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IJMR_MK111737 – 9.1.

19/reemers

F. M. Fernandes et al.: Deposition of fine copper film on samples placed internally and externally to the cathodic cage

Fernanda M. Fernandesa , Edglay A. RochaFilhob , Ivan A. Souzab , Igor O. Nascimentob , Rô-


mulo R. M. de Sousac , Edalmy O. Almeidab , Michelle C. Feitora,b , Thércio H. C. Costaa,b
a
Textile engineering department, Federal University of Rio Grande do Norte, Natal-RN, Brazil
b
Mechanical engineering department, Federal University of Rio Grande do Norte, Natal-RN, Brazil
c
Materials engineering department, Federal University of Piauí, Piauí-TE, Brazil

Deposition of fine copper film on samples placed


internally and externally to the cathodic cage
International Journal of Materials Research downloaded from www.hanser-elibrary.com by Hanser - Library on January 28, 2019

12]. Samples are positioned on an insulating surface and


The cathodic cage plasma nitriding technique is used for maintained at a floating potential or a relatively low polar-
thin film deposition. As such, the hollow cathode effect on ized potential [5, 11].
cage holes is directly related to deposition efficiency. The Whilst CCPN has been used on a variety of materials
objective of this work is to study the influence of the cath- [13 – 15], there is a need to better comprehend CCPN mech-
ode length-to-diameter ratio in the deposition of fine copper anisms in order for the process to evolve. Several process
films on samples placed internally and externally to the variables, such as temperature [16], gas composition [17]
cathodic cage, in an argon atmosphere, for 3 h at 420 8C. and cathodic cage configurations [5], have been altered
Compositional, transmittance and morphological character- with the objective of improving both deposition and the re-
ization of films show copper deposition in all treatments. sulting substrate. Furthermore, there has been analysis and
However, it was observed that substrate temperatures dur- discussion around variations to the cathodic cage lid [18]
ing film deposition influence its morphology. As such, the as well as nitriding through external deposition on cage
For personal use only.

formation of continuous film on internal samples is ob- holes [19].


served, whereas external samples show uniformally dis- With the objective of better comprehending the mecha-
persed nanoparticles as well as the absence of dense film nisms of the deposition of copper films using the cathodic
on substrates. As far as the length-to-diameter ratio is con- cage technique, and to study the influence of the cathode
cerned, the 1.5 ratio presented the highest deposition effi- length-to-diameter ratio on deposition, glass samples were
ciency. positioned internally and externally to the cathodic cage
and were treated in argon (Ar) atmosphere at 420 8C for 3 h.
Keywords: Cathodic cage; Thin films; Copper nanoparti-
cles; Hollow cathode 2. Experimental procedure

Glass substrates measuring 25 · 37.5 mm and 20 · 25 mm


1. Introduction were used for external and internal deposition, respectively.
In order to improve film adhesion, they were treated in a
Copper is widely used in both the civil and automobile in- 10 % potassium hydroxide (KOH) and 90 % distilled water
dustries, and in recent years has gained significance due to ultrasonic bath for 10 min, followed by agitation in a 10 %
its bactericidal properties [1, 2]. However, copper is a me- nitric acid (HNO3) and 90 % distilled water solution for
tallic material usually used in deposition devices, whether, 3 min, and bathed in an acetone p.a ultrasonic bath for
physical, chemical or plasma, to test and/or prove the effi- 10 min.
ciency of the system [3, 4]. Plasma nitriding may be used Six length-to-diameter ratios, i. e. 0.25; 0.5; 0.75; 1.5;
for coating surfaces to improve mechanical properties and 2.25 and 3, were used. 8 mm diameter holes were main-
resistance to corrosion [5 – 8]. Whilst this technique has tained throughout the cage, with varying lid thicknesses of
greater advantages versus salt bath and gas nitriding, it does 2, 4, 6, 12, 18 and 24 mm. Each lid measured 65 mm in dia-
present disadvantages such as the edge effect, damage meter and contained 19, 13 mm equidistant holes. The lids
caused by opening of arcs and temperature variances. As were formed with a pure electrolytic copper (99 % Cu) plate
an alternative to reduce these limitations, the active screen measuring 2 mm, 4 mm and 6 mm in thickness and the cage
nitriding technique was created [5, 9]. Cathodic cage plas- with a plate of 4 mm, a process of machining manufactured
ma nitriding (CCPN) derives from this technique [10]. both. Figure 1 illustrates the reactor, cage and sample dis-
Different to ion nitriding, active species do not interact positions. The cage measured 70 mm (externally) and
directly with sample surfaces when using a cathodic cage. 62 mm (internally) in diameter, and 26 mm in height.
All the workload is applied to the cathodic cage (CC), and The plasma equipment utilized is detailed in [20]. Sam-
the luminous discharge is dislocated from samples to a me- ples were positioned inside the cathodic cage under a ce-
tallic screen in cathodic potential [5, 11]. The cathodic ramic disk at floating potential, and outside the cage, at
cage’s function is to generate extra secondary electrons, anodic potential, on the reactor vessel upper flange.
confine existing electrons in the electromagnetic discharge, Current and voltage parameters varied as per Table 1, as
and uniformly distribute the discharge onto the sample [5, the objective was to guarantee a hollow cathode effect in

