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M95320-DF
32-Kbit serial SPI bus EEPROM with high-speed clock
Features
• Compatible with the Serial Peripheral Interface
(SPI) bus
• Memory array
SO8 (MN)
– 32 Kb (4 Kbytes) of EEPROM
150 mil width – Page size: 32 bytes
• Write
– Byte Write within 5 ms
– Page Write within 5 ms
• Additional Write lockable page (Identification
page)
TSSOP8 (DW) • Write Protect: quarter, half or whole memory
169 mil width array
• High-speed clock: 20 MHz
• Single supply voltage:
– 2.5 V to 5.5 V for M95320-W
– 1.8 V to 5.5 V for M95320-R
UFDFPN8 – 1.7 V to 5.5 V for M95320-DF
2 × 3 mm
• Operating temperature range: from -40°C up to
+85°C
• Enhanced ESD protection
• More than 4 million Write cycles
• More than 200-year data retention
• Packages:
– SO8 (ECOPACK2®)
– TSSOP8 (ECOPACK2®)
– UFDFPN8 (ECOPACK2®)
Contents
1 Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
2 Memory organization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
3 Signal description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
3.1 Serial Data Output (Q) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
3.2 Serial Data Input (D) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
3.3 Serial Clock (C) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
3.4 Chip Select (S) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
3.5 Hold (HOLD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
3.6 Write Protect (W) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
3.7 VCC supply voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
3.8 VSS ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
5 Operating features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
5.1 Supply voltage (VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
5.1.1 Operating supply voltage (VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
5.1.2 Device reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
5.1.3 Power-up conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
5.1.4 Power-down . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
5.2 Active Power and Standby Power modes . . . . . . . . . . . . . . . . . . . . . . . . 14
5.3 Hold condition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
5.4 Status Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
5.5 Data protection and protocol control . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
6 Instructions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
6.1 Write Enable (WREN) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
6.2 Write Disable (WRDI) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
6.3 Read Status Register (RDSR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
6.3.1 WIP bit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
8 Maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
9 DC and AC parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
10 Package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
10.1 SO8N package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
10.2 TSSOP8 package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43
10.3 UFDFN8 package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
11 Part numbering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
12 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
List of tables
List of figures
1 Description
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The SPI bus signals are C, D and Q, as shown in Figure 1 and Table 1. The device is
selected when Chip Select (S) is driven low. Communications with the device can be
interrupted when the HOLD is driven low.
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1. See Section 10: Package information for package dimensions, and how to identify pin-1.
2 Memory organization
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3 Signal description
During all operations, VCC must be held stable and within the specified valid range:
VCC(min) to VCC(max).
All of the input and output signals must be held high or low (according to voltages of VIH,
VOH, VIL or VOL, as specified in Section 9: DC and AC parameters). These signals are
described next.
All instructions, addresses and input data bytes are shifted in to the device, most significant
bit first. The Serial Data Input (D) is sampled on the first rising edge of the Serial Clock (C)
after Chip Select (S) goes low.
All output data bytes are shifted out of the device, most significant bit first. The Serial Data
Output (Q) is latched on the first falling edge of the Serial Clock (C) after the instruction
(such as the Read from Memory Array and Read Status Register instructions) have been
clocked into the device.
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1. The Write Protect (W) and Hold (HOLD) signals should be driven, high or low as appropriate.
Figure 4 shows an example of three memory devices connected to an SPI bus master. Only
one memory device is selected at a time, so only one memory device drives the Serial Data
Output (Q) line at a time. The other memory devices are high impedance.
The pull-up resistor R (represented in Figure 4) ensures that a device is not selected if the
Bus Master leaves the S line in the high impedance state.
In applications where the Bus Master may leave all SPI bus lines in high impedance at the
same time (for example, if the Bus Master is reset during the transmission of an instruction),
the clock line (C) must be connected to an external pull-down resistor so that, if all
inputs/outputs become high impedance, the C line is pulled low (while the S line is pulled
high): this ensures that S and C do not become high at the same time, and so, that the
tSHCH requirement is met. The typical value of R is 100 kΩ.
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5 Operating features
5.1.4 Power-down
During power-down (continuous decrease of the VCC supply voltage below the minimum
VCC operating voltage defined under Operating conditions in Section 9), the device must be:
• deselected (Chip Select S should be allowed to follow the voltage applied on VCC),
• in Standby Power mode (there should not be any internal write cycle in progress).
