SCANNING ELECTRON

MICROSCOPE

Sub To: Mr. Tapeshwar Bhardwaj

Sub By: Sarita
Roll no: 1311
M.Sc. FORENSIC SCIENCE
 INTRODUCTION
• A scanning electron microscope is type of
electron microscope that produces image of a
sample by scanning the surface with a focused
beam of electrons.
• The electrons interact with atoms in the
sample, producing various signals that contain
information about the surface topography and
composition of the sample.
 Conti…..
• The electron beam is scanned in a raster scan
pattern, and the position of the beam is
combined with the intensity of the detected
signal to produce an image.
• The secondary electrons emitted by atoms
excited by the electron beam are detected
using an Everhart-Thornley detector.
• SEM can achieve resolution better than 1 nm.
A LOOK OF AN SEM……….
 HISTORY
• An account of the early history of SEM has been
presented by McMullan.
• Max Knoll produced a photo with a 50mm object
field width showing channeling contrast by the
use of an electron beam scanner.
• It was Manfred von Ardenne who in 1937
invented a true microscope with high
magnification by scanning a very small raster with
a demagnified and finely focused electron beam.
It was commercially used in 1965.
 Principle
Basically SEM depends upon the various kinds
of electronic signals. Such as:
1. Secondary electrons(SE)
2. Reflected or Back scattered electrons (BSE)
3. X-Rays
4. light(cathodoluminescence)
5.Absorbed current (specimen current)
 CHARACTERSTICS THAT CAN BE
VIEWED…
Topography:
The surface features of an object or “how it looks”, its
texture, direct relation b/w these features and materials
properties.
Morphology:
The shape and size of the particles making up the object
;direct relation b/w these structures and materials
properties .
Composition:
The elements and the compounds that the object is
compared of and relative amounts of them ;direct
relation b/w composition and materials properties.
 Conti…
Crystallographic information:
How the atoms are arranged in the object.
 COMPARISION B/W OM & EM
• OPTICAL MICROSCOPE • ELECTRON MICROSCOPE
1. the source of light. 1. The light source is
replaced by a fast
2. The specimen. moving electrons beam.
3. The lenses that makes 2. The specimen is
the makes the specimen specially prepared.
seem bigger.
3. The lenses are replaced
4. The magnified image of by a electromagnetic
the specimen that we coils.
see.
4. The image is formed as a
photograph on a TV
screen.
 SEM Sample Preparation
• Cleaning the surface of specimen:
The specimen should be free from the dust, silt,
detritus and other kind contamination before the
examination.
• Stabilizing the specimen:
Stabilizing is typically done with fixatives. Fixation
can be achieved, for e.g., by perfusion,
microinjection, immersion and by using vapours like
osmium tetraoxide, aldehydes, tannic acid etc.
 Conti..
• Rinsing the specimen:
Use to remove the excess of fixative.
• Dehydrating the specimen:
It is perforated with acetone or ethanol
• Drying the specimen:
In SEM it is necessary to dry the samples at its
critical point drying(CPD) otherwise in vacuum
chamber the sample can be destroyed.
 Conti..
• Mounting the specimen:
After dried using an appropriate protocol, specimen
must be mounted on a holder that can be inserted
into the SEM. Typically samples are mounted on a
metallic stub(aluminum) using a double sticky tape.
• Coating the specimen:
It is use to increase the conductivity of specimen in
SEM to prevent the high voltage charges on the
specimen by conducting the to ground. E.g. gold, Pt.
Prepared specimen..
HOW A SCANNING ELECTRON
MICROSCOPE WORK??
SCANNING ELECTRON MICROSCOPE
 SCANNING ELECTRON MICROSCOPE
1) The virtual source at the top represents the
electron gun, producing a stream of
monochromatic electrons.
2) The stream is condensed by the first
condenser lens (usually controlled by the
coarse probe current knob). This lens is used
to both form the beam and light the amount
of current in the beam . Its works in
conjunction with the condenser aperture to
eliminate the high angle electrons from the
beam.
SCANNING ELECTRON MICROSCOPE
SCANNING ELECTRON MICROSCOPE
 SCANNING ELECTRON MICROSCOPE
6) A set of coils then scan or sweep the beam in a
grid fashion (like a TV), dwelling on points for a
period of time determined by the scan speed
(usually in microscope range).
7) The final lens, the objective, focuses the scanning
beam onto the other part of the specimen desired.
8) when the beam strikes the sample interactions
occur inside the sample and detected by
instruments.
 SCANNING ELECTRON MICROSCOPE
9) Before the beam to its next dwell point these
instruments count the number of electrons
interactions and display a pixel on CRT.
10) This process is repeated until the grid scan is
finished and then repeated, the entire pattern
can be scanned 30 times/sec.
 SEM APPLICATIONS

• It is used in a number of scientific and industries

especially where the characterization of solid
materials is beneficial.
• To get topographical, morphological and
compositional information.
• SEMs are essential research tool in life science,
gemology, medical and forensic science, metallurgy.
• Also used in semiconductors and microchips
production.
ADVANTAGE USING SEM OVER OM
Magnification depth of field resolution
OM: 4X-1400X 0.5mm -0.2mm
SEM:10X-500kx 30mm 1.5nm
1. The seem has a large depth of field ,which allows a large
amount of the sample to be in focus at one time and
produces an image that is good representation of the 3-D
sample .
2. The combination of higher magnification, larger depth of
field, greater resolution, compositional and crystallographic
information's makes the SEM one of the most heavily used
instrument in academic/ national lab research areas and
industry.
 DISADVANTAGE
• Firstly it is very expensive and large.
• Its handling is very complicated.
• The sample preparation require special
training.
• It is limited to solid, inorganic samples and size
to fit in sample chamber.
• Its carry a small risk of radiation exposure.
• It needs highly precautions during working.
THANK YOU