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$EVWUDFW—To model drain IV characteristics, the temperature
dependence is important for GaN HEMT. We show that the time
dependence should also be included in the modeling approach.
In this paper, we use the trap information obtained from current
transient spectroscopy (CTS) to create a 3D plot of Ids­Vds­time(I­
V­t). This gives a more realistic description for time­domain
pulsed IV behavior. The controversial question of whether the
pulsed IV/RF is a trapping effect or a thermal effect is analyzed.
The Poole­Frenkel emission­based time­dependent trapping
model is proposed to describe the GaN HEMT memory effects
(kink effect and knee walkout). To our knowledge, this is the first
model offered to describe the “soft” (or degraded) knee region of
the GaN HEMT IV curves.
Index Terms—AlGaN/GaN HEMT High Electron Mobility
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