Follow the presentation and write down the essential points in your own

words. In this way, you will automatically have your own individual training
document.

© Mahr GmbH, Goettingen/GERMANY

Notizen/Notes:

MarSurf / ISO 1302 4.1

The roughness of a technical surface is tested by scanning the surface:
The probe is moved by the drive unit parallel to the surface. Measuring
force and speed are finely tuned to one another so that the probe tip is
always in contact with the surface.

Notizen/Notes:

MarSurf / ISO 1302 4.2

This drawing entry corresponds to the international standard
ISO 1302. The profile depth Pt of the primary profile P is tolerated.

Notizen/Notes:

MarSurf / ISO 1302 4.3

The profile depth Pt is the total height of the profile P, measured over the
total reference path lp from the lowest to the highest profile point.
Pt shows not only the surface roughness but also the waviness and the
proportion of form deviations of the test surface detected on the reference
path lp.

Notizen/Notes:

MarSurf / ISO 1302 4.4

According to ISO standards, measurement and evaluation of the profile P
must always be carried out over the entire length of the test surface:
For the primary profile, reference path lp, measuring length ln and
traversing length lt are to be selected approximately equal to the length of
the testing surface.

Notizen/Notes:

MarSurf / ISO 1302 4.5

Since the waviness and form deviations of the test area are to be covered,
no skidded probe may be used for checking parameters from the primary
profile P. (The same applies for measuring the profile W.) Skidded probes
may be used for roughness, but the only device for reference
measurements will always be the skidless probe.

Notizen/Notes:

MarSurf / ISO 1302 4.6

During a measurement with tactile stylus, the unfiltered and non-aligned
profile D is first detected.

Notizen/Notes:

MarSurf / ISO 1302 4.7

To get from profile D to profile P, the directly measured profile must first be
horizontally aligned.
This alignment takes place automatically, but the responsibility for the
correct setting of the Ls filters lies with the measuring engineer.

Notizen/Notes:

MarSurf / ISO 1302 4.8

The Ls-filter is used to eliminate extremely short-wave perturbations in the
measurement process. Which cutoff wavelength is set for measuring a
profile P-parameter must be specified by the designing engineer: If there
was no corresponding value (see arrow) in the tolerance, this drawing
entry would be incomplete.

Notizen/Notes:

MarSurf / ISO 1302 4.9

For each modern roughness tester that is able to measure profile P-
parameters, it should be possible to freely adjust the cutoff wavelength Ls
in the measuring conditions menu. If this should not be possible, before
the measurement of the profile P a Lc value corresponding to the required
Ls value must be selected according to the table above.

Notizen/Notes:

MarSurf / ISO 1302 4.10

The third and last step from profile D to profile P is the elimination of the
nominal form being a part of the directly measured profile D.

Notizen/Notes:

MarSurf / ISO 1302 4.11

The above diagram shows the aligned, Ls-filtered surface profile. The
uniformly constant radius of the test surface can be recognized.
Only after this radius has been eliminated by an arc-filter (Arc), the correct
value for Pt is being indicated.

Notizen/Notes:

MarSurf / ISO 1302 4.12

The largest permissible value for Pt appears to be 63 microns. But
actually, in accordance with ISO 1302 and ISO 4288 it is allowed to
exceed individual tolerances.

Notizen/Notes:

MarSurf / ISO 1302 4.13

The test surface is of course GO when all measuring values are smaller
than 63 µm.

Notizen/Notes:

MarSurf / ISO 1302 4.14

According to the 16% rule specified by ISO as standard, one of each six
measuring values is allowed to exceed the tolerance.

Notizen/Notes:

MarSurf / ISO 1302 4.15

Only when two of six readings are greater than 63 microns, the test
surface is NO GO.

Notizen/Notes:

MarSurf / ISO 1302 4.16

If the designer wants to be certain to avoid measured roughness values
exceeding tolerances, he must expand the parameter names with the
symbol ‘max’: Only then does the so-called maximum value rule apply to
ISO 4288.

Notizen/Notes:

MarSurf / ISO 1302 4.17

The maximum value rule categorically excludes exceeding tolerances:
even a single measuring value out of tolerance makes the workpiece a
rework or NO GO part.

Notizen/Notes:

MarSurf / ISO 1302 4.18

Each roughness measurement requires the proper measurement of the
profile P. For R-parameters, it may be useful to support the elimination of
the nominal form by using a suitable skidded probe.

Notizen/Notes:

MarSurf / ISO 1302 4.19

The roughness profile R originates from the profile P by using an Lc filter:
This filter eliminates the waviness and the form deviations contained in the
primary profile.

Notizen/Notes:

MarSurf / ISO 1302 4.20

In the ideal case, both filter cutoffs Ls and Lc used in a roughness
measurement are indicated in the drawing.

Notizen/Notes:

MarSurf / ISO 1302 4.21

Notes on the choice of the cutoff Lc according to standard, i.e. without a
drawing specification can be found in another surface lesson of the Mahr
Academy. The ‘short’ cutoff wavelength Ls is generally automatically set
by the measuring instrument according to this table and depending from
the Lc value set by the metrologist (cf. ISO 1302).

Notizen/Notes:

MarSurf / ISO 1302 4.22

Automatically following from the set value for Lc is the measuring length
ln=5xLc that corresponds to the standard.
The traversing length lt of the probe is a little longer than ln, since a
certain pre- and post-travel is needed for proper operation of the Lc filter.

Notizen/Notes:

MarSurf / ISO 1302 4.23

In the best case, the test surface is at least a bit longer than then selected
traverse path lt.

Notizen/Notes:

MarSurf / ISO 1302 4.24

In the worst case, the test surface is shorter than the required traversing path
lt.
In the example shown, it also would be possible to measure on the
circumference of the test surface, but as it is ideal to measure perpendicular to
the travel of the tool, in most cases this possibility is excluded.

Notizen/Notes:

MarSurf / ISO 1302 4.25

Instead, it is recommended to break down the measuring path ln in five
individual segments lr=Lc and measure them individually.

Notizen/Notes:

MarSurf / ISO 1302 4.26

The desired measurement value for Rz is the average of the
independently measured five individual values Rz1 to Rz5.
This method can be generally applied, since almost all of the roughness
parameters described in ISO 4287 are calculated as mean values (except,
for example, Rt or Rz1max).

Notizen/Notes:

MarSurf / ISO 1302 4.27

The second possible solution is to optically measure a small, planar
section of the test surface and it cut out a sufficiently long measurement
profile - preferably perpendicular to the machining direction. The resulting
2D profile of the surface can then be evaluated as described before.

Notizen/Notes:

MarSurf / ISO 1302 4.28