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IJMR_MK111737 – 9.1.19/reemers

F. M. Fernandes et al.: Deposition of fine copper film on samples placed internally and externally to the cathodic cage

Table 1. Deposition parameters used for hole confinement.

Sample E0 E2 E4 E6 E12 E18 E24


Lid thickness Untreated 2 mm 4 mm 6 mm 12 mm 18 mm 24 mm
Current (A) 0.28 0.33 0.38 0.46 0.52 0.57
Tension (V) 760 810 780 680 580 520
Power (W) 212.8 267.3 296.4 312.8 301.6 296.4

a Thermo Fisher Scientific Genesys 10 UV Spectrophot-


ometer, whilst Field Emission Gun Scanning Electron Mi-
croscopy (FEG-SEM) images, magnified 20 000 · and
80 000 · , were captured using a Zeiss Auriga 40.
International Journal of Materials Research downloaded from www.hanser-elibrary.com by Hanser - Library on January 28, 2019

3. Results and discussion

Figure 2 depicts both internal (I) and external (O) glass


samples, and clearly shows a change in color on all sam-
ples, confirming deposition in all treatments. Figure 2a de-
picts the glass sample without copper deposition (standard),
Fig. 1. 3D image of reactor used for cathodic cage copper deposition whilst Fig. 2Ob–d show higher translucence, confirmed by
process. the visualization of letters positioned behind the film. Fig-
ure 2Oe and f present a different hue with pigmentation ap-
proximate to that of pure copper. Figure 2Og depicts a tran-
sition between samples. As far as samples placed inside the
cathodic cage are concerned, Fig. 2Ib–g, it is clear that for
all cage thicknesses there was a higher deposition when
For personal use only.

compared to external samples. This is due to the proximity


of internal samples, as well as the 420 8C temperature to
which they were subjected.
The variation in the tonality can be attributed to the dif-
ference in the thickness of the deposited films, that is, the
more the sample is coppery, the more efficient was the de-
position of copper on the sample. However, upon attempt-
ing to analyze the thickness of this film on external samples
via transverse SEM analysis, no film was observed. There-
Fig. 2. Samples (a) EO; (b) E2; (c) E4; (d) E6; (e) E12; (f) E18; (g)
E24 Post-treatment. I = internal and O = external. fore, we sought to understand the deposition kinetics in-
volved. According to Nishimoto et al. [10], the longer the
distance between the sample and the active screen, the
Table 2. Transmittance of the films. smaller the deposited particles. As per Sousa et al. [21],
the substrate temperatures influence continuous, dense film
Sample Transmittance (%)
Internal External formation. As part of the samples were positioned outside
the cage at an average distance of 180 mm, the influencing
E0 85.27 temperature was approximately 65 8C, which may not have
E2 65.91 0.0 been sufficient for the adhesion of copper particles and the
E4 42.63 0.0 consequent formation of dense continuous film as defined
E6 22.74 0.0 by Tentardini [22].
E12 5.08 0.0 In order to quantify film transmittance, which would
E18 21.72 0.0 quantify the effect visualized in Fig. 2, all samples were
E24 38.87 0.0 submitted to transmittance testing. Table 2 shows the aver-
age transmittance results of tested samples and Fig. 3 gra-
phically shows the transmittance values.
On external samples, there is a decrease in the intensity
the holes of the cage lid, in order to ensure more effective of light transmitted. As per Fig. 2, sample E12 showed the
copper deposition and uniformity at process temperature. lowest transmittance documented in Table 2. This may be
The parameters that remained constant were temperature related to film thickness and/or the quantity of copper de-
(420 8C), deposition time (3 h) and argon flow (12 cm3 posited. As far as internal samples are concerned, it was
min–1). not possible to either measure or estimate which had the
Quantitative analysis was performed using a Bruker D2 highest deposition, as none of the samples transmitted light.
Phaser energy dispersive X-ray fluorescence spectrometer Figure 4 illustrates film composition quantitative data
in Bragg–Brentano geometry performing 0,028 min–1 obtained using Energy Dispersive X-Ray Spectroscopy
sweeps from 208 to 908. Transmittance was measured with (EDS) and X-ray diffraction (XRF), showing that, as ob-

