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The Theory And Measurement Of

Bidirectional Reflectance Distribution
Function (Brdf) And Bidirectional
Transmittance Distribution Function
(BTDF)

F O Bartell, E. L. Dereniak, W. L Wolfe

F O Bartell, E. L. Dereniak, W. L Wolfe, "The Theory And Measurement Of

Bidirectional Reflectance Distribution Function (Brdf) And Bidirectional
Transmittance Distribution Function (BTDF)," Proc. SPIE 0257, Radiation
Scattering in Optical Systems, (3 March 1981); doi: 10.1117/12.959611

Event: 1980 Huntsville Technical Symposium, 1980, Huntsville, United States

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 The Theory
The Theory and
andmeasurement
measurementofofbidirectional
bidirectionalreflectance
reflectancedistribution
distribution function
function
(BRDF) and
(BRDF) and bidirectional
bidirectional transmittance
transmittance distribution
distribution function
function (BTDF)
(BTDF)

F. O.
F. O. Bartell, E.
E. L. Dereniak, W.
L. Dereniak, W. L.
L. Wolfe
Optical Sciences
Optical Center, University
Sciences Center, University of Arizona,
Arizona, Tucson,
Tucson, Arizona
Arizona 85721
85721

Abstract

The
The concepts
concepts of
of BRDF (Bidirectional Reflectance Distribution
BRDF (Bidirectional Distribution Function)
Function) and
and BTDF
BTDF (Bidirec-
(Bidirec-
tional Transmittance Distribution Function)
tional Function) are
are defined
defined and
and discussed
discussed asas being
being the
the ratios
ratios
of differential
differential outputs
outputs of radiance divided
divided by differential
differential inputs
inputs of
of irradiance.
irradiance. Appro-
priate measurement
priate measurement arrangements and procedures areare presented,
presented, and
and the
the problems
problems are
are de-
de-
scribed
scribed that
that are
are involved
involved in
in going from the
the differentials of theory
theory to
to the
the finite
finite quantities
quantities
of measurement. Finally appropriate data reduction
reduction schemes
schemes are
are given
given for
for determining
determining BRDF
BRDF
and BTDF from these measurements.
and measurements.

Introduction

This
This paper
paper discusses
discusses the
the theory of BRDF (Bidirectional
(Bidirectional Reflectance
Reflectance Distribution
Distribution Function)
Function)
and
and BTDF (Bidirectional Transmittance Distribution Function)
BTDF (Bidirectional Function) and
and it
it also
also describes
describes methods
methods
and
and problems involved in
problems involved in the measurement of these
these quantities.
quantities.

BRDF is
BRDF is a function of a reflecting
reflecting surface
surface and
and it
it depends
depends on
on four
four angles
angles (two
(two for
for the
the
incident radiation and
incident and two
two for
for the
the reflected
reflected radiation).
radiation). (9) of
Equation (9) of reference
reference (1)(1)
gives
gives the definition for
the following definition for BRDF:
BRDF:

dLr(ei,i,er,r;Ei)
dL (9 - ,<j> . ;0 ,cf> ;E.)
f (e . , cf) . ; e , 4).)
fr(ei'i;er'`1)i)
-= -— £-y£ ^
dEi(ei,4i)
(l)
(1)
i i* i
where e0 and $ are angles in spherical coordinates,
are angles coordinates, ii and
and rr subscripts
subscripts refer
refer to
to incident
incident and
and
reflected, and L and E are radiance
reflected, radiance and
and irradiance.
irradiance. According to to the
the text
text preceeding
preceeding
Eq. (9) in
in reference (1) that equation requires
reference (1) requires '...uniform
"...uniform irradiance
irradiance over
over aa large
large enough
enough
area of aa uniform
uniform and
and isotropic
isotropicsurface...
surface...".
". Two problem areas
areas are
are noted
noted in
in the
the accompany-
accompany-
ing
ing discussion: (1) AA possible
(1) possible lateral
lateral displacement
displacement over
over the
the surface between thethe center
center of
the
the incoming flux and thethe center
center of
of the
the outgoing
outgoing flux.
flux. (2)
(2) Possible
Possible differences between
differentials in
the ratios of differentials in the
the theory
theory and
and the
the ratios
ratios of
of non
non-zero
-zero intervals
intervals involved
involved in
in
real
real measurements.

