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MCP3008 PDF
MCP3008 PDF
CH2 3 12 AGND
CH3 4 11 CLK
Functional Block Diagram NC 5 10 DOUT
NC 6 9 DIN
VDD VSS DGND 7 8 CS/SHDN
VREF
CH2 3 14 AGND
Comparator
CH3 4 13 CLK
Sample 10-Bit SAR CH4 5 12 DOUT
and CH5 6 11 DIN
Hold CH6 7 10 CS/SHDN
Shift CH7 8 9 DGND
Control Logic
Register
ELECTRICAL SPECIFICATIONS
Electrical Characteristics: Unless otherwise noted, all parameters apply at VDD = 5V, VREF = 5V,
TA = -40°C to +85°C, fSAMPLE = 200 ksps and fCLK = 18*fSAMPLE. Unless otherwise noted, typical values apply for
VDD = 5V, TA = +25°C.
Parameter Sym Min Typ Max Units Conditions
Conversion Rate
Conversion Time tCONV — — 10 clock
cycles
Analog Input Sample Time tSAMPLE 1.5 clock
cycles
Throughput Rate fSAMPLE — — 200 ksps VDD = VREF = 5V
75 ksps VDD = VREF = 2.7V
DC Accuracy
Resolution 10 bits
Integral Nonlinearity INL — ±0.5 ±1 LSB
Differential Nonlinearity DNL — ±0.25 ±1 LSB No missing codes over
temperature
Offset Error — — ±1.5 LSB
Gain Error — — ±1.0 LSB
Dynamic Performance
Total Harmonic Distortion — -76 dB VIN = 0.1V to 4.9V@1 kHz
Signal-to-Noise and Distortion — 61 dB VIN = 0.1V to 4.9V@1 kHz
(SINAD)
Spurious Free Dynamic Range — 78 dB VIN = 0.1V to 4.9V@1 kHz
Reference Input
Voltage Range 0.25 — VDD V Note 2
Current Drain — 100 150 µA
0.001 3 µA CS = VDD = 5V
Analog Inputs
Input Voltage Range for CH0 or VSS — VREF V
CH1 in Single-Ended Mode
Input Voltage Range for IN+ in IN- — VREF+IN-
pseudo-differential mode
Input Voltage Range for IN- in VSS-100 — VSS+100 mV
pseudo-differential mode
Note 1: This parameter is established by characterization and not 100% tested.
2: See graphs that relate linearity performance to VREF levels.
3: Because the sample cap will eventually lose charge, effective clock rates below 10 kHz can affect linearity
performance, especially at elevated temperatures. See Section 6.2 “Maintaining Minimum Clock
Speed”, “Maintaining Minimum Clock Speed”, for more information.
TEMPERATURE CHARACTERISTICS
Electrical Specifications: Unless otherwise indicated, VDD = +2.7V to +5.5V, VSS = GND.
Parameters Sym Min Typ Max Units Conditions
Temperature Ranges
Specified Temperature Range TA -40 — +85 °C
Operating Temperature Range TA -40 — +85 °C
Storage Temperature Range TA -65 — +150 °C
Thermal Package Resistances
Thermal Resistance, 14L-PDIP θJA — 70 — °C/W
Thermal Resistance, 14L-SOIC θJA — 108 — °C/W
Thermal Resistance, 14L-TSSOP θJA — 100 — °C/W
Thermal Resistance, 16L-PDIP θJA — 70 — °C/W
Thermal Resistance, 16L-SOIC θJA — 90 — °C/W
TCSH
CS
TSUCS
THI TLO
CLK
TSU THD
DIN MSB IN
TDO TR TF TDIS
TEN
DOUT NULL BIT MSB OUT LSB
tF CS
tR
1 2 3 4
CLK
Voltage Waveforms for tDO
DOUT B9
CLK tEN
tDO
Voltage Waveforms for tDIS
DOUT
VIH
CS
FIGURE 1-2: Load Circuit for tR, tF, tDO. DOUT 90%
Waveform 1*
TDIS
DOUT 10%
Waveform 2†
* Waveform 1 is for an output with internal
conditions such that the output is high,
unless disabled by the output control.
† Waveform 2 is for an output with internal
conditions such that the output is low,
unless disabled by the output control.
1.0
1.0
0.8 VDD = VREF = 2.7 V
0.8
0.6 0.6
0.4 0.4
Positive INL
INL (LSB)
INL (LSB)
0.2 0.2 Positive INL
0.0 0.0
-0.2 Negative INL -0.2 Negative INL
-0.4 -0.4
-0.6 -0.6
-0.8 -0.8
-1.0 -1.0
0 25 50 75 100 125 150 175 200 225 250 0 25 50 75 100
FIGURE 2-1: Integral Nonlinearity (INL) FIGURE 2-4: Integral Nonlinearity (INL)
vs. Sample Rate. vs. Sample Rate (VDD = 2.7V).
