Professional Documents
Culture Documents
LE: How much worse a given gate is at producing output current compared to the inverter.
LE is the Cinof a gate input divided by Cinof the inverter.
p –Intrinsic delay
1 •Predominantly caused by the internal capacitance associated with its transistors.
2 •Increasing size of transistor, increases their ability to overcome their own increased internal capacitance.
3 •‘p’value stays constant irrespective of the size of the gate.
What happens to the delay and the gain of the cell if the load capacitance doubles?
New delay 2D and gain = 2Cout/Cin
1 Fix the delays, estimate the load and resize the cell.
2 Timing + Parasitics= Size
3 Synthesis tool uses a Supercell(Shown with a spring).
4 During Placement the cell sizes are adjusted depending on the value of ‘d’
5
To achieve the same drive strength as the inverter, the 2-input NAND must have an input capacitance of four units (as seen by
each input), and thus its logical effort is taken to be 4/3. The 2-input NOR has an input capacitance of five units (as seen by each
input) and thus its logical effort is taken to be 5/3.
Let us now design a 2-input NAND gate so that it has the same drive characteristics
as an inverter with a pulldown of width 1 and a pullup of width 2.
. The capacitance of the transistor’s gate is proportional to W and its ability to produce output current,
or conductance, is also proportional to . Under this assumption, an inverter will have a pulldown transistor of width W and a
pullup transistor of width 2W_
so the total input capacitance can be said to be 3W By contrast, each of the two pullup transistors in parallel need be only as
large as the inverter pullup transistor to achieve the same drive as the reference inverter. Here we assume that if either input to
the NAND gate is LOW, the output must be pulled HIGH, and so the output drive of the NAND gate must match that of the
inverter even if only one of the two pullups is conducting.
We find the logical effort of the NAND gate in Figure 4.1b by extracting capacitances from the circuit schematic. The input
capacitance of one input signal is the sum of the width of the pulldown transistor and the pullup transistor, or
_ Let us now design a 2-input NAND gate so that it has the same drive characteristics as an inverter with a pulldown of width
1 and a pullup of width 2. Because the two pulldown transistors of the NAND gate are in series, each must have twice the
conductance of the inverter pulldown transistor so that the series connection has a conductance equal to that of the inverter
pulldown transistor. Therefore, these transistors are twice as wide as the inverter pulldown transistor or 2 + 2 = 4. The input
capacitance of the inverter with identical output drive is 2+ 1 = 3 . We designed the NOR gate in Figure 4.1c in a similar way.
To obtain the same pulldown drive as the inverter, pulldown transistors one unit wide suffice. To obtain the same pullup drive,
transistors four units wide are required, since two of them in series must be equivalent to one transistor two units wide in the
inverter. Summing the input capacitance on one input, we find that the NOR gate has logical effort, g=5/3 This is larger than
the logical effort of the NAND gate because pullup transistors are less effective at generating output current than pulldown
transistors.
1 d = (LE x G) + p
2 –LE –Logical effort
3 –G –Gain
4 –p –intrinsic delay
5 •All parameters in calculation of ‘d’is normalized to a base logical function.
6 •The base function is a inverter driving another identical inverter with no parasitics.
Making delay independent of load