33
3.3 Critical Issues 34
3.4 Absorption for Withstanding High Power Densities 39
CHAPTER 4: THIN FILMS: FABRICATION TECHNIQUES AND
EQUIPMENT
4.1 Thin Films Deposition 41
4.2 Coating Techniques 41
4.3 Deposition Techniques 43
4.4 Critical Issues 47
CHAPTER 5: THIN FILMS CHARACTERISATION
5.1 Important Parameters 51
5.2 Characterisation Tools and EquipmentInduction 51
CHAPTER 6: SCIENTIFIC APPLICATIONS
6.1 Electronics Applications 55
6.2 Medical Applications 59
6.3 Differential Thermal Analysis Measurements 60
6.4 Thin Film Sensors 60
6.5 Thin Films Coatings Applications 61
6.6 Thin Films in Nanotechnology 62
6.7 Optical Applications 63
6.8 Thin Films for Efficient Solar Energy Conversion 64
CHAPTER 7: INDUSTRIAL APPLICATIONS
7.1 Electronics Applications 67
7.2 Thin Films Coatings Applications 70
7.3 Nanotechnology Applications 68
7.4 Medical Applications 74
7.5 Optical Applications 75
7.6 Soil Testing Method 76
7.7 Polyethylene Terephthalate Films (Biaxially Oriented) for Food Packaging 76
7.8 Thin Films for Warming Applications in Agriculture 76
7.9 Thin Films for Information Storage 77
7.10 Thin Films for Electroacoustics 77
7.11 Thin Films in Telecommunications 78
7.12 Ultrananocrystalline Diamond Thin Films 79
CHAPTER 8: CONSUMER APPLICATIONS
8.1 Electronics Applications 83
8.2 Transducers Applications 86
8.3 Thin Films Lithium Batteries 87
8.4 Lead Sulphide Thin Films in Decorative Coatings and Imaging Techniques 87
8.5 Thin Films Amorphous Silicon for Chemical Imaging 88
8.6 Thin Films for Artificial Retina 88
8.7 Thin Film Coatings for Artificial Jewellery 88
CHAPTER 9: MILITARY APPLICATIONS
9.1 Military Optics and Coatings 91
CHAPTER 10: EMERGING TRENDS/CONCLUSIONS
10.1 Future Challenges in Useful Applications of Thin Films 95
10.2 Conclusions 97
List of Acronyms 99
Physical Quantity and Units 102
Glossary 103
Index 107
x
Chapter 1
1.1 INTRODUCTION
The main purpose of depositing thin film optical coatings on an optical surface is to
so modify it to provide environmental protection and/or improve optical performance.
Thin films are thin material layers ranging in thickness from fractions of a nanometer to
several micrometers. Electronic semiconductor devices and optical coatings are the
main applications benefitting from thin films construction.
Some work is being done with ferromagnetic thin films as well for use as
computer memory. Ceramic thin films are also in wide use. The relatively high
hardness and inertness of ceramic materials make this type of thin films coatings of
interest for protection of substrate materials against corrosion, oxidation, and wear.
In particular, the use of such coatings on cutting tools may extend their life by
several orders of magnitude.
materials. The design is done by considering the Fresnel reflection coefficient from a
single interface between two materials and is carried out by keeping in mind the function
to be performed by the coated component, e.g., high reflection, anti-reflection (AR),
polarisation, chromatic dispersion, beam splitting or filtering, etc. Other parameters to
be considered are the operational wavelength range and the desired angle of incidence.
It is interesting to note that even if the value of the reflection coefficient is small for
a particular interface because of small difference of refractive indices of the materials of
the layers surrounding it, it is still possible to obtain a very high overall reflectivity of
the component because of the contributions of the reflection from other interfaces,
based on constructive interference in a certain wavelength range.
The well known laser mirrors have all the optical layer thicknesses equal to a quarter
of thickness of the desired wavelength. The design becomes more complicated if the
desired effect is to be obtained in a broader region of wavelengths. For AR coatings,
design is based on the destructive interference. It is also possible to design coatings for
other specific functions like beam splitting, polarisation, a combination of beam splitting
and polarisation, edge filters (like short wave pass filters, long wave pass filters, and
band pass filters), a combination of desired reflection properties in different wavelength
ranges (like AR at certain wavelengths and high reflection at other wavelengths or vice
versa), and chromatic dispersion, i.e., dichroic mirrors.
