Unit No.

3
1. Which is used to control the scan path movement?
a) clock signals
b) input signals
c) output signals
d) delay signals

2. Boundary scan test is used to test

a) pins
b) multipliers
c) boards
d) wires

3. The boundary scan path is provided with

a) serial input outputs pads
b) parallel input pads
c) parallel output pads
d) buffer pads

4. The boundary scan path tests the

a) input nodes
b) output nodes
c) buffer nodes
d) interconnection points

5. Boundary scan method takes lesser time on test pattern generation.

a) true
b) false

6. The disadvantage of boundary scan method is that the fault coverage is less.
a) true
b) false

7. In scan/set method, __________ is used to implement a scan path

a) serial registers
b) storage elements
c) parallel registers
d) separate register