Professional Documents
Culture Documents
2.7V Dual Channel 12-Bit A/D Converter With SPI Serial Interface
2.7V Dual Channel 12-Bit A/D Converter With SPI Serial Interface
MCP3202
• ±2 LSB max INL (MCP3202-C) CH0 2 7 CLK
• Analog inputs programmable as single-ended or CH1 3 6 DOUT
pseudo-differential pairs
VSS 4 5 DIN
• On-chip sample and hold
• SPI serial interface (modes 0,0 and 1,1)
• Single supply operation: 2.7V-5.5V
Functional Block Diagram
• 100 ksps max. sampling rate at VDD = 5V
• 50 ksps max. sampling rate at VDD = 2.7V VSS
VDD
• Low power CMOS technology
- 500 nA typical standby current, 5 μA max.
- 550 µA max. active current at 5V
Input
• Industrial temp range: -40°C to +85°C CH0 Channel DAC
CH1 Mux
• 8-pin MSOP, PDIP, SOIC and TSSOP packages
Comparator
Applications
Sample 12-Bit SAR
• Sensor Interface and
• Process Control Hold
Description
CS/SHDN DIN CLK DOUT
The Microchip Technology Inc. MCP3202 is a succes-
sive approximation 12-bit Analog-to-Digital (A/D)
Converter with on-board sample and hold circuitry. The
MCP3202 is programmable to provide a single pseudo-
differential input pair or dual single-ended inputs. Differ-
ential Nonlinearity (DNL) is specified at ±1 LSB, and
Integral Nonlinearity (INL) is offered in ±1 LSB
(MCP3202-B) and ±2 LSB (MCP3202-C) versions.
Communication with the device is done using a simple
serial interface compatible with the SPI protocol. The
device is capable of conversion rates of up to 100 ksps
at 5V and 50 ksps at 2.7V. The MCP3202 device oper-
ates over a broad voltage range (2.7V-5.5V). Low-
current design permits operation with typical standby
and active currents of only 500 nA and 375 μA, respec-
tively. The MCP3202 is offered in 8-pin MSOP, PDIP,
TSSOP and 150 mil SOIC packages.
ELECTRICAL CHARACTERISTICS
All parameters apply at VDD = 5.5V, VSS = 0V, TAMB = -40°C to +85°C, fSAMPLE = 100 ksps and fCLK = 18*fSAMPLE
unless otherwise noted.
Parameter Sym Min. Typ. Max. Units Conditions
Conversion Rate:
Conversion Time tCONV — — 12 clock
cycles
Analog Input Sample Time tSAMPLE 1.5 clock
cycles
CS
tSUCS
tHI tLO
CLK
tSU tHD
DIN MSB IN
tDO tR tF tDIS
tEN
DOUT NULL BIT MSB OUT LSB
Load circuit for tR, tF, tDO Load circuit for tDIS and tEN
Test Point
1.4V VDD
tDIS Waveform 2
3 kΩ Test Point 3 kΩ VDD/2
DOUT DOUT tEN Waveform
DOUT B11
tEN
CS VIH
CLK
tDO DOUT
90%
Waveform 1*
DOUT TDIS
DOUT 10%
Waveform 2†
* Waveform 1 is for an output with internal conditions such that
the output is high, unless disabled by the output control.
† Waveform 2 is for an output with internal conditions such that
the output is low, unless disabled by the output control.
1.0 2.0
0.8 Positive INL VDD = 2.7V
1.5
0.6
1.0
0.4 Positive INL
INL (LSB)
INL (LSB)
0.2 0.5
0.0 0.0
-0.2 Negative INL -0.5
Negative INL
-0.4 -1.0
-0.6
-1.5
-0.8
-2.0
-1.0
0 20 40 60 80 100
0 25 50 75 100 125 150
FIGURE 2-1: Integral Nonlinearity (INL) vs. Sample FIGURE 2-4: Integral Nonlinearity (INL) vs. Sample
Rate. Rate (VDD = 2.7V).
