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HAT2050T

Silicon N Channel Power MOS FET


High Speed Power Switching

ADE-208-660A (Z)
2nd. Edition
February 1999

Features

• Low on-resistance
• Capable of 4 V gate drive
• Low drive current
• High density mounting

Outline

TSSOP–8

65
87

34
1 8 12
D D

4 5
G G

1, 8 Drain
S S S S 2, 3, 6, 7 Source
2 3 6 7
4, 5 Gate
MOS1 MOS2
HAT2050T

Absolute Maximum Ratings (Ta = 25°C)


Item Symbol Ratings Unit
Drain to source voltage VDSS 100 V
Gate to source voltage VGSS ± 20 V
Drain current ID 1 A
Note1
Drain peak current I D(pulse) 4 A
Body-drain diode reverse drain current I DR 1 A
Note2
Channel dissipation Pch 1.0 W
Note3
Channel dissipation Pch 1.5 W
Channel temperature Tch 150 °C
Storage temperature Tstg – 55 to + 150 °C
Note: 1. PW ≤ 10µs, duty cycle ≤ 1 %
2. 1 Drive operation : When using the glass epoxy board (FR4 40 x 40 x 1.6 mm), PW≤ 10s
3. 2 Drive operation : When using the glass epoxy board (FR4 40 x 40 x 1.6 mm), PW≤ 10s

Electrical Characteristics (Ta = 25°C)


Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdown voltage V(BR)DSS 100 — — V I D = 10 mA, VGS = 0
Gate to source breakdown voltage V(BR)GSS ± 20 — — V I G = ± 100 µA, VDS = 0
Gate to source leak current I GSS — — ± 10 µA VGS = ± 16 V, VDS = 0
Zero gate voltege drain current I DSS — — 1 µA VDS = 100 V, VGS = 0
Gate to source cutoff voltage VGS(off) 1.3 — 2.3 V VDS = 10 V, I D = 1 mA
Static drain to source on state RDS(on) — 0.56 0.75 Ω I D = 0.5 A, VGS = 10 V Note4
resistance RDS(on) — 0.72 1.0 Ω I D = 0.5 A, VGS = 4 V Note4
Forward transfer admittance |yfs| 0.7 1.1 — S I D = 0.5 A, VDS = 10 V Note4
Input capacitance Ciss — 90 — pF VDS = 10 V
Output capacitance Coss — 42 — pF VGS = 0
Reverse transfer capacitance Crss — 20 — pF f = 1MHz
Turn-on delay time t d(on) — 11 — ns VGS = 4 V, ID = 0.5 A
Rise time tr — 24 — ns VDD ≅ 10 V
Turn-off delay time t d(off) — 14 — ns
Fall time tf — 11 — ns
Body–drain diode forward voltage VDF — 0.84 1.1 V I F = 1 A, VGS = 0 Note4
Body–drain diode reverse t rr — 85 — ns I F = 1 A, VGS = 0
recovery time diF/ dt = 20 A/µs
Note: 4. Pulse test

2
HAT2050T

Main Characteristics

Power vs. Temperature Derating Maximum Safe Operation Area


2.0 10
Test Condition : 10 µs
When using the glass epoxy board 3 10
Pch (W)

0
µs

I D (A)
(FR4 40x40x1.6 mm), PW < 10 s
1.5 1 DC 1
PW m
Op s
er =
0.3 ati 10
on m
s

Drain Current
Channel Dissipation

(P
2

1.0 0.1 W
Dr

Operation in No
<
10 te5
ive

1 this area is s)
Op

Dr 0.03
limited by R DS(on)
er

ive
at

0.5 Op 0.01
ion

er
at Ta = 25°C
ion 0.003 1 shot Pulse
1 Drive Operation
0.001
0 50 100 150 200 0.2 1 3 10 30 100 200
Ambient Temperature Ta (°C) Drain to Source Voltage V DS (V)

Note 5 :
When using the glass epoxy board
(FR4 40x40x1.6 mm)

Typical Output Characteristics Typical Transfer Characteristics


5 5
Pulse Test
8V
4 10V 4
(A)
I D (A)

5V
–25°C
ID

3 6V 4.0 V 3 Tc = 75°C
25°C
Drain Current

Drain Current

2 2
3.0 V
1 1
VGS = 2.5 V V DS = 10 V
Pulse Test
0 2 4 6 8 10 0 2 4 6 8 10
Drain to Source Voltage V DS (V) Gate to Source Voltage V GS (V)

3
HAT2050T

Drain to Source Saturation Voltage vs. Static Drain to Source on State Resistance
Gate to Source Voltage vs. Drain Current
2.0 20

Drain to Source On State Resistance


R DS(on) ( Ω )
Pulse Test Pulse Test
Drain to Source Saturation Voltage
V DS(on) (V)

