United States Patent Myer Ga) RF-TEST PROBE (75) Inventor: Robert Evan Myer, Deaville, NJ (US) (73) Assignee: (4). Notice: Subject to any disclaimer, the term of this patent is extended or adjusted under 35 USCC. 1544b) by 0 days Appl. No. Filed: i 091656,933, Sep. 7, 2000 Gor 2726 US. 324/95; 524/158.1; 324/149; 1690 (58) Fleld of Seareh 324/754, 158.1, 324/765, 600, 690, 149, 752, 753, 761, 195, 106, 725, 633, 119; 439/482, 700, (6; 340600; 343,703 60) References Cited USS, PATENT DOCUMENTS. 3798914 A = 2974 Astin 2495 Ro1vea8 A © 11/1075: Beldea fe p98 RURLSTS A * “1/97. Hopfer 324/106 302108 A* 7/1985 Hopfer 32495 Suazo A 711902 Shab el sia7a5 527433 A + 12/1993 Cronk eta 244090 Sr0x928 A * 121997 Galloway a so COAXIAL OUTPUT 'US006753676B1 US 6,753,676 BL (10) Patent No. 5) Date of Patent Jun. 22, 2004 Si748002 A * S195 Scot eta sages SAMOS A 11/1998 Moot et a 2495 S0s2830 A “01900 Theaser eta 3119 FOREIGN PATENT DOCUMENTS ep suas yas Howps08 i DSSL Sot AZ TH93 ‘conRiins? (OTHER PUBLICATIONS Patent Abstracts of Japan, vol. 4, No, 142, Oct 7, 1980, & 4P'55 090861 A (FUITTSU), Jul. 9, 1980 * abstract * European Patent Offce—Search Report, * cited by examiner Primary Examiner—Evan Pert Assistant Examiner—Jimmy Nguyen on ABSTRACT ‘An inexpensive RF test probe provides consistent monito ing of an RF signal while having minimal effect on the circuit under test. In one embodiment, an RF test probe ‘comprises a return conductor and a probing conductor The probing consluctor is positioned within an insulator and a fermination such as 2.50 ohm resistor is electrically posi- tioned between the ground conductor aed probing condue- tor. The probe is used by placing a portion ofthe insulating ‘material Surounding the probe corkluctor in contact with a circuit such as an RF mictostip carrying an RF signal to be ‘monitored, 20 Claims, 2 Drawing SheetsU.S. Patent Jun. 22, 2004 Sheet 1 of 2 US 6,753,676 B1 COAXIAL OUTPUT \ FIG. 1 Vx axe > RF MICROSTRIPUS 6,753,676 BL Sheet 2 of 2 Jun. 22, 2004 U.S. Patent 3 FIG. 2 FIG. 5 FIG. 20 FIG. 4 2 20 6 FIC. 2 dyes DIRECTION ee OF RF 40US 6,753,676 BL 1 RF TEST PROBE BACKGROUND OF THE INVENTION 1. Field of the Invention ‘The present invention relates to radio frequency cireits move specially, probes for testing radio frequency cievits 2, Deseription of the Related Art In the past, radio frequency circuits were tested usually using radio frequency (RF) couplers. Radio frequency cou- plers were built ino the circuit to provide test points 10 ‘monitor the rid Frequency signal inthe circuit wnder test. This technique had the disadvantage of using precious reuit card ral estate as well as adding the expense of RE ‘couples Another technique for esting RF circuits involved using RE test probes with a bayonet type tip. Oae of the hayonct tips was used as a ground and tbe sevond bayonet tip was used lo contact a ridio frequeney conductor such as @ microstrip in the circuit under test. The bayonet tips ten proved poor coatact with ether he micresrip or ground. Adkitionally, the bayonet probe affected the circuit under test and thereby distorted the RF signal to be measuee SUMMARY OF THE INVENTION ‘The present iaveation provides an inexpensive RF test probe that provides « consistent measurement of an RE Signal while having minimal effect on the circuit under test. In one embodiment of the present invention, an RF test probe comprises retum conductor and a probing conductor. ‘The probing condvetor is positioned within an insulator, and 4 termination such as a. 50 ohm resistor is electrically Positioned between the ground conductor and probing con- ‘ductor. The probe is used by placing a portion of the insulating material that surounds the probe conductor ia ‘contact with a circuit such as an RF microstrip eartying an RF signal to be monitored [BRIEF DESCRIPTION OF THE DRAWINGS FIG. illustrates the RF test probe being used to measure an RF sigoal carried on an RF microstrip; FIG, 2is side view of the RF test probe; FIG, 3 is 4 second side view of the RE test probe; FIG. 4is cross section along line AA of FIG. 2; FIG, § is across section along line BB of