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This measurement technique, using ultra-thin expanded laser beams, is particularly useful to detect
microscopic imperfections in optical coatings or transmission optical surfaces.[5]
See also
Densitometer
Microscopy
N-slit interferometer
Particle size
References
1. J. C. Dainty and R. Shaw, Image Science (Academic, New york, 1974).
2. T. H. James, The Theory of the Photographic Process (Eastman Kodak, Rochester, 1977).
3. F. J. Duarte, Tunable Laser Optics (Elsevier Academic, New York, 2003) Chapter 10.
4. F. J. Duarte, Electro-optical interferometric microdensitometer system, US Patent 5255069
(1993).
5. F. J. Duarte, Tunable Laser Applications (CRC, New York, 2009) Chapter 12.