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a. This resets the internal logic, except the WEL and WIP bits of the Status Register.
b. In the specific case where the device has shifted in a Write command (Inst + Address + data bytes, each data
byte being exactly 8 bits), deselecting the device also triggers the Write cycle of this decoded command.
The Hold condition starts when the Hold (HOLD) signal is driven low when Serial Clock (C)
is already low (as shown in Figure 6).
The Hold condition ends when the Hold (HOLD) signal is driven high when Serial Clock (C)
is already low.
Figure 6 also shows what happens if the rising and falling edges are not timed to coincide
with Serial Clock (C) being low.
0 0 None None
0 1 Upper quarter 0C00h - 0FFFh
1 0 Upper half 0800h - 0FFFh
1 1 Whole memory 0000h - 0FFFh
6 Instructions
Each command is composed of bytes (MSBit transmitted first), initiated with the instruction
byte, as summarized in Table 3.
If an invalid instruction is sent (one not contained in Table 3), the device automatically enters
a Wait state until deselected.
For read and write commands to memory array and Identification Page the address is
defined by two bytes as explained in Table 4.
READ or
x x x x A11 A10 A9 A8 A7 A6 A5 A4 A3 A2 A1 A0
WRITE
RDID or
0 0 0 0 0 0 0 0 0 0 0 A4 A3 A2 A1 A0
WRID
RDLS or
0 0 0 0 0 1 0 0 0 0 0 0 0 0 0 0
LID
1. A: Significant address bit.
2. x: bit is Don’t Care.
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The status and control bits of the Status Register are as follows:
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Driving the Chip Select (S) signal high at a byte boundary of the input data triggers the self-
timed Write cycle that takes tW to complete (as specified in AC tables under Section 9: DC
and AC parameters).
While the Write Status Register cycle is in progress, the Status Register may still be read to
check the value of the Write in progress (WIP) bit: the WIP bit is 1 during the self-timed
Write cycle tW, and 0 when the Write cycle is complete. The WEL bit (Write Enable Latch) is
also reset at the end of the Write cycle tW.
The Write Status Register (WRSR) instruction enables the user to change the values of the
BP1, BP0 and SRWD bits:
• The Block Protect (BP1, BP0) bits define the size of the area that is to be treated as
read-only, as defined in Table 2.
• The SRWD (Status Register Write Disable) bit, in accordance with the signal read on
the Write Protect pin (W), enables the user to set or reset the Write protection mode of
the Status Register itself, as defined in Table 6. When in Write-protected mode, the
Write Status Register (WRSR) instruction is not executed.
The contents of the SRWD and BP1, BP0 bits are updated after the completion of the
WRSR instruction, including the tW Write cycle.
The Write Status Register (WRSR) instruction has no effect on the b6, b5, b4, b1, b0 bits in
the Status Register. Bits b6, b5, b4 are always read as 0.
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1. Depending on the memory size, as shown in Table 4, the most significant address bits are Don’t Care.
If Chip Select (S) continues to be driven low, the internal address register is incremented
automatically, and the byte of data at the new address is shifted out.
When the highest address is reached, the address counter rolls over to zero, allowing the
Read cycle to be continued indefinitely. The whole memory can, therefore, be read with a
single READ instruction.
The Read cycle is terminated by driving Chip Select (S) high. The rising edge of the Chip
Select (S) signal can occur at any time during the cycle.
The instruction is not accepted, and is not executed, if a Write cycle is currently in progress.
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1. Depending on the memory size, as shown in Table 4, the most significant address bits are Don’t Care.
In the case of Figure 12, Chip Select (S) is driven high after the eighth bit of the data byte
has been latched in, indicating that the instruction is being used to write a single byte.
However, if Chip Select (S) continues to be driven low, as shown in Figure 13, the next byte
of input data is shifted in, so that more than a single byte, starting from the given address
towards the end of the same page, can be written in a single internal Write cycle.
Each time a new data byte is shifted in, the least significant bits of the internal address
counter are incremented. If more bytes are sent than will fit up to the end of the page, a
condition known as “roll-over” occurs. In case of roll-over, the bytes exceeding the page size
are overwritten from location 0 of the same page.