1.0
1.0 VDD = VREF = 2.7 V
0.8
0.8 fSAMPLE = 75 ksps
0.6
0.6
0.4 Positive INL
0.4
INL(LSB)
Positive INL
INL(LSB)
0.2
0.2
0.0
0.0
-0.2 -0.2
Negative INL
-0.4 -0.4
Negative INL
-0.6 -0.6
-0.8 -0.8
-1.0 -1.0
0 1 2 3 4 5 6 0.0 0.5 1.0 1.5 2.0 2.5 3.0
FIGURE 2-2: Integral Nonlinearity (INL) FIGURE 2-5: Integral Nonlinearity (INL)
vs. VREF. vs. VREF (VDD = 2.7V).
0.5 0.5
VDD = VREF = 5 V VDD = VREF = 2.7 V
0.4 0.4
fSAMPLE = 200 ksps fSAMPLE = 75 ksps
0.3 0.3
0.2 0.2
INL (LSB)
INL (LSB)
0.1 0.1
0.0 0.0
-0.1 -0.1
-0.2 -0.2
-0.3 -0.3
-0.4 -0.4
-0.5 -0.5
0 128 256 384 512 640 768 896 1024 0 128 256 384 512 640 768 896 1024
FIGURE 2-3: Integral Nonlinearity (INL) FIGURE 2-6: Integral Nonlinearity (INL)
vs. Code (Representative Part). vs. Code (Representative Part, VDD = 2.7V).
0.6 0.6
VDD = VREF = 2.7 V
0.4 fSAMPLE = 75 ksps
0.4
Positive INL Positive INL
0.2
0.2
INL (LSB)
INL (LSB)
0.0
0.0
Negative INL
-0.2
-0.2
Negative INL
-0.4
-0.4
-0.6
-0.6
-50 -25 0 25 50 75 100
-50 -25 0 25 50 75 100
Temperature (°C) Temperature (°C)
FIGURE 2-7: Integral Nonlinearity (INL) FIGURE 2-10: Integral Nonlinearity (INL)
vs. Temperature. vs. Temperature (VDD = 2.7V).
0.6
0.6
VDD = VREF = 2.7 V
0.4 0.4
0.2
DNL (LSB)
0.2
DNL (LSB)
Positive DNL Positive DNL
0.0 0.0
-0.4 -0.4
-0.6 -0.6
0 25 50 75 100 125 150 175 200 225 250 0 25 50 75 100
1.0 0.8
VDD = VREF = 2.7 V
0.8 0.6
fSAMPLE = 75 ksps
0.6 0.4
Positive DNL Positive DNL
0.4
DNL (LSB)
0.2
DNL (LSB)
0.2
0.0
0.0
-0.2 -0.2 Negative DNL
Negative DNL
-0.4 -0.4
-0.6 -0.6
-0.8 -0.8
-1.0
-1.0
0 1 2 3 4 5
0.0 0.5 1.0 1.5 2.0 2.5 3.0
VREF (V) VREF(V)
1.0 1.0
VDD = VREF = 5 V VDD = VREF = 2.7 V
0.8 0.8
fSAMPLE = 200 ksps fSAMPLE = 75 ksps
0.6 0.6
0.4 0.4
DNL (LSB)
DNL (LSB)
0.2 0.2
0.0 0.0
-0.2 -0.2
-0.4 -0.4
-0.6 -0.6
-0.8 -0.8
-1.0 -1.0
0 128 256 384 512 640 768 896 1024 0 128 256 384 512 640 768 896 1024
Digital Code Digital Code
0.6 0.6
VDD = VREF = 2.7 V
fSAMPLE = 75 ksps
0.4 0.4
Positive DNL
0.2
DNL (LSB)
0.2 Positive DNL
DNL (LSB)
0.0 0.0
Negative DNL
-0.2 -0.2
Negative DNL
-0.4 -0.4
-0.6 -0.6
-50 -25 0 25 50 75 100 -50 -25 0 25 50 75 100
2.0 8
1.5 7
VDD = 2.7 V
Gain Error (LSB)
FIGURE 2-15: Gain Error vs. VREF. FIGURE 2-18: Offset Error vs. VREF.
0.0 1.2
-0.2 0.8
-0.4 0.4
VDD = VREF = 5 V
fSAMPLE = 200 ksps
-0.5 0.2
-0.6 0.0
-50 -25 0 25 50 75 100 -50 -25 0 25 50 75 100
Temperature (°C) Temperature (°C)
FIGURE 2-19: Gain Error vs. Temperature. FIGURE 2-22: Offset Error vs.
Temperature.
