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IRF9Z34NPbF
HEXFET® Power MOSFET
l Advanced Process Technology
l Dynamic dv/dt Rating
D
l 175°C Operating Temperature VDSS = -55V
l Fast Switching
l P-Channel
RDS(on) = 0.10Ω
l Fully Avalanche Rated G
l Lead-Free
ID = -19A
Description S
Fifth Generation HEXFETs from International Rectifier
utilize advanced processing techniques to achieve
extremely low on-resistance per silicon area. This
benefit, combined with the fast switching speed and
ruggedized device design that HEXFET Power
MOSFETs are well known for, provides the designer
with an extremely efficient and reliable device for use
in a wide variety of applications.
Thermal Resistance
Parameter Typ. Max. Units
RθJC Junction-to-Case 2.2
RθCS Case-to-Sink, Flat, Greased Surface 0.50 °C/W
RθJA Junction-to-Ambient 62
02/05/04
IRF9Z34NPbF
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V(BR)DSS Drain-to-Source Breakdown Voltage -55 V VGS = 0V, ID = -250µA
∆V(BR)DSS/∆TJ Breakdown Voltage Temp. Coefficient -0.05 V/°C Reference to 25°C, ID = -1mA
RDS(on) Static Drain-to-Source On-Resistance 0.10 Ω VGS = -10V, ID = -10A
VGS(th) Gate Threshold Voltage -2.0 -4.0 V VDS = V GS, ID = -250µA
gfs Forward Transconductance 4.2 S VDS = 25V, I D = -10A
-25 VDS = -55V, VGS = 0V
IDSS Drain-to-Source Leakage Current µA
-250 VDS = -44V, VGS = 0V, TJ = 150°C
Gate-to-Source Forward Leakage 100 VGS = 20V
IGSS nA
Gate-to-Source Reverse Leakage -100 VGS = -20V
Qg Total Gate Charge 35 ID = -10A
Qgs Gate-to-Source Charge 7.9 nC VDS = -44V
Qgd Gate-to-Drain ("Miller") Charge 16 VGS = -10V, See Fig. 6 and 13
td(on) Turn-On Delay Time 13 VDD = -28V
tr Rise Time 55 ID = -10A
ns
td(off) Turn-Off Delay Time 30 RG = 13Ω
tf Fall Time 41 RD = 2.6Ω, See Fig. 10
Between lead, D
LD Internal Drain Inductance 4.5
6mm (0.25in.)
nH G
from package
LS Internal Source Inductance 7.5
and center of die contact S
VSD Diode Forward Voltage -1.6 V TJ = 25°C, IS = -10A, VGS = 0V
trr Reverse Recovery Time 54 82 ns TJ = 25°C, IF = -10A
Q rr Reverse RecoveryCharge 110 160 nC di/dt = -100A/µs
ton Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
Notes:
Repetitive rating; pulse width limited by ISD ≤ -10A, di/dt ≤ -290A/µs, VDD ≤ V(BR)DSS,
max. junction temperature. ( See fig. 11 ) TJ ≤ 175°C
Starting TJ = 25°C, L = 3.6mH Pulse width ≤ 300µs; duty cycle ≤ 2%.
RG = 25Ω, IAS = -10A. (See Figure 12)
IRF9Z34NPbF
- 6.0V - 6.0V
- 5.5V - 5.5V
- 5.0V - 5.0V
BOTTOM - 4.5V BOTTOM - 4.5V
10 10
-4.5V
-4.5V
20µs PULSE WIDTH 20µs PULSE WIDTH
Tc = 25°C TC = 175°C
1 A 1 A
0.1 1 10 100 0.1 1 10 100
-VDS , Drain-to-Source Voltage (V) -VDS , Drain-to-Source Voltage (V)
100 2.0
I D = -17A
R DS(on) , Drain-to-Source On Resistance
-ID , Drain-to-Source Current (A)
1.5
TJ = 25°C
TJ = 175°C
(Normalized)
10 1.0
0.5
VDS = -25V
20µs PULSE WIDTH VGS = -10V
1 0.0 A
A
4 5 6 7 8 9 10 -60 -40 -20 0 20 40 60 80 100 120 140 160 180
1200 20
V GS = 0V, f = 1MHz I D = -10A
C iss = Cgs + C gd , Cds SHORTED
C rss = C gd
800
Ciss
12
600 Coss
8
400
Crss
4
200
100 1000
OPERATION IN THIS AREA LIMITED
BY R DS(on)
-ISD , Reverse Drain Current (A)
10 100
TJ = 175°C 10µs
TJ = 25°C
100µs
1 10
1ms
TC = 25°C
TJ = 175°C 10ms
VGS = 0V Single Pulse
0.1 A 1 A
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1 10 100
-VSD , Source-to-Drain Voltage (V) -VDS , Drain-to-Source Voltage (V)
VGS
D.U.T.
15 RG -
ID , Drain Current (A)
+ VDD
-10V
10 Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
td(on) tr t d(off) tf
VGS
10%
0
25 50 75 100 125 150 175
TC , Case Temperature ( °C)
90%
VDS
Fig 9. Maximum Drain Current Vs.
Case Temperature
Fig 10b. Switching Time Waveforms
10
Thermal Response (Z thJC )
D = 0.50
1
0.20
0.10
0.05 PDM
0.1 0.02 SINGLE PULSE
0.01 (THERMAL RESPONSE) t1
t2
Notes:
1. Duty factor D = t 1 / t 2
2. Peak T J = P DM x Z thJC + TC
0.01
0.00001 0.0001 0.001 0.01 0.1
t1 , Rectangular Pulse Duration (sec)
L 500
VDS ID
200
15V
100
Fig 12a. Unclamped Inductive Test Circuit
0 A
25 50 75 100 125 150 175
I AS Starting TJ , Junction Temperature (°C)
tp
V(BR)DSS
50KΩ
QG 12V .2µF
.3µF
-10V -
QGS QGD D.U.T. +VDS
VGS
VG
-3mA
IG ID
Charge Current Sampling Resistors
Fig 13a. Basic Gate Charge Waveform Fig 13b. Gate Charge Test Circuit
IRF9Z34NPbF
Peak Diode Recovery dv/dt Test Circuit
+
- +
-
RG • dv/dt controlled by RG +
• ISD controlled by Duty Factor "D" V DD
-
• D.U.T. - Device Under Test
VGS
[VGS=10V ] ***
Reverse
Recovery Body Diode Forward
Current Current
di/dt
D.U.T. VDS Waveform
Diode Recovery
dv/dt
[VDD]
Re-Applied
Voltage Body Diode Forward Drop
Inductor Curent
[ISD ]
Ripple ≤ 5%
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IRF9Z34NPBF