FIG. FIG, 6 illustrates an altroative cross section taken along, line BB of FIG. 2; and FIG, 7 illustrates another embodiment of the RF test, probe. DETAILED DESCRIPTION OF THE INVENTION FIG. 1 illustrates RF tes probe 10 being used to measure an RF signal cartied on RF microstrip 12, Coaxial ovsput portion 14 of BF test probe 10 caries «signal representative ‘of the RF signal on microstrip 12 to testing equipment such 88 an oscilloscope of spectrum analyzer. Handle 16 is used to provide a convenient non-conductive eipping surface for the user. Signal pickup section 18 includes insulator 20 and probe conductor 22. The probe is used by contacting an outer Surface of insulator 20 to the conductor carrying the RF signal 1 he monitored IG. 2 isa sce view of test probe 10 In this view, coaxial ‘output portion 14 i shovwa with a theeided connector to % o 2 ‘acilitate connecting a cable used ta provide & connection to ‘esting equipment. Within bandle 16, coaxial conductor 28 continues until reaching handle end 30, At handle end 30, the fondicive shielding associated with the outer layer of coaxial conductor 28 is sripped away to expose a Mexible insulator 20. tis possible 10 use the care material of the coaxial conductor 8s insulator 20; however, iti also pos: sible to strip away the core material and’ use’ Mexible insulator such asa TEFLON® type materi ss insulator 20, (TEFLON® is a registred trademark of E. 1. duPont de ‘Nemours and Company) Probe conductor 2, which may be the conter conductor of coaxial conductor 28, continues on curved path through insulator 20 and reemters handle 16. ‘Once eentering handle 16, probe conductor 22 isterminated in terminator 32. Terminator 32 is electrically positioned between probe condictor 22 and the rem or ground conductor of coaxial conductor 28. The return conductor of coaxial conductor 28 may be external metal sheathing 34 or ‘may be a conductive shield positoed below + non- ‘conducive outer shield. Terminator 32 may be a resistor or semieonductive device such asa diode. If resistor is used, it is preferable to use a resistance value that matches the characteristic impedance of the RF ciccuit under test. In ‘many circuits the characteristic impedance i typically SO ‘ohms and therefore terminator 32 is typically #50 ohm FIG, 3 illustcates another side view of test probe 10. ‘The view of FIG. 3 illustrates the view of FIG. 2 rotated 50 egres, FIG, 4 is a cross section taken along line AA of FIG. 2. “The eros section illustrates conductor 22 within insulator 20 nd it also illustrates that insulator 20 has a eireular cross Section. Additionally arrow 40 illustrates the drestion ofthe [RF signal in the circuit under tes relative to the probe 10 produce the maximum signal conducted through coax conductor 28. As a resull, the probe may be rotated 10 Selermine the propagation direction ofthe RF signal being monitored FIG, § is a ross section taken along line BB of FG. 2. FIG, § once again illustrates thal the cross section of insulator 20 is eireular, The cieuae ross section offers the advantage of allowing the probe tobe held a diferent angles ‘when making contaet with a conductor carrying an RF signal tobe monitored. The crculs eros section permits te probe to be held at different angles while maintaining the same distance between probe conductor 22 and the conductor carrying the signal tobe monitored. This Fests in consistent ‘measures ofthe signal to be monitored independent of the angle at which the probe is held FIG. 6 illustrates an alterative cross section taken along. line BB of FIG, 2. In this ase, insulator 20 has atleast @ partial cross section that is substantially circular in a plane that is substantially perpendicular to probe conductor 22 that Js pussng through the cross section. This embodiment offers the advantage of providing a circular eross section along the areas where the probe would most likely contact the cireult ‘under test while providing a la exoss section in areas where the probe is less likely to contact a circuit earrying a signal to be monitored. FIG, 7 illustrates ao alternative embodiment othe inven ‘ion, In this