The
The conditions are more limiting and
conditions are and the
the problems are
are more
more severe
severe for
for BTDF
BTDF than
than they
they are
are
for BRDF. Nevertheless,
Nevertheless, the
the two
two quantities
quantities BRDF
BRDF and
and BTDF
BTDF are
are very
very closely
closely related;
related; and
and the
the
problems of
problems of developing appropriate measurement procedures
procedures from
from the
the mathematical
mathematical definitions
definitions
are very similar
are similar in
in the
the two cases. With these
two cases. these considerations
considerations inin mind,
mind, we
we propose,
propose, for
for
practical measurement purposes,
practical purposes, that
that an
an expression
expression identical
identical to
to the
the right
right side
side of
of Eq.
Eq. (1)
(1)
for the definition
be used for definition ofof BTDF.
BTDF.

Ideal and real geometry

Ideal geometry
are defined
Both BRDF and BTDF are defined for
for infinitesimals.
infinitesimals. The quantity dE dE assumes
assumes anan infinites-
infinites-
imal
imal sample
sample size
size and an infinitesimal angular
angular spread
spread for
for the
the incident
incident beam.
beam. The quantity
dL
dL assumes
assumes both an
an infinitesimal sample
sample size
size and
and an
an infinitesimal
infinitesimal detector
detector size
size with
with the
the
detector
detector area,
area, much,
much, much larger than
than the
the projected
projected area
area of
of the
the sample
sample as
as seen
seen from
from the
the
detector. Figure 1 1 depicts those
those ideal
ideal and
and unattainable
unattainable conditions.
conditions.

In
In carrying
carrying over
over from the ideal
ideal to the real,
real, the incident
incident beam
beam size,
size, the
the sample
sample size
size and
and
the detector size
the size are
are made
made finite:
finite:

dAincident
dA. . , , becomes Aincident
A. ... ,
incident incident (2)
(2)
dA
dAsample T becomes Asample
A ..
sample sample
dA-. ,
dAdetector , becomes Adetector
A, , ,
detector detector

Equation (2)
(2) suggests that
that Special
Special Condition
Condition 11 in
in Figure
Figure 11 would
would become
become

A sample = Aincident /cos9 i

Aincident/cosei
(3)
Asample

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inOptical
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 dAdetector
detector

to
normal to
surface

incident beam

dAsample
sample
dA
dA.
incident

Note: angles
angles Oi 0 r are
and or
9. and the same
in the
are not necessarily in plane.
same plane.

Special Conditions:
1. dA
1. dAsample (dA. ., .)/cose.
sample incident /cos0ii
(dAincident)

2 ^03 , ,_ .
dwdetector
detector (dA, ^ ^ )/£
detector ' 2
(dAdetector)R
2

1.
Figure 1. Ideal Geometry for BRDF and BTDF
Ideal Geometry
However, Eq. (3)
However, Eq. (3) is real incident
general, because real
is not true in general, are not
beams are
incident beams col-
ideally col-
not ideally
limated; and,
limated; fact, as
in fact,
and, in as is incident beams,
the section on incident
is described in the con-
prefer aa con-
beams, we prefer
beam.
verging incident beam.
(2) also
Equation (2)
Equation suggests that Special Condition
also suggests in Figure
Condition 22 in becomes:
Figure 11 becomes:
2
^detector
wdetector (Adetector)R
detector (5)
(5)

