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NiO Tarjeta
NiO Tarjeta
Entry Date: 07/27/2010 Last Modification Date: 01/17/2013 Cross-Ref PDF #'s: 00-004-0835 (Alternate)
References:
Type DOI Reference
Primary Reference Calculated from ICSD using POWD-12++ (2004).
Additional Reference Sasaki, S., Fujino, K., Takeuchi, Y. Golden Book of Phase Transitions, Wroclaw 1, 1 (2002).
"X-ray determination of electron-density distributions in oxides, Mg O, Mn O, Co O, and Ni O, and atomic scattering
Structure factors of their constituent atoms". Sasaki, S., Fujino, K., Takeuchi, Y. Proc. Jpn. Acad. 55, 43 (1979).
ANX: AX. Analysis: Ni1 O1. Formula from original source: Ni O. ICSD Collection Code: 9866. Calculated
Database Comments: Pattern Original Remarks: Stable above 523 K (2nd ref., Tomszewski), below R3-m. Wyckoff Sequence: b
a(FM3-M). Unit Cell Data Source: Single Crystal.
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