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F. M. Fernandes et al.: Deposition of fine copper film on samples placed internally and externally to the cathodic cage
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IJMR_MK111737 – 9.1.19/reemers
F. M. Fernandes et al.: Deposition of fine copper film on samples placed internally and externally to the cathodic cage
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F. M. Fernandes et al.: Deposition of fine copper film on samples placed internally and externally to the cathodic cage
served in transmittance results, sample E12 contains the ment used. Furthermore, EDS measures a smaller percent-
highest quantity of deposited copper, which leads us to af- age of a specific area compared to XRF. According to
firm that this thickness promotes the highest sputtering in Silva [23] whose study focused on the deposition of fine ti-
this technique. tanium nitride films using two distinct cage lid thicknesses
Results obtained from both analyses converge. There is, (1 mm and 10 mm), higher length-to-distance ratios result
however, a difference in the percentage of copper found be- in thicker films. However, Fernandes et al. [20] had pre-
tween techniques. This is due to the precision of the equip- viously affirmed that the best length-to-distance ratio for
International Journal of Materials Research downloaded from www.hanser-elibrary.com by Hanser - Library on January 28, 2019
Fig. 3. Standard sample and treated sample transmittance profiles: (A) external samples, and (B) internal samples.
For personal use only.
Fig. 4. Percentage atomic of copper present in the (A) external samples, and (B) internal samples, according to the XRF and EDS analyzes.
Fig. 5. XRD results of (A) external samples, and (B) internal samples.
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F. M. Fernandes et al.: Deposition of fine copper film on samples placed internally and externally to the cathodic cage
International Journal of Materials Research downloaded from www.hanser-elibrary.com by Hanser - Library on January 28, 2019
For personal use only.
Fig. 6. SEM images of samples (a) E2; (b) E4; (c) E6; (d) E12; and (e) E18.
copper films deposited on internal glass substrates is 1.5, films, which can be visualized in Fig. 5b showing that films on
because greater ratios promote sputtering over a larger dia- internal samples were more crystalline, whilst samples E18
meter and lower film uniformity. and E24 showed the formation of CuO and Cu2O.
Using XRD analysis on Fig. 5a samples, copper peaks were Figure 6 shows FEG-SEM micrographs of external sam-
found on E2, E4, E12 and E18 external samples. Samples E2 ples. Analysis shows the presence of copper nanoparticles,
and E4 also showed copper oxide (CuO) peaks. The presence confirmed by SEM-EDS analysis in the micro-areas.
of these peaks may be a result of residual gas, such as oxygen, Furthermore, sample E12 shows the highest density of these
present in the deposition reactor, as reported in ref. [24] the particles, confirming previous analyses and the affirmation
presence of CuO, after using magnetron sputtering for cooper that continuous, dense film formation is not possible on ex-
deposition. For this deposition a copper target was used and ternally treated samples, with only copper nanoparticle de-
an oxygen atmosphere. Because the internal samples E2 and position occurring.
E4 also showed copper oxide (CuO) peaks, they were not Figure 7 illustrates the morphology of deposited copper,
characterized using XRD, since it was sought to obtain copper magnified 80.000X. Again, nanoparticles were confirmed
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F. M. Fernandes et al.: Deposition of fine copper film on samples placed internally and externally to the cathodic cage
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F. M. Fernandes et al.: Deposition of fine copper film on samples placed internally and externally to the cathodic cage
Ciências e Tecnologia – ECT of the Universidade Federal do Rio [23] S.S. da Silva, C. de L.R. Bottoni, L.C. Gontijo, S.O. Ferreira, S.S.
Grande do Norte – UFRN Lab. da Silva, C. de L.R. Bottoni, L.C. Gontijo, S.O. Ferreira: Matéria
(Rio Janeiro) 22 (2017).
References DOI:10.1590/s1517-707620170003.0191
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