(5) is
Equation (5)
Equation general.
in general.
is valid in
sizes
Re a1 sample sizes
Real

experimental arrangement
every experimental
Associated with every the measurement
for the
arrangement for BRDF or
of BRDF
measurement of there
BTDF there
or BTDF
factors at work
are factors tend to
work that tend the sample
keep the
to keep larger than
size larger
sample size minimum. Scat-
certain minimum.
than aa certain
tering are statistical
phenomena are
tering phenomena statistical in nature, and the scattering
in nature, can be
surface can
scattering surface considered to
be considered to
made up of an array of smaller
be made
be surface elements
smaller surface properties are
scattering properties
elements whose scattering more
are more
less uniform over each element yet
or less different from
yet different element to
from element element. For reasonably
to element.
about 100
measurements, about
representative BRDF or BTDF measurements, or more
190 or these surface
of these
more of elements
surface elements
should be
should in the
included in
be included the sample for appropriate optical interaction
area; and for
sample area; the
between the
interaction between
incident beam
incident the sample,
and the
beam and sample, allowance should be made for of about
dimensions of
for element dimensions 10
about 10
wavelengths (of the incident
wavelengths (of radiation) or
incident radiation) more. These two requirements combine
or more. according
combine according
to the
to following calculations,
the following calculations, toto suggest should have
samples should
suggest that circular samples diameters, s,
have diameters, s,
113 wavelengths or
of about 113 more:
or more:
S2 (6)
-
= 100(10)02 113 A
or ss =- 1137,
lOO(lOX) 2 or (6)
4

should be made for

Provision should
Provision sizes, and
irregular element sizes,
for irregular larger value
so aa larger
and so that
than that
value than
called out in (6) ought
Eq. (6)
in Eq. used. Table
ought to be used. 1 has
Table 1 been prepared for
has been s^..
for smin values
mm with values
times as
that are 10 times large as
as large those in
as those Eq. (6):
in Eq.
min
Ssmin == 10s
lOs -= 1130X
1130) (7)
(7)

Common sizes for reflectance and transmittance

Common sizes are 11 cm,
samples are
transmittance samples inch, 22 cm,
0.5 inch,
cm, 0.5 inch,
cm, 11 inch,
inches. Therefore,
cm, and 22 inches.
5 cm,
5 in satisfying
Therefore, little difficulty should be encountered in the
satisfying the
minimum sizes of Table
sample sizes
minimum sample Table 1 is 10.6
1 when the wavelength is smaller; however
ym or smaller;
10.6 pm the
when the
however when

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 wavelength is larger
wavelength is larger than 10.6 um,
ym, special
special concern
concern should
should be
be given
given to
to the
the size
size of
of the
the
sample. Note,
Note, however, that we have included
however, that included aa safety
safety factor
factor of
of 10.
10.

Table 1.
1. Minimum sample size
size
XX Minimum sample diameter
(um)
(ym) mm inches
0.6328 0.715 0.028
1.15 1. 30
1.30 0.051
3. 39
3.39 3.83 0.151
10.6 12. 0
12.0 0.472
41.7 47.1 1. 86
1.86
118.0 133. 0
133.0 5.25

NOTE: This table is based on Ea. (7) which assumes that samples are statistical arrays of
100 or more elements which have dimensions of ZOa or more on a side; and an additional fac-
tor of 10 is given to the sample sizes to allow for nonuniform element sizes.
Real incident beams
Real beams

Two
Two considerations are important
important for
for the
the real
real incident
incident beams
beams in
in BRDF
BRDF and
and BTDF
BTDF measure-
measure-
ment hardware. The first
first is
is the
the real
real sample
sample sizes
sizes described
described in
in the
the previous
previous section.
section. The
second is aa desire
second is desire to make BRDF measurements as
to make as close
close as
as possible
possible to
to the
the specular
specular direction
direction
and BTDF
and BTDF measurements as close as possible to
measurements as to the
the axis
axis of
of the
the incident
incident beam.
beam.