80 80
VDD = VREF = 5 V VDD = VREF = 5 V
70 70 fSAMPLE = 200 ksps
fSAMPLE = 200 ksps
60 60
SINAD (dB)
SNR (dB)
50 50
40 40 VDD = VREF = 2.7 V
VDD = VREF = 2.7 V fSAMPLE = 75 ksps
30 fSAMPLE = 75 ksps 30
20 20
10 10
0 0
1 10 100 1 10 100
Input Frequency (kHz) Input Frequency (kHz)
0 70
-10
60
-20
-30 50 VDD = VREF = 5 V
SINAD (dB)
10.00 10.0
9.8 VDD = VREF = 5V
9.6 fSAMPLE = 200 ksps
9.75
9.4
ENOB (rms)
ENOB (rms)
FIGURE 2-25: Effective Number of Bits FIGURE 2-28: Effective Number of Bits
(ENOB) vs. VREF. (ENOB) vs. Input Frequency.
100 0
60 -30
50 VDD = VREF = 2.7 V
fSAMPLE = 75 ksps -40
40
30 -50
20
-60
10
-70
0
1 10 100 1000 10000
1 10 100
Input Frequency (kHz) Ripple Frequency (kHz)
FIGURE 2-26: Spurious Free Dynamic FIGURE 2-29: Power Supply Rejection
Range (SFDR) vs. Input Frequency. (PSR) vs. Ripple Frequency.
0 0
-10 VDD = VREF = 5 V VDD = VREF = 2.7 V
-10
-20 FSAMPLE = 200 ksps fSAMPLE = 75 ksps
-20
FINPUT = 10.0097 kHz fINPUT = 1.00708 kHz
-30 -30
4096 points 4096 points
Amplitude (dB)
Amplitude (dB)
-40 -40
-50 -50
-60 -60
-70 -70
-80 -80
-90 -90
-100 -100
-110 -110
-120 -120
-130 -130
0 20000 40000 60000 80000 100000 0 5000 10000 15000 20000 25000 30000 35000
Frequency (Hz) Frequency (Hz)
550 550
500 500
450 450
400 400
350 350
IDD (µA)
IDD (µA)
300 300
250 250
200 200
150 VREF = VDD 150 VREF = VDD
100 All points at fCLK = 3.6 MHz except 100 All points at fCLK = 3.6 MHz except
at VREF = VDD = 2.5 V, fCLK = 1.35 MHz 50 at VREF = VDD = 2.5 V, fCLK = 1.35 MHz
50
0 0
2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0
FIGURE 2-31: IDD vs. VDD. FIGURE 2-34: IREF vs. VDD.
500 120
450 110
100
400
90 VDD = VREF = 5 V
350 80
IREF (µA)
IDD (µA)
FIGURE 2-32: IDD vs. Clock Frequency. FIGURE 2-35: IREF vs. Clock Frequency.
550
500 VDD = VREF = 5 V 140
450 fCLK = 3.6 MHz VDD = VREF = 5 V
120 fCLK = 3.6 MHz
400
350 100
IDD (µA)
IREF (µA)
300
80
250
200 60
150 40 VDD = VREF = 2.7 V
VDD = VREF = 2.7 V
100 fCLK = 1.35 MHz
fCLK = 1.35 MHz 20
50
0 0
-50 -25 0 25 50 75 100 -50 -25 0 25 50 75 100
Temperature (°C) Temperature (°C)
FIGURE 2-33: IDD vs. Temperature. FIGURE 2-36: IREF vs. Temperature.
70 2.0
VREF = CS = VDD VDD = VREF = 5 V
40 1.2
1.0
30
0.8
20 0.6
0.4
10
0.2
0 0.0
2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0 -50 -25 0 25 50 75 100
VDD (V) Temperature (°C)
FIGURE 2-37: IDDS vs. VDD. FIGURE 2-39: Analog Input Leakage
Current vs. Temperature.
100.00
VDD = VREF = CS = 5 V
10.00
IDDS (nA)
1.00
0.10
0.01
-50 -25 0 25 50 75 100
Temperature (°C)
VDD
Sampling
Switch
VT = 0.6V
RSS CHx SS RS = 1 kΩ
CSAMPLE
VA CPIN ILEAKAGE = DAC capacitance
VT = 0.6V
7 pF ±1 nA = 20 pF
VSS
Legend
VA = Signal Source ILEAKAGE = Leakage Current At The Pin
Due To Various Junctions
RSS = Source Impedance SS = sampling switch
CHx = Input Channel Pad RS = sampling switch resistor
CPIN = Input Pin Capacitance CSAMPLE = sample/hold capacitance
VT = Threshold Voltage
4
VDD = VREF = 5 V
Clock Frequency (Mhz)
0
100 1000 10000
tCYC tCYC
tCSH
CS
tSUCS
CLK
tCONV
tSAMPLE tDATA **
* After completing the data transfer, if further clocks are applied with CS low, the A/D converter will output LSB
first data, then followed with zeros indefinitely. See Figure 5-2 below.
