OMICRON PTL MCGG Overcurrent Protection Test Template User Manual

OMICRON PTL

Protection Test Template PTT

Overcurrent Protection

AREVA MCGG

User Manual

V1.000

© OMICRON electronics GmbH 1/12

OMICRON PTL MCGG Overcurrent Protection Test Template User Manual

Contents

1 General Information ..................................................................................................................................3

2 Quick Start Information ............................................................................................................................4
3 Using the Template ...................................................................................................................................5
3.1 Test Object ...........................................................................................................................................5
3.2 Hardware Configuration .......................................................................................................................5
4 Required Test Modules/TU-Version/Hardware.......................................................................................9
5 Functional Range ....................................................................................................................................10
6 OMICRON Test Strategy .........................................................................................................................10
7 Template Structure .................................................................................................................................11
7.1 Pick-up and Drop-off of IDMT Overcurrent Stages [Phase & Earth Fault].........................................11
7.2 Trip Time of IDMT and DMT Overcurrent Stages [Phase and Earth Fault] .......................................11
7.3 Trip Time with Circuit Breaker Contacts.............................................................................................12

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OMICRON PTL MCGG Overcurrent Protection Test Template User Manual

1 General Information
The MCGG overcurrent protection test template is used for testing the overcurrent protection functions of
the AREVA MCGG relay. This template comprehends various modules for testing the most important
overcurrent protection functions. It is designed and configured for use with the AREVA MCGG XRIO
converter which is included in this template. For more information about the converter, see the AREVA
user manual of the MCGG XRIO Converter.

Note: The template is designed and built for the applications of the Test Universe 2.22 software.

The template has been tested on the following relay:

Manufacturer: AREVA
Model: MCGG
Hardware Version: 52

Annotations:
• This template is developed particularly for the relay and application specified above.
• The OMICRON PTTs are designed for an experienced OMICRON user. The use of the Test
Universe software, the XRIO technology with LinkToXRIO should be familiar (see
http://www.omicron.at/products/training/ for training information).

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OMICRON PTL MCGG Overcurrent Protection Test Template User Manual

2 Quick Start Information

To test with the MCGG overcurrent protection template:
1. Double click the file MCGG.occ to start the template-based procedure.
2. Open the global test object.
3. Load (Import) the latest XRIO converter version for the MCGG.
4. Enter or your relay model and system settings under Relay Parameter Section and Additional
Information, and then click OK.

Figure 1: Relay settings in the XRIO converter

5. Open the Hardware Configuration.

6. Control all necessary information for:
• General
• Analog Outputs
• Binary / Analog Inputs
• Binary Outputs
• DC Analog Inputs
Expand the hardware configuration settings if necessary, but notice that changes in the hardware
configuration can influence the test.

7. Click OK.
8. Follow the wiring instructions.
9. Start testing.
10. Evaluate and archive the results.

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OMICRON PTL MCGG Overcurrent Protection Test Template User Manual

3 Using the Template

The MCGG overcurrent protection test template is divided into three object groups: test object, hardware
configuration and the list of OMICRON test modules used for testing the relay's protection functions. The
template can be used for testing the following protection functions:
• Phase and earth fault overcurrent (50, 50N, 51, 51N)
• CB auxiliary contacts

3.1 Test Object

The test object already contains the AREVA MCGG XRIO converter which includes all setting parameters
of the modeled MCGG protection functions. For more information, see the AREVA MCGG XRIO converter
user manual.

3.2 Hardware Configuration

The hardware configuration offers various configuration options for voltage and current outputs. For
testing the MCGG relay with the MCGG overcurrent protection test template, the standard configuration
as shown in the following figure is required.

Figure 2: Configuration of the voltage and current outputs

Note: If higher currents are needed for testing (e.g. relays with Inom = 5 A), the current output
configuration can be adapted (e.g. by setting to 3 x 25 A).

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OMICRON PTL MCGG Overcurrent Protection Test Template User Manual

In the Analog Outputs dialog box, the voltage and current outputs have to be routed to the name
variables. The Figure 3 shows the Analog Outputs configuration.

Figure 3: Analog Outputs configuration

In the Binary / Analog Inputs dialog box, configure the signals as follows:
• 1 trigger signal set to Trip,
• 1 signal for the circuit breaker auxiliary contacts set to CB phase A [52a],
• 1 signal for the circuit breaker auxiliary contacts set to CB phase B [52a],
• 1 signal for the circuit breaker auxiliary contacts set to CB phase C [52a],

Note: The binary inputs are preset to potential free. Change these predefined settings to the values
needed at the test site.

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OMICRON PTL MCGG Overcurrent Protection Test Template User Manual

The following figure shows the Binary / Analog Inputs configuration.