These
These considerations lead
lead us
us to
to prefer
prefer anan incident
incident beam
beam size
size at
at the
the sample
sample of
of about
about
1 cm
1 cm to
to 55 cm diameter;
diameter; and a beam size at thethe detector
detector that
that is
is as
as small
small asas possible
possible when
when
the sample
the sample is
is a mirror or
or no
no sample at
sample at all.
all. As shown in
As in Figures 22 and
and 3,
3, these
these conditions
conditions
are
are realized
realized by
by the
the use
use of a incident beam;
convergent real incident beam; and
and the
the beam
beam diameter
diameter atat the
the
detector for
detector for a mirror sample
sample or
or aa no- sample is
no-sample is approximately
approximately that of thethe Airy
Airy disc:
disc:

a -= 2.44
2.44XA f/D
f/D (8)

. Normal
to
Sample

_
ei1 . I

l e
/
Specular
Direction ,/
Detector'',

2.
Figure 2. BRDF geometry

Detector

ormal
to
ample

Figure
Figure 3.
3. BTDF geometry
BTDF

156 //SPIE
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 field of
Detector field view
of view

are three
There are
There three alternate for the
alternate arrangements for the illuminated
relationship between the
the relationship part
illuminated part
view. We prefer
of view.
field of
the sample and the detector field
of the that the
prefer that detector field
the detector of view
field of view
include, all times,
at all
include, at times, all sample.
the sample.
Dart of the
all of the illuminated part leads
That arrangement leads
to aa cosine
to cosine signal for Lambertian scattering
signal relationship for samples; and
scattering samples; can be
that can
and that to
used to
be used
simplify calibration;
simplify calibration; of this theoretical relationship should
course this
of course be verified
should be verified by an
by an
experimental calibration using a reference sample
experimental sample that
that is as diffuse
is as as is
diffuse as available.
is available.

An alternative
An alternative arrangement is the entire
to have the
is to field of
entire field view of
of view the detector
of the filled at
detector filled at
all times by
all times part of
by aa part the illuminated part of the
of the sample.
the sample. That arrangement leads to aa con-
leads to con-
signal relationship with
stant signal
stant for Lambertian scattering
with angle for samples; and
scattering samples; and that arrange-
that arrange-
emDloved.
successfully employed.
ment can be successfully However there are two
there are reasons why
two reasons we prefer
why we larger-
thelarger
preferthe -
-of -view case
field-of-view
field case to this - field -of -view arrangement.
smaller-field-of-view
this smaller arrangement. One reason is that is
is that is
is is
more difficult to handle the sample size
the sample that were
problems that
size problems described in
were described the section
in the section
titled: "Real sample sizes." The
"Real The second
second reason involves a
reason involves small collecting optical system
a small system
that is
that is often added
added to to improve
detector to
the detector
to the signal-to-noise
improvesignal ratios when
-to -noise ratios mea-
BTDF mea-
when BRDF or BTDF
surements are
surements are performed far fromfrom the specular angles.
specular or direct beam angles. This small
This optical
small optical
system is
system often removed
is often removed leaving only a baffled detector when measurements are performed
are performed
specular or
the specular
near the
near or direct beams the scattered
beams where the signal is
scattered signal higher, and
is higher, there
where there
and where
is
is aa desire
desire toto move
move as
as close asas possible toto the
the specular
specular or direct beam. We prefer the
direct beam.
larger-field-of-view
larger arrangement
- field -of -view arrangementbecause
because arrangementisis easier
thatarrangement
that adjust and cali-
to adjust
easier to
brate forfor the two cases; one
two cases; for the
one for detector alone,
the detector and the
alone, and other for
the other the detector
for the plus
detector plus
system.
the collecting optical system.
the

A third arrangement is aa combination

combination of
of the
the first two; with
first two; first arrangement
the first
with the apply-
arrangement apply-
when the
ing when
ing and the
normal, and
the viewing direction is near normal, arrangement applying
second arrangement
the second the
when the
applying when
viewing direction is
viewing normal.
from normal.
far from
is far This avoided, because
This alternative should be avoided, it will
because it
serios calibration problems,
have series
have and because it
problems, and susceptible to
it will be susceptible error.
to error.