The design of dielectric coatings is a complete topic in itself, and has to be learnt by
the optical design engineer. Here the subject is being introduced and its physics is
discussed. It is to be understood that the complexity of the design depends upon the
nature and the number of functions to be performed by the coated component. The more
complicated the functions, and more the number of functions, the more complex is the
design. In some cases, the number of layers is small (3 to ~21), and in some cases, it can
be very high indeed (in the vicinity of 100). The design also depends on the difference
of the values of refractive indices of the materials of the layers. Resonator mirrors in
lasers are mostly dielectric-coated mirrors, as these are free from absorption associated
with the metallic coatings, and leading to very high reflection (99.99 per cent or higher).
However, these do not give shining lustre like appearance as is the case for metallic
mirrors. Instead, they appear transparent, since they have high reflection at a particular
wavelength, and also because the materials have negligible absorption.
The reflection properties of a multilayer (ML) mirror can be calculated by matrix
method, in which each layer is associated with 2 × 2 matrix, and the matrix of the design
is obtained by multiplying together the matrices of all the layers. The resultant matrix
can be used to calculate the complex amplitudes of the reflected and the transmitted
waves, along with the field distribution in the multilayer structure. The frequency
dependence of these coefficients results in achieving chromatic dispersion, i.e.,
designing of dichroic mirrors. It is to be noted that nowadays, many numerical
optimisation software based on the matrix method are commercially available. Some
refined softwares like Monte Carlo method are also available for efficient optimisation of
the designs.
(a) Anti-reflection Coatings
The AR coatings (optical thin film coatings for reducing reflections from surfaces)
are one of the most important coated components. These AR coatings are dielectric thin
film coatings applied to an optical surface to reduce the optical reflectivity of that
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Thin Films: Technology and Applications
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Thin Films and their Applications in Military and Civil Sectors
modifies the electron motion by defining allowed and forbidden electronic energy
bands. Thus, PhCs can be considered as the artificial structures with the optical
equivalent of the energy gap in a semiconductor. Using high speed photons in place of
relatively slow electrons as the carriers of information, the speed and bandwidth of
advanced communication systems is expected to increase dramatically, and thus,
revolutionising the telecommunications industry. During the data movement on silicon
chips, electrons pass through electronic gates, and being charged interact with each
other, thus generating excessive heat and limiting their movement.
The PhCs use uncharged photons for data flow and are thus free from this problem.
It is to be noted that negative refraction has been observed in periodically
inhomogeneous substances. This has been demonstrated in photonic crystals, both
theoretically as well as experimentally. Negative refraction of acoustic waves has also
drawn the attention of the researchers. The experimental confirmation of negative
refraction has helped the electromagnetic research community to identify many
observable and exploitable effects. When photons pass through a block of transparent
dielectric material, these encounter regions of high refractive index (dielectric)
separated by regions of low refractive index (the air holes).
This contrast in refractive index acts like a periodic potential experienced by
electrons traveling through a silicon crystal. In case of a large contrast in refractive
index between the two regions, most of the light is confined in either of the two regions,
thus resulting in the formation of allowed energy regions separated by a forbidden
region, i.e., photon band gap. The effect can be more pronounced in the presence of
defects which are nothing but irregularities introduced by changing the size of a hollow
ball or the chemical microstructure of the PhC. This is because the defects act like
efficient guides routing light through desired paths at a speed much higher than that of
electrons in a chip.
The PhCs have applications in waveguides, Bragg reflectors, supercollimators, and
superprisms. Choi5, et al. have studied improved transmittance in one-dimensional
metallic PhCs5. They have theoretically considered the effect of absorption losses in
metal layers, and have shown that the transmittance of a one-dimensional metallic PhC
can be increased up to 67 per cent. The starting structure for their study consisted of a
stack of five alternate layers of Ag (layer thickness 30 nm) and four layers of GaN (layer
thickness 64 nm), and also one layer each of GaN of 32 nm (i.e., half thick) on top and
bottom of the stack. The total thickness of Ag layers chosen in this PhC was 150 nm, so
that it is several times longer than the skin depth of Ag.
An interesting observation made by them is that the stack without the two GaN
layers produces strong oscillations in the transmittance spectrum, with the peak value
of only 30 per cent. The addition of one GaN layer to the structure results in
smoothening of the overall increase of transmittance, but with the same peak value. It is
only in the case of having the two additional layers, that one can achieve the smoother
transmittance spectrum with more than twice the transmittance.
Recently, Alejo-Molina6, et al. have studied the metallo-dielectric photonic crystal
(MDPhC) in relation to the substratum DPhC, by carrying out the analytical and
numerical analysis of metallic insets embedded in a DPhC. The complex MDPhC
dispersion relation curves and the transmission coefficient at different propagation
regimens through the finite stack have been described. It has been observed that in a
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Thin Films: Technology and Applications
DPhC6, the band gap argument corresponds to undefined complex solutions of a real
dispersion relation, but in a MDPhC, it corresponds to a definite complex solution which
is a function of the metal thickness; and analytic continuation of the dispersion curve
on the imaginary K plane.