1.0 1.0
0.8 FSAMPLE = 100 ksps 0.8 FSAMPLE = 50 ksps
0.6 Positive INL 0.6 Positive INL
0.4 0.4
INL (LSB)
INL (LSB)
0.2 0.2
0.0 0.0
-0.2 -0.2
-0.4 Negative INL -0.4
-0.6 Negative INL
-0.6
-0.8 -0.8
-1.0 -1.0
3.0 3.5 4.0 4.5 5.0 2.5 3.0 3.5 4.0 4.5 5.0
VDD(V) VDD(V)
FIGURE 2-2: Integral Nonlinearity (INL) vs. VDD. FIGURE 2-5: Integral Nonlinearity (INL) vs. VDD.
1.0 1.0
0.8 0.8 VDD = 2.7V
0.6 0.6 FSAMPLE = 50 ksps
0.4 0.4
INL (LSB)
INL (LSB)
0.2 0.2
0.0 0.0
-0.2 -0.2
-0.4 -0.4
-0.6 -0.6
-0.8 -0.8
-1.0 -1.0
0 512 1024 1536 2048 2560 3072 3584 4096 0 512 1024 1536 2048 2560 3072 3584 4096
FIGURE 2-3: Integral Nonlinearity (INL) vs. Code FIGURE 2-6: Integral Nonlinearity (INL) vs. Code
(Representative Part). (Representative Part, VDD = 2.7V).
1.0 1.0
0.8 0.8 VDD = 2.7V
Positive INL
0.6 0.6 FSAMPLE = 50 ksps
Positive INL
0.4 0.4
INL (LSB)
INL (LSB)
0.2 0.2
0.0 0.0
-0.2 Negative INL -0.2
-0.4 -0.4
Negative INL
-0.6 -0.6
-0.8 -0.8
-1.0 -1.0
-50 -25 0 25 50 75 100 -50 -25 0 25 50 75 100
FIGURE 2-7: Integral Nonlinearity (INL) vs. FIGURE 2-10: Integral Nonlinearity (INL) vs.
Temperature. Temperature (VDD = 2.7V).
1.0 2.0
0.8 V DD = 2.7V
1.5
0.6
1.0
0.4 DNL (LSB)
Positive DNL Positive DNL
DNL (LSB)
0.2 0.5
0.0 0.0
-0.2 -0.5 Negative DNL
-0.4 Negative DNL
-1.0
-0.6
-0.8 -1.5
-1.0 -2.0
0 25 50 75 100 125 150 0 20 40 60 80 100
Sample Rate (ksps) Sample Rate (ksps)
FIGURE 2-8: Differential Nonlinearity (DNL) vs. FIGURE 2-11: Differential Nonlinearity (DNL) vs.
Sample Rate. Sample Rate (VDD = 2.7V).
1.0 1.0
0.8 FSAMPLE = 100 ksps 0.8 FSAMPLE = 50 ksps
0.6 Positive DNL 0.6
0.4 0.4 Positive DNL
DNL (LSB)
DNL (LSB)
0.2 0.2
0.0 0.0
-0.2 -0.2
-0.4 Negative DNL -0.4 Negative DNL
-0.6 -0.6
-0.8 -0.8
-1.0 -1.0
3.0 3.5 4.0 4.5 5.0 2.5 3.0 3.5 4.0 4.5 5.0
VDD(V) VDD(V)
FIGURE 2-9: Differential Nonlinearity (DNL) vs. VDD. FIGURE 2-12: Differential Nonlinearity (DNL) vs. VDD.
1.0 1.0
0.8 0.8 V DD = 2.7V
0.6 0.6 FSAMPLE = 50 ksps
0.4 0.4
DNL (LSB)
DNL (LSB)
0.2 0.2
0.0 0.0
-0.2 -0.2
-0.4 -0.4
-0.6 -0.6
-0.8 -0.8
-1.0 -1.0
0 512 1024 1536 2048 2560 3072 3584 4096 0 512 1024 1536 2048 2560 3072 3584 4096
FIGURE 2-13: Differential Nonlinearity (DNL) vs. FIGURE 2-16: Differential Nonlinearity (DNL) vs.