BPDF, BTDF and BSDF

5551jL_BTDF

Nicodemus in the reference cited

Nicodemus cited above
above defines BRDF.
defines BRDF. He asso-
He avoided the complexities asso-
ciated with
ciated the equivalent definition of BTDF,
with the the Bidirectional Transmission
BTDF, the Distribution
Transmission Distribution
Function. WeWe define it,
it, following
following him,
him, as
as the
the ratio
ratio of radiance to
transmitted radiance
of transmitted incident
to incident
irradiance. We assert thatthat the irradiance of
the irradiance is that
concern is
of concern that on the front
on the front surface of the
surface of the
sample.
transparent sample. Although
Although the BTDF will then function of
then be aa function thickness of
the thickness
of the the
of the
this is not different
sample, this
sample, from the
different from specular reflection and specular
corresponding specular.
the corresponding trans-
specular trans-
mission situations. For now we leave leave the
the question of how to values from
interpolate values
to interpolate one
from one
thickness to another,
thickness to another, taking note, however, of the
note, however, the problems of bulk
problems of bulk scattering, absorption
scattering, absorption
and the
and the change
change in
in solid
solid angle resulting from the refractive
from the of the
index of
refractive index material. We do
the material. do
note the additional
note the additional experimental difficulties of change in
the change
of the focus of
in focus the beam,
of the mul-
the mul-
beam, the
tiple surface reflections,
tiple surface reflections, and the fact that the
fact that profile will be
the beam profile measured near
be measured the
near the
axis.
optical axis. Conceptually BTDF is like BRDF and
just like
is just measurements and
their measurements
and their calibrations
and calibrations
similar.
should also be very similar. To this end then we define the
To this quantity BSDF,
general quantity
the more general the
BSDF, the
bidirectional
bidirectional scattering distribution function.
distribution function.

BRDF and
measuring; BRDF
The definition method for measuring BTDF
and BTDF

Equation can be
(1) can
Equation (1) be written in the following form
following modified form

BSDF == dL
dLout /dE.
/dE.in = L /E. (9)
Lout /E. (9)

radiance is
The radiance
The found from a voltage reading of aa detector
is found
V == d
PPd -= & Ad cosed
,WTT LL Ad cos9 s/d2
A S cosec
cos9 d As /d 2 (10)

where sft
.q -= detector responsivity
TT = path
path transmission
L = radiance
A
Ad = detector area
A = illuminated sample area
sample area
0eds, = angle
detector angle
0^
es =
= anale with
sample angle to detector
respect to
with respect detector--sample line of
-- sample line of centers
d =
= senaration
detector sample separation
In experimental arrangement most of the beam will be
appropriate experimental
an appropriate
In an be focused
focused onto
onto the
the detec-
detec-
tor so
tor that aa measurement
so that measurement of in the
sample in
of the detector output with no sample the beam is
is aa measure-
ment of
ment the beam power
of the ianorina the transmission TT and
power ionorinn the flux
and the flux distribution in
in the
the beam.
beam.
the irradiance
Then the
Then is found by
irradiance is
p
h'
E =
= V
V ns Ayr
Vns/W A so
/-#» Aso (11)

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 The detection
The voltage after transmission through the sample
detection voltage is given
sample is by
given by
Vs =
= EE Tb JP As cose
coses Ad cose
s Ad d/d 2
cosed/d2 (12)
the experimental
Since the
Since sets 8d, = 00 one has
experimental arrangement sets
/ V \ /A \
BDTF == ( s 1 lJ™_____1
(AA ns (13)
YW cose s/
\ As COS9
VnsVs J
(BDTF s s