2
F. M. Fernandes et al.: Deposition of fine copper film on samples placed internally and externally to the cathodic cage

served in transmittance results, sample E12 contains the ment used. Furthermore, EDS measures a smaller percent-
highest quantity of deposited copper, which leads us to af- age of a specific area compared to XRF. According to
firm that this thickness promotes the highest sputtering in Silva [23] whose study focused on the deposition of fine ti-
this technique. tanium nitride films using two distinct cage lid thicknesses
Results obtained from both analyses converge. There is, (1 mm and 10 mm), higher length-to-distance ratios result
however, a difference in the percentage of copper found be- in thicker films. However, Fernandes et al. [20] had pre-
tween techniques. This is due to the precision of the equip- viously affirmed that the best length-to-distance ratio for
International Journal of Materials Research downloaded from www.hanser-elibrary.com by Hanser - Library on January 28, 2019

Fig. 3. Standard sample and treated sample transmittance profiles: (A) external samples, and (B) internal samples.
For personal use only.

Fig. 4. Percentage atomic of copper present in the (A) external samples, and (B) internal samples, according to the XRF and EDS analyzes.

Fig. 5. XRD results of (A) external samples, and (B) internal samples.

3
F. M. Fernandes et al.: Deposition of fine copper film on samples placed internally and externally to the cathodic cage
International Journal of Materials Research downloaded from www.hanser-elibrary.com by Hanser - Library on January 28, 2019
For personal use only.

Fig. 6. SEM images of samples (a) E2; (b) E4; (c) E6; (d) E12; and (e) E18.

copper films deposited on internal glass substrates is 1.5, films, which can be visualized in Fig. 5b showing that films on
because greater ratios promote sputtering over a larger dia- internal samples were more crystalline, whilst samples E18
meter and lower film uniformity. and E24 showed the formation of CuO and Cu2O.
Using XRD analysis on Fig. 5a samples, copper peaks were Figure 6 shows FEG-SEM micrographs of external sam-
found on E2, E4, E12 and E18 external samples. Samples E2 ples. Analysis shows the presence of copper nanoparticles,
and E4 also showed copper oxide (CuO) peaks. The presence confirmed by SEM-EDS analysis in the micro-areas.
of these peaks may be a result of residual gas, such as oxygen, Furthermore, sample E12 shows the highest density of these
present in the deposition reactor, as reported in ref. [24] the particles, confirming previous analyses and the affirmation
presence of CuO, after using magnetron sputtering for cooper that continuous, dense film formation is not possible on ex-
deposition. For this deposition a copper target was used and ternally treated samples, with only copper nanoparticle de-
an oxygen atmosphere. Because the internal samples E2 and position occurring.
E4 also showed copper oxide (CuO) peaks, they were not Figure 7 illustrates the morphology of deposited copper,
characterized using XRD, since it was sought to obtain copper magnified 80.000X. Again, nanoparticles were confirmed

4
F. M. Fernandes et al.: Deposition of fine copper film on samples placed internally and externally to the cathodic cage

Fig. 8. Transversal morphology of films de-


posited on internal samples.
International Journal of Materials Research downloaded from www.hanser-elibrary.com by Hanser - Library on January 28, 2019

as previously indicated in this work, and affirmed by Nishi-


moto et al. [9]. The mean diameter of the nanoparticles was
23.48 nm, with the maximum diameter at 32.5 nm and the
minimum diameter at 13.75 nm ± 0.04.
For personal use only.