Code (Representative Part). Code (Representative Part, VDD = 2.7V).
1.0 1.0
V DD = 2.7V
0.8 0.8
FSAMPLE = 50 ksps
0.6 0.6
0.4 Positive DNL 0.4 Positive DNL
DNL (LSB)
DNL (LSB)
0.2 0.2
0.0 0.0
-0.2 -0.2
Negative DNL Negative DNL
-0.4 -0.4
-0.6 -0.6
-0.8 -0.8
-1.0 -1.0
-50 -25 0 25 50 75 100 -50 -25 0 25 50 75 100
FIGURE 2-14: Differential Nonlinearity (DNL) vs. FIGURE 2-17: Differential Nonlinearity (DNL) vs.
Temperature. Temperature (VDD = 2.7V).
2.0 2.0
1.5 1.8
FSAMPLE = 10 ksps 1.6 FSAMPLE = 100 ksps
Offset Error (LSB)
FSAMPLE = 50 ksps
Gain Error (LSB)
1.0
1.4
0.5 1.2
0.0 1.0
-0.5 0.8
0.6
-1.0 FSAMPLE = 10 ksps
FSAMPLE = 100 ksps
0.4
-1.5 0.2
FSAMPLE = 50 ksps
-2.0 0.0
2.5 3.0 3.5 4.0 4.5 5.0 2.5 3.0 3.5 4.0 4.5 5.0
VDD(V) VDD(V)
FIGURE 2-15: Gain Error vs. VDD. FIGURE 2-18: Offset Error vs. VDD.
1.0 2.0
0.8 1.8
V DD = 2.7V
0.6 1.6 VDD = 5V
FSAMPLE = 50 ksps
0.4 1.4 FSAMPLE = 100 ksps
0.2 1.2
0.0 1.0
-0.2 0.8
VDD = 2.7V
-0.4 0.6
FSAMPLE = 50 ksps
-0.6 0.4
V DD = 5V
-0.8 0.2
FSAMPLE = 100 ksps
-1.0 0.0
-50 -25 0 25 50 75 100 -50 -25 0 25 50 75 100
FIGURE 2-19: Gain Error vs. Temperature. FIGURE 2-22: Offset Error vs. Temperature.
100 100
VDD = 5V VDD = 5V
90 90
FSAMPLE = 100 ksps FSAMPLE = 100 ksps
80 80
70 70
SINAD (dB)
SNR (dB)
60 60
VDD = 2.7V
50 50 VDD = 2.7V
FSAMPLE = 50 ksps
40 40 FSAMPLE = 50 ksps
30 30
20 20
10 10
0 0
1 10 100 1 10 100
FIGURE 2-20: Signal to Noise Ratio (SNR) vs. Input FIGURE 2-23: Signal to Noise and Distortion
Frequency. (SINAD) vs. Input Frequency.
0
80
-10 VDD = 5V
-20 70
FSAMPLE = 100 ksps
-30 60
SINAD (dB)
THD (dB)
FIGURE 2-21: Total Harmonic Distortion (THD) vs. FIGURE 2-24: Signal to Noise and Distortion
Input Frequency. (SINAD) vs. Signal Level.
12.0
12.0 VDD = 5V
FSAMPLE = 50ksps 11.5 FSAMPLE = 100 ksps
11.5 11.0
ENOB (rms)
ENOB (rms)
11.0 10.5
FSAMPLE = 100 ksps 10.0
10.5
9.5
10.0
9.0
9.5 V DD = 2.7V
8.5
FSAMPLE = 50 ksps
9.0
8.0
2.0 2.5 3.0 3.5 4.0 4.5 5.0
1 10 100
VDD (V) Input Frequency (kHz)
FIGURE 2-25: Effective Number of Bits (ENOB) vs. FIGURE 2-28: Effective Number of Bits (ENOB) vs.