The main problem here is

The to establish
is to the area
A S , the
establish As, illumination on
of illumination
area of on the sample. If it is
the sample. is
smaller than
smaller the sample
than the sample area itself then the the BTDF will be because more
overestimated because
be overestimated the
of the
more of
sample than
illuminates the sample
beam illuminates for. The ratio of Ans to
accounted for.
is accounted
than is As cos0 g is
to Ascoses constant
is constant
for sample tilt
any sample
for any tilt if the beam is smaller than
if the sample. Beams of large
the sample.
than the yield
extent yield
large extent
errors.
errors. One way
One way to reduce these
to reduce errors is
these errors is to with aa detector;
probe with
to probe find the
detector; find beam shape
the beam shape
and calculate
and error. To
calculate an effective error. To some provides the
some extent a nonuniform detector provides same
the same
difficulties determining Ad.
difficulties in determining cancel out
factors cancel
A^. Although most factors the same
when the
out when detector is
same detector is
used in the
used in same position,
the same position, not all do,do, and situation is
the situation
and the aggravated if attenuators must
is aggravated must
be used
be in either
used in measurements. The
the measurements.
of the
either of The sample -in measurement
sample-in will also be made at
measurement will at aa
different focal position,
different focal position, although forfor the convergence angle.
same convergence
the same Problems of source
angle. Problems
stability, detector
stability, stability and
detector and environmental stability and the differences in
the differences unwanted scattered
in unwanted
radiation
radiation all creep in.
all creep The calibration is
in. The the measurement!
is not just like the
Reference sample method
Reference sample method for BRDF

One of the most popular methods for making BRDF

for making measurements, and
BRDF measurements, procedure that
and aa procedure is
that is
especially simple
especially simple to mathematically, is
to analyze and describe mathematically, the reference
called the
is called sample
reference sample
method. For this method an appropriate reference
an appropriate is used,
sample is
reference sample it is
and it
used, and that
required that
is required
the BRDF values
the BRDF values for for all
this reference be known for
for this of the
all of conditions under
the conditions measure-
which measure-
under which
ments
ments are made.
to be made.
are going to In principle,
In the reference sample method requires
principle, the all
that all
requires that
measurements
measurements be made in pairs, one
in pairs, the unknown
with the
one with sample, the
unknown sample, other with
the other reference
the reference
with the
sample. In practice,
In practice, fewer reference sample measurements are usually made.
are usually return
made. We will return
this discussion
to this
to full set
discussion of how to obtain a full fewer reference
set of BRDF data with fewer measure-
reference measure-
ments
ments in a "Single reference
titled "Single
a later section titled method";
measurement method
reference measurement "; but now will
we will
now we
proceed with
proceed an analytical
with an analytical review of BRDF data reduction based on pairs of
on pairs measurements:
of measurements:
The voltage
The voltage from a measurement of the sample
of the is, as
sample is, before
as before
V
Vs = T
s s
p bs
p
bs
s As
EEs cose ss A
A s cose d /d s 2
cose d/ds
Add cose (14)
That
That from the is
the reference is
V
r
= T
r Rr
`
br Er
pp br GOS0 rr A
E r Ar cose Cos9 dd /d ri 2
Add cose (15)

The BRDF of
The BRDF the sample
of the p,
sample pbs then is
then is
Vs Tr .Rr EEr Ad cosed /d2
Cos6 r Ad
r Ar coser
J bs P br (16)
(16)
pbs pbr V Ts T,s ES As coses Ad cosed /d2

Most of these terms cancel.

terms cancel. fact if
In fact
In and reference
sample and
the sample
if the reference are substituted one for
one for
the other
the at every
other at of measurement,
angle of
every angle is valid to write
measurement, it is
J bs
pbs = 'br VVr
pbr Vs/Vr (17)
(17)

This is
This method. But
substitution method.
the ultimate substitution
is the it
But it requires a knowledge of
requires everywhere,
p br everywhere,
of pbr
and does one
how does
and how that? It
one get that? It can be done
can be the
done by the auxiliary
other auxiliary
definition method or by other
measurements. It seems better
It seems to use
better to procedure
a procedure
use a like this than
like to use
than to definition
the definition
use the
method every sample
on every
method on for the
sample for reasons:
the following reasons
(1)
(1) One is used for
particular reference sample is
One particular number of
large number
for a large samples,
unknown samples,
of unknown
so it
so is appropriate
it is far more effort in
appropriate to spend far BRDF re £ than
determining BRDFref
in determining could
than could
be assigned
properly be
properly BRDF , .
assigned for the measurement of any one BRDFunk.
(2)
(2) It is customary
It is to select for
customary to surface that
sample, aa surface
for a reference sample, approximately
is approximately
that is
The simple
Lambertian. The shape of the
simple shape BRDF graph
the approximately Lambertian BRDF provides
graph provides
simplified data,
simplified data, and useful checks for
useful self checks the difficulties
solving the
for solving described
difficulties described
earlier.