The instruction is not accepted, and is not executed, under the following conditions:
• if the Write Enable Latch (WEL) bit has not been set to 1 (by executing a Write Enable
instruction just before),
• if a Write cycle is already in progress,
• if the device has not been deselected, by driving high Chip Select (S), at a byte
boundary (after the eighth bit, b0, of the last data byte that has been latched in),
• if the addressed page is in the region protected by the Block Protect (BP1 and BP0)
bits.
Note: The self-timed write cycle tW is internally executed as a sequence of two consecutive
events: [Erase addressed byte(s)], followed by [Program addressed byte(s)]. An erased bit
is read as “0” and a programmed bit is read as “1”.
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1. Depending on the memory size, as shown in Table 4, the most significant address bits are Don’t Care.
c. A group of four bytes is located at addresses [4*N, 4*N+1, 4*N+2, 4*N+3], where N is an integer.
The Identification Page (32 bytes) is an additional page which can be written and (later)
permanently locked in Read-only mode.
Reading this page is achieved with the Read Identification Page instruction (see Table 3).
The Chip Select signal (S) is first driven low, the bits of the instruction byte and address
bytes are then shifted in, on Serial Data Input (D). Address bit A10 must be 0, upper address
bits are Don't Care, and the data byte pointed to by the lower address bits [A4:A0] is shifted
out on Serial Data Output (Q). If Chip Select (S) continues to be driven low, the internal
address register is automatically incremented, and the byte of data at the new address is
shifted out.
The number of bytes to read in the ID page must not exceed the page boundary, otherwise
unexpected data is read (e.g.: when reading the ID page from location 10d, the number of
bytes should be less than or equal to 22d, as the ID page boundary is 32 bytes).
The read cycle is terminated by driving Chip Select (S) high. The rising edge of the Chip
Select (S) signal can occur at any time during the cycle. The first byte addressed can be any
byte within any page.
The instruction is not accepted, and is not executed, if a write cycle is currently in progress.
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8 Maximum ratings
Stressing the device outside the ratings listed in Table 7 may cause permanent damage to
the device. These are stress ratings only, and operation of the device at these, or any other
conditions outside those indicated in the operating sections of this specification, is not
implied. Exposure to absolute maximum rating conditions for extended periods may affect
device reliability.
9 DC and AC parameters
This section summarizes the operating conditions and the DC/AC characteristics of the
device.
CL Load capacitance 30 pF
- Input rise and fall times - 25 ns
- Input pulse voltages 0.2 VCC to 0.8 VCC V
- Input and output timing reference voltages 0.3 VCC to 0.7 VCC V
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TA ≤ 25 °C,
- 4,000,000
VCC(min) < VCC < VCC(max)
(2)
Ncycle Write cycle endurance Write cycle(3)
TA = 85 °C,
- 1,200,000
VCC(min) < VCC < VCC(max)
1. Cycling performance for products identified by process letter K (previous products were specified with 1
million cycles at 25 °C)
2. The Write cycle endurance is defined for groups of four data bytes located at addresses [4*N, 4*N+1,
4*N+2, 4*N+3] where N is an integer. The Write cycle endurance is defined by characterization and
qualification.
3. A Write cycle is executed when either a Page Write, a Byte Write, a WRSR, a WRID or an LID instruction is
decoded. When using the Byte Write, the Page Write or the WRID instruction, refer also to Section 6.6.1:
Cycling with Error Correction Code (ECC).
Input leakage
ILI VIN = VSS or VCC - ±2 µA
current
Output leakage
ILO S = VCC, VOUT = VSS or VCC - ±2 µA
current
VCC = 2.5 V, fC = 5 MHz,
- 3
C = 0.1 VCC/0.9 VCC, Q = open
VCC = 2.5 V, fC = 10 MHz,
- 2(1)
Supply current C = 0.1 VCC/0.9 VCC, Q = open
ICC mA
(Read) VCC = 3.0 V, fC = 10 MHz
- 4
C = 0.1 VCC/0.9 VCC, Q = open
VCC = 5.5 V, fC = 20 MHz,
- 5(1)
C = 0.1 VCC/0.9 VCC, Q = open
Supply current
ICC0(2) During tW, S = VCC, 2.5 V < VCC < 5.5 V - 5 mA
(Write)
S = VCC, VCC = 5.5 V
- 3(1)
VIN = VSS or VCC
Supply current S = VCC, VCC = 5.0 V
ICC1 - 2 µA
(Standby) VIN = VSS or VCC
S = VCC, VCC = 2.5 V
- 1(3)