VDD. Input Frequency.
100 0
VDD = 5V
-30
60
50 V DD = 2.7V -40
40 FSAMPLE = 50 ksps -50
30
-60
20
10 -70
0 -80
1 10 100 1 10 100 1000 10000
FIGURE 2-26: Spurious Free Dynamic Range FIGURE 2-29: Power Supply Rejection (PSR) vs.
(SFDR) vs. Input Frequency. Ripple Frequency.
0 0
-10 VDD = 5V -10 VDD = 2.7V
-20 FSAMPLE = 100 ksps -20 FSAMPLE = 50 ksps
-30 -30 FINPUT = 998.76 Hz
FINPUT = 9.985 kHz
Amplitude (dB)
Amplitude (dB)
-40 -40
4096 points 4096 points
-50 -50
-60 -60
-70 -70
-80 -80
-90 -90
-100 -100
-110 -110
-120 -120
-130 -130
0 10000 20000 30000 40000 50000 0 5000 10000 15000 20000 25000
FIGURE 2-27: Frequency Spectrum of 10 kHz input FIGURE 2-30: Frequency Spectrum of 1 kHz input
(Representative Part). (Representative Part, VDD = 2.7V).
500 80
All points at FCLK = 1.8 MHz except
450 CS = V DD
at VDD = 2.5V, FCLK = 900 kHz 70
400
60
350
50
IDDS (pA)
300
IDD (µA)
250 40
200 30
150
20
100
10
50
0 0
2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0
FIGURE 2-31: IDD vs. VDD. FIGURE 2-34: IDDS vs. VDD.
500 100.00
450 VDD = CS = 5V
400
V DD = 5V 10.00
350
300
IDD (µA)
IDDS (nA)
250 1.00
V DD = 2.7V
200
150
100 0.10
50
0
0.01
10 100 1000 10000
-50 -25 0 25 50 75 100
FIGURE 2-32: IDD vs. Clock Frequency. FIGURE 2-35: IDDS vs. Temperature.
500 2.0
V DD = 5V
Analog Input Leakage (nA)
450 1.8
FCLK = 1.8 MHz
400 1.6
350 1.4
300 1.2 VDD = 5V
IDD (µA)
FIGURE 2-33: IDD vs. Temperature. FIGURE 2-36: Analog Input leakage current vs.
Temperature.
3.1 CH0/CH1 The MCP3202 device offers the choice of using the
analog input channels configured as two single-ended
Analog inputs for channels 0 and 1 respectively. These inputs or a single pseudo-differential input. Configura-
channels can programmed to be used as two indepen- tion is done as part of the serial command before each
dent channels in single ended-mode or as a single conversion begins. When used in the pseudo-differen-
pseudo-differential input where one channel is IN+ and tial mode, CH0 and CH1 are programmed as the IN+
one channel is IN-. See Section 5.0 for information on and IN- inputs as part of the command string transmit-
programming the channel configuration. ted to the device. The IN+ input can range from IN- to
VREF (VDD + IN-). The IN- input is limited to ±100 mV
3.2 Chip Select/Shutdown (CS/SHDN) from the VSS rail. The IN- input can be used to cancel
small signal common-mode noise which is present on
The CS/SHDN pin is used to initiate communication
both the IN+ and IN- inputs.
with the device when pulled low and will end a conver-
sion and put the device in low power standby when For the A/D Converter to meet specification, the charge
pulled high. The CS/SHDN pin must be pulled high holding capacitor (CSAMPLE) must be given enough time
between conversions. to acquire a 12-bit accurate voltage level during the
1.5 clock cycle sampling period. The analog input
3.3 Serial Clock (CLK) model is shown in Figure 4-1.
The SPI clock pin is used to initiate a conversion and to In this diagram, it is shown that the source impedance
clock out each bit of the conversion as it takes place. (RS) adds to the internal sampling switch (RSS) imped-
See Section 6.2 for constraints on clock speed. ance, directly affecting the time that is required to
charge the capacitor, CSAMPLE. Consequently, larger
3.4 Serial Data Input (DIN) source impedances increase the offset, gain, and inte-
gral linearity errors of the conversion.