10
1.6

ID=2A 5

1.2
2
4V
0.8
1
1A
VGS = 10 V
0.4 0.5

0.5 A
0.2
0 2 4 6 8 10 0.2 0.5 1 2 5 10 20
Gate to Source Voltage V GS (V) Drain Current I D (A)

Static Drain to Source on State Resistance Forward Transfer Admittance vs.


vs. Temperature Drain Current
Static Drain to Source on State Resistance

2.0 5
Forward Transfer Admittance |y fs | (S)
R DS(on) (Ω )

1.6 ID = 2 A 2
Tc = –25 °C
1
1.2 1, 0.5 A

0.5
75 °C
2A
0.8
25 °C
1, 0.5 A 0.2

0.4 4V
0.1 V DS = 10 V
VGS = 2.5 V Pulse Test Pulse Test
0 0.05
–40 0 40 80 120 160 0.02 0.05 0.1 0.2 0.5 1 2
Case Temperature Tc (°C) Drain Current I D (A)

4
HAT2050T

Body–Drain Diode Reverse Typical Capacitance vs.


Recovery Time Drain to Source Voltage
500 1000
VGS = 0
Reverse Recovery Time trr (ns)

f = 1 MHz
200 300

Capacitance C (pF)
100 100 Ciss

50 30 Coss

10
20
Crss
10 3
di/dt = 20 A/µs
V GS = 0, Ta = 25°C
5 1
0.1 0.2 0.5 1 2 5 10 0 10 20 30 40 50
Reverse Drain Current I DR (A) Drain to Source Voltage V DS (V)

Dynamic Input Characteristics Switching Characteristics


50 10 100
V DS (V)

V GS = 4 V, V DD = 10 V
I D= 1 A
V GS (V)

PW = 5 µs, duty < 1 %


50
40 8
Switching Time t (ns)

V DD = 5 V
10 V V GS t d(off)
20
Drain to Source Voltage

20 V
30 6
Gate to Source Voltage

t d(on)
10 tf
V DS tr
20 4
5

10 V DD = 20 V 2
10 V 2
5V
0 1
0 0.8 1.6 2.4 3.2 4.0 0.01 0.02 0.05 0.1 0.2 0.5 1
Gate Charge Qg (nc) Drain Current I D (A)

5
HAT2050T

Reverse Drain Current vs.


Souece to Drain Voltage
5
Pulse Test

Reverse Drain Current I DR (A)


4

5V V GS = 0
1

0 0.4 0.8 1.2 1.6 2.0


Source to Drain Voltage V SD (V)

Normalized Transient Thermal Impedance vs. Pulse Width (1 Drive Operation)


10
γ s (t)
Normalized Transient Thermal Impedance

D=1
1
0.5
0.2
0.1
0.1
0.05
0.02
θ ch – f(t) = γ s (t) • θ ch – f
0.01 θ ch – f = 166 °C/W, Ta = 25 °C
0.01 e
puls When using the glass epoxy board
h ot (FR4 40x40x1.6 mm)
1s
PDM PW
0.001 D=
T
PW
T
0.0001
10 µ 100 µ 1m 10 m 100 m 1 10 100 1000 10000
Pulse Width PW (S)

6
HAT2050T

Normalized Transient Thermal Impedance vs. Pulse Width (2 Drive Operation)


10
γ s (t)
Normalized Transient Thermal Impedance

D=1
1
0.5
0.2
0.1
0.1
0.05
0.02
θ ch – f(t) = γ s (t) • θ ch – f
0.01 θ ch – f = 210 °C/W, Ta = 25 °C
0.01 When using the glass epoxy board
lse (FR4 40x40x1.6 mm)
t pu
ho PW
0.001 1s PDM D=
T
PW
T
0.0001
10 µ 100 µ 1m 10 m 100 m 1 10 100 1000 10000

Pulse Width PW (S)

Switching Time Test Circuit Switching Time Waveform

Vin Monitor Vout


Monitor
90%
D.U.T.
RL
Vin 10%

Vin V DD Vout 10%


50Ω 10%
4V = 10 V

90% 90%

td(on) tr td(off) tf

7
HAT2050T

Package Dimensions

Unit: mm

3.00 ± 0.1

8 5

4.40 ± 0.1

1 4
1.10 Max

6.40 ± 0.20

0–8°
0.65
0.07 +0.03
–0.04
0.17 ± 0.05

0.10 0.50 ± 0.10


+0.08
0.22 –0.07
0.13 M
Hitachi Code TTP–8D
EIAJ Code —
JEDEC Code —

8
Cautions

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copyright, trademark, or other intellectual property rights for information contained in this document.
Hitachi bears no responsibility for problems that may arise with third party’s rights, including
intellectual property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have
received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However,
contact Hitachi’s sales office before using the product in an application that demands especially high
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk
of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation,
traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly
for maximum rating, operating supply voltage range, heat radiation characteristics, installation
conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used
beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable
failure rates or failure modes in semiconductor devices and employ systemic measures such as fail-
safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other
consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without
written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor
products.

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Copyright ' Hitachi, Ltd., 1999. All rights reserved. Printed in Japan.

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