VIN = VSS or VCC
VIL Input low voltage - –0.45 0.3 VCC V
VIH Input high voltage - 0.7 VCC VCC+1 V
VOL Output low voltage IOL = 1.5 mA, VCC = 2.5 V - 0.4 V
VCC = 2.5 V and IOH = 0.4 mA or
VOH Output high voltage 0.8 VCC - V
VCC = 5.5 V and IOH = 2 mA
Internal reset
VRES(2) - 1.0(4) 1.65(5) V
threshold voltage
1. Only for the device identified by process letter K.
2. Characterized only, not tested in production.
3. 2 µA with the device identified by process letter K.
4. 0.7 V with the device identified by process letter K.
5. 1.3 V with the device identified by process letter K.
Input leakage
ILI VIN = VSS or VCC - ±2 µA
current
Output leakage
ILO S = VCC, voltage applied on Q = VSS or VCC - ±2 µA
current
VCC = 1.8 V, max clock frequency (fC),
- 2
Supply current C = 0.1VCC/0.9VCC, Q = open
ICC mA
(Read) VCC = 1.8 V, fC = 5 MHz,
- 2(2)
C = 0.1VCC/0.9VCC, Q = open
Supply current
ICC0(3) VCC = 1.8 V, during tW, S = VCC - 5 mA
(Write)
Supply current
ICC1 VCC = 1.8 V, S = VCC, VIN = VSS or VCC - 1 µA
(Standby)
VIL Input low voltage 1.8 V ≤VCC < 2.5 V –0.45 0.25 VCC V
VIH Input high voltage 1.8 V ≤VCC < 2.5 V 0.75 VCC VCC+1 V
VOL Output low voltage IOL = 0.15 mA, VCC = 1.8 V - 0.3 V
VOH Output high voltage IOH = –0.1 mA, VCC = 1.8 V 0.8 VCC - V
Internal reset
VRES(3) - 1.0(4) 1.65(5) V
threshold voltage
1. If the application uses the M95320-R device at 2.5 V < VCC< 5.5 V and -40 °C < TA < +85 °C, please refer to Table 15: DC
characteristics (M95320-W, device grade 6), rather than to the above table.
2. For the device identified by process letter K.
3. Characterized only, not tested in production.
4. 0.7 V with the device identified by process letter K.
5. 1.3 V with the device identified by process letter K.
Input leakage
ILI VIN = VSS or VCC - ±2 µA
current
Output leakage
ILO S = VCC, voltage applied on Q = VSS or VCC - ±2 µA
current
VCC = 1.7 V, max clock frequency (fC),
- 2
Supply current C = 0.1 VCC/0.9 VCC, Q = open
ICC mA
(Read) VCC = 1.7 V, fC = 5 MHz,
- 2
C = 0.1 VCC/0.9 VCC, Q = open
Supply current
ICC0(2) VCC = 1.7 V, during tW, S = VCC - 5 mA
(Write)
Supply current
ICC1 VCC = 1.7 V, S = VCC, VIN = VSS or VCC - 1 µA
(Standby)
VIL Input low voltage 1.7 V ≤VCC < 2.5 V –0.45 0.25 VCC V
VIH Input high voltage 1.7 V ≤VCC < 2.5 V 0.75 VCC VCC+1 V
VOL Output low voltage IOL = 0.15 mA, VCC = 1.7 V - 0.3 V
VOH Output high voltage IOH = –0.1 mA, VCC = 1.7 V 0.8 VCC - V
Internal reset
VRES(2) - 1.0 1.65 V
threshold voltage
1. If the application uses the M95320-DF devices at 2.5 V ≤ VCC ≤ 5.5 V and –40 °C ≤TA ≤ +85 °C, please refer to Table 15:
DC characteristics (M95320-W, device grade 6), rather than to the above table.
2. Characterized only, not tested in production.
New products
VCC = 2.5 to 5.5 V VCC = 4.5 to 5.5 V
Symbol Alt. Parameter Unit
Min. Max. Min. Max.
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