Figure 4: Binary / Analog Inputs configuration

Route the signals configured in the Binary / Analog Inputs dialog box to the following binary inputs:
• Trip to binary input 1
• CB aux. Phase A (52a) to binary input 7
• CB aux. Phase B (52a) to binary input 8
• CB aux. Phase C (52a) to binary input 9

Note: The circuit breaker auxiliary contact is required for the trip test with the circuit breaker. If the circuit
breaker auxiliary contact cannot be connected to the binary inputs, the trip test with the circuit breaker
cannot be performed.

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OMICRON PTL MCGG Overcurrent Protection Test Template User Manual

Connection for
GEC MCGG: 42,5x,6x,82

CB Phase C (52a)
CB Phase B (52a)
CB Phase A (52a)
Trip

*- skip for two phase connections

Figure 5: Connecting the CMC 256plus to the MCGG 42,5x, 6x and 82 relays

Connection for
GEC MCGG 22
CB Phase A (52a)
Trip

Figure 6: Connecting the CMC 256plus to the MCGG 22 relay

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OMICRON PTL MCGG Overcurrent Protection Test Template User Manual

Connection for
GEC MCGG: 52,53,82
Earth Fault Tests

Trip

Figure 7: Connecting the CMC 256 the MCGG 52,53 and 82 relays for Earth Fault tests

4 Required Test Modules/TU-Version/Hardware

To use this template, you must have a valid test license for the OMICRON Test Universe 2.22 or higher
and the following test modules:
• Control Center
• Quick CMC
• Ramping
• State Sequencer
• Overcurrent

There are no restrictions on for the hardware. You can use a CMC56, CMC156 or a CMC256 for testing
(The development tests are performed with a CMC256plus).

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OMICRON PTL MCGG Overcurrent Protection Test Template User Manual

5 Functional Range
The test modules are grouped according to the tested protection function. The MCGG overcurrent
protection test template includes OMICRON test modules for the following protection functions:
• Pick-up and drop-off of:

Definite time overcurrent protection (50), (50N)

Inverse time overcurrent protection (51), (51N)
• Trip time of:

Definite time overcurrent protection (50), (50N)

Inverse time overcurrent protection (51), (51N)
• Trip time with circuit breaker contacts

6 OMICRON Test Strategy

The MCGG overcurrent protection test template includes the pick-up and trip time value tests which are
performed in a standardized way. For the pick-up and drop-off value test, the setting value is evaluated by
a ramp increasing the variable under test until the pick-up value is reached. The test of drop-off values is
done in a similar way by decreasing the tested value until the drop-off value is reached.
Trip times are tested by simulating a fault which exceeds the pick-up value and the specific tolerances.
This results in a trip command of the tested protection function. The time between the simulation of the
fault and the reception of the trip signal is measured and evaluated.

Note: Do not only rely on the automatic assessment of test points in the test modules. Check the
plausibility of all test results manually to gain maximum security that all test results are reliable.

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OMICRON PTL MCGG Overcurrent Protection Test Template User Manual

7 Template Structure
The structure of the MCGG overcurrent protection test template is shown below.

Figure 8: MCGG overcurrent protection test template

7.1 Pick-up and Drop-off of IDMT Overcurrent Stages [Phase & Earth Fault]
For testing the pick-up and drop-off values, the OMICRON Ramping test module is used. This module
allows testing the pick-up and drop-off of the overcurrent stage with the lowest pick-up value. Each
module covers the pick-up and drop-off of the overcurrent stage. The following faults are tested:
• Fault in Phase A
• Fault in Phase C
• Earth Fault

7.2 Trip Time of IDMT and DMT Overcurrent Stages [Phase and Earth Fault]
For testing the trip time of the IDMT and DMT overcurrent stages, the OMICRON Overcurrent test module
is used. Every fault case is tested with a separate overcurrent module. The test points are set to 1.15°x°I>
[IDMT], 0.9°x°I>> [DMT] and 1.1°x°I>>. The trip tim es of the following faults are tested:
• Fault in Phase A
• Fault in Phase C
• Earth Fault

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OMICRON PTL MCGG Overcurrent Protection Test Template User Manual

Figure 9: Trip time test for phase A

7.3 Trip Time with Circuit Breaker Contacts

For testing the trip time with circuit breaker contacts test, the OMICRON State Sequencer test module
is used. This test is divided into three sequencer states: pre-fault, fault and post-fault. For each fault case
– in phase A, in phase B and in Phase C – a separate test module is used. The fault is a one-pole fault in
the direction of the corresponding overcurrent stage. The time between the trip command and the time
when the circuit breaker is opened is evaluated.

© OMICRON electronics GmbH 12/12