Twin Crystal Probe :

The twin crystal probe is designed to eliminate the dead zone

problem of a single crystal probe. But actually, a twin crystal probe
also has a dead zone of few millimeters.
Twin crystal probe contains two independent crystals in a single
housing. The crystals are mounted on plastic delay lines that are
usually cut at an angle to the horizontal plane [ forms the roof
angle ], so that the transmitting and receiving beam paths cross
beneath the surface of the test piece. The dead zone is where the
transmitting and receiving beams have not converged. In this
arrangement, one of the crystals transmits ultrasound and the
other receives the reflected signal. The crystal assemblies are
separated by some form of acoustic barrier [ usually Cork ] to
prevent cross talk noise.
A highly penetrating couplant should not be used, otherwise
damage to this cross talk barrier may take place. Dual crystal
configuration almost eliminates dead zone, improves near surface
and lateral resolution and performs well on corroded back walls
and rough entry surfaces. The crossed beam design acts as
pseudo focus and increases sensitivity for short range flaw
detection. In general, a decrease in the roof angle or an increase
in the crystal size will result in a longer pseudo -focal distance and
an increase in the useful test range of the probe.
Range calibration :
Angled crystal arrangement in dual probe produces a V-path in
the test specimen and hence the sound travel path is more than
the actual thickness of the part. Because of this condition, multiple
back reflections are not used for range calibration when accuracy
of calibration is desired.
For accurate range calibration two independent thickness sections,
one near the start and the other near the end of the required test
range are used. The lower thickness echo is set by the delay
control and the higher thickness echo by the fine range control.
Echo positioning requires many repetitions. Calibrated range will be
accurate between the two selected calibration block thickness.
The calibrated screen does not contain the initial echo because
of the long delay path in the plastic delay line and permits flaw
detection and measurement near the surface. Multiple reflections in
the transmitter delay line is not detected because the transmitter
crystal does not have any reception function. A small cross-talk
echo may appear on the screen and its height will decrease when
the probe is coupled to the test material.
Accuracy of calibration may be checked on a step wedge block
for thickness measurement applications.
Dual crystal probes are useful for detecting discontinuities closer
to the scanning surface. The probe exhibits high sensitivity and
produces good signal amplitude from small discontinuities located
within short distance. After the pseudo focus, the sensitivity drops
rapidly and the useful range for detecting smaller flaws is around
50 mm. [ - 6 dB sensitivity ]
Dual crystal probes are excellent for thickness measurements in
thinner sections, inspection of cladding and bonding, lamination
testing in thinner plates, evaluation of castings and other sound
scattering materials and for measuring corrosion in low thickness
plates and tubing. When measuring very thin sections with larger
probes, sound may bounce twice within the part before reaching
the receiving crystal and record twice the actual thickness.

K. Chatterjee, 75643 Center for NDT P 00 Rv 02 Self study material.