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Process Capability PDF
Process Capability PDF
Process Capability PDF
Sources of Variation
• within unit (positional variation)
• between units (unit-unit variation)
• between lots (lot-lot variation)
• between lines (line-line variation)
• across time (time-time variation)
• measurement error (repeatability & reproducibility)
a) percentage (%)
b) parts per million (ppm)
c) parts per billion (ppb)
Representative
Curve
15 20 25 30
X Dimension
a) b)
c)
• Process Potential
– Cp
• Process Performance
– Cpu
– Cpl
– Cpk
Engineering Tolerance
Cp =
Natural Tolerance
USL − LSL
=
6σ
LSL USL
Cp Reject Rate
1.00 0.270 %
1.33 0.007 %
1.50 6.8 ppm
2.00 2.0 ppb
a) b)
USL − µ
C pu =
3σ
µ − LSL
C pl =
3σ
C pk = Minimum {C pu , C pl }
c)
Cp = 2 a) Process is highly capable (Cpk>1.5)
Cpk < 1
b) Process is capable (Cpk=1 to 1.5)
c) Process is not capable (Cpk<1)
USL − LSL 16 − 4
Cp = = = 0.5
6σ 6(4 )
USL − LSL 16 − 4
Cp = = = 1.0
6σ 6(2 )
USL − LSL 16 − 4
Cp = = = 1.0
6σ 6(2 )
USL − LSL 16 − 4
Cp = = = 2.0
6σ 6(1)
Experimental Design
Experimental Design • to center mean
• to reduce variation • to reduce variation
a)
Cp = 2 b)
Cpk = 2 Cp = 2
Cpk = 1
c)
Cp = 2
Cpk < 1
Cp – Cpk ≡ Missed Opportunity
Stable Process
Time
Unstable
Time
Process
UCL
CL
LCL
Foc
u s of
Si x
Sig
ma
UCL
CL
LCL
No Yes
Cpk Short term
Supplier A
Supplier A Supplier B
Cp = 1.11
Supplier B
Cp = 0.62
Same Cp value
Distribution B Distribution A
Out of
specification
Remark:
Same SD but different Central
Tendency affects Cpk seriously
but remains same for Cp.