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Abstract - MOSFETs and IGBTs devices are The aim of the present paper is to illustrate a new
increasingly used in electronic circuits due to both the driver strategy and a circuit topology that allow to obtain
easy driving and the capability to handle high currents an acceptable compromise between switching speed, power
and voltages at high switching frequencies. This paper dissipation and electromagnetic radiation, by suitably
deals with a new driver circuit that allows to optimise shaping the gate current during the switching transients.
the switching speed, to reduce the energy losses during The description of the new driving strategy starts with an
the switching time, and to limit the Electro Magnetic analysis of voltage and current switching waveforms of
Interference (EMI). Firstly an analysis of voltage and gate insulated devices, pointing on those characteristics
current switching waveforms of gate insulated devices is that influence the drain current slope. As a result of such
performed. Hence, how to control voltage and current an analysis a driving strategy that allows to independently
slopes independently it is shown, by using a suitable control voltage and current slopes is developed. A suitable
adaptive driving technique, based on a PLL approach. adaptive driver circuit implementing the new driving
Such a technique has been adopted in order to correctly strategy, based on a PLL approach, is then shown and
generate the gate signals regardless of tlie operiiting practically tested.
conditions. Finally practical tests of tlie proposed
driving circuit obtained using a single switch converter
and IGBT devices are reported.
2. SWITCHING TRANSIENTS
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the inner BJT structure. In fact, as the gate voltage goes
below tlie threshold level, tlie electrons current ceases in
the MOSFET structure while tlie holes current in the BJT I L=2
decays with a tail, strongly dependent on the used
technology.
The above switcliing waveforms are generated using a
constant current generator supplying the gate terminal of
tlie device. This is not a coninion case since IGBTs and
Power MOSFETs are normally driven by voltage pulses.
By considering a step voltage vd applied to the input Fig.2 - Parasitic inductances influencing the switching
terminals the drain current slopes during turn-on and transient.
turn-off may be calculated by mean of the following
equation: Such inductances affect the switching transient,
particularly the driving voltage is dropped by the presence
I/ -v.--I d of L,, in tlie gate source path. Equation (1) must be
consequently rearranged accounting for the parasitic
voltage drop as follows:
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the transconduttance depend on the specific device, while changing the slope of the drain current.
the step voltage v d and stray inductance L,, are fixed by
the circuit.
@
voltage to the gate terminal at turn-on, and a negative
voltage at turn-off. Current
The positive gate voltage pulse applied to the input
terminals must be suitably selected to have low drain-
source on state voltage Vh(onl.
The negative step gate voltage, that would be
unnecessary to obtain the forward blocking state during the
turn-off transient, is however useful to prevent spurious
turn-on caused by dv/dt reported in the input circuit trough
c,d and also to speed-up the switching transients.
It can be observed that the term L,, in equation (4)
acquires a great relevance in comparison with the term 5
482
construction technology, its effects cannot be reduced by
I I I I I I I I I I I I I means of the driving circuit. Turn-off losses of IGBT
I I I I I I I I I I I I
c 4-1- + 4-4-4-I- + 4-4-4 devices can only be reduced during both Miller effect and
l l l l l l l l l l l l
PMOS turn-off phases. Moreover in order to reduce losses,
I I I I I !
it is necessary to decrease the R, value [SI. As a
consequence of the gate resistance value reduction, dVddt
I I I I I I
increases and thus losses decrease. It is also necessaly to
pay attention to not exceed the RBSOA limits, in fact, the
I
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I
I
I
I
I
I
I
I
I I I I I I I I I
latching current and the RBSOA are strongly related with
-I- r -I- r T -1- -I-T i r
- 7-1- ~ -I i r the dVd/dt, i.e. with RgoEvalue [ 9 ] .
-
I I I I I I l l l l l l l l l l l l
l-7
l l l l l l l l l l l l l l l l l l l l I 1
I I
7 -1
I I
I I
483
IGBT structure. Taking care of the absence of the current - a ramp generator triggered by the command signal Vh;
tail and of the latching phenomenon, the previous - a voltage comparator producing the enabling signal for
considerations are valid for Power MOSFET too and the the current generator V,.
proposed circuit acts in the manner just described. The PLL circuit operating at turn-off owns a similar
The above mentioned PLL circuits, shown in Fig. 3, are structure.
used to synchronise the driving current pulses, either at The Miller effect sensing block is based on an RC
turn-on and at turn-off, with the raising of the Miller network, as the time derivative of the gate voltage can be
effect. This is mandatory in order to obtain the best results used to detect the beginning of the Miller zone. The main
and cannot be simply achieved by imposing a fixed delay constraints to face in the design of such RC network are:
between the driving signal and the current generator. In - the capacitance C must be smaller than the input
fact such delay must be continuously changed according capacitance of the device Cissto not affect the dynamic of
with the operating conditions. the gate voltage;
As it is not convenient to directly use the derivative of - the resistance R must be small in order to obtain a high
the gate voltage to enable the current generators, due to bandwidth but big enough to not interfere with the
noises, to the fact that the shape of the gate voltage driving circuit and to produce a sufficiently large signal.