** tDATA: during this time, the bias current and the comparator powers down while the reference input becomes
a high-impedance node.
tCYC
CS tCSH
tSUCS
Power Down
CLK
Start
DIN D2 D1 D0 Don’t Care
SGL/
DIFF
HI-Z Null HI-Z
B9 B8 B7 B6 B5 B4 B3 B2 B1 B0 B1 B2 B3 B4 B5 B6 B7 B8 B9*
DOUT Bit
(MSB)
tCONV tDATA **
tSAMPLE
* After completing the data transfer, if further clocks are applied with CS low, the A/D converter will output zeros
indefinitely.
** tDATA: During this time, the bias circuit and the comparator powers down while the reference input becomes
a high-impedance node, leaving the CLK running to clock out LSB first data or zeroes.
HI-Z NULL
DOUT BIT B9 B8 B7 B6 B5 B4 B3 B2 B1 B0
Start
MCU Transmitted Data Bit
(Aligned with falling 0 0 0 0 0 0 0 1 SGL/ X X X X X X X X
edge of clock) DIFF D2 D1 DO X X X X
MCU Received Data
(Aligned with rising ? ? ? ? ? ? ? ? ? ? ? ? 0 B9 B8
? (Null) B7 B6 B5 B4 B3 B2 B1 B0
edge of clock)
Data stored into MCU receive Data stored into MCU receive Data stored into MCU receive
register after transmission of first register after transmission of register after transmission of last
X = “Don’t Care” Bits 8 bits second 8 bits 8 bits
FIGURE 6-1: SPI Communication with the MCP3004/3008 using 8-bit segments
(Mode 0,0: SCLK idles low).
SCLK 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
Data is clocked out of A/D
converter on falling edges
SGL/ D2 D1 DO Don’t Care
DIN Start DIFF
NULL
HI-Z BIT B9 B8 B7 B6 B5 B4 B3 B2 B1 B0
DOUT
Start
MCU Transmitted Data Bit
(Aligned with falling SGL/
edge of clock) 0 0 0 0 0 0 0 1 DIFF D2 D1 DO X X X X X X X X X X X X
Data stored into MCU receive Data stored into MCU receive Data stored into MCU receive
register after transmission of first register after transmission of register after transmission of last
X = “Don’t Care” Bits 8 bits second 8 bits 8 bits
FIGURE 6-2: SPI Communication with the MCP3004/3008 using 8-bit segments (Mode 1,1: SCLK idles high).
6.2 Maintaining Minimum Clock Speed Low-pass (anti-aliasing) filters can be designed using
Microchip’s free interactive FilterLab® software.
When the MCP3004/3008 initiates the sample period, FilterLab will calculate capacitor and resistors values,
charge is stored on the sample capacitor. When the as well as determine the number of poles that are
sample period is complete, the device converts one bit required for the application. For more information on fil-
for each clock that is received. It is important for the tering signals, see AN699, “Anti-Aliasing Analog Filters
user to note that a slow clock rate will allow charge to for Data Acquisition Systems”.
bleed off the sample capacitor while the conversion is
taking place. At 85°C (worst case condition), the part
will maintain proper charge on the sample capacitor for VDD
at least 1.2 ms after the sample period has ended. This 10 µF
means that the time between the end of the sample 4.096V
Reference
period and the time that all 10 data bits have been
clocked out must not exceed 1.2 ms (effective clock 0.1 µF 1 µF
MCP1541
frequency of 10 kHz). Failure to meet this criterion may
introduce linearity errors into the conversion outside 1 µF
the rated specifications. It should be noted that during IN+ V
C1 MCP601 REF
the entire conversion cycle, the A/D converter does not R1
require a constant clock speed or duty cycle, as long as VIN + MCP3004
all timing specifications are met. R2 -
IN-
C2
6.3 Buffering/Filtering the Analog R
R3 4
Inputs
If the signal source for the A/D converter is not a low-
impedance source, it will have to be buffered or FIGURE 6-3: The MCP601 Operational
inaccurate conversion results may occur (see Figure 4- Amplifier is used to implement a second order
2). It is also recommended that a filter be used to anti-aliasing filter for the signal being converted
eliminate any signals that may be aliased back in to the
by the MCP3004.
conversion results, as is illustrated in Figure 6-3, where
an op amp is used to drive, filter and gain the analog
input of the MCP3004/3008. This amplifier provides a
low-impedance source for the converter input, plus a
low-pass filter, which eliminates unwanted high-
frequency noise.
VDD
DGND AGND
Connection
0.1 µF
Device 2
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• Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the
intended manner and under normal conditions.
• There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our
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01/02/08