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    Meghana S
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    1) Six experiments are described to test different circuit components including a clock detector, current mirror, and voltage source. 2) The experiments involve analyzing transient response, DC levels, and AC characteristics of the circuits when applying different input voltages and clock signals. 3) Key components like NMOS and PMOS transistors are configured with default sizes or specified gate lengths and widths, and the circuits are analyzed for properties like voltage levels and current values under varying conditions.

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    1) Six experiments are described to test different circuit components including a clock detector, current mirror, and voltage source. 2) The experiments involve analyzing transient response, DC levels, and AC characteristics of the circuits when applying different input voltages and clock signals. 3) Key components like NMOS and PMOS transistors are configured with default sizes or specified gate lengths and widths, and the circuits are analyzed for properties like voltage levels and current values under varying conditions.

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    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
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    22 views7 pages

    Mixed Mode

    Uploaded by

    Meghana S
    1) Six experiments are described to test different circuit components including a clock detector, current mirror, and voltage source. 2) The experiments involve analyzing transient response, DC levels, and AC characteristics of the circuits when applying different input voltages and clock signals. 3) Key components like NMOS and PMOS transistors are configured with default sizes or specified gate lengths and widths, and the circuits are analyzed for properties like voltage levels and current values under varying conditions.

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    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Flag for inappropriate content
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