Figure 8 shows the transverse morphology of films de-


posited on internal samples, and Fig. 9 shows the average
thicknesses of films deposited according to the previous
figure. Figure 8a and b, samples E6 and E12 respectively,
shows the presence of continuous, dense film, the average
thicknesses were 8.24 ± 1.5 lm and 15.7 ± 0.36 lm respec-
tively for the samples E6 and E12. However, Fig. 8c and d
show that whilst the film seems to be continuous, it is actu-
ally composed of micrometric particles, suggesting that the
size of particles extracted from cathode walls when the
length-to-distance ratio is greater than 1,5 negatively im-
pacts adhesion to the substrate, the average thicknesses
Fig. 7. FEG – SEM of sample E12. were 8.86 ± 0.75 lm and 3.95 ± 0.78 lm, respectively for
the samples E18 and E24. As the same temperature was
used in all treatments, we can affirm that for length-to-dis-
tance ratios greater than 1.5, higher temperatures are
needed in order to promote dense film formation.
This factor may be related to the potential used in this
work. As illustrated in Fig. 9, the highest potential was
found in sample E12. When comparing potentials used in
samples E6, E18 and E24, we note that there is a direct rela-
tionship between plasma potential and deposition effi-
ciency, as sample E6 has a deposition potential equal to or
lower than that of samples E18 and E24. However, as the
current used was directly proportional to plasma ion den-
sity, and with increasing length-to-distance ratios resulting
in higher treatment currents, we can affirm that deposition
efficiency decreased because there was a reduction in the
treatment current, which signified lower electric field inten-
sity and consequent lower particle kinetic energy. This can
be related to Fernandes et al.’s [19] study because if parti-
cles extracted from cathodes are larger, more energy is
needed for movement and subsequent deposition on the
Fig. 9. Power, Current and Voltage parameters used in depositions. glass substrates.

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F. M. Fernandes et al.: Deposition of fine copper film on samples placed internally and externally to the cathodic cage

4. Conclusions 147. DOI:10.1016/J.MSEA.2007.06.033


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As a result of this work, we conclude the following: [13] M. Naeem, M. Shafiq, M. Zaka-ul-Islam, A. Ashiq, J.C. Díaz-
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meter ratio influence on the deposition of films, neverthe- 745 – 753. DOI:10.1016/J.MATDES. 2016.07.044
less, the use in metallic materials must be studied for pur- [14] R.R.M. de Sousa, P.S. Sato, B.C. Viana, C. Alves, A. Nishimoto,
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the deposition of nanoparticles of metallic materials, how- [17] R. Mohammadzadeh, A. Akbari, M. Drouet: Surf. Coatings Tech-
ever, for external deposition process it is necessary to con- nol. 258 (2014), 566 – 573.
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sider the sample temperature and the adhesion of the film
International Journal of Materials Research downloaded from www.hanser-elibrary.com by Hanser - Library on January 28, 2019

[18] F. de M. Fernandes, T.H. de C. Costa, R.R.M. de Sousa, M.C. Fei-


to the substrate for future studies; tor, E. de A.R. Filho, I.A. de Souza: in An. Do Congr. Anu. Da
- The highest fine copper film deposition efficiency was ABM (Editora Blucher, São Paulo, 2017) 2748 – 2756.
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[19] F. de M. Fernandes, I.O. Nascimento, R.R.M. de Sousa, I.A. de
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cathodic cage, and exposed to lower temperatures, only em Metal. Mater. e Mineração 15 (2018) 296.
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[22] E.K. Tentardini: doctor thesis, Obtenção e caracterização de
We thank the Departamento de Materiais – DEMat Laboratory, and filmes finos de (Ti,Al) do tipo multicamadas para aplicação em
Materiais Multifuncionais e Experimentação Numérica da Escola de matrizes, UFRGS, BR (2004).
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