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MPC Control
MPC Control#:#: E-7830013-T
7830013 Serial
SerialNumber:
Number: E-7830013-T
7830013
AssetID:
Asset ID: NONE
NONE Calibration
CalibrationDate:
Date: October
October11,11,
2019
2019
Thermocouple Calibration
Type K
TEMP ( ⁰F )
Fluke Thermocouple
reference Expected mV Lower Upper Uncertainty
Testpoint As found Value Voltage to Temperature Result
junctions at 32 OUTPUT Limit Limit (±)
Conversion
°F
1 50 ⁰F 0.3970 mV 0.39690 mV 50.0018 °F 49.70 °F 50.30 °F PASS 0.030 °F
2 100 ⁰F 1.5210 mV 1.52130 mV 100.0238 °F 99.70 °F 100.30 °F PASS 0.030 °F
3 200 ⁰F 3.8200 mV 3.82149 mV 200.0588 °F 199.70 °F 200.30 °F PASS 0.030 °F
4 500 ⁰F 10.5610 mV 10.56248 mV 500.0522 °F 499.70 °F 500.30 °F PASS 0.030 °F
5 800 ⁰F 17.5260 mV 17.52915 mV 800.1536 °F 799.70 °F 800.30 °F PASS 0.030 °F
6 1000 ⁰F 22.2550 mV 22.25612 mV 1000.0364 °F 999.70 °F 1000.30 °F PASS 0.030 °F
7 1200 ⁰F 26.9780 mV 26.97854 mV 1200.0272 °F 1199.70 °F 1200.30 °F PASS 0.030 °F
8 1375 ⁰F 31.0520 mV 31.05273 mV 1375.0268 °F 1374.70 °F 1375.30 °F PASS 0.030 °F
9 1650 ⁰F 37.2810 mV 37.28137 mV 1649.9966 °F 1649.70 °F 1650.30 °F PASS 0.030 °F
10 1950 ⁰F 43.8080 mV 43.80832 mV 1950.0242 °F 1949.70 °F 1950.30 °F PASS 0.030 °F
11 2150 ⁰F 47.9830 mV 47.98387 mV 2150.0564 °F 2149.70 °F 2150.30 °F PASS 0.030 °F
Type N
TEMP ( ⁰F )
Fluke Thermocouple
reference Expected mV Lower Upper Uncertainty
Testpoint As found Value Voltage to Temperature Result
junctions at 32 OUTPUT Limit Limit (±)
Conversion
°F
1 50 ⁰F 0.2610 mV 0.26119 mV 50.0198 °F 49.70 ⁰F 50.30 ⁰F PASS 0.046 ⁰F
2 100 ⁰F 1.0040 mV 1.00262 mV 99.9176 °F 99.70 ⁰F 100.30 ⁰F PASS 0.046 ⁰F
3 200 ⁰F 2.5770 mV 2.57842 mV 200.0660 °F 199.70 ⁰F 200.30 ⁰F PASS 0.046 ⁰F
4 500 ⁰F 7.9410 mV 7.94202 mV 500.0378 °F 499.70 ⁰F 500.30 ⁰F PASS 0.046 ⁰F
5 800 ⁰F 13.9690 mV 13.96948 mV 800.0456 °F 799.70 ⁰F 800.30 ⁰F PASS 0.046 ⁰F
6 1000 ⁰F 18.2000 mV 18.20023 mV 1000.0184 °F 999.70 ⁰F 1000.30 ⁰F PASS 0.046 ⁰F
7 1200 ⁰F 22.5230 mV 22.52314 mV 1200.0200 °F 1199.70 ⁰F 1200.30 ⁰F PASS 0.046 ⁰F
8 1375 ⁰F 26.3380 mV 26.33861 mV 1375.0394 °F 1374.70 ⁰F 1375.30 ⁰F PASS 0.046 ⁰F
9 1650 ⁰F 32.3280 mV 32.32845 mV 1650.0272 °F 1649.70 ⁰F 1650.30 ⁰F PASS 0.046 ⁰F
10 1950 ⁰F 38.7740 mV 38.77404 mV 1949.9900 °F 1949.70 ⁰F 1950.30 ⁰F PASS 0.046 ⁰F
11 2150 ⁰F 42.9760 mV 42.97842 mV 2150.1032 °F 2149.70 ⁰F 2150.30 ⁰F PASS 0.046 ⁰F
Type J
TEMP ( ⁰F )
Fluke Thermocouple
reference Expected mV Lower Upper Uncertainty
Testpoint As found Value Voltage to Temperature Result
junctions at 32 OUTPUT Limit Limit (±)
Conversion
°F
1 50.00 ⁰F 0.5072 mV 0.50801 mV 50.0432 °F 49.70 ⁰F 50.30 ⁰F PASS 0.046 ⁰F
2 100.00 ⁰F 1.9433 mV 1.94385 mV 100.0490 °F 99.70 ⁰F 100.30 ⁰F PASS 0.046 ⁰F
3 200.00 ⁰F 4.9067 mV 4.90827 mV 200.0408 °F 199.70 ⁰F 200.30 ⁰F PASS 0.046 ⁰F
4 500.00 ⁰F 14.1107 mV 14.11150 mV 500.0414 °F 499.70 ⁰F 500.30 ⁰F PASS 0.046 ⁰F
5 800.00 ⁰F 23.3207 mV 23.32157 mV 800.0618 °F 799.70 ⁰F 800.30 ⁰F PASS 0.046 ⁰F
6 1000.00 ⁰F 29.5119 mV 29.52097 mV 1000.0004 °F 999.70 ⁰F 1000.30 ⁰F PASS 0.046 ⁰F
7 1200.00 ⁰F 36.0046 mV 36.00560 mV 1200.0542 °F 1199.70 ⁰F 1200.30 ⁰F PASS 0.046 ⁰F
