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STGWT60V60DF
Trench gate field-stop IGBT, V series
600 V, 60 A very high speed
Datasheet - production data
Features
TAB
• Maximum junction temperature: TJ = 175 °C
• Tail-less switching off
• VCE(sat) = 1.85 V (typ.) @ IC = 60 A
• Tight parameters distribution
3
2 3 • Safe paralleling
1 2
1 • Low thermal resistance
• Very fast soft recovery antiparallel diode
TO-247 TO-3P
Applications
• Photovoltaic inverters
Figure 1. Internal schematic diagram
• Uninterruptible power supply
C (2 or TAB)
• Welding
• Power factor correction
• Very high frequency converters
G (1)
Description
This device is an IGBT developed using an
advanced proprietary trench gate field stop
structure. The device is part of the V series of
IGBTs, which represent an optimum compromise
between conduction and switching losses to
E (3) maximize the efficiency of very high frequency
converters. Furthermore, a positive VCE(sat)
temperature coefficient and very tight parameter
distribution result in safer paralleling operation.
1 Electrical ratings
2 Electrical characteristics
Collector-emitter
V(BR)CES breakdown voltage IC = 2 mA 600 V
(VGE = 0)
VGE = 15 V, IC = 60 A 1.85 2.3
VGE = 15 V, IC = 60 A
Collector-emitter saturation 2.15
VCE(sat) TJ = 125 °C V
voltage
VGE = 15 V, IC = 60 A
2.35
TJ = 175 °C
IF = 60 A 2 2.6 V
VF Forward on-voltage IF = 60 A TJ = 125 °C 1.7 V
IF = 60 A TJ = 175 °C 1.6 V
VGE(th) Gate threshold voltage VCE = VGE, IC = 1 mA 5 6 7 V
Collector cut-off current
ICES VCE = 600 V 25 μA
(VGE = 0)
Gate-emitter leakage
IGES VGE = ± 20 V 250 nA
current (VCE = 0)
350 80
VGE >_ 15 V, TJ <_ 175 °C
300 70
60
250
50
200
40
150
30
100
20
50 10
0 0
0 25 50 75 100 125 150 175 TC (°C) 0 25 50 75 100 125 150 175 TC (°C)
9V 9V
100 100
50 50
7V 7V
0 0
0 1 2 3 4 VCE (V) 0 1 2 3 4 VCE (V)
Figure 6. VCE(SAT) vs. junction temperature Figure 7. VCE(SAT) vs. collector current
VCE(sat) AM17143v1 VCE(sat) AM17144v1
(V) (V)
3.2 VGE = 15 V 3.2 VGE = 15 V
IC = 120 A
3.0 3.0 TJ = 175 °C
2.8 2.8
2.6 2.6
2.4 2.4 TJ = 25 °C
IC = 60 A
2.2 2.2
2.0 2.0
1.8 1.8
TJ = - 40 °C
1.6 IC = 30 A 1.6
1.4 1.4
1.2 1.2
-50 -25 0 25 50 75 100 125 150 175 TJ (ºC) 10 20 30 40 50 60 70 80 90 100 110 120 IC (A)
60
50 1
40
30
rectangular current shape, 0.1 (single pulse TC =25 °C,
20 (duty cycle=0.5, VCC = 400V, RG=4.7 Ω, TJ <=175 °C; VGE =15 V)
10 VGE = 0/15 V, TJ =175°C)
0 0.01
1 10 f [kHz] 1 10 100 VCE (V)
Figure 10. Transfer characteristics Figure 11. Diode VF vs. forward current
AM17146v1 AM17148v1
IC (A) VF (V)
TJ= - 40°C
VCE= 5V TJ= 25°C 2.8
200
2.4
150
2
100
1.6
25°C
50
-40°C 1.2
175 °C
175°C
0 0.8
6 7 8 9 10 11 VGE (V) 10 30 50 70 90 110 IF (A)
Figure 12. Normalized VGE(th) vs. junction Figure 13. Normalized V(BR)CES vs. junction
temperature temperature
VGE(th) AM17149v1 V(BR)ces AM17150v1
norm norm
VCE= VGE
1.1 IC= 1 mA IC = 2 mA
1.1
1.0
0.9
1.0
0.8
0.7
0.6 0.9
-50 -25 0 25 50 75 100 125 150 175 TJ (ºC) -50 -25 0 25 50 75 100 125 150 175 TJ (ºC)