embodiment, probe $0 includes handle $2 and coaxial conductor 84, Coaxial eonductor 54 may include a threaded end at end section 86 to facilitate connection to & ‘cial cable for connection to testing equipment. At end $8 fof handle $2 probe conductor 60, which may be the center ‘onrlctor of coaxial conductor 84, emeapes from the handleUS 6,753,676 BL - without outer conductive shield 62 of coaxial conductor 84 i should be noted that outer shield 62 may also act as & return or ground conductor. Probe conductor 60 extends out from handle $2 and then returns into handle $2 at position 64. After reentering handle 64, conductor 60 is terminated in terminator 66 which is electrically positioned between con- ‘ductor 60 and return conductor 62. As mentioned earlier, terminator 66 may be a resistor oF semiconductor device ‘such a8 a diode. Insulator 68 is positioned adjacent to the portion of probe conductor 60 that extends out of bande 82 ‘The outer Surfaeo of insulator 68 is used to make coataet (© conductor carrying an RF signal io be monitored. Insulator {68 may be attached direely to conductor 60 ort may be held jn a spaced relationship to conductor 60 ans attached 10 handle 82 for mechanical support, Other embodiments of the invention may include con- figurations that permit an insulated surface adjacent o probing conductor tobe placed in contact with an RF circuit Under test while a tenminator is placed between the probe ‘conductor and s return or ground conductor "What is claimed is: 1. An RF probe, comprising: 4 concuetive returns an insulator having a contact surface; 4 probe conductor adjacent to the insulator, and «termination electrically positioned between the conduc tive reuen and the probe conductor, wherein the probe conductor is equidistant with the insulator along the entire contact surface 2. The RF probe of claim 1, wherein the concictive etura a ground return 3. The RF probe of claim 1, wherein the termination isa resistor 44 The RE probe of claim 3, wherein the probe conductor Js formed within a coaxial conductor andthe termination is approximately 50 ohms. 'S. The RF probe of claim 1, whore the termination isa semiconchictor device. 6, The RF probe of elaim inde. 7 An RE probe, comprising 4 conductive return; 4 probe conductor within an insulator, the insulator having, "contact surface; and ‘wherein the termination is 3 4 4 termination electrically positioned between the condue~ live etum and the probe conductor, wherein the probe ‘conductor is equidistant with the insulator along the ‘entire contact surlace. 8. The RF probe of claim 7, wherein the conductive return isa ground return, 9. The RF probe of elaim 7, wherein the termination is a 10, The RF probe of claim 9, wherein the probe conductor is formed win a coaxial conductor and the termination is approximately 50 obs. UL. The RF probe of claim 7, wherein the termination is 4 semiconductor device. 12. The RF probe of ea a diode 13. The RF probe of claim 7, wherein the insulator has at Jeast a partial ross section that is substantially circular in a plane substantially perpendicular to the probe conductor 14, The RF probe of claim 13, wherein the conductive return isa ground return. 18. The RF probe of claim 13, wherein the termination is a resistor 16. The RF probe of claim 18, wherein the termination is approximately 50 obms. 17. The RF probe of claim 13, wherein the termination is 4 semiconductor devioe. 18, The RF probe of cla a diode 19, An RE probe, comprising: « contuctive return; «probe conductor positioned within an insulator having 3 ‘contact surfice, the probe conductor being curved and the insulator having atleast patil crs section that is substantially circular in a plane substantially perpen dicular to the probe conductor, and 4 temination electrically positioned between the condue- live etum and the probe conductor, wherein the probe ‘conductor is equidistant with the insulator along the entire contact surface 20. The RF probe of claim 19, wherein the probe con- ‘ductor is equidistant with an RF Source along the contact sucfice. AL, wherein the termination is 17, wherein the termination is