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Vishay Siliconix
Power MOSFET
FEATURES
PRODUCT SUMMARY
• Dynamic dV/dt rating
VDS (V) 500 Available
• Repetitive avalanche rated
RDS(on) () VGS = 10 V 1.5
• Fast switching Available
Qg max. (nC) 38
Qgs (nC) 5.0 • Ease of paralleling
Qgd (nC) 22 • Simple drive requirements
Configuration Single • Material categorization: for definitions of compliance
please see www.vishay.com/doc?99912
D
Note
* This datasheet provides information about parts that are
TO-220AB RoHS-compliant and / or parts that are non-RoHS-compliant. For
example, parts with lead (Pb) terminations are not RoHS-compliant.
Please see the information / tables in this datasheet for details.
G
DESCRIPTION
Third generation power MOSFETs from Vishay provide the
S
S
designer with the best combination of fast switching,
D ruggedized device design, low on-resistance and
G
N-Channel MOSFET cost-effectiveness.
The TO-220AB package is universally preferred for all
commercial-industrial applications at power dissipation
levels to approximately 50 W. The low thermal resistance
and low package cost of the TO-220AB contribute to its
wide acceptance throughout the industry.
ORDERING INFORMATION
Package TO-220AB
IRF830PbF
Lead (Pb)-free
SiHF830-E3
IRF830
SnPb
SiHF830
3.0
7.0 V
6.0 V 2.0
(Normalized)
5.5 V
5.0 V 1.5
100 Bottom 4.5 V
4.5 V 1.0
0.5
20 µs Pulse Width
TC = 25 °C
10-1 0.0
100 101 - 60 - 40 - 20 0 20 40 60 80 100 120 140 160
91063_01 VDS, Drain-to-Source Voltage (V) 91063_04 TJ, Junction Temperature (°C)
VGS 1500
101 VGS = 0 V, f = 1 MHz
Top 15 V Ciss = Cgs + Cgd, Cds Shorted
10 V 1250 Crss = Cgd
8.0 V Coss = Cds + Cgd
ID, Drain Current (A)
7.0 V
Capacitance (pF)
6.0 V 1000
5.5 V 4.5 V
5.0 V 750 Ciss
100 Bottom 4.5 V
500
Coss
250
20 µs Pulse Width
TC = 150 °C Crss
10-1 0
100 101 100 101
91063_02 VDS, Drain-to-Source Voltage (V) 91063_05 VDS, Drain-to-Source Voltage (V)
Fig. 2 - Typical Output Characteristics, TC = 150 °C Fig. 5 - Typical Capacitance vs. Drain-to-Source Voltage
20
101 ID = 3.1 A
VGS, Gate-to-Source Voltage (V)
VDS = 250 V
25 °C 12 VDS = 100 V
100
4
10-1 20 µs Pulse Width
For test circuit
VDS = 50 V
see figure 13
0
4 5 6 7 8 9 10 0 8 16 24 32 40
91063_03 VGS, Gate-to-Source Voltage (V) 91063_06 QG, Total Gate Charge (nC)
Fig. 3 - Typical Transfer Characteristics Fig. 6 - Typical Gate Charge vs. Drain-to-Source Voltage
5.0
101
ISD, Reverse Drain Current (A)
150 °C 4.0
2.0
100 1.0
VGS = 0 V
0.0
0.4 0.6 0.8 1.0 1.2 25 50 75 100 125 150
91063_07 VSD, Source-to-Drain Voltage (V) 91063_09 TC, Case Temperature (°C)
Fig. 7 - Typical Source-Drain Diode Forward Voltage Fig. 9 - Maximum Drain Current vs. Case Temperature
RD
102 VDS
Operation in this area limited
5
by RDS(on)
2
VGS
10 µs D.U.T.
ID, Drain Current (A)
10 RG
+
5
100 µs - VDD
2
1 1 ms 10 V
Pulse width ≤ 1 µs
5
10 ms Duty factor ≤ 0.1 %
2
10
Thermal Response (ZthJC)
1
0 - 0.5
0.2 PDM
0.1
0.1 0.05 t1
0.02 Single Pulse t2
0.01 (Thermal Response)
Notes:
1. Duty Factor, D = t1/t2
2. Peak Tj = PDM x ZthJC + TC
10-2
10-5 10-4 10-3 10-2 0.1 1 10
L V(BR)DSS
VDS
Vary tp to obtain tp
required IAS VDD
RG D.U.T +
V DD
- VDS
IAS A
10 V
tp 0.01 Ω
IAS
Fig. 12a - Unclamped Inductive Test Circuit Fig. 12b - Unclamped Inductive Waveforms
600
ID
Top
EAS, Single Pulse Energy (mJ)
2.0 A
500 2.8 A
Bottom 4.5 A
400
300
200
100
VDD = 50 V
0
25 50 75 100 125 150
Current regulator
Same type as D.U.T.
QG 50 kΩ
10 V 12 V 0.2 µF
0.3 µF
QGS QGD +
VDS
D.U.T. -
VG
VGS
3 mA
Charge
IG ID
Current sampling resistors
Fig. 13a - Basic Gate Charge Waveform Fig. 13b - Gate Charge Test Circuit
- +
-
Rg • dV/dt controlled by Rg +
• Driver same type as D.U.T. VDD
-
• ISD controlled by duty factor “D”
• D.U.T. - device under test
VGS = 10 Va
Reverse
recovery Body diode forward
current current
dI/dt
D.U.T. VDS waveform
Diode recovery
dV/dt
VDD
Re-applied
voltage
Body diode forward drop
Inductor current
Ripple ≤ 5 % ISD
Note
a. VGS = 5 V for logic level devices
DWG: 6031
Note
• M* = 0.052 inches to 0.064 inches (dimension including
protrusion), heatsink hole for HVM
C
b
e
J(1)
e(1)
Package Picture
ASE Xi’an
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