As it is clear that in these applications, light has to be coupled into the PhC, and so
insertion losses take place, especially at the frequencies near band gaps, and this
provides noise. The coupling losses can be controlled by long mode matching
structures or by short AR coatings. This concept is comparatively new, and not much is
known about the coupling losses, and so designing of efficient PhC AR coatings is
done by trial and error method, which involves a lot of numerical simulation. However, in
case, the impedances of the PhCs used in the design are known, these trials become
simple and can be calculated easily.
Impedance is an intrinsic property of the substance, and if its value for two adjacent
materials is known, the reflection and transmission coefficients at their interfaces can be
easily calculated. It is difficult to extend the concept of impedance to PhCs, as the bulk
PhCs scatter light in multiple directions, and it is difficult to distinguish the interface
reflections from the internal scattering. So, various ad hoc impedance definitions have
been proposed in the literature, but they are all scalar and not very useful for efficient
design of AR coatings for PhCs.
For a good AR coating design, the impedance should satisfy two criteria, viz., it
should be uniquely defined for each PhC at any wavelength, incident angle, and
polarisation, and also should be sufficient to find the reflection and transmission
between the two PhCs. Lawrence7, et al. have designed and discussed AR coatings for
two-dimensional PhCs using a rigorous impedance definition. In the latest treatment of
this type of design, at each wavelength, the field inside each PhC is considered as a
superposition of propagating and evanescent Bloch modes and their quasiperiodic
eigenmodes, since PhC's Bloch mode travels through the PhC's interior without
reflection. Each PhC is considered as a stack of gratings, and its Bloch modes are
represented as a superposition of propagating and evanescent plane wave solutions to
the grating equation.
Since the Bloch modes are infinite in number, the calculations are made manageable
by projecting the field onto a truncated but sufficiently complete set of propagating and
slowly evanescent Bloch modes by a least square approximation that satisfies the two
criteria in a balanced manner and is economical. The set is divided into N forward
travelling/decaying modes and N backward modes, and thus the interface reflection and
transmission coefficients become M × M matrices mapping between the truncated Bloch
sets. It should be noted that a larger value of N leads to better accuracy, but the accuracy
is good for M approximately equal to the number of propagating plane wave solutions to
the grating equation.
The impedance is defined by calculating the reflection at an interface between
uniform dielectrics, and is generalised to work with Bloch modes. The Bloch modes are
mapped in each PhC to plane-wave field amplitudes and are used to compare fields
across the interface and to find the reflection. The matrix that maps forward Bloch modes
to plane-wave field strength coefficients, are found numerically via the transfer matrix,
for the E and M field components. The columns of E and M are taken from the sums and
differences of forward and backward plane-wave expansions of Bloch modes. It should
5
Thin Films and their Applications in Military and Civil Sectors
be noted here that the accuracy of the AR coating design depends upon the accuracy of
finding the impedances. The AR coating consists of one or more thin layers coated on
the substrate, i.e., bulk medium. The refractive indices and the thicknesses of the layer
materials have to be so chosen that all the interface reflections cancel. Since a PhC's
width cannot be varied continuously, two layers are required in general for designing a
perfect AR coating. The net reflection is easily derived from the interface reflections and
the phase changes across the layers, and is made to approach zero.
6
Thin Films: Technology and Applications
2.5
IBST
REFRACTIVE INDEX (n)
2.0
CONVENTIONAL
1.6
Figure 1.1. Ion-beam sputtering technique produces coatings of higher refractive index
than those by conventional techniques (e.g. electron beam deposition).
stoichiometry (i.e., desired oxygen state). The problem is not so acute in case of other
oxides like CeO2 and Ta2O5. On the other hand, the films of fluoride compounds like
MgF2 and CeF2 have to be grown in high vacuum for high purity and low absorption.
Thus, it is clear that in the case of fabrication of ML stack of different types of
materials without any cross-contamination, the process parameters involved are
interrelated, and hence, the development of a particular coating for any specific
application is really a complicated process.
The mechanical properties of the coatings, namely, adhesion, hardness, and
abrasion resistance depend on the microstructure of the coatings and the nature of
chemical bonds, besides matching the stress coefficients and the thermal coefficients.