8 1375.00 ⁰F 42.0314 mV 42.03189 mV 1374.9692 °F 1374.70 ⁰F 1375.30 ⁰F PASS 0.046 ⁰F
9 1650.00 ⁰F 51.8081 mV 51.80845 mV 1650.0164 °F 1649.70 ⁰F 1650.30 ⁰F PASS 0.046 ⁰F
10 1950.00 ⁰F 61.7957 mV 61.79267 mV 1949.9054 °F 1949.70 ⁰F 1950.30 ⁰F PASS 0.046 ⁰F
11 2150.00 ⁰F 68.2137 mV 68.21402 mV 2149.9898 °F 2149.70 ⁰F 2150.30 ⁰F PASS 0.046 ⁰F
Type R
TEMP ( ⁰F )
Fluke Thermocouple
reference Expected mV Lower Upper Uncertainty
Testpoint As found Value Voltage to Temperature Result
junctions at 32 OUTPUT Limit Limit (±)
Conversion
°F
1 50.00 ⁰F 0.0544 mV 0.05515 mV 50.2862 °F 49.70 ⁰F 50.30 ⁰F PASS 0.046 ⁰F
2 100.00 ⁰F 0.2187 mV 0.21905 mV 100.1660 °F 99.70 ⁰F 100.30 ⁰F PASS 0.046 ⁰F
3 200.00 ⁰F 0.5978 mV 0.59825 mV 200.0804 °F 199.70 ⁰F 200.30 ⁰F PASS 0.046 ⁰F
4 500.00 ⁰F 2.0173 mV 2.01810 mV 500.1692 °F 499.70 ⁰F 500.30 ⁰F PASS 0.046 ⁰F
5 800.00 ⁰F 3.6863 mV 3.68692 mV 800.1122 °F 799.70 ⁰F 800.30 ⁰F PASS 0.046 ⁰F
6 1000.00 ⁰F 4.8859 mV 4.88679 mV 1000.1480 °F 999.70 ⁰F 1000.30 ⁰F PASS 0.046 ⁰F
7 1200.00 ⁰F 6.1443 mV 6.14494 mV 1200.1010 °F 1199.70 ⁰F 1200.30 ⁰F PASS 0.046 ⁰F
8 1375.00 ⁰F 7.2933 mV 7.29354 mV 1375.0286 °F 1374.70 ⁰F 1375.30 ⁰F PASS 0.046 ⁰F
9 1650.00 ⁰F 9.1907 mV 9.19139 mV 1650.1028 °F 1649.70 ⁰F 1650.30 ⁰F PASS 0.046 ⁰F
10 1950.00 ⁰F 11.3823 mV 11.38294 mV 1950.0836 °F 1949.70 ⁰F 1950.30 ⁰F PASS 0.046 ⁰F
11 2150.00 ⁰F 12.9039 mV 12.90454 mV 2150.0834 °F 2149.70 ⁰F 2150.30 ⁰F PASS 0.046 ⁰F
The expanded uncertainty of measurement is stated as the standard uncertainty of measurement multiplied by the coverage factor k=2, which for a normal distribution corresponds
to a coverage probability of approximately 95% , unless otherwise stated.
Statements
This of Pass
calibration report orwith
complies FailISO/IEC
Conformance
17025:2017 and ANSI/NCSL Z540.3 Method 6-Guard Bands based on Test Uncertainty Ratio.
The uncertainty of measurement has been taken into account when determining compliance with specification, as per ILAC-G8:03/2009.
All measurements and test results guard banded to ensure the probability- End of Calibration
of false-accept Report
does not exceed 2% in- compliance with ANSI/NCSL Z540.3-2006.
The status of compliance with the acceptance criteria is reported as:
PASS - Compliant with specification
FAIL - Not compliant with specification.
Z
FAIL - The measured value is not within the acceptance limits. However, a portion of the expanded uncertainty of measurement at 95% is within the specified tolerance.
Z
PASS - The measured value is within acceptance limits.limits
Acceptance However,
for ≤a2portion of the expanded
% probability uncertainty
of false accept (PFA)ofguard
measurement
band at 95% exceeds the specified tolerance.
The expanded uncertainty of measurement is stated as the standard uncertainty of measurement multiplied by the coverage factor k=2, which for a normal distribution corresponds
to a coverage probability of approximately 95% , unless otherwise stated.
This calibration report complies with ISO/IEC 17025:2017 and ANSI/NCSL Z540.3 Method 6-Guard Bands based on Test Uncertainty Ratio.