Figure 14. Capacitance variations Figure 15. Gate charge vs. gate-emitter voltage
AM17151v1 AM17152v1
C (pF) VGE (V)
C ies
10000 16 VCC = 480V
IC = 60A
14
C oes
12
1000
C res 10
100 6
f = 1MHz, VGE =0 4
2
10 0
0.1 1 10 VCE (V) 0 100 200 300 Qg (nC)
Figure 16. Switching losses vs. collector Figure 17. Switching losses vs. gate resistance
current
AM17153v1 AM17154v1
E (μJ) E (μJ)
4500 4500
VCC 400V, VGE= 15V, VCC=400V, VGE = 15V,
4000 Rg=4.7Ω, TJ = 175°C
4000 IC = 60 A, TJ = 175 °C
3500
3500 EON
3000
3000
2500 EON
2500
2000
2000 EOFF
1500
1000
1500
0 500
0 10 20 30 40 50 60 70 80 90 100 110120 Ic (A) 0 10 20 30 40 RG (Ω)
Figure 18. Switching losses vs. junction Figure 19. Switching losses vs. collector
temperature emitter voltage
AM17155v1 AM17156v1
E (μJ) E (μJ)
1500 VGE = 15V, TJ = 175°C
2000 IC = 60 A, Rg = 4.7 Ω
1400 VCC =400V, VGE = 15V, E ON
IC = 60 A, Rg = 4.7 Ω 1800
1300
1200 1600
1100
E ON 1400
1000
900 1200
E OFF
800 1000
700
E OFF 800
600
500 600
400 400
25 50 75 100 125 150 TJ (ºC) 150 200 250 300 350 400 450 Vce (V)
Figure 20. Switching times vs. collector current Figure 21. Switching times vs. gate resistance
AM17157v1 AM17159v1
t(ns) t(ns)
VCC = 400V, VGE = 15V, VCC= 400V, VGE = 15V,
Tj =175°C, Rg = 4.7 Ω Tj =175°C Ic = 60 A
1000
tdoff t doff
100 tr
tr tdon
100 t don
tf tf
10 10
0 20 40 60 80 100 Ic (A) 0 10 20 30 40 Rg (Ω)
Figure 22. Reverse recovery current vs. diode Figure 23. Reverse recovery time vs. diode
current slope current slope
AM17158v1 AM17160v1
Irm (A) trr (ns)
Vr = 400 V, IF = 60 A Vr = 400V, IF = 60 A
50
200
40
175°C 150 175 °C
30
100
20
TJ=25°C
10 50 TJ=25°C
0 0
0 500 1000 1500 2000 di/dt (A/μs) 0 500 1000 1500 2000 di/dt (A/μs)
Figure 24. Reverse recovery charge vs. diode Figure 25. Reverse recovery energy vs. diode
current slope current slope
Qrr (nC)
AM17161v1 Err AM17162v1
(μJ)
Vr = 400V, IF = 60 A
1400 VCC = 400V, VGE = 15V, IF = 60A
2500
1200
2000 175 °C 175°C
1000
1500 800
600
1000
TJ=25°C
400
500
200
TJ=25°C
0 0
0 500 1000 1500 2000 di/dt (A/μs) 0 500 1000 1500 2000 2500 3000 di/dt (A/μs)
0.2
0.1
10-1 0.05
0.02
0.01
Single pulse
-2
10
10-5 10-4 10-3 10-2 10-1 tp (s)
3 Test circuits
Figure 28. Test circuit for inductive load Figure 29. Gate charge test circuit
switching
AM01504v1 AM01505v1
Figure 30. Switching waveform Figure 31. Diode recovery time waveform
VG 10%
IF trr
90%
ta tb
VCE Tr(Voff)
10%
Tcross t
90%
IRRM IRRM
IC Td(off)
10%
Td(on) Tf
Tr(Ion)
Toff
Ton
VF
dv/dt
AM01506v1 AM01507v1
A 4.85 5.15
A1 2.20 2.60
b 1.0 1.40
b1 2.0 2.40
b2 3.0 3.40
c 0.40 0.80
D 19.85 20.15
E 15.45 15.75
e 5.30 5.45 5.60
L 14.20 14.80
L1 3.70 4.30
L2 18.50
∅P 3.55 3.65
∅R 4.50 5.50
S 5.30 5.50 5.70
0075325_G
A 4.60 5
A1 1.45 1.50 1.65
A2 1.20 1.40 1.60
b 0.80 1 1.20
b1 1.80 2.20
b2 2.80 3.20
c 0.55 0.60 0.75
D 19.70 19.90 20.10
D1 13.90
E 15.40 15.80
E1 13.60
E2 9.60
e 5.15 5.45 5.75
L 19.50 20 20.50
L1 3.50
L2 18.20 18.40 18.60
øP 3.10 3.30
Q 5
Q1 3.80
8045950_A
5 Revision history
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