The stress in a thin film layer is generated either within the layer or at the interface
with the other layer or the substrate surface. In case of the stress originating at the
interface, the difference in the thermal coefficients has to be minimum, which also results
in minimising the structural mismatch due to the differences in the mutual chemical
bonding. Thus, it is necessary to choose the coating materials with compatible thermal
coefficients and stresses, especially when the coated samples are to be used in large
variations of temperature. It is very important to note that the temperature and the stress
are inter-related.
Many coating materials, especially oxides and fluorides, are coated on substrates
heated to temperatures in the vicinity of 200 °C300 °C for achieving the efficient
mechanical and optical properties, and hence, the relative stress of the layers is affected.
The stress can be either compressive or tensile in case of metals, while it is, in general,
tensile for metals. A very interesting case is that of TiO2/SiO2 ML stack, which produces
a low stress in it in a good temperature region, as TiO2 has tensile stress, and SiO2 has
compressive stress. To some extent, the stress can be controlled by the deposition
process, e.g., the sputtering is a very versatile process for controlling the sign of stress
by varying power and pressure at low substrate temperature, while electron beam
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Thin Films and their Applications in Military and Civil Sectors
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Thin Films: Technology and Applications
3 SUBSTRATE
SUBSTRATE HEATER
HOLDER QUARTZ
CRYSTAL
E-BEAM VACUUM
EVAPORATOR CHAMBER
2
1-2-3-4-5 ZnSe
1
WINDOWS CO2 LASER
SILVER
MIRROR He-Ne LASER
(0.6328 nm)
Figure 1.2. Balzers vacuum coating unit fitted with in situ film thickness monitor, designed
and developed at LASTEC.
9
Thin Films and their Applications in Military and Civil Sectors
conditions and the cleaning of the substrate to be coated, especially in case of the
optical thin films. The properties of the optical coatings depend on the refractive index
of the coatings materials, which is strongly dependent on the various factors like rate of
evapouration, degree of vacuum, temperature of the substrate being coated, and the
coating technique which determines the packing density of the coating. The packing
density of the coatings is large (approaching unity in the case of the technique
employing the adatoms carrying high energy ~ 1000 eV e.g. in case of ion-beam
sputtering technique which gives the value of refractive index close to that of the bulk
material). The optical coatings fabricated by such techniques are stable and of high
damage threshold resistance, and are particularly suitable for high power laser
applications. Lower than unity packing density coatings results in very slow absorption
of moisture and other chemicals by them, which change the refractive index of the layers
thus changing the performance of the coatings.
The thin film technologies are also being developed as a means of substantially
reducing the cost of photovoltaic (PV) systems. The rationale is thin film modules are
expected to be cheaper to manufacture owing to their reduced material costs, energy
costs, handling costs and capital costs. However, the thin films have to be developed
using new semiconductor materials, including amorphous silicon, copper-indium
diselenide, cadmium-telluride, and film crystalline silicon. In all the cases, these
technologies face major technical and financial hurdles.
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Thin Films: Technology and Applications
REFERENCES
1. Willey, Ronald R. Practical design and production of optical thin films. Willey
Optical, Consultants. CRC Press, Marcel Dekker Incorporated, Charlevoix,
Michigan, 2002.
2. Dobrowolski, J.A. & Lowe, D.G. Optical thin film synthesis program based on the
use of Fourier transforms. Applied Optics, 1978, 17(19), 3039.
3. Dobrowolski, J.A. & Kemp, R.A. Refinement of optical multilayer systems with
different optimisation procedures. Applied Optics, 1990, 29(19), 2876.
4. Tikhonravov, A.V.; Trubetskov, M.K. & DeBell, G.W. Application of the needle
optimisation technique to the design of optical coatings. Applied Optics, 1996,
35(28), 5493.
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Thin Films and their Applications in Military and Civil Sectors
5. Choi, Young-Kyoung; Ha, Young-Ki; Kim, Jae-Eun; Park, Hae Yong & Kim, Kihong.
Improved transmittance in one-dimensional metallic photonic crystals. Physics B:
Cond. Matt., 2003, 338, 132-35.
6. Alejo-Molina, A.; Sánchez-Mondragón, J.J.; May-Arrioja, D.A.; Romero, D.;
Escobedo-Alatorre, J. & Zamudio-Lara, A. Complex dispersion relation of 1D
dielectric photonic crystal with thin metallic layers. Microelectronic, 2009, 40,
459-61.
7. Lawrence, Felix J.; Botten, Lindsay C.; Dossou, Kokou B. & Sterke, C. Martjin de.
Antirefection coatings for two-dimensional photonic crystals using a rigorous
impedance definition. Appl. Phys. Lett., 2008, 93, 121114/1-3.
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