The SPI port serial data input pin is used to clock in
Ideally, the impedance of the signal source should be
input channel configuration data.
near zero. This is achievable with an operational ampli-
3.5 Serial Data Output (DOUT) fier such as the MCP601 which has a closed loop out-
put impedance of tens of ohms. The adverse affects of
The SPI serial data output pin is used to shift out the higher source impedances are shown in Figure 4-2.
results of the A/D conversion. Data will always change When operating in the pseudo-differential mode, if the
on the falling edge of each clock as the conversion voltage level of IN+ is equal to or less than IN-, the
takes place. resultant code will be 000h. If the voltage at IN+ is equal
to or greater than {[VDD + (IN-)] – 1 LSB}, then the out-
4.0 DEVICE OPERATION put code will be FFFh. If the voltage level at IN- is more
than 1 LSB below VSS, then the voltage level at the IN+
The MCP3202 A/D Converter employs a conventional input will have to go below VSS to see the 000h output
SAR architecture. With this architecture, a sample is code. Conversely, if IN- is more than 1 LSB above VSS,
acquired on an internal sample/hold capacitor for then the FFFh code will not be seen unless the IN+
1.5 clock cycles starting on the second rising edge of input level goes above VDD level.
the serial clock after the start bit has been received.
Following this sample time, the input switch of the con- 4.2 Digital Output Code
verter opens and the device uses the collected charge
on the internal sample and hold capacitor to produce a The digital output code produced by an A/D Converter
serial 12-bit digital output code. Conversion rates of is a function of the input signal and the reference volt-
100 ksps are possible on the MCP3202. See age. For the MCP3202, VDD is used as the reference
Section 6.2 for information on minimum clock rates. voltage. As the VDD level is reduced, the LSB size is
Communication with the device is done using a 3-wire reduced accordingly. The theoretical digital output code
SPI-compatible interface. produced by the A/D Converter is shown below.
4096•V IN
Digital Output Code = ------------------------
-
V DD
where:
VIN = analog input voltage
VDD = supply voltage
VDD
Sampling
Switch
VT = 0.6V
RSS CHx SS RS = 1 kΩ
CSAMPLE
VA CPIN ILEAKAGE = DAC capacitance
VT = 0.6V
7 pF ±1 nA = 20 pF
VSS
Legend
VA = signal source
RSS = source impedance
CHx = input channel pad
CPIN = input pin capacitance
VT = threshold voltage
ILEAKAGE = leakage current at the pin
due to various junctions
SS = sampling switch
RS = sampling switch resistor
CSAMPLE = sample/hold capacitance
2.0
1.8 VDD = 5V
Clock Frequency (MHz)
1.6
1.4
1.2
1.0
0.8
V DD = 2.7V
0.6
0.4
0.2
0.0
100 1000 10000
tCYC tCYC
tCSH
CS
tSUCS
CLK
tDATA**
* After completing the data transfer, if further clocks are applied with CS low, the A/D Converter will output zeros
indefinitely. See Figure 5-2 below for details on obtaining LSB first data.
** tDATA: during this time, the bias current and the comparator power down while the reference input becomes a
high impedance node, leaving the CLK running to clock out the LSB-first data or zeros.
FIGURE 5-1: Communication with the MCP3202 using MSB first format only.
tCYC
tCSH
CS
tSUCS
Power Down
CLK MSBF
ODD/
SIGN
SGL/
DIFF
Start
* After completing the data transfer, if further clocks are applied with CS low, the A/D Converter will
output zeros indefinitely.
** tDATA: During this time, the bias circuit and the comparator power down while the reference input
becomes a high impedance node, leaving the CLK running to clock out LSB first data or zeroes.
