P and C charts

These are control charts for attributes. These charts can be used only if the characteristics of a
product

which is to be controlled is measured by method of attributes.

The products are not measured in numerical value. They are checked just using the GO and NO GO

gauges.

P Chart (Percent of fraction defective chart)

This chart helps to find out the variation in the process based in number of defective pieces found in

the total number of pieces inspected.

This chart shows the number of defectives parts found in the given sample. The numbers of
defective

parts are marked as P. It is called fraction defective or percent defective.

P= Total Number of defective parts

Total parts inspected

For example: If 20 products are found to be defective in a sample of 200, thus = 20⁄200 = 0.1.

a) Control limits for P charts

The control limits are based on 3σ limits and expressed in the following equations.

UCL = P+ P(1-P)

; LCL = P- P(1-P)

Where, P = fraction defective

= number of pieces in the sample

b) Construction of P Chart

Using the values of P, UCL and LCL, the P chart is established a shown in fig 3.2.3 P value of

each sample is calculated and plotted on P-Chart. This is done by taking samples periodically.

While the process is going on, finally it is considered if the P value is with in control limits, and

the process is within control.

C- Chart (Number of defects chart)

C-Chart is also a control chart for attributes just like P-Chart. In this chart, the numbers of defectives

per unit are plotted. This chart can be used while inspecting the following.

1. Number of welding defects in a welded part

2. Number of pin holes in a tin sheet.

The following equation is used to calculate the number of defects per unit.

C= Total Number of defectives collected

Total Number of units inspected

a) Control limits for C-Chart

The control limits are based on 3σ limits and calculated as below:

UCL = C+3 C ; LCL = C-3 C