158
755 //SPIE
SPIEVol.
Vol. 257
257Radiation
Radiation Scattering
Scattering in
inOptical
OpticalSystems
Systems (1980)
(1980)

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 (3)
(3) Several different
Several different reference samples can their properties
and their
can be measured and be
can be
properties can
compared with one
compared several different laboratory equipments or
another. And several
another. varia-
or varia-
tions of
tions same
the same
of the laboratory equipment can be used for self check
for self measurement.
check measurement.
(4)
(4) exchange of
The exchange
The of reference samples laboratories can
among different laboratories
samoles among considered.
be considered.
can be
or self
Additional verification or self check can be
information can
check information upon to
drawn upon
be drawn the
solve the
to solve
measurement difficulties for BBRDF
difficulties for ref by
RDFref consulting the
by consulting literature, since
the literature, reference
since reference
samples can be
samples can be selected or prepared to conform to data. 2
published data.2
to Published
We have
We have found mak-3s aa very
sandpaper makes
found that gold plated sandpaper very useful working reference
useful working sample.
reference sample.
Desirable properties
Desirable include high
properties include high reflectance, surface strength,
satisfactory surface
reflectance, satisfactory approximate
strength, approximate
conformance to
conformance to Lambertian properties, and a choice of grit
surface properties,
Lambertian surface grit sizes for different
sizes for wave-
different wave-
lengths .
lengths.

In the
In visible wavelength
the visible wavelength region we have
region we oxide, sodium
have found that magnesium oxide, chloride,
sodium chloride,
and halon
and BRDF values
have BRDF
halon have values very close to those of Lambertian surfaces; but samples
surfaces; but of
samples of
these materials
these are not
materials are for continuous
not strong or rugged enough for over long
use over
continuous use periods of
long periods of
region, we recommend
Therefore, in the visible region,
time. Therefore, combination of
recommend aa combination or more
one or
of one of
more of
samples plus
these samples
these samples of gold plated sandpaper;
one or more samples
plus one recommend that
and we recommend
sandpaper; and the
that the
comparisons be
comparisons in the paragraph labeled
be performed that are described in (3) in
labeled (3) in this section.
this section.
to 10.6
out to
the infrared wavelengths out
For the 10.6 pm have found
ym we have of sulfur
flowers of
that flowers
found that sulfur can be
can be
for aa reference
used for
used reference sample that is Lambertian, but this
is nearly Lambertian, is rather
material is
this material fragile,
rather fragile,
so it
so it should be teamed up with a more sturdy companion
should be gold plated
like gold
companion like sandpaper.
plated sandpaper.
Although none of these samples
of these is Lambertian
samples is Lambertian for much exceeding
angles much
for angles have
°, we have
exceeding4545°,
developed aa technique,
developed technique, described in next section,
the next
in the does not
that does
section, that this. It
require this.
not require It is
also far more economical
far more point-by-point
thanpoint
economical than comparisons.
-by -point comparisons.

Single reference measurement method

The
The equation for p,
for pbs [Eq. can be
(16)] can
[Eq. (16)] be simplified in steps.
in steps. Certainly for reason-
any reason-
for any
A-, cose
able arrangement Ad
able cos9/d 2 /EA and
/d2,EA are constant.
and TT are constant. Thus