SCLK 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
SGL/
DIN Start DIFF Don’t Care
HI-Z NULL
B7 B6 B5 B4 B3 B2 B1 B0
DOUT B11 B10 B9 B8
BIT
Start
Bit
MCU Transmitted Data SGL/ ODD/
(Aligned with falling X X X X X X X 1 MSBF X X X X X X X X X X X X X
edge of clock) DIFF SIGN
Data stored into MCU receive Data stored into MCU receive Data stored into MCU receive
register after transmission of register after transmission of register after transmission of
first 8 bits second 8 bits last 8 bits
X = Don’t Care Bits
FIGURE 6-1: SPI Communication using 8-bit segments (Mode 0,0: SCLK idles low).
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
SCLK
Data is clocked out of
A/D Converter on falling edges
MSBF
ODD/
SIGN
SGL/
DIFF
HI-Z NULL
DOUT B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0
BIT
Start
Bit
MCU Transmitted Data
(Aligned with falling SGL/ ODD/ X X X X X X X X
0 0 0 0 0 0 0 1 MSBF X X X X X
edge of clock) DIFF SIGN
Data stored into MCU receive Data stored into MCU receive Data stored into MCU receive
register after transmission of register after transmission of register after transmission of
first 8 bits second 8 bits last 8 bits
X = Don’t Care Bits
FIGURE 6-2: SPI Communication using 8-bit segments (Mode 1,1: SCLK idles high).
VDD
C1 0.1 μF
R1 MCP601
VIN + IN+
R2
- MCP3202
C2
IN-
R4
R3
XXXXXXXX MCP3202 e3
XXXXXNNN I/PNNN
YYWW YYWW
XXXXXXXX MCP3202 e3
XXXXYYWW ISNYYWW
NNN NNN
XXXXXX 3202I e3
YWWNNN YWWNNN
XXXX 3202
YYWW IYWW
NNN NNN
Note: In the event the full Microchip part number cannot be marked on one line, it
will be carried over to the next line, thus limiting the number of available
characters for customer-specific information.
* Standard OTP marking consists of Microchip part number, year code, week code, facility code, mask
rev#, and assembly code.
E1
n 1
A A2
L
c
A1
β B1
p
eB B
8-Lead Plastic Small Outline (SN) – Narrow, 150 mil Body (SOIC)
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
E1
D
2
B n 1
h α
45°
c
A A2
φ
β L A1
D
N
E
E1
NOTE 1
1 2
e
A2
c ϕ
A
A1 L1 L
Units MILLIMETERS
Dimension Limits MIN NOM MAX
Number of Pins N 8
Pitch e 0.65 BSC
Overall Height A — — 1.10
Molded Package Thickness A2 0.75 0.85 0.95
Standoff A1 0.00 — 0.15
Overall Width E 4.90 BSC
Molded Package Width E1 3.00 BSC
Overall Length D 3.00 BSC
Foot Length L 0.40 0.60 0.80
Footprint L1 0.95 REF
Foot Angle ϕ 0° — 8°
Lead Thickness c 0.08 — 0.23
Lead Width b 0.22 — 0.40
Notes:
1. Pin 1 visual index feature may vary, but must be located within the hatched area.
2. Dimensions D and E1 do not include mold flash or protrusions. Mold flash or protrusions
shall not exceed 0.15 mm per side.
3. Dimensioning and tolerancing per ASME Y14.5M
BSC: Basic Dimension. Theoretically exact value shown without tolerances.
REF: Reference Dimension, usually without tolerance, for information purposes only.
E1
D
2
1
n
b
α
c
ϕ
A
β
L A1 A2
• Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the
intended manner and under normal conditions.
• There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our
knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data
Sheets. Most likely, the person doing so is engaged in theft of intellectual property.
• Microchip is willing to work with the customer who is concerned about the integrity of their code.
• Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not
mean that we are guaranteeing the product as “unbreakable.”
Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our
products. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts
allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act.
10/19/06