changes with the operating conditions, and to the need to The following expression can be used to calculate the
use expensive very fast devices, a PLL approach has been amplitude of the signal across the resistor of the RC
selected to generate the driving current pulses. network at turn-on, in according to the parameters of the
A scheme of the PLL circuit operating at turn-on is used devices:
shown in Fig. 8, where are evidentiated:
- the Miller effect sensing block, based on a RC network
described in the following;
- a phase comparator detecting the phase shift between the
output of the RC network V,, and the signal enabling
the current generator Vy;
- a low pass-filter producing a variable threshold Vt: In Fig. 9 the gate voltage V, and the RC network
- two time delaying blocks used to conipensate propagation
output V,, used to detect the Miller zones are shown .
delays;
VRC \i*T
Phase
--+
Comparator Low Pass Filter
Current Gencrstor
@ Delay Delay
Compensator
I
vt
r-+- Buffer
Shift
U Ramp Generator
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I I I I I I I I
I l l
I l l / I l l
T - - 7--1---1-
I
l l l l l l l
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Fig. 11 -Signal enabling the current generator Vq and
input of phase comparator Vcpd.
Fig. 9 - Turn-on and turn-off transient of IGBT: V [SV/div], t [200ns/div]
a) Gate voltage;
b) RC network output. The signal enabling the current pulses V, in fact is
t [ 5 ps/div] generated, as shown in Figs 8 and 12, by comparing the
variable threshold Vt with a ramp Vr triggered by the
In order to synchronise the signal enabling the current command signal Vi*,.
generator V, with the raising of the Miller effect at turn-
I I I I I I I I I I I I I I I I I
on, the output of the RC filter V,, amplified and squared, .-4-I- t -e 4- c t 4 4-c 4-I- c + 4-I- t
I I I I I I I I I I I I I I I I I
is used to set a flip-flop FF as shown in Fig. 8. A suitable I I I I I I I I I I I I I I I I I
I I I I I I I
reset signal is used to disable the flip-flop at turn-off to
avoid incorrect operations. I I
The output VRof FF is then phase compared with Vcpd
obtained by delaying the signal enabling the current
generator as shown in Fig. 10 and 11. Such delay must be I I I I I I
I I I I I I I
suitably settled in order to compensate any propagation i -I- t +I -II-I- I t
I I I I
delay. I I I I I I I
The output of the phase comparator is processed by mI I I I I I I
mean of a low-pass filter generating a variable threshold I I I I I I I
V,. Such threshold is used to modify the firing times of the 1-I_ L 11-1- L
I I I I I I I
current pulses at turn-on in order to match the raising of
the Miller effect.
Fig. 12 - Voltage comparator inputs.
V [5V/div], t [2001is/div]
485
double gate current pulse it is possible to significantly ACKNOWLEDGMENTS
reduce the power losses during the P-MOS turn-off phase
and the Miller zone of the IGBT turn-off transient [lo]. This work has been supported by the Italian Ministry of
University and Scientific Research (MURST 40 W).
REFERENCES
A.R. Hefner, "An Investigation of the Drive Circuit
Requirements for the Power Insulated Gate Bipolar
Transistor (IGBT)", IEEE Transactions on Power
Electronics, Vo1.6. no 2. April 1991, pp.208-219.
The development and the experimental evaluation of an A. Gallimo, R. Letor, M. Melito, "Switching with IGBTs:
How to Obtain Better Perfonnances", Conf.Rec.PCIM,
adaptive driving circuit based on a PLL approach for gate Niiniberg, 1991, pp.465-474.
controlled devices have been presented. An esperinieiital
evaluation of the device performances has been carried out L. Marechal, "A new MOSFET device, the COMFET
with both traditional and new driving circuit, aiming to offers low on-resistance, high breakdown voltage and
demonstrate the advantages of the new one. The most current per unit area as high as SCRs.", Conf.Rec.PCIM,
important results obtained can be suniinarized as follows: the Niiniberg, 1983, pp. 15-24.
automatic detection of the Miller effect makes the driving
circuit not dipendent on drived device arid operating P. Mourick, "Optimization of the turn-on and turn-off
conditions. At turn-on arid turn-off the circuit permits to behaviour of IGBT Modules", Conf.Rec.PClM,Niimberg,
1991, pp.460465.
separately control the voltage and current gradients, so
allowing the reduction of both power losses and EMI; i n M. Melito, R. Letor, "Safe Behaviour of IGBTs submitted
addition the turn-off delay time can easily be controlled. In to a dv/dt", Conf.Rec.PCIM,Munich, 1990, pp.25-32.
conclusion, on basis of the obtained results, it has been found
that the new driving circuit allows to get from the devices [IO] A. Galluzzo, M. Melito, G. Belverde, S. Musumeci, A.
better performances, and hence an increase of efficiency arid Raciti, A. Testa, "Switching cliaracteristic improvement
reliability. The increased complexity and related cost suggest of niodeni gate controlled devices" Conf. Rec. EPE 93
to use the proposed circuit in high power applications. Brighton 1993 pp. 374-379.
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