Vg
Vs cos9
coserr
p bs
pbs = br V~
ppbr V c^T
cose (18)
r s

that although E and A may both change,their

Notice that
Notice product is
change > their product to be
likely to
is likely constant. Now
be aa constant.
we can use pp, as
as a for reasonable
sample for
a more or less Lambertian sample of incidence
angles of
reasonable angles and
incidence and
correct by
correct by the
thé obliquity factors. however, that the power on
Notice, however,
factors. Notice, the sample
on the must
sample must
constant.
remain constant. It should also be emphasized that V
It should Vg is the voltage measured at
is the the
at the
sample and Vr
anale, and
measurement angle,
sample measurement Vr is the voltage measured for
is the for the reference at
the reference reference
the reference
at the
angle.
measurement angle.
Equation (18) represents the single reference
(18) represents method.
reference measurement method. It has
It advantage
has the advantage
(17) of
Eq. (17)
compared to Eq. reduced time
of reduced and effort
time and set up
both set
for both
effort for up of samples and
of samples recording of
and recording of
has the advantage of
data, and it has
data, less information
requiring less
of requiring its reference
from its
information from sample. It
reference sample.
has compared to
has the disadvantage compared (17) of
Eq. (17)
to Eq. of providing less drift
providing less drift correction for and
source and
for source
detector; it
detector; it provides less correction information about
provides less of instrument
anomalies of
about anomalies geometry
instrument geometry
and scattered
and radiation; and
scattered radiation; it requires
and it requires the prior verification for
orior calibration verification equip-
the equip-
for the
readings from
ment being used that the voltage readings Lambertian scattering
from Lambertian samples vary
scattering samples according
vary according
to the
to the cosine of 0 .
of er.
5fL5? rence Methods
Reference

There
There are techniques by which one
four techniques
are four can calibrate
one can BRDF and
both BRDF
calibrate both reference
BTDF reference
and BTDF
samples. One can use a
One can a diffuse reflector in the manner described
in the above. He can equiva-
described above.
lently use
lently transmitter if
use aa diffuse transmitter can find
he can
if he one. These
find one. are particularly appropriate
These are
for samples
for large diffuse
samples with aa large component of
diffuse component reflection. Alternatively
of reflection. he can use the
Alternatively he
perfectly specular transmitter,
perfectly specular i.e., no sample at all,
transmitter, i.e., all, or aa highly specular reference
specular reference
mirror. Now it seems
Now it logical to
seems logical use the
to use reflecting standards
the reflecting for BRDF
standards for and
measurements and
BRDF measurements
the
the transmitting standards for for BTDF measurements. This
BTDF measurements. This is, not necessary;
course, not
is, of course, it
necessary; it
only aa matter
is only
is of convenience unless
matter of substitution method is
unless the direct substitution used. We have
is used.
standardized on
largely standardized
largely the no sample standard for
on the for specular samples the diffuse
and the
samples and re-
diffuse re-
the others.
for the
flector for Cross checks
others. Cross are certainly
checks are useful.
certainly useful.
Conclusion
can be
It can
It said in
be said in conclusion that Drecise and accurate measurement of
that the precise BSDF's is
of BSDF's is aa
task. Because of the radiometric,
difficult and tedious task. geometric, signal
radiometric, geometric, background
level, background
signal level,
level,"low
level, interference level,
level, level, and
source level,
"low source few unknown difficulties,
probably aa few
and probably it is
difficulties, it is

SPIE Vol.
SPIE Vol.257
257Radiation
RadiationScattering
ScatteringininOptical
OpticalSystems
Systems(1980)
(1980)/ / 159
159

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 unlikely that
unlikely that many measurements better
better than
than ±20%
±20% have made.
have been made.

References

1. Nicodemus, F.
Nicodemus, F. F.,
E., J.
J. C.
C. Richmond,
Richmond, J. J. Hsia,
J. J. Hsia, I. W. Ginsberg,
I. TV. Ginsberg, and
and T.
T. Limoeris,
Limperis,
"Geometrical Considerations
"Geometrical Considerations and Nomenclature forfor Reflectance,"
Reflectance," NBS
NBS Monograph
Monograph 160,
160,
1977.
October, 1977.

2. Grum, F., and

Grum, F., and R.
R. J.
J. Becherer, Optical Radiation Measurements,
Becherer, Optical Measurements, Volume
Volume 1,
1, Radiometry,
Radiometry,
Academic Press,
Press, New
New York,
York, 1979.
1979.

160 //SPIE
160 SPIE Vol.
Vol. 257
257 Radiation
Radiation Scattering
Scattering in
in Optical
OpticalSystems
Systems (1980)
(1980)

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